Search Images Maps Play YouTube News Gmail Drive More »
Sign in
Screen reader users: click this link for accessible mode. Accessible mode has the same essential features but works better with your reader.

Patents

  1. Advanced Patent Search
Publication numberUSRE35317 E
Publication typeGrant
Application numberUS 08/321,649
Publication dateAug 27, 1996
Filing dateOct 11, 1994
Priority dateJul 26, 1991
Also published asUS5155361
Publication number08321649, 321649, US RE35317 E, US RE35317E, US-E-RE35317, USRE35317 E, USRE35317E
InventorsStuart M. Lindsay
Original AssigneeThe Arizona Board Of Regents
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Potentiostatic preparation of molecular adsorbates for scanning probe microscopy
US RE35317 E
Abstract
.[.A method of.]. .Iadd.An apparatus and method for .Iaddend.preparing molecular adsorbates for scanning probe microscopy by potentiostatic methods. Negatively charged molecules are deposited upon and held to a substrate with an electrochemical cell having a gold substrate, a platinum wire counter electrode and a silver wire reference electrode. The polymer to be observed is dissolved into a buffer solution which is non-reactive with the substrate which is gold (111).
Images(1)
Previous page
Next page
Claims(14)
Accordingly, what is claimed is:
1. A method of preparing molecular adsorbates for scanning probe microscopy comprising: loading a substrate into a cell; placing the cell on a scanning probe microscope; placing a clean reference electrode in said cell; placing a clean counter electrode in said cell in spaced relationship to said reference electrode; dissolving a polymer containing negatively charged molecules into a buffer solution that is inert relative to said substrate; filling said cell with said polymer .[.contained.]. .Iadd.containing .Iaddend.buffer solution; activating said reference electrode and said counter electrode and applying a potential to said substrate to deposit and secure said polymer onto said substrate for examination by said microscope.
2. A method according to claim 1 in which said substrate is gold (111).
3. A method according to claim 1 in which said reference electrode is silver wire.
4. A method according to claim 1 in which said counter electrode is platinum wire.
5. A method according to claim 1 in which said buffer solution is NaH2 PO4 at a pH of 6.
6. A method according to claim 3 in which said electrodes are activated to a voltage of from about -1.2 up to about .Iadd.+ .Iaddend.1.3.
7. A method according to claim 5 in which said electrodes are activated to a voltage of from about -1.2 up to about .Iadd.+ .Iaddend.1.3.
8. A method according to claim 2 in which said reference electrode is silver wire.
9. A method according to claim 8 in which said counter electrode is platinum wire.
10. A method according to claim 9 in which said buffer solution is NaH2 PO4 at a pH of 6.
11. A method according to claim 10 in which said electrodes are activated to a voltage of from about -1.2 up to about .Iadd.+ .Iaddend.1.3. .Iadd.
12. A method of preparing molecular adsorbates for scanning probe microscopy comprising:
loading a substrate into a cell;
placing the cell on a scanning probe microscope;
placing a clean reference electrode in said cell;
placing a clean counter electrode in said cell in spaced relationship to said reference electrode;
dissolving a polymer containing charged molecules into a buffer solution that is inert relative to said substrate;
filling said cell with said polymer containing buffer solution;
activating said reference electrode and said counter electrode; and
applying a potential between said substrate and said counter electrode to deposit and secure said polymer onto said substrate for examination by said microscope..Iaddend..Iadd.13. A method according to claim 12 in which said substrate comprises gold..Iaddend..Iadd.14. A method according to claim 12 in which said reference electrode is silver wire..Iaddend..Iadd.15. A method according to claim 12 in which said
counter electrode is platinum wire..Iaddend..Iadd.16. A method according to claim 12 in which said buffer solution is NaH2 PO4 at a pH of 6. .Iaddend..Iadd.17. A method according to claim 13 in which said substrate is activated to a voltage in a range of about -1.2 volts up to about +1.3 volts with respect to said reference electrode by application of a suitable voltage to said counter electrode..Iaddend..Iadd.18. A method according to claim 14 in which said substrate is activated to a voltage in a range of about -1.2 volts up to about +1.3 volts with respect to said reference electrode by application of a suitable voltage to said counter electrode..Iaddend..Iadd.19. A method according to claim 15 in which said substrate is activated to a voltage in a range of about -1.2 volts UP to about +1.3 volts with respect to said reference electrode by application of a suitable voltage to said counter electrode..Iaddend..Iadd.20. A method according to claim 16 in which said substrate is activated to a voltage in a range of about -1.2 volts up to about +1.3 volts with respect to said reference electrode by application of a suitable voltage to said counter electrode..Iaddend..Iadd.21. A method according to claim 13 in which said reference electrode is silver wire..Iaddend..Iadd.22. A method according to claim 15 in which said reference electrode is silver wire..Iaddend..Iadd.23. A method according to claim 13 in which said counter electrode is platinum wire..Iaddend..Iadd.24. A method according to claim 16 in which said counter electrode is platinum wire..Iaddend..Iadd.25. A method according to claim 23 in which said buffer solution is NaH2 PO4 at a pH of 6. .Iadd.26. A method according to claim 25 in which said substrate is activated to a voltage in a range of about -1.2 volts up to about +1.3 volts with respect to said reference electrode by application of a suitable voltage to said counter electrode..Iaddend..Iadd.27. An electrochemical fluid cell and substrate assembly for use in studying molecular adsorbates with a scanning probe microscope, said cell comprising:
an electrically conductive substrate;
an electrically insulating cell wall having an inner boundary defining a fluid container open at its top, said fluid container having a bottom boundary defined by said substrate;
said substrate having a portion extending under and beyond said inner boundary;
a reference electrode extending from beyond said fluid container into said fluid container through said top;
a counter electrode extending from beyond said fluid container into said fluid container through said top and maintained in spaced relationship to said reference electrode;
a voltage potential capable of being applied to said substrate by connecting said voltage potential to said electrically conductive substrate at said portion extending under and beyond said inner boundary..Iaddend..Iadd.28. An electrochemical fluid cell and substrate assembly according to claim 27 wherein said substrate comprises gold..Iaddend..Iadd.29. An electrochemical fluid cell and substrate assembly according to claim 27 wherein said reference electrode is silver wire..Iaddend..Iadd.30. An electrochemical fluid cell and substrate assembly according to claim 27 wherein said counter electrode is platinum
wire..Iaddend..Iadd.31. An electrochemical fluid cell and substrate assembly according to claim 28 wherein said reference electrode is silver wire..Iaddend..Iadd.32. An electrochemical fluid cell and substrate assembly according to claim 28 wherein said counter electrode is platinum wire..Iaddend..Iadd.33. An electrochemical fluid cell and substrate assembly according to claim 28 wherein said reference electrode is silver wire and said counter electrode is platinum wire..Iaddend..Iadd.34. An electrochemical fluid cell and substrate assembly for use in studying molecular adsorbates with a scanning probe microscope, said cell comprising:
an electrically conductive substrate;
an electrically insulating cell wall having an inner boundary defining a fluid container open at its top, said fluid container having a bottom boundary defined by said substrate;
said substrate in electrical contact with a conductor having a portion extending under and beyond said inner boundary;
a reference electrode extending from beyond said fluid container into said fluid container through said top;
a counter electrode extending from beyond said fluid container into said fluid container through said top and maintained in spaced relationship to said reference electrode;
a voltage potential capable of being applied to said substrate by connecting said voltage potential to said electrically conductive substrate at said portion of said conductor extending under and beyond said inner boundary..Iaddend..Iadd.35. An electrochemical fluid cell and substrate assembly according to claim 34 wherein said substrate comprises gold..Iaddend..Iadd.36. An electrochemical fluid cell and substrate assembly according to claim 34 wherein said reference electrode is silver wire..Iaddend..Iadd.37. An electrochemical fluid cell and substrate assembly according to claim 34 wherein said counter electrode is platinum wire..Iaddend..Iadd.38. An electrochemical fluid cell and substrate assembly according to claim 35 wherein said reference electrode is silver wire..Iaddend..Iadd.39. An electrochemical fluid cell and substrate assembly according to claim 35 wherein said counter electrode is platinum wire..Iaddend..Iadd.40. An electrochemical fluid cell and substrate assembly according to claim 35 wherein said reference electrode is silver wire and said counter electrode is platinum wire. .Iaddend.
Description
INTRODUCTION

