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Publication numberUSD422518 S
Publication typeGrant
Application numberUS 29/103,523
Publication dateApr 11, 2000
Filing dateApr 15, 1999
Publication number103523, 29103523, US D422518 S, US D422518S, US-S-D422518, USD422518 S, USD422518S
InventorsThomas M. Luebke
Original AssigneeApplied Power Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Electrical instrument probe tip
US D422518 S
Abstract  available in
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  1. The ornamental design for an electrical instrument probe tip, as shown and described.

FIG. 1 is a perspective view of an electrical instrument probe tip showing my new design;

FIG. 2 is a right side elevational view thereof, the left side elevational view being a mirror image of FIG. 2;

FIG. 3 is a top elevational view thereof;

FIG. 4 is a bottom elevational view thereof; and,

FIG. 5 is a front elevational view thereof.

The broken line representations of an electrical instrument in FIGS. 1-5 are exemplary and form no part of the claimed design.

Non-Patent Citations
1FCB International Co., Walnut Creek, Cal., brochure entitled "Electric Finder", undated, admitted prior art.
Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US6809535Feb 10, 2003Oct 26, 2004Lecroy CorporationNotched electrical test probe tip
US7140105Oct 22, 2004Nov 28, 2006Lecroy CorporationMethod of fabricating a notched electrical test probe tip
U.S. ClassificationD10/80