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Publication numberUSD573049 S1
Publication typeGrant
Application numberUS 29/275,496
Publication dateJul 15, 2008
Filing dateDec 28, 2006
Priority dateNov 3, 2006
Publication number275496, 29275496, US D573049 S1, US D573049S1, US-S1-D573049, USD573049 S1, USD573049S1
InventorsChin-Feng Chen, Chiou-Lin Fan, Ying-Chih Huang, Tay-Yang Lin
Original AssigneeHon Hai Precision Industry Co., Ltd.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Testing device for electronic component
US D573049 S1
Abstract  available in
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  1. The ornamental design for a testing device for electronic component, substantially as shown and described.

FIG. 1 is a perspective view of a testing device for electronic component in accordance with the present design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a perspective view thereof, with a display screen in an open position and a drawer being drawn out.

(Broken line portions are only included to show the intended use environment and do not constitute a part of the claimed design.)

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
USD788612 *Feb 11, 2016Jun 6, 2017Exfo Inc.Modular test instrument
U.S. ClassificationD10/75