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Publication numberUSD421968 S
Publication typeGrant
Application numberUS 29/095,314
Publication dateMar 28, 2000
Filing dateOct 20, 1998
Priority dateApr 21, 1998
Publication number095314, 29095314, US D421968 S, US D421968S, US-S-D421968, USD421968 S, USD421968S
InventorsShigeru Matsumura
Original AssigneeAdvantest Corporation
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Contactor for semiconductor IC testers
US D421968 S
Abstract  available in
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Claims(1)
  1. The ornamental design for a contactor for semiconductor IC testers, as shown and described.
Description

FIG. 1 is a perspective view of a contactor for semiconductor IC testers showing my new design;

FIG. 2 is a top plan view in a reduced scale of FIG. 1;

FIG. 3 is a bottom plan in a reduced scale of FIG. 1;

FIG. 4 is a front elevational view in a reduced scale of FIG. 1, the rear elevational view being a mirror image of the front elevational view;

FIG. 5 is a left side elevational view in a reduced scale of FIG. 1, the right side elevational view beign a mirror image of the left side elevational view; and,

FIG. 6 is an enlarged center horizontal cross-sectional view of FIG. 2.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
USD753073 *Dec 30, 2014Apr 5, 2016Altia Systems, Inc.Printed circuit board
Classifications
U.S. ClassificationD13/182, D13/147