.[.This.]. .Iadd.The .Iaddend.present invention relates generally to scanning probe microscopy and more particularly to .Iadd.an apparatus and method for .Iaddend.the potentiostatic preparation of molecular adsorbates for study with scanning probe microscopes.

.Iadd.This invention was made with Government support under contract No. N00014-90-J-1655 awarded by the Department of the Navy and grant DIR 89-20053 awarded by the National Science Foundation. The Government has certain rights in the invention..Iaddend.

BACKGROUND OF THE INVENTION

Various ways have heretofore been proposed for chemically reacting molecules with a metal substrate in an electrochemistry cell. In some cases, the prior methodology allows molecules to be bonded strongly enough so that they can be imaged in a scanning tunnelling microscope (STM) or in .[.the.]. .Iadd.an .Iaddend.atomic force microscope (AFM). However, in the case of negatively charged molecules, such as DNA, it is extremely difficult to get them to adhere to an electrode because most metal surfaces are intrinsically negatively charged and, as such, repel the molecule. Thus a clear need exists for new and improved technology for the potentiostatic preparation of negatively charged .[.molecules.]. .Iadd.molecular .Iaddend.adsorbates such as DNA to enable them to be properly bonded to .Iadd.a .Iaddend.suitable substrate so .Iadd.that .Iaddend.they can be imaged in .Iadd.a .Iaddend.scanning tunnelling microscope .[.(STM).]. or .Iadd.an .Iaddend.atomic force .[.microscopes (AFM).]. .Iadd.microscope.Iaddend.. It is .[.toward.]. .Iadd.to .Iaddend.this end that the present invention is directed.

BRIEF SUMMARY OF THE INVENTION

The present invention is predicated upon the discovery of a remarkably simple procedure for getting negatively charged molecules onto a substrate and holding them there. The new methodology is based in part on the concept that DNA (or any other negatively charged molecule) can be attracted to a surface which is positively charged by virtue of its interaction with an electrolyte (.[.See: Lindsay et al, 1988.]. .Iadd.See: Lindsay, S. M., and Barris, B., "Imaging DNA Molecules on a Metal Surface Under Water by STM", Journal of Vacuum Science and Technology. Vol. A6, Pages 544-547 (1988)).Iaddend.. What is new and unexpected is that the same forces that attract the molecules to the surface are capable, in the practice of the present invention, of holding such molecules in place on that surface for study in an .[.SPM.]. .Iadd.STM .Iaddend.or an AFM. More particularly, the present invention relates to the potentiostatic preparation of molecular adsorbates for scanning probe microscopy in an electrochemical cell having a gold substrate, a platinum wire counter electrode and a silver wire reference electrode placed upon the microscope. The polymer to be observed is dissolved into a buffer solution which is non-reactive with the gold in the substrate and thereafter quickly deposited upon the substrate. Once the cell is filled, the reference electrode and the counter .[.electrodes.]. .Iadd.electrode .Iaddend.are connected and a stable layer of adsorbate is formed on the gold electrode where it can be readily scanned with the microscope probe.

Accordingly, the principle object of the present invention is to provide new and improved methodology for preparing molecular adsorbates for scanning probe microscopy.

Another object of the present invention is to provide methodology especially adapted to potentiostatically prepared negatively charged molecular adsorbates for scanning probe microscopy.

These and still further objects as shall hereinafter appear are readily fulfilled by the present invention in a remarkably unexpected manner as will be readily discerned from the following detailed description of an exemplary embodiment thereof especially when read in conjunction with the accompanying drawing .[.in which like parts bear like numerals throughout the several views.]..

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings:

FIG. 1.[...]. is a schematic drawing of a simple electrochemical cell .Iadd.according to the present invention.Iaddend.; and

FIG. 2 is a cyclic voltammogram of a solution used for deposition of DNA taken in situ using a phosphate buffer solution adjusted to pH=6 with NaOH and containing .[.5 micrograms 5/ml.]. .Iadd.5 micrograms per milliliter .Iaddend.of DNA.

DESCRIPTION OF PREFERRED EMBODIMENT

A small electrochemistry cell is mounted on an STM or AFM as described in my prior U.S. Pat. No. 4,868,396. A sketch of the current simplified cell is shown in FIG. 1. The substrate is Au (111), the counter electrode a platinum wire and the reference electrode a silver wire. It has been discovered that silver wires produce results that are identical to Ag/AgCl/KCl reference electrodes in these particular solutions, but are much easier to use and do not cause chlorine contamination of the substrate.

