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Publication numberUSD639977 S1
Publication typeGrant
Application numberUS 29/363,035
Publication dateJun 14, 2011
Priority dateJun 3, 2010
Publication number29363035, 363035, US D639977 S1, US D639977S1, US-S1-D639977, USD639977 S1, USD639977S1
InventorsKarl Francis, Paul Crivelli, Emily Parker
Original AssigneeAlere San Diego, Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Test strip base
US D639977 S1
Abstract  available in
Images(3)
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Claims(1)
  1. The ornamental design for a test strip base, as shown and described.
Description

FIG. 1 is a perspective view from above of a test strip base.

FIG. 2 is a front view of the test strip base of FIG. 1.

FIG. 3 is a rear view of the test strip base of FIG. 1.

FIG. 4 is a left side view of the test strip base of FIG. 1.

FIG. 5 is a right side view of the test strip base of FIG. 1.

FIG. 6 is a top view of the test strip base of FIG. 1; and,

FIG. 7 is a bottom view of the test strip base of FIG. 1.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US8486717Jan 4, 2012Jul 16, 2013Symbolics, LlcLateral flow assays using two dimensional features
USD731671 *Mar 14, 2013Jun 9, 2015Eppendorf AgMicrocuvette
USD733911 *Dec 30, 2013Jul 7, 2015Hamamatsu Photonics K.K.Substrate for spectroscopic analysis
USD733912 *Dec 30, 2013Jul 7, 2015Hamamatsu Photonics K.K.Substrate for spectroscopic analysis
USD733913 *Dec 30, 2013Jul 7, 2015Hamamatsu Photonics K.K.Substrate for spectroscopic analysis
USD735879 *Dec 10, 2014Aug 4, 2015Scanadu IncorporatedDiagnostic test paddle
USD738526 *Nov 12, 2013Sep 8, 2015Bionime CorporationSensor strip
USD739954 *Dec 30, 2013Sep 29, 2015Hamamatsu Photonics K.K.Substrate for spectroscopic analysis
USD740439 *Dec 30, 2013Oct 6, 2015Hamamatsu Photonics K.K.Substrate for spectroscopic analysis
USD740440 *Dec 30, 2013Oct 6, 2015Hamamatsu Photonics K.K.Substrate for spectroscopic analysis
USD750799Jun 1, 2015Mar 1, 2016Hamamatsu Photonics K.K.Substrate for spectroscopic analysis
USD750800Jun 1, 2015Mar 1, 2016Hamamatsu Photonics K.K.Substrate for spectroscopic analysis
USD758608Dec 1, 2014Jun 7, 2016Scanadu IncorporatedDiagnostic test paddle
Classifications
U.S. ClassificationD24/225