|Publication number||USRE42955 E1|
|Application number||US 12/268,515|
|Publication date||Nov 22, 2011|
|Filing date||Oct 1, 2004|
|Priority date||Dec 4, 2003|
|Also published as||EP1690290A1, EP1690290A4, US7413958, US8247843, US20060148156, US20080265259, WO2005062365A1|
|Publication number||12268515, 268515, PCT/2004/32276, PCT/US/2004/032276, PCT/US/2004/32276, PCT/US/4/032276, PCT/US/4/32276, PCT/US2004/032276, PCT/US2004/32276, PCT/US2004032276, PCT/US200432276, PCT/US4/032276, PCT/US4/32276, PCT/US4032276, PCT/US432276, US RE42955 E1, US RE42955E1, US-E1-RE42955, USRE42955 E1, USRE42955E1|
|Inventors||Liberty L. Gunter, Kanin Chu, Charles R. Eddy, Jr., Theodore D. Moustakas, Enrico Bellotti|
|Original Assignee||Bae Systems Information And Electronic Systems Integration Inc.|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (22), Non-Patent Citations (8), Referenced by (4), Classifications (26), Legal Events (3)|
|External Links: USPTO, USPTO Assignment, Espacenet|
This application is a U.S. National Phase Application of PCT Application No. PCT/US2004/032276, filed Oct. 1, 2004, which claims the benefit of U.S. Provisional Application No. 60/527,238, filed Dec. 4, 2003, both of which is are herein incorporated in its their entirety by reference.
The invention relates to transistors, and more particularly, to permeable base transistors.
There is increasing need for new devices that can operate at frequencies greater than 1 GHz. The wide bandgap semiconductor gallium nitride (GaN) has received much interest in the last decade as a material for high efficiency, high power microwave devices due to its high breakdown field and electron saturation velocity, and low thermal generation rate. Unfortunately, there is no native substrate on which to grow GaN device epilayers, hence the films are grown heteroepitaxially on sapphire or silicon carbide substrates.
Such growth results in films with considerable vertical threading dislocation densities that limit electron mobility in lateral devices such as metal semiconductor field effect transistors (MESFETs) or high electron mobility transistors (HEMTs). Yet the vertical mobility is enhanced. This physical attribute together with the material properties previously mentioned makes GaN a highly suitable material for a permeable base transistor (PBT).
The PBT is device very similar to the MESFET but with vertical transport instead of lateral, and has received much attention in the last quarter of a century due to its potential as a high power, high frequency, and high temperature-operating device. PBTs were suggested as early as 1964, and are typically fabricated using silicon, cobalt disilicide, gallium arsenide, silicon carbide, nickel phthalocyanine, and copper phthalocyanine.
Due to the early stage of development in the GaN growth and understanding of the material properties, PBTs fabricated with GaN have only recently been attempted. Reported modeling simulations of a GaN based PBT with a cut-off frequency (fT) as high as 24.8 GHz and maximum frequency of oscillation (fmax) of 75.2 GHz. Such performance is relatively limited.
What is needed, therefore, techniques for making high power GaN PBTs using GaN.
One embodiment of the present invention provides an etched grooved GaN-based permeable-base transistor device. The device includes a GaN emitter region (e.g., having a thickness of about 6 to 10 μm) that is grown (e.g., on (0001) sapphire) using hydride vapor-phase epitaxy (HVPE). This emitter region may further include He implantation under base and collector contact pads to provide pad isolation (e.g., implant angle of about 7°). The device further includes a GaN base region (e.g., having a thickness of about 1 to 2 μm) that is grown on the GaN emitter region using molecular beam epitaxy (MBE). The device further includes a GaN collector region (e.g., having a thickness of about 0.1 to 0.3 μm) that has a plurality of collector fingers The collector region is grown on the GaN base region using MBE. In one such particular embodiment, the collector fingers have finger sidewall angles of about 80° to 85° for 1:1 and 1:3 finger spacing. In another particular such embodiment, the collector region has a collector pad region and a plurality of collector fingers, wherein the collector fingers have a first height in the collector pad region and a second height out of the collector pad region, with the first and second heights configured so as to prevent disconnect between the collector fingers and the collector pad region. For instance, the difference in the first and second heights could be the thickness of one layer of collector pad metal.
