USD583266S1 - Non-contact voltage tester - Google Patents
Non-contact voltage tester Download PDFInfo
- Publication number
- USD583266S1 USD583266S1 US29/301,057 US30105708F USD583266S US D583266 S1 USD583266 S1 US D583266S1 US 30105708 F US30105708 F US 30105708F US D583266 S USD583266 S US D583266S
- Authority
- US
- United States
- Prior art keywords
- contact voltage
- voltage tester
- tester
- contact
- ornamental design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
Claims (1)
- The ornamental design for the non-contact voltage tester, as shown and described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/301,057 USD583266S1 (en) | 2008-02-07 | 2008-02-07 | Non-contact voltage tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/301,057 USD583266S1 (en) | 2008-02-07 | 2008-02-07 | Non-contact voltage tester |
Publications (1)
Publication Number | Publication Date |
---|---|
USD583266S1 true USD583266S1 (en) | 2008-12-23 |
Family
ID=40134448
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/301,057 Expired - Lifetime USD583266S1 (en) | 2008-02-07 | 2008-02-07 | Non-contact voltage tester |
Country Status (1)
Country | Link |
---|---|
US (1) | USD583266S1 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140371528A1 (en) * | 2013-06-17 | 2014-12-18 | National Taiwan University | Endoscope and a method for chemical modification of the members thereof |
USD724592S1 (en) * | 2014-02-21 | 2015-03-17 | Amazon Technologies, Inc. | Scanner device |
USD750985S1 (en) * | 2014-12-02 | 2016-03-08 | Klein Tools, Inc. | Non-contact voltage tester |
USD838196S1 (en) * | 2017-08-24 | 2019-01-15 | ShenZhen Huayi Peakmeter Technology Co., LTD | Test pencil |
-
2008
- 2008-02-07 US US29/301,057 patent/USD583266S1/en not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140371528A1 (en) * | 2013-06-17 | 2014-12-18 | National Taiwan University | Endoscope and a method for chemical modification of the members thereof |
US9510733B2 (en) * | 2013-06-17 | 2016-12-06 | National Taiwan University | Endoscope and a method for chemical modification of the members thereof |
USD724592S1 (en) * | 2014-02-21 | 2015-03-17 | Amazon Technologies, Inc. | Scanner device |
USD750985S1 (en) * | 2014-12-02 | 2016-03-08 | Klein Tools, Inc. | Non-contact voltage tester |
USD838196S1 (en) * | 2017-08-24 | 2019-01-15 | ShenZhen Huayi Peakmeter Technology Co., LTD | Test pencil |
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