|Publication number||USRE39809 E1|
|Application number||US 09/906,308|
|Publication date||Sep 4, 2007|
|Filing date||Jul 16, 2001|
|Priority date||Dec 4, 1989|
|Also published as||US5050013, US20020057516, USRE37818|
|Publication number||09906308, 906308, US RE39809 E1, US RE39809E1, US-E1-RE39809, USRE39809 E1, USRE39809E1|
|Inventors||Steven V. Holsinger|
|Original Assignee||Research Investment Network, Inc.|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (14), Referenced by (2), Classifications (15), Legal Events (2)|
|External Links: USPTO, USPTO Assignment, Espacenet|
Notice: More than one reissue application has been filed for the reissue of U.S. Pat. No. 5,050,013. The reissue application are Ser. Nos. 08/116,470 and 09/906,308. This application is a continuation to United States Patent Application entitled HARD SECTORING CIRCUIT AND METHOD FOR A ROTATING DISK DATA STORAGE DEVICE, Ser. No. 08/116,470, filed Sep. 2, 1993, now U.S. Pat. No. RE 37,818, which is a reissue of U.S. patent application Ser. No. 07/519,497, filed May 4, 1990, now U.S. Pat. No. 5,050,013, which is a continuation of Ser. No. 445,75307,445,753, filed Dec. 4, 1989, and now abandoned.
1. Field of the Invention
The present invention related generally to improvements in rotating disk magnetic data storage devices, and, more particularly, but not by way of limitation to improvements in locating data sectors on the disks of such devices.
2. Brief Description of the Prior Art
In rotating disk magnetic data storage devices, data is stored in sectors extending angularly along concentric data tracks defined on the disks of the device. The disks have magnetizable surface coatings. Data is written and subsequently read by transducer heads that fly over the surfaces of the disks to magnetize cells of the surface coating, for writing, or respond to differences in magnetization of adjacent cells for reading. Both operations are controlled by a read/write controller that provides encoded data to the transducer head during writing and receives emf pulses from the transducer heads during readback of the data.
For such a system to operate, it is necessary for the sectors to be located prior to reading or writing and it is common practice to encode a data sector with a header that identifies the sector. Some means must be provided to supply sector location pulses to the controller to enable reading of information on the track as the transducer head approaches alignment with the header. Once the appropriate sector has been reached, reading or writing of data from or to the disk can proceed.
In the past, it has been common practice to include address marks on the disks that violate the code used in writing the data and the headers. A circuit can then be constructed to search for the address marks which the controller will place at the beginning of the sector. Such a circuit then provides the “sector” location pulses to the read/write controller.
The use of address marks on a disk suffers from the disadvantage that the marks can be lost for any of a number of reasons; for example, through flaws in the magnetic medium in which the data is written or accidental turn on of a write gate, used to enable writing, as a transducer head passes over an address mark. In this case, the data stored in the sector for that address mark has been lost. That sector's data can never be retrieved because the controller will never receive the pulses necessary for locating the sector. Similarly, read errors while searching for the address mark may cause a sector to be missed and lower the throughput of the data storage device.
The highly preferred alternative has been for the disk storage device to output sector location pulses at the required regular interval without having to write or recover any special data on the disk media itself. This is usually done with a simple circuit that counts out desired time (or number of bytes) in a sector before issuing the next sector location pulse. This simple circuit has been referred to as hard sectoring. Simple hard sectoring has proven adequate for decades of years because the time when sector location pulses should occur has been identical on every track of the disk storage device.
The problem is exacerbated by other requirements placed on a rotating disk data storage system. As is well known, it is desirable to store as much data on a disk as possible and this desire has lead to the recording of data at different frequencies on different tracks of the disk as taught by Bremmer et al. in U.S. Pat. No. 4,799,112 issued Jan. 17, 1989, the teachings of which are hereby incorporated by reference. With recording of different tracks at different frequencies, sectors on different tracks occupy different angular lengths that take differing times to pass by a transducer head. Accordingly, for rotating disk data storage devices that utilize different data transfer rates for different tracks, sector location pulses must be supplied to the controller at different rates that depend upon the radial location of the transducer head on the disk. As a result, it has been necessary in the past to either forego recording tracks at different frequencies or use address marks, despite the disadvantage of much lower data security.