One practical arrangement of an electrochemistry cell is shown in FIG. 1. Referring to FIG. 1, the electrochemistry cell is designated by the general reference 10 and comprises a gold-on-mica substrate 11.[.,.]. .Iadd.and .Iaddend.a glass cell 12, having a polished bottom that forms a seal against the gold substrate. A platinum (Pt) wire counter electrode 13 and a silver (Ag) wire reference electrode 14 extend into cell 12. Each of these wires are longer than needed and a fresh cut surface is introduced into the cell for each experiment by advancing the .[.electrode.]. .Iadd.electrodes .Iaddend.13, 14 in .[.its.]. .Iadd.their .Iaddend.respective electrode .[.holder.]. .Iadd.holders .Iaddend.15, 15. A stainless steel plate 16 is glued to the lower exterior surface of glass cell 12 to hold down the substrate 11 and make electrical contact with the gold.

Cleanliness is critical. As will appear, an excess length of wire is used for each wire electrode. Before starting the next run, the used portion of the wire is cut away and a portion of the fresh wire is advanced into the cell. A fresh gold substrate is also used for each run.

In one practice of the present invention, a substrate is loaded onto the SPM. Clean reference and counter electrodes are placed into a clean glass cell on the substrate as shown in FIG. 1. The polymer is dissolved into a buffer solution that does not react with the gold over the appropriate range of substrate potentials. One suitable buffer solution for use with Au (111) between -1.2 and .[.=.]. .Iadd.+ .Iaddend.1.3 V (vs. the Ag reference) is NaH2 PO4 .[...]. (10 mM adjusted to pH6 with NaOH). A cyclic voltammogram taken in situ is shown in FIG. 2. For sparse coverage of the electrode, a solution that, at full adsorption, gives less .[.that.]. .Iadd.than .Iaddend.a monolayer coverage of the macromolecule is used. For example, in a 50 microliter cell (0.5 cm2 electrode area) less than 5 micrograms of DNA per mL of solution are required.

The solution is placed onto the substrate as quickly as possible (to minimize contamination) and, once the cell is full, the reference and counter electrodes are connected. Any positive potential (in case of DNA) between the potentials at which reactions occur (from -0.2 V vs. Ag to +0.6 V vs. Ag; the DNA bases oxidize at higher voltage) may be applied to the substrate. There are some small reversible phosphate .[.absorptions.]. .Iadd.adsorptions .Iaddend.at lower potentials, but in the double-layer region macromolecules can be seen in stable arrangements all the way up to about 1 volt. The voltage employed in any given reading is correlated to the reference electrode. The voltage required for deposition is dependant upon the salt solution used. The values reported herein are for the phosphate buffer solution.

If the solutions are free of contamination and, in the case of the STM, the tip is well insulated, a very stable layer of .[.absorbate.]. .Iadd.adsorbate .Iaddend.is formed on the gold electrode. It may be scanned in situ repeatedly with no sign of sample movement or degradation. Indeed this is the salient feature of this invention, namely that .[.the.]. an adsorbate, when under potentiostatic control, is remarkably stable. Furthermore, the adsorbate layer may be lifted .[.on and off.]. .Iadd.off and placed back on .Iaddend.the electrode surface at will simply by cycling the substrate potential between a positive value and -0.2 V (vs. Ag). Of course, these conditions represent a much diminished disruption of the solvated structure of the polymers compared to methods where the adsorbate is chemically reacted onto the substrate.

The coverage of the substrate, even with the simple layout shown in FIG. 1, is remarkably homogeneous. The whole problem of molecular microscopy is now reduced to scanning an area large enough to contain a few molecules (as calculated from the expected coverage, given the cell geometry and sample concentration) and then applying a suitable potential. Furthermore, reactions and various dynamic processes may be studied simply by allowing them to proceed in the cell (using components and a potential that avoid irreversible reactions) and then applying .[.and.]. .Iadd.an .Iaddend.attractive charge to the substrate.

Finally it should be noted that the problem of contamination is greatly reduced. Only those molecules that satisfy conditions for physical adsorption appear in the image. In contrast a vacuum or ambient image would show all contaminants.

This method can also be used to hold positively charged molecules providing the reaction current due to dissolved oxygen is eliminated. This may be done .Iadd.by .Iaddend.using degassed solutions and by operating in an inert gas .[.enviroment.]. .Iadd.environment.Iaddend..

Experiments demonstrate that this method yields excellent high resolution images of macromolecular .[.absorbates.]. .Iadd.adsorbates .Iaddend.in both the STM and the AFM. The electrodes and buffers herein disclosed are intended as representative preferred materials and not by way of limitation thereon.

From the foregoing, it is readily apparent that a useful embodiment of the present invention has been herein described and illustrated which fulfills all of the .[.aforestated.]. .Iadd.aforementioned .Iaddend.objectives in a remarkably unexpected fashion. It is of course understood that such modifications, alterations and adaptations as may readily occur to the artisan confronted with this disclosure are intended within the spirit of this disclosure which is limited only by the scope of the claims appended hereto.

