Search Images Maps Play YouTube News Gmail Drive More »
Sign in
Screen reader users: click this link for accessible mode. Accessible mode has the same essential features but works better with your reader.

Patents

  1. Advanced Patent Search
Publication numberUSD498850 S1
Publication typeGrant
Application numberUS 29/171,847
Publication dateNov 23, 2004
Filing dateDec 2, 2002
Priority dateJun 10, 2002
Publication number171847, 29171847, US D498850 S1, US D498850S1, US-S1-D498850, USD498850 S1, USD498850S1
InventorsNaomi Ukon
Original AssigneeDaiichi Pure Chemicals Co., Ltd.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Specimen testing device
US D498850 S1
Abstract  available in
Images(4)
Previous page
Next page
Claims(1)
  1. The ornamental design for a specimen testing device, as shown and described.
Description

FIG. 1 is top plan view of a specimen testing device showing my new design;

FIG. 2 is a bottom plan view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a right side elevational view thereof, the left side elevational view being identical thereto; and,

FIG. 6 is a top perspective view thereof.

Classifications
U.S. ClassificationD24/223, D24/216, D24/225