The present invention provides an advanced hard sectoring circuit and method for generating the sector location pulses that is particularly suited to data storage devices in which data is recorded at different transfer rates on different track radii to maximize storage of data by the device. To this end, the hard sectoring circuit is comprised of a master clock generator that is synchronized with the rotation rate of the disk to produce master clock signals that are indicative of distances along the disk and a master reset generator that marks passage of an index location defined on the servo disk by the servo transducer head. The master clock signals are utilized to clock a counter following resetting by a master reset signal generated by the master reset generator so that the counter provides a continuous indication of the location, or time from index, of the transducer head with respect to the index location on the disk. An accumulator and latch assembly are used to accumulate next sector times in response to accumulator clock pulses that are generated by an accumulator clock that is enabled by a comparator whenever the time from index counter exceeds or equals the next sector time in the accumulator. Thus, the accumulator will be increased by one sector time each time the time from index counter reaches a sector pulse location. Concurrently with the generation of the accumulator clock signals, a sector location pulse generator, also connected to the comparator, generates the sector location pulses to the controller. The accumulator, as well as the counter, is reset by the master reset generator so that, subsequent to reset, a sector location pulse is generated each time a new sector is brought into angular alignment with a transducer head.
The circuit further comprises a partial reset generator that provides a partial reset signal to the accumulator each time the transducer head is moved from one track to another so that the accumulator clock will operate repetitively following a partial reset signal until the count in the accumulator reaches the time from index stored in the counter. The partial reset signal is further provided to the sector location pulse generator to disable generation of the sector location pulses until the comparator provides an indication that the contents of the accumulator has risen to the time from index stored in the counter. The partial reset signal is triggered by entry of sector times for the new track into a latch assembly that supplies time to be accumulated to the accumulator. Thus, each time the transducer heads are moved to a new track, the next sector time for the new track is accumulated by the accumulator while the sector location pulses are suppressed until the time from index in the counter is reached by the accumulator. Generation of the sector location pulses then ensues as if the transducer head had been following the new track to which it has been moved.
An object of the invention is to reliably provide sector location pulses for locating sectors on data storage disks.
Another object of the invention is to provide a circuit for providing sector location pulses for locating sectors on disks of a rotating disk data storage device that does not depend upon address marks on the disks.
Still a further object of the invention is to provide hard sectoring of rotating disk data storage devices that write data to different data tracks at different transfer rates.
Other objects, features and advantages of the present invention will become apparent from the following detailed description when read in conjunction with the drawings and appended claims.
Referring now to the drawings in general and to
As shown in
For purposes of illustration, the drawings contemplate that the data storage device 20 will be of the type in which positioning of the transducer heads used to write data to a disk is carried out by a servo circuit 40 in response to electrical signals received from a servo head 42 that is supported by the actuator 38, in alignment with the transducer head 36, adjacent a dedicated servo surface 44 on a disk 46 that is mounted on the spindle 30 to rotate with the disk 26. A servo pattern (not shown) is magnetically written on the surface 44; for example, the surface 44 may contain a tri-phase servo pattern as described in U.S. Pat. No. 4,811,135 issued Mar. 7, 1989 to Donald W. Janz, and the servo head responds to passage of elements of the pattern to provide position error signals to the servo circuit 40 on a conducting path 48. In particular, the servo pattern defines concentric servo tracks that are aligned with the data tracks and the position error signals provide an indication of the position of the servo head with respect to the nearest servo track. The servo circuit 40 provides control signals to the actuator 38, on a conducting path indicated at 52 in
It is also contemplated that the hard sectoring logic circuit can be used in data storage devices that position the head using a stepper motor actuator or any other positioning system.
As is also conventional, the servo circuit 40 is comprised of a servo PLO (not shown) that generates servo clock signals that are synchronized with the rotation of the disks, 26 and 46, so that distances along the tracks 32 and 34 are equivalent to times measured in servo PLO clock pulses. These pulses are transmitted to the hard sectoring logic circuit 22 on conducting path 58 for use in generating master clock signals for the circuit 22 in a manner and for a purpose to be discussed below. Additionally, the servo pattern will include a radially extending series of elements that provides an index indicated by the line 60 in FIG. 1. Corresponding to the index 60, each of the data storage disks will have defined therefor an index location, indicated by the dashed line 62 in
For the reading and writing of data, the data storage device 20 is further comprised of a data buffer 74 which temporarily stores data to be exchanged between the host computer interface 24 and the read/write controller 76 that controls the transfer of data from the buffer to the disk 26. Thus, in the write mode, data in the buffer 74 is transferred, in parallel, on bus 78 to the controller 76 and serially written to the disk by signals transmitted on conducting path 80 from the controller to transducer head 36. It will thus be seen that the timing of placement of data bits on each data track, to fit a block of data within a sector, is effected by the controller 76. For such effectuation, the controller 76 must have knowledge of the beginning of each sector and, for formatting, the location of the first sector; that is, an index, on the disk. The hard sectoring logic circuit 22 provides sector location pulses, both index and sector, to the controller 76 on conducting paths 82 and 84 respectively to indicate to the controller the locations of the sectors on the disks.