Patent Citations
Cited PatentFiling datePublication dateApplicantTitle
US33387 *Oct 1, 1861 Improvement in printing-presses
US34331 *Feb 4, 1862Himself And george HaywardImproved blast-generator
US34489 *Feb 25, 1862 Improvement in metallic cases for pictures, cards
US4343993 *Sep 12, 1980Aug 10, 1982International Business Machines CorporationScanning tunneling microscope
US4422002 *Aug 9, 1982Dec 20, 1983International Business Machines CorporationPiezo-electric travelling support
US4520570 *Dec 30, 1983Jun 4, 1985International Business Machines CorporationPiezoelectric x-y-positioner
US4668865 *Mar 5, 1986May 26, 1987International Business Machines CorporationScanning tunneling microscope
US4724318 *Aug 4, 1986Feb 9, 1988International Business Machines CorporationAtomic force microscope and method for imaging surfaces with atomic resolution
US4785177 *Mar 13, 1987Nov 15, 1988Kernforschungsanlage Julich Gesellschaft Mit Beschrankter HaftungKinematic arrangement for the micro-movements of objects
US4800274 *Feb 2, 1987Jan 24, 1989The Regents Of The University Of CaliforniaHigh resolution atomic force microscope
US4806755 *Oct 1, 1987Feb 21, 1989International Business Machines CorporationMicromechanical atomic force sensor head
US4823004 *Nov 24, 1987Apr 18, 1989California Institute Of TechnologyTunnel and field effect carrier ballistics
US4837435 *Jun 24, 1988Jun 6, 1989Seiko Instruments Inc.Tunneling scanning microscope having light source
US4866271 *Jul 10, 1987Sep 12, 1989Agency Of Industrial Science And TechnologyRelative displacement control apparatus
US4868396 *Oct 13, 1987Sep 19, 1989Arizona Board Of Regents, Arizona State UniversityCell and substrate for electrochemical STM studies
US4871938 *Jun 13, 1988Oct 3, 1989Digital Instruments, Inc.Positioning device for a scanning tunneling microscope
US4877957 *Jul 7, 1987Oct 31, 1989Olympus Optical Co., Ltd.Scanning type tunnel microscope
US4889988 *Jul 6, 1988Dec 26, 1989Digital Instruments, Inc.Feedback control for scanning tunnel microscopes
US4902892 *Oct 13, 1988Feb 20, 1990Agency Of Industrial Science And Technology, Kosaka Laboratory Ltd.Method of measurement by scanning tunneling microscope
US4914293 *Mar 1, 1989Apr 3, 1990Kabushiki Kaisha ToshibaMicroscope apparatus
US4924091 *Feb 1, 1989May 8, 1990The Regents Of The University Of CaliforniaScanning ion conductance microscope
US4935634 *Mar 13, 1989Jun 19, 1990The Regents Of The University Of CaliforniaAtomic force microscope with optional replaceable fluid cell
US4947042 *Jun 14, 1989Aug 7, 1990Mitsubishi Denki Kabushiki KaishaTunnel unit and scanning head for scanning tunneling microscope
US4952857 *Mar 24, 1989Aug 28, 1990Quanscan, Inc.Scanning micromechanical probe control system
US4954704 *Dec 4, 1989Sep 4, 1990Digital Instruments, Inc.Method to increase the speed of a scanning probe microscope
US4956817 *May 26, 1988Sep 11, 1990Quanscan, Inc.Random access memory
US4962480 *Sep 12, 1988Oct 9, 1990Seiko Instruments, Inc.Memory reading apparatus
US4968390 *Nov 3, 1988Nov 6, 1990Board Of Regents, The University Of Texas SystemHigh resolution deposition and etching in polymer films
US4968914 *Mar 24, 1989Nov 6, 1990Quanscan, Inc.High resolution electromechanical translation device
US4969978 *Nov 23, 1988Nov 13, 1990Seiko Instruments Inc.Apparatus and method for tunnel current measurement observed simultaneously with electrochemical measurement
US4992659 *Jul 27, 1989Feb 12, 1991International Business Machines CorporationNear-field lorentz force microscopy
US4992728 *Dec 21, 1989Feb 12, 1991International Business Machines CorporationElectrical probe incorporating scanning proximity microscope
US4999494 *Sep 11, 1989Mar 12, 1991Digital Instruments, Inc.System for scanning large sample areas with a scanning probe microscope
US4999495 *Aug 29, 1989Mar 12, 1991Seiko Instruments Inc.Scanning tunneling microscope
US5003815 *Oct 20, 1989Apr 2, 1991International Business Machines CorporationSpectroscopic apparatus
US5009111 *Aug 31, 1988Apr 23, 1991Quanscan, Inc.Differential force balance apparatus
US5017010 *May 16, 1989May 21, 1991International Business Machines CorporationHigh sensitivity position sensor and method
US5018865 *Oct 21, 1988May 28, 1991Ferrell Thomas LPhoton scanning tunneling microscopy
US5025658 *Nov 28, 1989Jun 25, 1991Digital Instruments, Inc.Compact atomic force microscope
US5047633 *May 3, 1990Sep 10, 1991Amersham International PlcImaging apparatus and method
US5051646 *Nov 29, 1990Sep 24, 1991Digital Instruments, Inc.Method of driving a piezoelectric scanner linearly with time
US5066858 *Apr 18, 1990Nov 19, 1991Digital Instruments, Inc.Scanning tunneling microscopes with correction for coupling effects
US5077473 *Jul 26, 1990Dec 31, 1991Digital Instruments, Inc.Drift compensation for scanning probe microscopes using an enhanced probe positioning system
US5081390 *Aug 13, 1990Jan 14, 1992Digital Instruments, Inc.Method of operating a scanning probe microscope to improve drift characteristics
US5103095 *May 23, 1990Apr 7, 1992Digital Instruments, Inc.Scanning probe microscope employing adjustable tilt and unitary head
US5107113 *Dec 26, 1990Apr 21, 1992Bell Communications Research, Inc.Method and apparatus for correcting distortions in scanning tunneling microscope images
US5107114 *Apr 15, 1991Apr 21, 1992Mitsubish Denki Kabushiki KaishaFine scanning mechanism for atomic force microscope
US5117110 *Jul 24, 1990May 26, 1992Seiko Instruments, Inc.Composite scanning tunnelling microscope with a positioning function
