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Publication numberUSD460702 S1
Publication typeGrant
Application numberUS 29/139,954
Publication dateJul 23, 2002
Filing dateApr 9, 2001
Priority dateApr 9, 2001
Publication number139954, 29139954, US D460702 S1, US D460702S1, US-S1-D460702, USD460702 S1, USD460702S1
InventorsHideo Kaise
Original AssigneeKaise Kabushiki Kaisha
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Circuit tester
US D460702 S1
Abstract  available in
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  1. The ornamental design for a circuit tester, as shown and described.

FIG. 1 is a plane view of a circuit tester showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view of thereof

FIG. 4 is a bottom plane view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a plane view, in which the testing rod is separated from the main body section; and,

FIG. 8 is a perspective elevational view thereof.

U.S. ClassificationD10/78