As noted above, sector lengths for different data tracks will vary, such variation arising from the writing of data on different tracks at different rates as taught by Bremmer et al. in the aforementioned U.S. Pat. No. 4,799,112. To this end, the data storage device 20 is comprised of a zone clock 86 that receives the servo PLO clock signals from the conducting path 58 and is controlled by the microcomputer 54 to generate zone clock signals that are rational multiples of the servo PLO frequency. The zone clock signals are transmitted to the read/write controller 76, for establishing the transfer rate of data to the disks, and to the hard sectoring logic circuit 22, for synchronizing the sector location pulses from the circuit 22 to the controller 76 with the zone clock signals received by the controller, on a conducting path 88.
With this introduction, attention is now invited to the hard sectoring logic circuit 22, major portions of which have been illustrated in FIG. 3. Remaining portions of the circuit 22 are a raw sector pulse generator 89 and an index-sector pulse generator 91. These, illustrated in
As can be seen in
Prior to describing the circuit 22, it is noted that a preferred manner of fabrication of the circuit 22 is to place the circuit on a single silicon chip using large scale integration techniques. In doing so, the amount of chip surface used can sometimes be minimized by using negative logic in which active signals or states are implemented by a low voltage. Thus, a negative logic signal will be referred to herein as either “active low” or “inactive high”. A positive logic signal will be referred to herein as either “active high” or “inactive low”. An event or signal can sometimes be indicated by a momentary active state then immediately returning inactive. This will be referred to as a “positive pulse” if implemented in positive logic or a “negative pulse” if implemented in negative logic. Further, as will be recognized by those skilled in the art, it will be useful to position buffers and inverters at selected locations in the circuit to provide higher power driving capabilities for elements which are heavily loaded by other parts of the circuit. Since the use of inverters and buffers to increase the fan-out of a circuit component is well known, elements whose sole purpose is to increase fan-out have not been illustrated in order to facilitate the understanding of the invention.
As shown in
A first counter 102 has a reset terminal connected to the master reset via conducting path 104 and a clock terminal that receives the first phase of the master clock on a conducting path 106 so that, following a master reset, the first counter continuously counts a time from index from the passage of the index location on the servo disk 46 by the servo head 42. This time from index is compared with a next sector time; that is, the time the next sector location pulse should occur, to mark the beginning of the sector following that currently adjacent the transducer head 36, by a first comparator 108 which is a conventional gate circuit having A and B parallel inputs that receive receives signals indicative of a digitally expressed number. The first comparator is constructed to provide an inactive low output, on conducting path 110, at all times that the time from index expressed at the A input is less than the next sector time expressed at the B input and an active high output at such times that the time from index is equal to or exceeds the next sector time. The next sector time is provided by an accumulator 112 which is reset via a negative reset pulse supplied on a conducting path 114 from the AND gate 94.
Next sector times are accumulated in accumulator 112 using the output of a latch assembly 116, to be described below. The accumulator 112 is clocked, to enter the next sector time, by a negative pulse provided by an accumulator clock 118 on conducting path 120. As shown in
As noted above, the next sector time accumulator 112 uses the output of latch assembly 116 which will now be discussed. The latch assembly 116 is comprised of a sector time latch 122 and a delay time latch 124 that are both connected to the microcomputer data bus 56 so that both the sector times corresponding to sectors 68, 70 and delay times corresponding to track portions 64, 66 in
The conducting path 132 extends, via an inverter 134 and conducting path 136, from a delayed index controller 138 that receives a signal from one line 140 of the microcomputer data bus 56 and a negative enable pulse from the microcomputer 54 on conducting path 142 so that the delayed index controller can place the hard sectoring logic circuit 22 in either of a nondelayed index mode of operation, in which the index delay time is forced to zero, or a delayed index mode of operation in which the index delay time entered into the delay time latch 124 will be used.
The hard sector logic circuit 22 is further comprised of a number of sectors latch 144 which is connected to the data bus 56 to enter the number of sectors chosen for a data track in response to a negative enable pulse received from the microcomputer 54 on a conducting path 146. The number of sectors latch 144 provides such number to a second comparator 148 that also receives, for comparison, the output of a second counter 150 that is clocked by the trailing; that is, rising, edge of each negative accumulator clock pulse, via conducting path 120. Thus, the second counter 150 will count the number of sector location accumulations performed in accumulator 112 so that the second comparator 148 can indicate when the number of sectors stored in number of sectors latch 144 has passed the transducer head 36. The second counter 150 is reset each time the index location passes the servo transducer head 36 by a negative master reset pulse received from AND gate 94 via conducting paths 96 and 155. The second counter is also disabled, as will be discussed below, for the first accumulator clock signal when in the delayed index mode by a signal transmitted from the delayed index controller 138 on a conducting path 154. Such initial disablement prevents counting of the delayed index skew distance as a sector location in a manner that will be discussed below.