US5120959 *Jan 31, 1990Jun 9, 1992Seiko Instruments Inc.Useful in surface treatment processing and semiconductors
US5141319 *Nov 15, 1991Aug 25, 1992Olympus Optical Co., Ltd.Displacement detection device with adjacent semiconductor diode lasers
US5142145 *Jul 5, 1990Aug 25, 1992Seiko Instruments, Inc.Composite scanning tunneling microscope
US5144833 *Sep 27, 1990Sep 8, 1992International Business Machines CorporationAtomic force microscopy
US5155361 *Jul 26, 1991Oct 13, 1992The Arizona Board Of Regents, A Body Corporate Acting For And On Behalf Of Arizona State UniversityPotentiostatic preparation of molecular adsorbates for scanning probe microscopy
US5155715 *Jan 12, 1990Oct 13, 1992Sharp Kabushiki KaishaReproducing apparatus
US5157251 *Mar 13, 1991Oct 20, 1992Park Scientific InstrumentsScanning force microscope having aligning and adjusting means
US5166516 *Oct 21, 1991Nov 24, 1992Olympus Optical Co., Ltd.Scanning probe microscope with slant detection and compensation
US5168159 *Nov 4, 1991Dec 1, 1992Olympus Optical Co., Ltd.Barrier height measuring apparatus including a conductive cantilever functioning as a tunnelling probe
US5189906 *Apr 19, 1991Mar 2, 1993Digital Instruments, Inc.Compact atomic force microscope
US5196713 *May 13, 1992Mar 23, 1993Wyko CorporationOptical position sensor with corner-cube and servo-feedback for scanning microscopes
US5198715 *Nov 12, 1991Mar 30, 1993Digital Instruments, Inc.Scanner for scanning probe microscopes having reduced Z-axis non-linearity
US5202004 *Dec 20, 1989Apr 13, 1993Digital Instruments, Inc.Determining contour of surface
US5204531 *Feb 14, 1992Apr 20, 1993Digital Instruments, Inc.Method of adjusting the size of the area scanned by a scanning probe
US5206702 *Oct 3, 1990Apr 27, 1993Olympus Optical Co., Ltd.Technique for canceling the effect of external vibration on an atomic force microscope
US5210410 *Sep 26, 1991May 11, 1993The Board Of Trustees Of The Leland Stanford Junior UniversityScanning probe microscope having scan correction
US5224376 *Feb 6, 1992Jul 6, 1993Digital Instruments, Inc.Atomic force microscope
US5229606 *Jun 5, 1989Jul 20, 1993Digital Instruments, Inc.Jumping probe microscope
US5231286 *Aug 22, 1991Jul 27, 1993Olympus Optical Co., Ltd.Scanning probe microscope utilizing an optical element in a waveguide for dividing the center part of the laser beam perpendicular to the waveguide
US5237859 *May 30, 1991Aug 24, 1993Digital Instruments, Inc.Atomic force microscope
US5245863 *Jul 1, 1991Sep 21, 1993Olympus Optical Co., Ltd.Atomic probe microscope
US5247186 *Apr 29, 1992Sep 21, 1993Olympus Optical Co., Ltd.Integrated optical displacement sensor
US5253516 *May 7, 1992Oct 19, 1993Digital Instruments, Inc.Atomic force microscope for small samples having dual-mode operating capability
US5257024 *Feb 20, 1990Oct 26, 1993Quan-Scan, Inc.Search position encoder
US5258107 *May 20, 1992Nov 2, 1993Seiko Instruments Inc.Method for manufacturing a cantilever with sharpened metal needle
US5260567 *Apr 8, 1992Nov 9, 1993Canon Kabushiki KaishaCantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit
US5260622 *Sep 24, 1991Nov 9, 1993Topometrix CorporationHigh resolution electromechanical translation device
US5260824 *Apr 19, 1990Nov 9, 1993Olympus Optical Co., Ltd.Atomic force microscope
US5262643 *Jun 12, 1992Nov 16, 1993International Business Machines Corp.Automatic tip approach method and apparatus for scanning probe microscope
US5266801 *Jan 26, 1993Nov 30, 1993Digital Instruments, Inc.Atomic force microscope for measuring a physical property of a sample
US5266896 *Jun 9, 1992Nov 30, 1993International Business Machines CorporationMechanical detection and imaging of magnetic resonance by magnetic moment modulation
US5266897 *Feb 24, 1993Nov 30, 1993International Business Machines CorporationMagnetic field observation with tunneling microscopy
US5267471 *Apr 30, 1992Dec 7, 1993Ibm CorporationDouble cantilever sensor for atomic force microscope
US5274230 *Mar 31, 1993Dec 28, 1993Olympus Optical Co., Ltd.Scanning probe microscope having first and second optical waveguides
US5276324 *Jul 29, 1992Jan 4, 1994Nikon CorporationComposite scanning tunneling microscope
US5280341 *Feb 27, 1992Jan 18, 1994International Business Machines CorporationFeedback controlled differential fiber interferometer
US5283437 *Feb 17, 1993Feb 1, 1994International Business Machines CorporationPneumatically and electrostatically driven scanning tunneling microscope
US5283442 *May 3, 1993Feb 1, 1994International Business Machines CorporationControlling the position of a tip of a scanning force microscope
US5286977 *Jan 25, 1993Feb 15, 1994Matsushita Electric Industrial Co., Ltd.Positioning device
US5289004 *Apr 10, 1992Feb 22, 1994Olympus Optical Co., Ltd.Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
US5291775 *Mar 4, 1992Mar 8, 1994TopometrixScanning force microscope with integrated optics and cantilever mount
US5293042 *Apr 29, 1992Mar 8, 1994Olympus Optical Co., Ltd.Servo circuit of scanning probe microscope
US5294804 *Mar 5, 1993Mar 15, 1994Olympus Optical Co., Ltd.Cantilever displacement detection apparatus
US5296704 *Jan 14, 1992Mar 22, 1994Olympus Optical Co., Ltd.Scanning tunneling microscope
US5298975 *Sep 27, 1991Mar 29, 1994International Business Machines CorporationCombined scanning force microscope and optical metrology tool
US5304924 *Nov 20, 1992Apr 19, 1994Canon Kabushiki KaishaEdge detector
