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Publication numberUSD432504 S
Publication typeGrant
Application numberUS 29/109,357
Publication dateOct 24, 2000
Filing dateAug 13, 1999
Priority dateApr 21, 1998
Publication number109357, 29109357, US D432504 S, US D432504S, US-S-D432504, USD432504 S, USD432504S
InventorsShigeru Matsumura
Original AssigneeAdvantest Corporation
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Contactor for semiconductor IC testers
US D432504 S
Abstract  available in
Images(1)
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Claims(1)
  1. The ornamental design for a contactor for semiconductor IC testers, as shown and described.
Description

FIG. 1 is a perspective view of a contactor for semiconductor IC testers;

FIG. 2 is a top plan view in a reduced scale of FIG. 1;

FIG. 3 is a bottom plan in a reduced scale of FIG. 1;

FIG. 4 is a front elevational view in a reduced scale of FIG. 1;

FIG. 5 is a left side elevational view in a reduced scale of FIG. 1, the right side elevational view being a mirror image of the left side elevational view; and,

FIG. 6 is a center horizontal cross-sectional view in an enlarged scale of FIG. 2.

Classifications
U.S. ClassificationD13/182