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Publication numberUSD441310 S1
Publication typeGrant
Application numberUS 29/121,319
Publication dateMay 1, 2001
Filing dateApr 6, 2000
Priority dateApr 6, 2000
Publication number121319, 29121319, US D441310 S1, US D441310S1, US-S1-D441310, USD441310 S1, USD441310S1
InventorsThomas F. Bauman
Original AssigneeHickok, Incorporated
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Electrical test probe
US D441310 S1
Abstract  available in
Images(4)
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Claims(1)
  1. The ornamental design for an electrical test probe, as shown and described.
Description

FIG. 1 is a perspective view of the electrical test probe of this invention showing a detachable primary probe point detached to reveal a non-detachable secondary sharp probe point;

FIG. 2 is a top view thereof with the secondary probe point covered;

FIG. 3 is a top view thereof to clearly illustrate the location of views shown in FIGS. 8, 9 and 10;

FIG. 4 is a front view thereof with the secondary probe point covered, the back view being a mirror image of the front view;

FIG. 5 is a bottom view thereof with the secondary probe point covered;

FIG. 6 is a left side view thereof;

FIG. 7 is a right side view thereof;

FIG. 8 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 8—8;

FIG. 9 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 9—9; and,

FIG. 10 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 10—10.

Classifications
U.S. ClassificationD10/78