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Publication numberUSD511981 S1
Publication typeGrant
Application numberUS 29/201,978
Publication dateNov 29, 2005
Filing dateMar 23, 2004
Priority dateMar 23, 2004
Publication number201978, 29201978, US D511981 S1, US D511981S1, US-S1-D511981, USD511981 S1, USD511981S1
InventorsWayne H. Miller, Ichiang Sun
Original AssigneeCredence Systems Corporation
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Semiconductor integrated circuit test head
US D511981 S1
Abstract  available in
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  1. The ornamental design for a semiconductor integrated circuit test head, as shown and described.

FIG. 1 is a perspective view of a semiconductor integrated circuit test head showing my new design,

FIG. 2 is an end elevation thereof, the opposite end elevation being of corresponding appearance,

FIG. 3 is a side elevation thereof; and,

FIG. 4 is a top plan view thereof.

U.S. ClassificationD10/80