Search Images Maps Play YouTube News Gmail Drive More »
Sign in
Screen reader users: click this link for accessible mode. Accessible mode has the same essential features but works better with your reader.

Patents

  1. Advanced Patent Search
Publication numberUSD583266 S1
Publication typeGrant
Application numberUS 29/301,057
Publication dateDec 23, 2008
Filing dateFeb 7, 2008
Priority dateFeb 7, 2008
Publication number29301057, 301057, US D583266 S1, US D583266S1, US-S1-D583266, USD583266 S1, USD583266S1
InventorsKingston T. Wong
Original AssigneeKlein Tools, Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Non-contact voltage tester
US D583266 S1
Abstract  available in
Images(4)
Previous page
Next page
Claims(1)
  1. The ornamental design for the non-contact voltage tester, as shown and described.
Description

FIG. 1 is a perspective view of the non-contact voltage tester.

FIG. 2 is a right side view of the non-contact voltage tester.

FIG. 3 is a left side view of the non-contact voltage tester.

FIG. 4 is a top view of the non-contact voltage tester.

FIG. 5 is a bottom view of the non-contact voltage tester.

FIG. 6 is a front view of the non-contact voltage tester; and,

FIG. 7 is a rear view of the non-contact voltage tester.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US9510733 *Nov 20, 2013Dec 6, 2016National Taiwan UniversityEndoscope and a method for chemical modification of the members thereof
US20140371528 *Nov 20, 2013Dec 18, 2014National Taiwan UniversityEndoscope and a method for chemical modification of the members thereof
USD724592 *Feb 21, 2014Mar 17, 2015Amazon Technologies, Inc.Scanner device
USD750985 *Dec 2, 2014Mar 8, 2016Klein Tools, Inc.Non-contact voltage tester
Classifications
U.S. ClassificationD10/78