US5306919 *Sep 21, 1992Apr 26, 1994Digital Instruments, Inc.Positioning device for scanning probe microscopes
US5307693 *Jan 21, 1993May 3, 1994At&T Bell LaboratoriesForce-sensing system, including a magnetically mounted rocking element
US5308974 *Nov 30, 1992May 3, 1994Digital Instruments, Inc.Scanning probe microscope using stored data for vertical probe positioning
US5314254 *Nov 3, 1992May 24, 1994Digital InstrumentsStiffness enhancer for movable stage assembly
US5314829 *Dec 18, 1992May 24, 1994California Institute Of TechnologyMethod for imaging informational biological molecules on a semiconductor substrate
Non-Patent Citations
Reference
1Allan J. Melmed, "Art and Science and other Aspects of Making Sharp Tips", J. Vac. Sci. Technol. B 9(2), pp. 601-608, Mar./Apr. 1991.
2 *Allan J. Melmed, Art and Science and other Aspects of Making Sharp Tips , J. Vac. Sci. Technol. B 9(2), pp. 601 608, Mar./Apr. 1991.
3B. B. Damaskin, "Comprehensive Treatise of Electrochemistry vol. 1: Chapter 8: The Absorption of Organic Moelcules", pp. 353-395.
4 *B. B. Damaskin, Comprehensive Treatise of Electrochemistry vol. 1: Chapter 8: The Absorption of Organic Moelcules , pp. 353 395.
5B. Drake, "Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope", Science, vol. 243, pp. 1586-1589, Mar. 24, 1989.
6 *B. Drake, Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope , Science, vol. 243, pp. 1586 1589, Mar. 24, 1989.
7Baselt, et al., "Scanned-cantilever atomic force microscope", Rev. Sci. Instrum. 64(4), Apr. 1993, pp. 908-911.
8 *Baselt, et al., Scanned cantilever atomic force microscope , Rev. Sci. Instrum. 64(4), Apr. 1993, pp. 908 911.
9Bezanilla, et al., "Adsorption of DNA to Mica, Silylated Mica, and Minerals: Characterization by Atomic Force Microscopy", Langmuir, vol. 11, No. 2, 1995, pp. 655-659.
10 *Bezanilla, et al., Adsorption of DNA to Mica, Silylated Mica, and Minerals: Characterization by Atomic Force Microscopy , Langmuir, vol. 11, No. 2, 1995, pp. 655 659.
11Booth, et al., "Silicia-Supported Cyclopentadienyl-Rhodium(I), -Cobalt(I), and -Titanium(IV) Complexes", Journal of Organometallic Chemistry, 315 (1986), pp. 143-156.
12 *Booth, et al., Silicia Supported Cyclopentadienyl Rhodium(I), Cobalt(I), and Titanium(IV) Complexes , Journal of Organometallic Chemistry, 315 (1986), pp. 143 156.
13C. Mathew Mate, "Research Report-Determination of Lubricant Film Thickness on A Particulate Disk Surface by Atomic Force Microscopy", Apr. 25, 1989.
14 *C. Mathew Mate, Research Report Determination of Lubricant Film Thickness on A Particulate Disk Surface by Atomic Force Microscopy , Apr. 25, 1989.
15DeRose, et al., "Comparative Scanning Probe Microscopy Study of the Surface Morphology of Au Films Grown from the Vapor onto Glass Fused Silicia", J. Vac. Sci. Technology. A. 11(4), Jul./Aug. 1993, pp. 776-780.
16 *DeRose, et al., Comparative Scanning Probe Microscopy Study of the Surface Morphology of Au Films Grown from the Vapor onto Glass Fused Silicia , J. Vac. Sci. Technology. A. 11(4), Jul./Aug. 1993, pp. 776 780.
17 *Exhibit A, John Adam Kramer, Candicacy Report, pp. 1 48, May 21, 1985.
18Exhibit A, John Adam Kramer, Candicacy Report, pp. 1-48, May 21, 1985.
19Exhibit B, Paul West, "Chemical Applications of Scanning Tunneling Microscopy", IBM J. Res. Develop. vol. 30(5), pp. 484-490, Sep. 1986.
20 *Exhibit B, Paul West, Chemical Applications of Scanning Tunneling Microscopy , IBM J. Res. Develop. vol. 30(5), pp. 484 490, Sep. 1986.
21 *Exhibit C, p. 691, copyright 1986.
22F. Ohnesorge, "True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces", Science vol. 260, pp. 1451-1456, Jun. 4, 1993.
23 *F. Ohnesorge, True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces , Science vol. 260, pp. 1451 1456, Jun. 4, 1993.
24Frisbie, et al., "Functional Group Imaging by Chemical Force Microscopy", Science, vol. 265, Sep. 30, 1994, pp. 2071-2074.
25 *Frisbie, et al., Functional Group Imaging by Chemical Force Microscopy , Science, vol. 265, Sep. 30, 1994, pp. 2071 2074.
26G. Binnig, "Single-Tube Three-Dimensional Scanner for Scanning Tunneling Microscopy", Rev. Sci. Instrum. 57 (8), pp. 1688-1689, Aug. 1986.
27 *G. Binnig, Single Tube Three Dimensional Scanner for Scanning Tunneling Microscopy , Rev. Sci. Instrum. 57 (8), pp. 1688 1689, Aug. 1986.
28G. Travaglini, "Scanning Tunneling Microscopy on Biological Matter", Surface Science 181, pp. 380-390, 1987.
29 *G. Travaglini, Scanning Tunneling Microscopy on Biological Matter , Surface Science 181, pp. 380 390, 1987.
30H. Hanselmann, "Implementation of Digital Controllers-A Survey", Automatica, vol. 23(1) pp. 7-32, 1987.
31 *H. Hanselmann, Implementation of Digital Controllers A Survey , Automatica, vol. 23(1) pp. 7 32, 1987.
32Hansma, et al., "Atomic Force Microscopy of DNA in Aqueous Solutions", Nucleic Acids Research, 1993, vol. 21, No. 3, pp. 505-512.
33 *Hansma, et al., Atomic Force Microscopy of DNA in Aqueous Solutions , Nucleic Acids Research, 1993, vol. 21, No. 3, pp. 505 512.
34Inga Holl Musselman, "Platinum/Iridium Tips with Controlled Geometry Tunneling Microscopy", J. Vac. Sci. Technol. A, vol. 8(4), pp. 3558-3562 Jul./Aug. 1990.
35 *Inga Holl Musselman, Platinum/Iridium Tips with Controlled Geometry Tunneling Microscopy , J. Vac. Sci. Technol. A, vol. 8(4), pp. 3558 3562 Jul./Aug. 1990.
36J. P. Ibe, "On the Electrochemical Etching of Tips for Scanning Tunneling Microscopy", J. Vac. Sci. Technol. A, vol. 8(4), pp. 3570-3575, Jul./Aug. 1990.