Another embodiment of the present invention provides a method for fabricating an etched grooved GaN-based permeable-base transistor device. One such embodiment of the method includes seven mask levels, including: Level 1—He implant mask; Level 2—nitride isolation pad; Level 3—collector ohmic pad mask; Level 4—e-beam lithography of collector fingers for liftoff; Level 5—base recess and metallization; Level 6—emitter and device isolation etch, emitter ohmic; and Level 7—microwave test pad metal deposition. Note that not all seven masks need to be used in practicing other embodiments of the present invention.
The features and advantages described herein are not all-inclusive and, in particular, many additional features and advantages will be apparent to one of ordinary skill in the art in view of the drawings, specification, and claims. Moreover, it should be noted that the language used in the specification has been principally selected for readability and instructional purposes, and not to limit the scope of the inventive subject matter.
Note that the various features shown in the Figures are not drawn to any particular scale. Rather, the Figures are drawn to emphasize features and structure for purposes of explanation. The actual geometries and scale of the pertinent features and structure will be apparent in light of this disclosure.
Embodiments of the present invention provide a design and method of fabrication of an etched grooved GaN-based permeable-base transistor structure. Process flow details regarding passivation, active region dry etching, and a mask set designed for PBT fabrication are disclosed. The mask set is configured to provide discrete PBT devices with a range of geometries for different frequency and power level operation, and high quality metal contacts to the various GaN layers.
One particular embodiment is fabricated using n-type GaN grown by hydride vapor phase epitaxy (HVPE) and molecular beam epitaxy on thick HVPE GaN quasi-substrates. The fabrication process employs isolation pads via helium (He) implantation and silicon nitride (SiN) deposition, as well as sub-micron chlorine-based high density inductively coupled plasma (ICP) etching of collector fingers patterned via e-beam lithography. Base Schottky contacts are deposited on the etched GaN layer prior to ohmic metal deposition so Schottky contacts on dry etched surfaces as well as low temperature annealed (0–500° C.) Schottky and ohmic contacts are characterized for their performance.
The resulting high power GaN PBT device has a cutoff frequency fT of about 134 GHz and a maximum frequency fmax of about 500 GHz. The device has a breakdown voltage of about 50V and a gm of 70 mS/mm. Analysis of the device topology shows smooth etched finger structures and base layer surface with finger sidewall angles of about 80° to 85° for 1:1 and 1:3 finger spacing. Specific contact resistivities of about 3×10−6Ω·cm2 for the ohmic contacts were achieved with Ti/Al/Ni/Au metallization scheme. DC testing of these example devices show a current density JS as high as 518 mA/mm2, and a collector current IC of about 140 mA/mm, both at VCE of 5V and VBE of +0.5V. The transconductance achieved is about 111 mS/mm in the measured collector-emitter bias range. These actual results are comparable, within the measurement tolerance, to physics-based modeling results.
Other configurations will be apparent in light of this disclosure. In any such cases, a GaN PBT is provided that combines the high breakdown field of GaN and the good frequency response of a PBT. Applications for use include, for example, millimeter-wave power applications.
Generally, there are two types of PBTs: etched groove and embedded or overgrown. In the case of etched groove, many submicrometer bases lay in etched grooves between ridge-like emitter contacts. In the case of embedded or overgrown, the base is completely buried inside the semiconductor lattice by epitaxial regrowth of the semiconductor. Embodiments of the present invention are directed to the etched groove type PBT.
