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Publication numberUSD525207 S1
Publication typeGrant
Application numberUS 29/194,881
Publication dateJul 18, 2006
Filing dateDec 2, 2003
Priority dateDec 2, 2003
Publication number194881, 29194881, US D525207 S1, US D525207S1, US-S1-D525207, USD525207 S1, USD525207S1
InventorsJanuary Kister, James Jaquette, Steve Fahrner
Original AssigneeAntares Contech, Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Sheet metal interconnect array
US D525207 S1
Abstract  available in
Images(6)
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Claims(1)
  1. The ornamental design for a sheet metal interconnect array, substantially as shown and described.
Description

FIG. 1 is a top view of sheet metal interconnect array and fixed on an environmental carrier structure in exemplary number of four.

FIG. 2 is a bottom view thereof.

FIG. 3 is a front view thereof.

FIG. 4 is a side view thereof; and,

FIG. 5 is a perspective view thereof.

The broken line showing of the environment is for illustrative purposes only and forms no part of the claimed design.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US7659739Sep 14, 2006Feb 9, 2010Micro Porbe, Inc.Knee probe having reduced thickness section for control of scrub motion
US7671610Oct 19, 2007Mar 2, 2010Microprobe, Inc.Vertical guided probe array providing sideways scrub motion
US7733101Jun 9, 2006Jun 8, 2010Microprobe, Inc.Knee probe having increased scrub motion
US7759949Jun 29, 2006Jul 20, 2010Microprobe, Inc.Probes with self-cleaning blunt skates for contacting conductive pads
US7786740Oct 11, 2006Aug 31, 2010Astria Semiconductor Holdings, Inc.Probe cards employing probes having retaining portions for potting in a potting region
US7944224Jan 8, 2010May 17, 2011Microprobe, Inc.Low profile probe having improved mechanical scrub and reduced contact inductance
US7952377Apr 7, 2009May 31, 2011Microprobe, Inc.Vertical probe array arranged to provide space transformation
US8111080Feb 3, 2010Feb 7, 2012Microprobe, Inc.Knee probe having reduced thickness section for control of scrub motion
US8203353May 11, 2010Jun 19, 2012Microprobe, Inc.Probes with offset arm and suspension structure
US8230593May 29, 2008Jul 31, 2012Microprobe, Inc.Probe bonding method having improved control of bonding material
US8324923May 31, 2011Dec 4, 2012Microprobe, Inc.Vertical probe array arranged to provide space transformation
US8415963May 16, 2011Apr 9, 2013Microprobe, Inc.Low profile probe having improved mechanical scrub and reduced contact inductance
US8723546Mar 2, 2010May 13, 2014Microprobe, Inc.Vertical guided layered probe
US8784117 *Jul 17, 2012Jul 22, 2014Hon Hai Precision Industry Co., Ltd.Electrical connector with X-type dual spring contacts for lower profile and lattice shielding therewith
US8907689Aug 30, 2010Dec 9, 2014Microprobe, Inc.Probe retention arrangement
US8988091Sep 13, 2010Mar 24, 2015Microprobe, Inc.Multiple contact probes
US9097740Feb 9, 2010Aug 4, 2015Formfactor, Inc.Layered probes with core
US9196395 *Nov 11, 2011Nov 24, 2015Kitagawa Industries Co., Ltd.Conductive member and method for producing same
US9274143Dec 4, 2012Mar 1, 2016Formfactor, Inc.Vertical probe array arranged to provide space transformation
US9310428Dec 9, 2014Apr 12, 2016Formfactor, Inc.Probe retention arrangement
US9316670Mar 20, 2015Apr 19, 2016Formfactor, Inc.Multiple contact probes
US9476911Mar 19, 2012Oct 25, 2016Microprobe, Inc.Probes with high current carrying capability and laser machining methods
US20070152686 *Jun 9, 2006Jul 5, 2007January KisterKnee probe having increased scrub motion
US20080001612 *Jun 29, 2006Jan 3, 2008January KisterProbes with self-cleaning blunt skates for contacting conductive pads
US20080068035 *Sep 14, 2006Mar 20, 2008Microprobe, Inc.Knee probe having reduced thickness section for control of scrub motion
US20090102495 *Oct 19, 2007Apr 23, 2009January KisterVertical guided probe array providing sideways scrub motion
US20130220678 *Nov 11, 2011Aug 29, 2013Kitagawa Industries Co., Ltd.Conductive member and method for producing same
USRE43503Oct 13, 2010Jul 10, 2012Microprobe, Inc.Probe skates for electrical testing of convex pad topologies
USRE44407Dec 23, 2009Aug 6, 2013Formfactor, Inc.Space transformers employing wire bonds for interconnections with fine pitch contacts
Classifications
U.S. ClassificationD13/154, D13/123