Search Images Maps Play YouTube News Gmail Drive More »
Sign in
Screen reader users: click this link for accessible mode. Accessible mode has the same essential features but works better with your reader.


  1. Advanced Patent Search
Publication numberUSD481962 S1
Publication typeGrant
Application numberUS 29/167,341
Publication dateNov 11, 2003
Filing dateSep 11, 2002
Priority dateAug 30, 2002
Publication number167341, 29167341, US D481962 S1, US D481962S1, US-S1-D481962, USD481962 S1, USD481962S1
InventorsChun Nan Ou, Galei Hu, Lin Yan, TaiPing Zhou, Yue Qing Zhao
Original AssigneeHon Hai Precision Ind. Co., Ltd.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Testing machine
US D481962 S1
Abstract  available in
Previous page
Next page
  1. The ornamental design for a testing machine, as shown.

FIG. 1 is a perspective view of a testing machine of our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

U.S. ClassificationD10/75