The operation of the PBT is very similar to that of the MESFET except that the PBT is a vertical device and the MESFET is a lateral carrier device. In the PBT, the current flows perpendicular to the material surface. With this type of device, the thickness of the grown material layers can be altered to vary the device characteristics. In addition, the PBT is unipolar with a relatively short base length compared to the base length of a MESFET.
As shown in
The device was fabricated starting from a GaN quasi-substrates (e.g., 6 to 10 μm) grown on (0001) sapphire using a hydride vapor-phase epitaxy (HVPE) reactor. Note that this GaN quasi-substrate layer also serves as the emitter region for the PBT. In one embodiment, this layer is auto-doped n-type with a silicon (Si) carrier concentration of about 5×1018 cm−3. Atomic force microscopy (AFM) studies on the GaN quasi-substrates show a step-flow growth mode with atomically smooth terraces or “fingers” of 0.2 μm width and step-height of 2 monolayers. RMS roughness of 0.45 nm was obtained over a 10×10 μm area.
The base and collector epilayers of this embodiment are 1.3 μm and 0.2 μm thick, respectively. The layers can be grown by plasma-enhanced molecular beam epitaxy (MBE) carried out, for example, in a Varian Genii GenII system. Other such systems can be used here as well. Seamless epitaxy of GaN via MBE on GaN quasi-substrates can be achieved by growing the epilayers in group III-rich conditions. These base and emitter layers replicate the underlying GaN quasi-substrate layer without renucleation. The base and collector layers are doped with silicon (Si) to carrier concentrations of 5×1016 and 5×1018, respectively.
When the PBT is in ON condition, the majority carriers flow from emitter (held at ground potential) to collector (biased at positive potential). Under normal operation, the Schottky barrier is reverse-biased by a negative base-to-emitter voltage. A voltage dependent depletion region forms beneath the Schottky barrier. This constricts the effective area of the n-channel (reducing the depletion region on either side of the emitter finger), causing the channel to open and the collector current to vary with applied base bias.
In a PBT, the base bias induces a potential barrier under the collector. Near pinch-off, electrons that are injected from the emitter are accelerated by the collector bias, and pass across the potential barrier. At higher collector biases, the thermionic emission current rises exponentially with applied collector bias eventually becoming space charge limited, resulting in a triode mode device operation, where the collector current does not saturate at high collector voltages.
When a negative bias is applied to the collector, the depletion region expands and current flow through the channel is restricted. This will ultimately result in pinch off of the channel, and turn off of the PBT. Pinch off can be approximated using the equation:
where q is the charge of an electron, a is the channel thickness (or, in the case of a PBT, half the width of 1 finger), ∈(r) is the relative permittivity of the material, and ∈(0) is the permittivity of vacuum.
The GaN PBT, because it is based on vertical transport, has three distinctly doped layers versus the two of lateral transistor devices for the metal contacts and the device itself to perform optimally. The material structure to be employed in the GaN PBT, in accordance with one embodiment of the present invention, is shown in
Due to the lattice mismatch of GaN grown on sapphire or SiC, the bottom n+ layer is deposited thick (e.g., n+5×1018 cm−3, HVPE) to keep the vertical threading dislocations minimal The layer structure is chosen because the heavily doped regions will be used for ohmic contacts and the lightly doped region will be used for a Schottky contact to adequately pinch off for a given range of high frequency operation. The desired blocking voltage of the transistor determines the thick n-region. The final structure will look similar to that shown in
Note that a full PBT will have a plurality of the collector fingers, and is this particular case. Only three are shown in
When referring to example embodiments of the PBT process described herein, the following views shall be discussed and are illustrated in
This is a seven-mask process flow that is the baseline for all of the subsequent versions. Various modifications and details not included in this version will be apparent in light of this disclosure.
