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Publication numberUSD658685 S1
Publication typeGrant
Application numberUS 29/366,648
Publication dateMay 1, 2012
Filing dateJul 28, 2010
Priority dateJul 28, 2010
Publication number29366648, 366648, US D658685 S1, US D658685S1, US-S1-D658685, USD658685 S1, USD658685S1
InventorsKoichi Sekiguchi, Masahiro Iwasaki, Tatsuhito Inouchi
Original AssigneeKuroda Precision Industries Ltd.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Profilometer
US D658685 S1
Images(12)
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Claims(1)
  1. We claim the ornamental design for a profilometer, as shown and described.
Description

FIG. 1 is a perspective view of a profilometer;

FIG. 2 is a front view thereof;

FIG. 3 is a left-side view thereof;

FIG. 4 is a right-side view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a back view thereof;

FIG. 7 is an enlarged view of portion 7-7 of FIG. 2;

FIG. 8 is an enlarged view of portion 8-8 of FIG. 3;

FIG. 9 is an enlarged view of portion 9-9 of FIG. 4;

FIG. 10 is an enlarged view of portion 10-10 of FIG. 5;

FIG. 11 is an enlarged view of portion 11-11 of FIG. 6;

FIG. 12 is an enlarged view of portion 12-12 of FIG. 1;

FIG. 13 is a perspective view of the profilometer; and,

FIG. 14 is an illustrative view of the profilometer thereof removed to disclose details not otherwise visible.

The subject article is a profilometer used for measuring a surface profile (such as the extent of flatness) of a thin disk object (such as a silicon wafer).

The broken lines in the drawings depict unclaimed environmental subject matter.

Classifications
U.S. ClassificationD15/122