Search Images Maps Play YouTube News Gmail Drive More »
Sign in
Screen reader users: click this link for accessible mode. Accessible mode has the same essential features but works better with your reader.


  1. Advanced Patent Search
Publication numberUSD626579 S1
Publication typeGrant
Application numberUS 29/356,738
Publication dateNov 2, 2010
Filing dateMar 2, 2010
Priority dateSep 30, 2009
Publication number29356738, 356738, US D626579 S1, US D626579S1, US-S1-D626579, USD626579 S1, USD626579S1
InventorsMitsuru Oonuma, Akira Omachi, Masahiko Ajima, Tomohisa Ohtaki
Original AssigneeHitachi High-Technologies Corporation
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Electron microscope
US D626579 S1
Abstract  available in
Previous page
Next page
  1. We claim the ornamental design for an electron microscope, as shown and described.

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines form no part of the claimed design.

U.S. ClassificationD16/131