Finally shown in
After a partial reset due to a zone change, the contents of the first counter 102 exceed the contents of the accumulator 112 so that, for a time, the output of the first comparator 108 will remain high. The result, also to be discussed below, will be that the accumulator clock 118 will be continuously enabled to provide a series of accumulator clock signals on conducting path 120 that will clock the cleared accumulator 112 and second counter 150 until the contents of the accumulator 112 and second counter 150 reach the values appropriate to the new zone with respect to the current orientation of the transducer head 36 relative to the index location on the servo disk.
Thus, the general operation of the portion of the circuit 22 shown in
With this overview, attention is now invited to the components of the circuit 22 which are used in the operation generally described above. Referring first to
In addition to the master reset flip-flop 157, the master clock-master reset generator includes a type D master clock flip-flop 162 that also receives the inverted servo index pulse from NOR gate 160 at an active low set input for setting of the flip-flop 162 by the servo index pulse. Upon setting of the flip-flop 162, master clock signals generated thereby and appearing on the paths 98 and 100 connected to the Q and QN outputs of the flip-flop 162 are suppressed, as shown on times axes 164 and 166 for the first and second phases respectively, until the rise of the first servo PLO signal following the servo index signal. Thereafter, the master clock will provide pulses at half the frequency of the servo PLO due to the logic state at the QN output of flip-flop 162 entering the D input thereof via a conducting path 167 which will toggle the state of flip-flop 162 at the next rise of servo PLO clock signals on conducting path 58. Since the resumption of generation of the master clock signals occurs with the rise of the first PLO clock signal following the servo index signal, the above described synchronization of the PLO clock signals with the rotation of the disk 26 results in synchronization of the master clock for the circuit 22 with the rotation of the disk.
The master clock-master reset generator can further include an RS system reset flip-flop 168 that can be reset by a position pulse from the microcomputer 54 on conducting path 201 to effect a complete shutdown of the entire circuit 22 until the next servo index signal appears on conducting path 72. To this end, the QN output of the flip-flop 168 will go inactive high which is connected to a second input of NOR gate 160 to cause the output of such gaste gate to go low and set both flip-flops 158 and 162. At this point, the master reset remains active and the master clock is maintained in a set state. The set input of flip-flop 168 is connected to the path 72 whereon the servo index pulse is received so that the shutdown of the entire circuit 22 is discontinued by setting flip-flop 168 with the servo index pulse going active then inactive. This causes NOR gate 160 output to go inactive high and a subsequent resumption of master clock pulse generation at the next servo PLO clock signal.
The circuit of the partial reset generator 156 has been illustrated in FIG. 6 and the operation of such circuit has been shown by a timing diagram in FIG. 7. As shown in
In addition to the flip-flop 175, the partial reset generator 156 includes a second type D flip-flop 182 having a Q output connected to one input of the NOR gate 176. The other input of the NOR gate 176 is connected to the inverted inverter 178, so that the reset of the flip-flop 182, in the absence of a master reset on the conducting path 92, will cause the output of the NOR gate 176 to be high. Such output is connected via an inverter 186 to an inverting set input of flip-flop 175 so that flip-flop 175 is set to provide the leading edge of a negative partial reset pulse with the reset of flip-flop 182. Such reset is effected upon entry of sector and delay times into the latches 122 and 124 via connection of the active low latch enable conducting paths 126 and 128 to the inputs of a NAND gate 187 whose inverting output is connected to the reset input of the flip-flop 182. Thus, as shown on time axes 188 and 190, initiation of a partial reset pulse begins with the entry of the sector times and delayed index times into the latches 122 and 124. The partial reset is terminated with the entry of the number of sectors into the latch 144; in particular, the D input of the flip-flop 182 is connected to the high terminal of a pull-up 192 and the clock terminal of the flip-flop 182 is connected to the conducting path 146 that is used to enable the latch 144. Thus, at the end of the entry of the number of sectors by a negative latch pulse to the latch 144, the Q output of the flip-flop 182 is clocked high to cause the output of the NOR gate 176 to go low and allow the QN output of flip-flop 175 to rise, ending the partial reset pulse, at the rise of the second phase of the next master clock signal that is transmitted to the clock input of flip-flop 175 on the conducting path 100 from FIG. 4. Thus, a negative partial reset pulse is initiated, as shown at 180 on the time axis 190 in
Referring now to
The Q output of flip-flop 200 is connected to one input of a NOR gate 202 and the QN output thereof is connected to one input of a NOR gate 204. The other input of each of the gates 202 and 204 is connected to conducting path 92, to receive the negative master reset pulses generated by the master clock-master reset generator 90. Since clocking the Q output of the flip-flop 200 high, for the delayed mode of operation of the hard sector logic circuit 22, of the flip-flop 200 will place a high voltage on one input of the NOR gate 202, gate 202 is uneffected by master reset pulses so that its output on conducting path 206, referred to herein as an output index conducting path, remains inactive low and its operation in the delayed index mode need not be further considered.
