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Publication numberUSD400811 S
Publication typeGrant
Application numberUS 29/079,957
Publication dateNov 10, 1998
Filing dateNov 21, 1997
Publication number079957, 29079957, US D400811 S, US D400811S, US-S-D400811, USD400811 S, USD400811S
InventorsMark A. Swart, Charles J. Johnston, Gordon A. Vinther
Original AssigneeDelaware Capital Formation, Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Test probe plunger tip
US D400811 S
Abstract  available in
Images(2)
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Claims(1)
  1. The ornamental design for a test probe plunger tip, as shown and described.
Description

FIG. 1 is a perspective view of the test probe plunger tip showing the new design;

FIG. 2 is a left side elevational view of the embodiment of FIG. 1;

FIG. 3 is a front elevational view of the embodiment of FIG. 1;

FIG. 4 is a right side elevational view of the embodiment of FIG. 1;

FIG. 5 is a back elevational view of the embodiment of FIG. 1;

FIG. 6 is a bottom elevational view of the embodiment of FIG. 1; and,

FIG. 7 is a top elevational view of the embodiment of FIG. 1.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US6538424Jul 31, 2000Mar 25, 2003Le Croy CorporationNotched electrical test probe tip
US6809535Feb 10, 2003Oct 26, 2004Lecroy CorporationNotched electrical test probe tip
US7140105Oct 22, 2004Nov 28, 2006Lecroy CorporationMethod of fabricating a notched electrical test probe tip
US20030189437 *Feb 10, 2003Oct 9, 2003Lecroy CorporationNotched electrical test probe tip
US20050052193 *Oct 22, 2004Mar 10, 2005Lecroy CorporationNotched electrical test probe tip
USD769753 *Jun 16, 2015Oct 25, 2016Omron CorporationProbe pin
WO2002010784A1 *Jul 30, 2001Feb 7, 2002Lecroy CorporationNotched electrical test probe tip
Classifications
U.S. ClassificationD10/80