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Publication numberUSD507198 S1
Publication typeGrant
Application numberUS 29/190,399
Publication dateJul 12, 2005
Filing dateSep 19, 2003
Priority dateJun 11, 2003
Also published asUSD510043
Publication number190399, 29190399, US D507198 S1, US D507198S1, US-S1-D507198, USD507198 S1, USD507198S1
InventorsJanuary Kister
Original AssigneeK&S Interconnect, Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Straight protruding probe beam contour surfaces
US D507198 S1
Abstract  available in
Images(4)
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Claims(1)
  1. The ornamental design for straight protruding probe beam contour surfaces, as shown and described.
Description

FIG. 1 is a perspective view of an exemplary environmental structure of a probe beam having straight protruding probe beam contour surfaces.

FIG. 2 is a plan view of an exemplary environmental structure of a probe beam in protruding direction of the straight protruding probe beam contour surfaces. Section lines indicate the position of the corresponding cross sections of FIGS. 8, 9, 10 with respect to the exemplary environmental structure of a probe beam. The section line arrows on both ends of each section line indicate the view direction of the corresponding cross section views.

FIG. 3 is a plan view of an exemplary environmental structure of a probe beam in protruding direction of the straight protruding probe beam contour surfaces without section lines.

FIG. 4 is a top view in direction from above with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 5 is a side view in direction from right with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 6 is a bottom view in direction from below with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 7 is a side view in direction from left with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 8 is an enlarged cross section view indicated in FIG. 2 by section line 8—8. The cross hatching indicates the contour with respect to the section line 8—8. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 9 is an enlarged cross section view indicated in FIG. 2 by section line 9—9. The cross hatching indicates the contour with respect to the section line 9—9. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam; and,

FIG. 10 is an enlarged cross section view indicated in FIG. 2 by section line 10—10. The cross hatching indicates the contour with respect to the section line 10—10. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

The broken lines shown in FIGS. 1-10 are for illustrative purposes only and form no part of the claimed design.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US7649372Jan 19, 2010Wentworth Laboratories, Inc.Die design with integrated assembly aid
US7659739Sep 14, 2006Feb 9, 2010Micro Porbe, Inc.Knee probe having reduced thickness section for control of scrub motion
US7671610Oct 19, 2007Mar 2, 2010Microprobe, Inc.Vertical guided probe array providing sideways scrub motion
US7733101Jun 9, 2006Jun 8, 2010Microprobe, Inc.Knee probe having increased scrub motion
US7759949Jun 29, 2006Jul 20, 2010Microprobe, Inc.Probes with self-cleaning blunt skates for contacting conductive pads
US7786740Oct 11, 2006Aug 31, 2010Astria Semiconductor Holdings, Inc.Probe cards employing probes having retaining portions for potting in a potting region
US7850460 *Dec 14, 2010Feinmetall GmbhElectrical contact element for contacting an electrical component under test and contacting apparatus
US7944224Jan 8, 2010May 17, 2011Microprobe, Inc.Low profile probe having improved mechanical scrub and reduced contact inductance
US7952377May 31, 2011Microprobe, Inc.Vertical probe array arranged to provide space transformation
US8111080Feb 3, 2010Feb 7, 2012Microprobe, Inc.Knee probe having reduced thickness section for control of scrub motion
US8203353Jun 19, 2012Microprobe, Inc.Probes with offset arm and suspension structure
US8230593May 29, 2008Jul 31, 2012Microprobe, Inc.Probe bonding method having improved control of bonding material
US8324923May 31, 2011Dec 4, 2012Microprobe, Inc.Vertical probe array arranged to provide space transformation
US8415963Apr 9, 2013Microprobe, Inc.Low profile probe having improved mechanical scrub and reduced contact inductance
US8723546Mar 2, 2010May 13, 2014Microprobe, Inc.Vertical guided layered probe
US8907689Aug 30, 2010Dec 9, 2014Microprobe, Inc.Probe retention arrangement
US8988091Sep 13, 2010Mar 24, 2015Microprobe, Inc.Multiple contact probes
US9097740Feb 9, 2010Aug 4, 2015Formfactor, Inc.Layered probes with core
US9274143Dec 4, 2012Mar 1, 2016Formfactor, Inc.Vertical probe array arranged to provide space transformation
US9310428Dec 9, 2014Apr 12, 2016Formfactor, Inc.Probe retention arrangement
US9316670Mar 20, 2015Apr 19, 2016Formfactor, Inc.Multiple contact probes
US20070152686 *Jun 9, 2006Jul 5, 2007January KisterKnee probe having increased scrub motion
US20080001612 *Jun 29, 2006Jan 3, 2008January KisterProbes with self-cleaning blunt skates for contacting conductive pads
US20080068035 *Sep 14, 2006Mar 20, 2008Microprobe, Inc.Knee probe having reduced thickness section for control of scrub motion
US20090096474 *Feb 7, 2008Apr 16, 2009Rogers Robert LDie design with integrated assembly aid
US20090102495 *Oct 19, 2007Apr 23, 2009January KisterVertical guided probe array providing sideways scrub motion
US20090280676 *May 8, 2009Nov 12, 2009Feinmetall GmbhElectrical contact element for contacting an electrical test sample and contacting apparatus
USRE43503Jul 10, 2012Microprobe, Inc.Probe skates for electrical testing of convex pad topologies
USRE44407Dec 23, 2009Aug 6, 2013Formfactor, Inc.Space transformers employing wire bonds for interconnections with fine pitch contacts
EP1923708A1 *Sep 7, 2006May 21, 2008NHK Spring Company LimitedConductive contact and method for manufacturing conductive contact
Classifications
U.S. ClassificationD10/78