The connection of one input of the gate 204 to the QN output of flip-flop 200, on the other hand, causes the NOR gate 204 to invert the negative master reset pulses on the conducting path 92 in the delayed index mode and produce a positive mask delayed index pulse at conducting path 208. The conducting path 208 leads to one input of a NOR gate 210, the other input of which receives the positive pulse complement of the partial reset pulse on the conducting path 153. Thus, either a mask delayed index pulse or the positive complement of a negative partial reset pulse, received on conducting path 211 shown in
At such times that the flip-flop 200 is reset; i.e., in the nondelayed index mode of operation, one input of NOR gate 202 will be low while the other input will be high in the absence of a master reset pulse. Thus, the NOR gate 202 will provide a positive pulse on the output index conducting path 206 in response to a negative master reset pulse. The NOR gate 204 will, on the other hand, have a high voltage at one input in this mode of operation to provide an inactive low voltage on the mask delayed index conducting path 208 so that operation of NOR gate 210 is effected solely by partial reset pulse complements appearing on conducting paths 153 (
Additionally, the delayed index controller 138 is comprised of a type D flip-flop 214 having an active low set terminal connected to the conducting path 96 from the output of the AND gate 94 that provides a negative combined reset pulse on conducting path 96 whenever a master reset or partial reset pulse is generated. Thus, the flip-flop 214 is set on either of these occasions. The D input of flip-flop 214 is connected to the low output of a pull-down 216 and the clock input of flip-flop 214 is connected, via connecting path 120 shown in FIG. 3 and carried into
Coming now to the sector location pulse generator which, as noted above, is comprised of the raw sector pulse generator 89, shown in
The counter 220 has four output terminals, for counting from a binary zero to a binary fifteen. These terminals are connected to four inputs of an AND gate 224 that is thus enabled when counting is complete and all counter 220 outputs are high. The output of the AND gate 224 is connected to the D input of a type D flip-flop 226 which is clocked by zone clock pulses received on the conducting path 88 and a conducting path 228 therefrom. Both the counter 220 and the flip-flop 226 have active low set terminals that receive negative combined reset pulses from the AND gate 94 via the conducting path 96 every time a master or partial reset occurs.
The outputs of the counter 220 are also connected to the inputs of a NAND gate 301, which receives the raw sector pulses at an additional input and the output of NAND gate 301 is connected via conductor 302 to the enable terminal of the counter 220. Thus, at the end of a count up to a binary fifteen and in the absence of a negative raw sector pulse on conducting path 222, the output of NAND gate 301 will be low and the counter 220 will be disabled. Enablement of the counter 220 will thus occur with the reception of the raw sector pulse which causes the counter output to become zero on the first zone clock pulse and then count to a binary fifteen with the enablement thereof being maintained by low voltages appearing at the outputs of the counter while counting occurs. The counter 220 is then disabled while awaiting the next raw sector pulse.
The most significant bit of the number appearing at the output terminals of the counter 220 is connected to the inputs of a three input NAND gate 230, directly for one input and via serially connected pulse stretches 232 and 234 for the remaining two inputs. As will become clear below, short duration sector location pulses, eight zone clock periods in length, are provided via the NAND gate 230 and, as is known in the art, polling at a one byte rate is commonly utilized by read/write controllers to pick up sector location pulses. The use of the pulse stretchers 232 and 234 insures that the cycle time for the NAND gate 230, that is the time between a drop of the most significant bit of the counter 220 to zero and and its subsequent rise at the end of a countdown will exceed eight zone clock periods by an amount sufficient for the read/write controller to detect all sector location pulses.
From the above, it can be seen that in the normal state of the index-sector pulse generator 91; that is, while “disabled” due to no raw sector pulse input at the conducting path 222, all counter outputs are allowed to count up to all high. At this point, as will be discussed below, the raw sector input is also high causing the output of gate 301 to go low and disable counter 220. The output of the NAND gate 230 will, at this time, go low. During the count up by the counter 220, the QN output of the flip-flop 226 is utilized to generate 15 bit long duration sector location pulses so that, in the normal state of the index-sector pulse generator 91, both the NAND gate 230 and the flip-flop 226 will provide a low voltage to components that, as will be discussed below, provide the sector location pulses to the controller 76.
It will be useful at this point to consider the operation of the above-described portion of the index-sector pulse generator 91 before continuing with the remaining structure and, for this purpose, selected points of the circuit have been identified with the letters A, B, and C corresponding to time axes 235, 237 and 239 in FIG. 10. In particular, time axis 235 (point A) illustrates the signal at the output of AND gate 224, time axis 237 (point B) illustrates the signal at the QN output of flip-flip 226 and time axis 237 (point C) illustrates the signal at the NAND gate 230 output following reception of a negative raw sector pulse by the counter 220.
