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Publication numberUSD412294 S
Publication typeGrant
Application numberUS 29/093,423
Publication dateJul 27, 1999
Filing dateSep 10, 1998
Publication number093423, 29093423, US D412294 S, US D412294S, US-S-D412294, USD412294 S, USD412294S
InventorsHideo Kaise, Masazo Murase
Original AssigneeKaise Kabushiki Kaisha
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Circuit tester
US D412294 S
Abstract  available in
Images(6)
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Claims(1)
  1. The ornamental design for a circuit tester, as shown and described.
Description

FIG. 1 is a perspective view of a circuit tester showing my new design;

FIG. 2 is a perspective view thereof with the cover thereof closed;

FIG. 3 is a perspective view thereof with the test leads thereof pulled out;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is a left side elevational view thereof;

FIG. 9 is a right side elevational view thereof;

FIG. 10 is a front elevational view thereof with the cover thereof closed;

FIG. 11 is a rear elevational view thereof with the cover thereof closed;

FIG. 12 is a top plan view thereof with the cover thereof closed;

FIG. 13 is a bottom plan view thereof with the cover thereof closed;

FIG. 14 is a left side elevational view thereof with the cover thereof closed;

FIG. 15 is a right side elevational view thereof with the cover thereof closed;

FIG. 16 is a front elevational view thereof in which the cover is turned until reaching a rear face of a body proper; and,

FIG. 17 is a bottom plan view thereof in which the cover is turned until reaching the rear face of the body proper.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US7224159 *Jun 12, 2003May 29, 2007The Stanley WorksFoldable multimeter
US8570026 *Aug 7, 2011Oct 29, 2013Chung Instrument Electronics Industrial Co., Ltd.Multimeter having clamping means for test probe
US20040012379 *Jun 12, 2003Jan 22, 2004Van Deursen Gary E.Foldable multimeter
US20130033253 *Aug 7, 2011Feb 7, 2013Chung Instrument Electronics Industrial Co., Ltd.Multimeter having clamping means for test probe
Classifications
U.S. ClassificationD10/78