37 *J. P. Ibe, On the Electrochemical Etching of Tips for Scanning Tunneling Microscopy , J. Vac. Sci. Technol. A, vol. 8(4), pp. 3570 3575, Jul./Aug. 1990.
38L. A. Nagahara, "Preparation and Characterization of STM Tips for Electrochemical Studies".
39 *L. A. Nagahara, Preparation and Characterization of STM Tips for Electrochemical Studies .
40Lindsay, et al., "Scanning Tunneling Microscopy and Atomic Force Microscopy Studies of Biomaterials at a Liquid-Solid Interface", J. Vac. Sci. Technol. A., vol. 11, No. 4, Jul./Aug. 1993, pp. 808-815.
41 *Lindsay, et al., Scanning Tunneling Microscopy and Atomic Force Microscopy Studies of Biomaterials at a Liquid Solid Interface , J. Vac. Sci. Technol. A., vol. 11, No. 4, Jul./Aug. 1993, pp. 808 815.
42Lyubchenko, et al., "A technique for stable adhesion of DNA to a modified graphite surface for imaging by scanning tunneling microscopy", J. Vac. Sci. Technol. B. 9(2), Mar./Apr. 1991, 1288-1290.
43Lyubchenko, et al., "Atomic Force Microscopy Imaging of Double Stranded DNA and RNA", Journal of Biomolecular Structure & Dynamics, 1992, vol. 10, Issue No. 3, pp. 589-606.
44Lyubchenko, et al., "Atomic force microscopy of DNA and bateriophage in air, water and propanol: the role of adhesion forces", Nucleic Acids Research, 1993, vol. 21, No. 3, pp. 1117-1123.
45Lyubchenko, et al., "Atomic Force Microscopy of Long DNA: Imaging in Air and Under Water", Proc. Natl. Acad. Sci. USA, Mar. 1993, vol. 90, pp. 2137-2140.
46Lyubchenko, et al., "Atomic force microscopy of reovirus dsRNA: a routine technique for length measurements", Nucleic Acids Research, Jun. 1992, vol. 20, No. 15, pp. 3983-3986.
47 *Lyubchenko, et al., A technique for stable adhesion of DNA to a modified graphite surface for imaging by scanning tunneling microscopy , J. Vac. Sci. Technol. B. 9(2), Mar./Apr. 1991, 1288 1290.
48 *Lyubchenko, et al., Atomic Force Microscopy Imaging of Double Stranded DNA and RNA , Journal of Biomolecular Structure & Dynamics, 1992, vol. 10, Issue No. 3, pp. 589 606.
49 *Lyubchenko, et al., Atomic force microscopy of DNA and bateriophage in air, water and propanol: the role of adhesion forces , Nucleic Acids Research, 1993, vol. 21, No. 3, pp. 1117 1123.
50 *Lyubchenko, et al., Atomic Force Microscopy of Long DNA: Imaging in Air and Under Water , Proc. Natl. Acad. Sci. USA, Mar. 1993, vol. 90, pp. 2137 2140.
51 *Lyubchenko, et al., Atomic force microscopy of reovirus dsRNA: a routine technique for length measurements , Nucleic Acids Research, Jun. 1992, vol. 20, No. 15, pp. 3983 3986.
52M. Brede, "Brittle Crack Propagation in Silicon Single Crystals", J. Appl. Phys. 70(2), pp. 758-771, Jul. 15, 1991.
53 *M. Brede, Brittle Crack Propagation in Silicon Single Crystals , J. Appl. Phys. 70(2), pp. 758 771, Jul. 15, 1991.
54M. D. Kirk, "Low Temperature Atomic Force Microscopy", Rev. Sci. Instrum. 59(6), pp. 833-835, Jun. 1988.
55 *M. D. Kirk, Low Temperature Atomic Force Microscopy , Rev. Sci. Instrum. 59(6), pp. 833 835, Jun. 1988.
56Martin Specht, "Simultaneous Measurement of Tunneling Current and Force as a Function of Position Through A Lipid Film on A Solid Substrate", Surface Science Letters 257, pp. L653∝658, 1991.
57 *Martin Specht, Simultaneous Measurement of Tunneling Current and Force as a Function of Position Through A Lipid Film on A Solid Substrate , Surface Science Letters 257, pp. L653 658, 1991.
58Mazur, et al., "Resonant Tunneling Bands and Electrochemical Reduction Potentials", Abstract, Washington State University, pp. 1-16.
59 *Mazur, et al., Resonant Tunneling Bands and Electrochemical Reduction Potentials , Abstract, Washington State University, pp. 1 16.
60O. Marti, "Atomic Force Microscopy of Liquid-covered Surfaces: Atomic Resolution Images", Appl. Phys. Lett. 51(7), pp. 484-486, Aug. 17, 1987.
61O. Marti, "Control Electronics for Atomic Force Microscopy", Rev. Sci. Instrum., vol. 59(6) pp. 836-839, Jun. 1988.
62 *O. Marti, Atomic Force Microscopy of Liquid covered Surfaces: Atomic Resolution Images , Appl. Phys. Lett. 51(7), pp. 484 486, Aug. 17, 1987.
63 *O. Marti, Control Electronics for Atomic Force Microscopy , Rev. Sci. Instrum., vol. 59(6) pp. 836 839, Jun. 1988.
64P. Davidson, "A New Symmetric Scanning Tunneling Microscope Design", Journal of Vacuum Science & Technology: Part A, pp. 380-382, Mar./Apr. 1986.
65 *P. Davidson, A New Symmetric Scanning Tunneling Microscope Design , Journal of Vacuum Science & Technology: Part A, pp. 380 382, Mar./Apr. 1986.
66P. S. Jung, "Novel Stationary-Sample Atomic Force Microscope with Beam-Tracking Lens", Dec. 14, 1992.
67 *P. S. Jung, Novel Stationary Sample Atomic Force Microscope with Beam Tracking Lens , Dec. 14, 1992.
68Plueddemann, E., "Silane Coupling Agents", Second Edition, Plenum Press, pp. cover-xi.
69 *Plueddemann, E., Silane Coupling Agents , Second Edition, Plenum Press, pp. cover xi.
70Rees, et al., "Evidence of DNA Bending in Transcription Complexes Imaged by Scanning Force Microscopy", Science, Jun. 11, 1993, vol. 260, 1646-1649.
71 *Rees, et al., Evidence of DNA Bending in Transcription Complexes Imaged by Scanning Force Microscopy , Science, Jun. 11, 1993, vol. 260, 1646 1649.
72Richard Sonnenfeld, "Atomic-Resolution Microscopy in Water", Science, vol. 232, pp. 211-213, Apr., 11, 1986.
73Richard Sonnenfeld, "Semiconductor Topography in Aqueous Environments: Tunneling Microscopy of Chemomechanically Polished (001) GaAs", 320 Applied Physics Letters 50(24), pp. 1742-1744, Jun. 15, 1987.