As noted above, the index-sector pulse generator 91 is clocked by the zone clock and will, accordingly, be asynchronous with the remainder of the hard sectoring logic circuit 22 so that, as indicated on time lines 238 and 240, the raw sector pulse will not necessarily coincide in time with a zone clock pulse. However, as will be discussed below, provision is made in the raw sector pulse generator to insure that the raw sector pulse will be of a duration that will be long enough to include one rising edge of a zone clock pulse. Accordingly, during the rise of the first zone clock pulse, as at 231, following the leading edge 233 of a raw sector pulse, the output of counter 220 will be clocked to zero and, subsequently, countup of the counter 220 will occur. At this time, the output of the AND gate 224 will drop to zero so that the D input of the flip-flop 226 will also drop. As a result, the Q output of flip-flop 226 will be clocked low at the rise of the next zone clock pulse 229 to provide an upgoing signal at the QN output thereof as indicated at 242 in FIG. 10. Since the AND gate 224 will remain disabled for the remainder of the up count, as shown for the point A on the time axis 235, point B will remain high as indicated at 244 on the time axis 237, for the remainder of the count; that is, for fifteen zone clock periods. However, the output of the NAND gate 230 (point C) will go active high immediately after the first zone clock pulse 231 following reception of the raw sector pulse and remain high for slightly over 8 zone clocks, as shown at 248, until slightly after the rise of the ninth zone clock pulse, at 246, following reception of the raw sector pulse, as shown on time axis 239. This results because of the control of this gate solely by the most significant bit of the number in the counter 220. Thus, the operation of the counter 220, flip-flop 226 and gates 224 and 230 is to provide a positive pulse on the conducting paths 250 and 252 for eight and fifteen zone clock periods respectively. It will be noted that the voltage level at the QN output of flip-flop 226 is delivered to the raw sector pulse generator on conducting path 254 (
The outputs of the AND gates 262 and 266 are connected to the inputs of an OR gate 268 so that a positive pulse of the selected duration will occur at the output of the OR gate 268 each time a raw sector pulse is transmitted to the index-sector pulse generator 91. This pulse will be delivered to the read/write controller as either an index pulse, via an AND gate 270 (point D on FIG. 9), or a sector pulse, via an AND gate 272 (point E on FIG. 9), as will now be described with reference to
The selection of the pulse as an index or sector pulse is effected by a type D flip-flop 274 having an active low set terminal that receives the negative master reset pulses on the conducting path 92 and an active high reset terminal that receives the positive pulse complements of the partial reset pulses on the conducting path 153. Three cases of operation occur as indicated on time axes 276 and 278 (case I), time axes 280 and 282 (case II), and time axes 284 and 286 (case III). These cases have been illustrated for short duration pulses in FIG. 10. As will be clear to those skilled in the art, the cases will occur identically for long duration pulses; merely the durations of the sector location pulses will be changed.
In case I, the case that occurs most commonly, the Q output of flip-flop 274 will have been clocked low by a previous sector location pulse, as will be discussed below, and the QN output will be high. Thus, in response to a raw sector pulse that will enable OR gate 268, AND gate 272 will be enabled, via conducting path 288 to the high QN output of flip-flop 274. Thus, the AND gate 272 will pass the positive pulse from OR gate 268 to the conducting path 84, as shown on time axis 276, as a sector pulse. Concurrently, the AND gate 270 will block transmission of an index pulse as indicated on time axis 278.
Following a master reset, case II will occur. In this case, the negative master reset pulse, which is received at the active low set terminal of the flip-flop 274 will set such flip-flop so that the output of gate 270 will become active high via conducting path 290 to give rise to an index pulse as indicated on time axis 282 while the gate 272 will be disabled via conducting path 288 to suppress the generation of a sector pulse as indicated on time axis 280.
Subsequent to this index pulse, the Q output of flip-flop 274 will be clocked low to return the operation to case I operation as will now be described. As shown in
The third case occurs after a partial reset. The active high reset terminal of the flip-flop 274 receives the partial reset positive pulse complement on the conducting path 153 so that, except in the case that such complement is suppressed by a master reset as discussed above, the flip-flop 274 will be reset to cause operation that is identical to case I operation as shown by the pulse on time axis 284 and the lack thereof on time axis 286. Should a master and partial reset occur at the same time, the partial reset complement is suppressed and operation occurs in the manner described above for case II.
Referring now to
In addition to the sector location pulse gate 300, the raw sector pulse generator is comprised of three type D flip flops having clock terminals connected to the conducting path 98 on which appears phase one of the master clock. To facilitate the discussion of the operation of the circuit 22, these flip-flops will be referred to as the delayed index flip-flop 308, the pulse stretcher flip-flop 310, and the raw sector flip-flop 312.
