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Publication numberUSD444720 S1
Publication typeGrant
Application numberUS 29/127,137
Publication dateJul 10, 2001
Filing dateJul 31, 2000
Priority dateJul 31, 2000
Publication number127137, 29127137, US D444720 S1, US D444720S1, US-S1-D444720, USD444720 S1, USD444720S1
InventorsJulie A. Campbell
Original AssigneeLecroy Corporation
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Notched electrical test probe tip
US D444720 S1
Abstract  available in
Images(3)
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Claims(1)
  1. The ornamental design for a notched electrical test probe tip, as shown and described.
Description

FIG. 1 is a general perspective view of a notched electrical test probe tip showing the new design, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 2 is a front view of the notched electrical test probe tip, the back view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 3 is a right side view of the notched electrical test probe tip, the left side view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 4 is a top view of the notched electrical test probe tip; and,

FIG. 5 is a bottom view of the notched electrical test probe tip.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US6846735Sep 5, 2002Jan 25, 2005Bridge Semiconductor CorporationCompliant test probe with jagged contact surface
US7671613Jan 5, 2007Mar 2, 2010Lecroy CorporationProbing blade conductive connector for use with an electrical test probe
US8098078Mar 1, 2010Jan 17, 2012Lecroy CorporationProbing blade with conductive connector for use with an electrical test probe
US9140724Nov 8, 2011Sep 22, 2015Lecroy CorporationCompensating resistance probing tip optimized adapters for use with specific electrical test probes
US9253894Aug 22, 2013Feb 2, 2016Wintec Industries, Inc.Electronic assembly with detachable components
US9404940Mar 3, 2013Aug 2, 2016Teledyne Lecroy, Inc.Compensating probing tip optimized adapters for use with specific electrical test probes
US20110241708 *Jun 10, 2011Oct 6, 2011Wintec Industries, Inc.Apparatus for predetermined component placement to a target platform
Classifications
U.S. ClassificationD10/80