74 *Richard Sonnenfeld, Atomic Resolution Microscopy in Water , Science, vol. 232, pp. 211 213, Apr., 11, 1986.
75 *Richard Sonnenfeld, Semiconductor Topography in Aqueous Environments: Tunneling Microscopy of Chemomechanically Polished (001) GaAs , 320 Applied Physics Letters 50(24), pp. 1742 1744, Jun. 15, 1987.
76S. A. Chalmers, "Determinaton of Tilted Superlattice Structure by Atomic force Microscopy", 320 Applied Physics Letters 55(24), pp. 2491-2493, Dec. 11, 1989.
77 *S. A. Chalmers, Determinaton of Tilted Superlattice Structure by Atomic force Microscopy , 320 Applied Physics Letters 55(24), pp. 2491 2493, Dec. 11, 1989.
78S. M. Hu, "Stress-Related Problems in Silicon Technology", J. Appl. Phys. 70(6), pp. R53-R80, Sep. 15, 1991.
79 *S. M. Hu, Stress Related Problems in Silicon Technology , J. Appl. Phys. 70(6), pp. R53 R80, Sep. 15, 1991.
80Schueir, et al., "Creating and observing surface features with a Scanning Tunneling Microscope", SPEI, vol. 897, Scanning Microscopy Technologies and Applications (1988), pp. 16-19.
81 *Schueir, et al., Creating and observing surface features with a Scanning Tunneling Microscope , SPEI, vol. 897, Scanning Microscopy Technologies and Applications (1988), pp. 16 19.
82Steitz, Thomas, "Structural studies of protein-nucleic acid interaction: the sources of sequence-specific binding", Quarterly Review of Biophysics, 23, 3 (1990), pp. 205-280.
83 *Steitz, Thomas, Structural studies of protein nucleic acid interaction: the sources of sequence specific binding , Quarterly Review of Biophysics, 23, 3 (1990), pp. 205 280.
84Stephen A. Joyce, "Mechanical Relaxation of Organic Monolayer Films Measured by Force Microscopy", Physical Review Letters, vol. 68(18), pp. 2790-2793, May 4, 1992.
85 *Stephen A. Joyce, Mechanical Relaxation of Organic Monolayer Films Measured by Force Microscopy , Physical Review Letters, vol. 68(18), pp. 2790 2793, May 4, 1992.
86 *The FASEB Journal, vol. 6, No. 1, No. 855, Jan. 1, 1992.
87Thundat, et al., "Atomic Force Microscopy of DNA on MICA and Chemically Modified Mica", Scanning Microscopy, 1992, vol. 6, No. 4, (pp. 911-918).
88 *Thundat, et al., Atomic Force Microscopy of DNA on MICA and Chemically Modified Mica , Scanning Microscopy, 1992, vol. 6, No. 4, (pp. 911 918).
89Y. Martin, "Atomic Force Microscopy-Force Mapping and Profiling on a Sub 100-A Scale", J. Appl. Phys. 61(10), May 15, 1987.
90 *Y. Martin, Atomic Force Microscopy Force Mapping and Profiling on a Sub 100 A Scale , J. Appl. Phys. 61(10), May 15, 1987.
91Yang, et al., "Atomic force microscopy of DNA molecules", Federation of European Biochemical Societies, Apr. 1992, vol. 301, No. 2, pp. 173-176.
92 *Yang, et al., Atomic force microscopy of DNA molecules , Federation of European Biochemical Societies, Apr. 1992, vol. 301, No. 2, pp. 173 176.
Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US6326215Jul 30, 1999Dec 4, 2001Keensense, Inc.Molecular wire injection sensors
US6635311Jan 5, 2000Oct 21, 2003Northwestern UniversityMicrofabrication and nanofabrication, atomic force microscope imaging
US6699667Sep 20, 2001Mar 2, 2004Keensense, Inc.Molecular wire injection sensors
US6762056May 16, 2001Jul 13, 2004Protiveris, Inc.Rapid method for determining potential binding sites of a protein
US6827979May 24, 2001Dec 7, 2004Northwestern UniversityMethods utilizing scanning probe microscope tips and products therefor or produced thereby
US6979544Feb 2, 2004Dec 27, 2005Keensense, Inc.Molecular wire injection sensors
US7220550Oct 25, 2005May 22, 2007Keensense, Inc.Molecular wire injection sensors
US7569252Jun 2, 2003Aug 4, 2009Northwestern UniversityMethods utilizing scanning probe microscope tips and products therefor or produced thereby
US8247032Oct 31, 2007Aug 21, 2012Northwestern UniversityMethods utilizing scanning probe microscope tips and products therefor or produced thereby
Classifications
U.S. Classification250/307, 205/780.5, 204/409, 205/794.5, 250/304, 361/234, 204/412, 250/440.11, 204/400, 204/403.01
International ClassificationG01Q60/40, H01J37/26, G01N1/28, H01J37/20, G01Q30/14
Cooperative ClassificationY10S977/852, B82Y35/00, G01Q30/14
European ClassificationB82Y35/00, G01Q30/14
Legal Events
DateCodeEventDescription
Apr 27, 2006ASAssignment
Owner name: MOLECULAR IMAGING CORP, A WHOLLY OWNED SUBSIDIARY
Free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME CORRECTION;ASSIGNOR:MOLECULAR IMAGING CORP;REEL/FRAME:017537/0032
Effective date: 20060104
Apr 26, 2006ASAssignment
Owner name: AGILENT TECHNOLOGIES, INC., COLORADO
Free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE THE STATE IN THE ADDRESS OF THE NEW ASSIGNEE SHOULD BE COLORADO PREVIOUSLY RECORDED ON REEL 017519 FRAME 0904;ASSIGNOR:MOLECULAR IMAGING CORP, A WHOLLY OWNED SUBSIDIARY OF AGILENT TECHNOLOGIES, INC.;REEL/FRAME:017527/0255
Effective date: 20060425
Free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE THE STATE IN THE ADDRESS OF THE NEW ASSIGNEE SHOULD BE COLORADO PREVIOUSLY RECORDED ON REEL 017519 FRAME 0904. ASSIGNOR(S) HEREBY CONFIRMS THE ON THE ORIGINAL THE STATE IN THE ADDRESS WAS LISTED AS OHIO.;ASSIGNOR:MOLECULAR IMAGING CORP, A WHOLLY OWNED SUBSIDIARY OF AGILENT TECHNOLOGIES, INC.;REEL/FRAME:017527/0255
Apr 25, 2006ASAssignment
Owner name: AGILENT TECHNOLOGIES, INC., COLORADO
Free format text: CHANGE OF NAME;ASSIGNOR:MOLECULAR IMAGING CORP;REEL/FRAME:017519/0904
Effective date: 20060104
Owner name: MOLECULAR IMAGING CORP, A WHOLLY OWNED SUBSIDIARY