The QN output of the index delay flip-flop 308 is connected to the third input terminal of the sector location pulse gate 300 via a conducting path 324 to disable the gate 300 at such times that the index delay flip-flop 308 is set and thereby prevent the generation of a raw sector pulse and, accordingly, a sector location pulse as will be discussed below. Such disablement is effected by a partial reset pulse or in the nondelayed index mode. Such delayed index mode of operation by the connection of an active low set terminal of the flip-flop 308 to the mask first sector output of NOR gate 210 (
As its name implies, the raw sector flip-flop 312 provides the negative raw sector pulse to the sector location pulse generator 91 via the conducting path 222 that is connected between the QN output of the flip-flop 312 and one input of NAND gate 301 of FIG. 9. The active high reset terminal of the raw sector pulse flip-flop 312 is connected, via an inverter 314 and the conducting path 96, to the AND gate 94 that delivers both the master and partial reset pulses. Thus, the raw sector pulse flip-flop 312 is reset at the leading; that is, falling edge of either of these negative pulses.
The D input of the raw sector flip-flop 312 is connected to the output of a NOR gate 316 so that an active high signal at the output of the NOR gate 316 at the time the first phase of the master clock rises will clock the QN output of the raw sector flip-flop 312 low to initiate transmission of a negative pulse to the index-sector pulse generator 91 and initiate the count sequence of the pulse time counter 220 as discussed above. As noted above, the voltage level at the QN output of the flip flop 226 (FIG. 9), which becomes high as the count sequence of the sector location pulse commences, is transmitted to the raw sector pulse generator 89 via the conducting path 254 to terminate the raw sector pulse. One input of the gate 316 receives the signal on the conducting path 254 so that any phase one master clock pulse delivered after the QN output of the flip-flop 226 has been clocked high will cause the output of the NOR gate 316 to become low and terminate the raw sector pulse by clocking the QN output of flip-flop 312 high.
The pulse stretcher flip-flop 310 has an active low set terminal that is connected to the output of AND gate 94 (
At the time the first phase one clock pulse 368 rises, the high state of the output of the first comparator 108 and the low state of the Q output of the flip-flop 170 causes the output of the NOR gate 173 to be high. Accordingly, in the Q output of the flip-flop 170 will be clocked high and the QN output thereof; that is, the accumulator clock, will be clocked low as at 370. Thus, the time for a sector is clocked into the accumulator 112, as at 372 via the connection of the clock input of the accumulator 112 to the accumulator clock 118 and the connection of the accumulator data input to the accumulation time selector 130. (In the nondelayed mode of operation, the Q output of the flip-flop 200 in
With the return of the accumulator clock output to a high level, such level being transmitted to the clock input of the second counter 150 on conducting path 151, a count of one, to count the first sector on the disk, will be entered into the second counter 150 as at 382. Since this count is being compared with the number of sectors in the number of sectors latch 144, the output of the second comparator 148 will remain low.
Returning to the master reset pulse 340 and referring to
At the time that the phase one clock pulse 368 rises, the output of the sector location pulse gate 300 will be low so that the Q output terminal of the pulse stretcher flip-flop 310 will be clocked low, as at 386, to prevent AND gate 322 from being enabled at the rise of the phase one 380. Thus, if no zone clock pulses have been received by the index-sector pulse generator circuit 91 prior to the rise of the pulse 380, so that the QN output of the flip-flop 226 in
Finally, at the rise of the clock pulse 368, the output of the first comparator 108 will be high and such output is transmitted to the D input of the index delay flip-flop 308 to cause clocking of the QN output thereof low as at 390. The result is that the sector location pulse gate 300 output becomes high, as at 392, and remains high for the duration of the first phase one clock pulse 368. At the time the second phase one clock pulse 380 rises, the output of the first comparator will already be low so that the QN output of the index delay flip flop will again be clocked high, as at 394, but such clocking will not effect the output state of the sector location pulse gate 300. In particular, since the output of the first comparator 108 will remain low while the first counter 102 counts up to the first sector time that has been entered in the accumulator 112, the output of the sector location pulse gate 300 will remain high to prevent further raw sector pulses from being generated by the raw sector flip-flop 312 until the next sector location time.
Thus, the state of the circuit 22 just prior to the phase one clock pulse, indicated at 396, that clocks the counter 102 to a number equal to the sector time that has been entered into the accumulator 112 differs from the state of the circuit 22 just prior to the rise of the clock pulse 368 in only the following ways:
Such operation continues until the contents of the second counter reaches the number of sectors indicated at 412 in
Referring first to
Further, the Q output of the flip-flop 200 will be high so that setting of the flip-flop 214 by reception of the master reset signal at the active low set terminal thereof will cause the output of NAND gate 218 to go low. Such output is provided to the enable terminal of the second counter 150 on conducting path 154 to disable counting thereby and the inverter 134, on conducting path 136, that is connected to the select terminal of the accumulation time selector 130 and causes such selector to transmit the output of the delay time latch 124, rather than the sector time latch 122, to the inputs of the accumulator 112.
