US D422518 S
Abstract available in
FIG. 1 is a perspective view of an electrical instrument probe tip showing my new design;
FIG. 2 is a right side elevational view thereof, the left side elevational view being a mirror image of FIG. 2;
FIG. 3 is a top elevational view thereof;
FIG. 4 is a bottom elevational view thereof; and,
FIG. 5 is a front elevational view thereof.
The broken line representations of an electrical instrument in FIGS. 1-5 are exemplary and form no part of the claimed design.