This particular embodiment begins with the HVPE growth of 10 μm of heavily doped (e.g., 2×1018 cm−3 to 5×1018 cm−3) n-GaN followed by 2 μm of MBE grown, lightly doped (e.g., 2×1016 cm−3 to 5×1016 cm−3) n-GaN and 0.3 μm of MBE grown, highly doped (e.g., 2×1018 cm−3 to 5×1018 cm−3) n-GaN. The silicon nitride deposition (to be discussed in turn) is to passivate the sidewalls of the collector fingers to prevent shorting of the base to the collector if metal accidentally deposits on the sidewalls.
The mask levels for this example process are shown here in Table 1:
He implant mask
Nitride isolation pad
Collector ohmic pad mask
E-beam lithography of collector fingers for liftoff
Base recess and metallization
Emitter and device isolation etch, emitter ohmic
Microwave test pad metal deposition
The process flow will now be discussed in steps, and with reference to the
Step 1: Perform RCA wafer clean. The purpose of the RCA wafer clean is to remove organic contaminants (e.g., dust particles, grease or silica gel) from the wafer surface, as well as any oxide layer that may have built up, and any ionic or heavy metal contaminants.
Step 2: Open windows for helium (He) implantation using optical lithography. Due to the fact that the PBT is a “normally-on” device, the semiconductor material is conducting by default. Thus, an insulating layer is used to isolate the pads from the device. In this particular embodiment, the insulating layer is provided with He implantation.
Step 3: Perform He2+ implantation at about 250 keV, 1.35 μm isolation depth (determined from a TRIM calculation).
Step 4: Strip the photo resist mask. The resulting structure after stripping is shown in
Step 5: Open windows for thin, high quality silicon nitride pad (SiNx), about 1000–2000 Å thick, using optical lithography.
Step 5a: Perform deposition of high quality SiNx pad, 1000–2000 Å thick. This SiNx layer serves as the second electrical isolation for the collector and base contact pads.
Step 5b: Perform lift-off of high quality silicon nitride pad, 1000–2000 Å thick.
Step 6: Open windows for Ti metal pad using optical lithography.
Step 6a: Perform Ti metallization.
Step 6b: Perform lift-off of Ti metallization.
Step 7: Perform E-beam lithography of collector fingers and for self-aligned base recess and metallization.
Step 7a: Perform ohmic metallization of collector. Prior to metallization, a 1 minute HCl:DI H20 (1:1) dip is used for removing contaminants on the semiconductor surface. Although not mentioned in other steps, this can beneficially be used for all metal depositions on semiconductor material.
Step 7b: Perform lift-off of ohmic metallization of collector.
Step 8: Open windows for a Ti cap in collector pad region using optical lithography.
Step 8a: Deposit thin Ti cap in collector pad region again to prevent collector metal fingers from peeling upward and losing contact to the pad.
Step 8b: Perform lift-off of the thin Ti cap in collector region.
Step 9: Open windows for the base recess/metallization (collector lines are part of mask) using optical lithography.
Step 9a: Perform a high density plasma etch to recess the base layer to n− layer (e.g., about 0.5 μm).
Step 9b: Perform conformal SiNx deposition for spacer and sidewall passivation. This layer prevents shorting between the base and collector if metal accidentally deposits on the finger sidewalls.
Step 9c: Perform directional etch to remove SiNx on parallel surfaces.
Step 9d: Perform base metallization (Pt/Ni).
Step 9e: Perform lift-off of base metallization (Pt/Ni).
Note that a post Schottky deposition anneal is used to alloy the ohmic contacts. This is because the Schottky metal is deposited before the emitter ohmic metal. A low temperature anneal does not substantially alter the forward bias behavior of the Schottky contacts, but decreases the reverse leakage current. Further note that the Schottky contacts are the contacts in the base region). In one particular embodiment, an anneal for about 60 seconds at 500° C. is used to maintain low reverse current leakage while providing low contact resistance.
Step 10: Open emitter etch/contact window using optical lithography.
Step 10a: Etch emitter recess to bottom, HVPE n+ GaN quasi-substrate layer (e.g., about 2.5 μm).