Returning now to
However, the operation of the accumulator clock 118 is not affected by the state of the sector location pulse gate 300 so that a time will be accumulated in the accumulator 112 as in the nondelayed mode of operation. Such time will be the delay time because of the signal transmitted to the accumulation time selector 130 from the inverter 134. Thus, the delay time for the track being followed will be entered in the accumulator 112, at 418 in place of the entry of the sector time indicated at 372 in FIG. 12. Concurrently a single count will be entered in the first counter 102 so that the output of the first comparator will go low at 419 as in the nondelayed mode of operation of the circuit 22. It will be noted that the entry of the delay time into the accumulator 112 will not be counted by the second counter 150 because of the disablement of such counter noted above.
Thus, the overall response of the circuit 22 to the first clock pulse 368 following the master reset is the entry of the delay time into the accumulator 112 but no counting of such time as a sector time and no emission of an index or sector pulse to the read/write controller 76.
With a low output for the first comparator, the rise of the second phase one clock pulse 380 will clock the QN output of the index delay flip flop 308 high in exactly the same manner that such clocking occurs in the nondelayed mode of operation of the circuit 22. The result is that the disablement of the sector location pulse gate 300 caused by the reset of the index delay flip-flop 308 is removed so that the gate 300 will now operate in the same manner as in the nondelayed mode of operation. Accordingly, subsequent transitions of the first comparator output to a high state will give rise to raw sector pulses and, consequently, index and sector pulses as described above for the nondelayed mode of operation.
During the partial reset, the delay and sector times for the new track to be followed are entered into the latches 122 and 124 and the number of sectors for the new track is set into the latch 144 as described above. Thus, before the move to the new track is initiated, the latches in circuit 22 are in a state to accumulate new delay and sector times and count sectors for the new track.
With the partial reset, indicated at 422 in
Initially, and referring once again to
With the drop of the QN output of the flip-flop 170, the Q output thereof goes high so that the output of the NOR gate 173 will go low. The result is that the rise of the next clock pulse 436 will clock the QN output of the flip-flop 170 back high to result, under the assumption made above, in the counting of the accumulator clock pulse by the second counter 150 as at 434.
If the entry of the sector time for the new track into the accumulator 112 does not bring the contents thereof to the level of the count in the first counter 102, the output of the first comparator 108 will remain high and a second sector time accumulation and sector count, for the new track, will occur with the rise of the next clock pulse 438. The process will then be repeated until the accumulator 112 contents surpass the contents of the first counter 102. Thus, the combined operation of the first counter 102, the accumulator 112, the first comparator 108, the second counter 150 and the accumulator clock 118 is to count the number of sectors and next sector times that would have been counted subsequent to a master reset had the transducer head 36 been following the new track to which it has been moved. Thus, when the contents of the accumulator 112 finally surpass the contents of the first counter 102, indicated at 454 the counters 102 and 150 and the accumulator 112 will contain the same numbers, for the relative locations of the transducer head 36 and index 62, that such devices would have contained following a master reset had the head been following the new track. Thus, the operation of the circuit 22, in so far as the counting of sectors and sector times is concerned will subsequently be the same as the operation that has been described above for following a track after a master reset.
During the time that the next sector time is being loaded into the accumulator 112 and the sector number from index currently under the transducer head 36 is being loaded into the second counter, the generation of index and sector pulses used by the read/write controller 76 in the transfer of data to and from the disk 26 is suppressed as will now be discussed.
It will be clear that the present invention is well adapted to carry out the objects and attain the ends and advantages mentioned as well as those inherent therein. While a presently preferred embodiment has been described for purposes for this disclosure, numerous changes may be made which will readily suggest themselves to those skilled in the art and which are encompassed in the spirit of the invention disclosed and as defined in the appended claims.
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|U.S. Classification||360/72.1, 360/78.04|
|International Classification||G11B15/18, G11B5/596, G11B27/10, G11B20/12, G11B19/02|
|Cooperative Classification||G11B27/10, G11B19/02, G11B2020/1282, G11B20/1258, G11B2220/2508|
|European Classification||G11B20/12D23, G11B19/02, G11B27/10|
|Jan 9, 2002||AS||Assignment|
Owner name: RESEARCH INVESTMENT NETWORK, INC., CALIFORNIA
Free format text: CHANGE OF NAME;ASSIGNOR:RICOS INTERNATIONAL, INC.;REEL/FRAME:012495/0702
Effective date: 20011001
|Mar 22, 2002||AS||Assignment|
Owner name: RESEARCH INVESTMENT NETWORK, INC., CALIFORNIA
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:DISCOVISION ASSOCIATES;REEL/FRAME:012796/0888
Effective date: 20020312