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Publication numberUSD476246 S1
Publication typeGrant
Application numberUS 29/166,015
Publication dateJun 24, 2003
Filing dateAug 22, 2002
Priority dateMay 9, 2002
Publication number166015, 29166015, US D476246 S1, US D476246S1, US-S1-D476246, USD476246 S1, USD476246S1
InventorsMasamichi Kuramoto, Tomosuke Itoh
Original AssigneeKyoritsu Electrical Instruments Works, Ltd.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Volt-ohm-ammeter
US D476246 S1
Images(7)
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Claims(1)
  1. The ornamental design for a volt-ohm-ammeter, as shown and described.
Description

FIG. 1 is a top and left front perspective view of a volt-ohm-ammeter, showing oure new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof;

FIG. 7 is a right side elevational view thereof;

FIG. 8 is a left side elevational view thereof, with a clamp sensor detached by way of reference only;

FIG. 9 is a rear elevational view thereof, with test rods detached by way of reference only;

FIG. 10 is a front elevational view thereof, with the clamp sensor and test rods detached by way of reference only.

FIG. 11 is a bottom plan view thereof, with the clamp sensor and test rods detached by way of reference only; and,

FIG. 12 is a top and left front perspective view thereof, with the clamp sensor and test rods deteched and with cords loosened by way of reference only.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US8570026 *Aug 7, 2011Oct 29, 2013Chung Instrument Electronics Industrial Co., Ltd.Multimeter having clamping means for test probe
US20130033253 *Aug 7, 2011Feb 7, 2013Chung Instrument Electronics Industrial Co., Ltd.Multimeter having clamping means for test probe
Classifications
U.S. ClassificationD10/78