Step 10b: Perform emitter ohmic metallization.
Step 10c: Perform lift-off of emitter ohmic metallization. FIG. 3aa shows the resulting structure after the emitter ohmic metallization of this step.
Step 11: Open windows for RF test pad metallization using optical lithography. FIG. 3bb shows the resulting structure after the optical lithography of this step.
Step 11a: Deposit RF test pad metal. FIG. 3cc shows the resulting structure after the deposition of test pad metal of this step. In one particular embodiment, this metal includes an adhesion layer (e.g., titanium or nickel) and a thick gold (Au) capping layer, since Au is a good microwave conductor and prevents oxidation.
Step 11b: Perform lift-off RF test pad metal. FIG. 3dd shows the resulting and final structure after the RF test pads liftoff of this step.
Variations on Fabrication Methodology
A first variation on the PBT fabrication methodology deals with the deposition of the SiNx in step 5. In more detail, a conformal deposition of SiNx over the entire wafer followed by photo resist patterning and wet chemistry etch to remove the SiNx from the unwanted areas may be more desirable, since SiNx is sometimes difficult to remove via liftoff. In this case, the SiNx is about 1000 Å thick, and the wet chemical etch will provide a shallow slope on the sidewalls which will ensure metal continuity from the collector fingers to the contact pad. In addition, the metal pad on top of the collector region can be altered to Ni/Pt because of the new Schottky metal on the collector fingers.
The electron beam lithography can also be changed, to provide a second variation. In particular, instead of opening up windows for the fingers and depositing metal as previously described in steps 7 through 7b, a large window can be opened. For example,
Following base recess, all steps would be similar to those previously discussed until step 9d, where the Schottky metal deposited would be the metal for both the base region and collector fingers. The Schottky metal would be feasible as the collector metal because of ballistic electrons that could pass the potential barrier. In addition, the Ti capping layer on the collector contact in steps 8 through 8b can be omitted, in this particular variation.
In a third variation of the fabrication process, a “0” level Ti/Pt layer can be used. In more detail, note that the first layer (step 3) is a He implantation, which requires alignment for further steps in the process. In particular, implanted He areas are not distinguishable under optical alignment For this reason, a “0” level mask for subsequent optical and electron beam alignment was added. The metal to be used for enabling optical alignment is titanium (Ti) followed by platinum (Pt). In one such embodiment, this “0” level mask is a Ti/Pt layer of about 200–500/1500 Å, respectively. These metals are chosen because of Ti's good adhesion to GaN and Pt is a good alignment metal for e-beam writers (because it is high Z). Crosses for optical alignment and squares for e-beam alignment are thus provided.
The thick Pt was found to work best for this e-beam writing system. Also, it was found that the He2+ implantation given in step 3 would penetrate the photo resist about 3.50 μm based on a TRIM calculation of Rp+ΔRp (the ion range and range straggling). This shows that a thick resist, such as AZ4620, is needed. In addition, the SiNx etch can be done via a wet chemistry of NH4F, which will leave a shallow slope on the nitride walls due to the slow etching and isotropy characteristic of wet chemistry etches. The e-beam photo resist, PMMA, is not intended to be a dry etch mask and for this reason, cannot be used as previously given in step 7. For this reason, only the collector fingers shall be opened.
In one such particular embodiment for high power operation, 20 fingers could be used. These fingers shall be 40–200 μm long and varying width (0.15–0.3 μm). The metal on top of these fingers can be, for example, Schottky, Ni/Pt/Ni (200/500/500 Å), where the final Ni layer is used as an etch mask since it was found to withstand a chlorine etch well. This is followed by the base etch similar to step 9. The settings of this etch shall be ICP, ˜0.43 μm in depth using pure Cl2 chemistry, 400 W ICP power, and 200 eV ion energies. The low bias voltage is used to provide a slow and accurate etch depth. The structure resulting from the base etch following collector metal deposition (with photo resist) is shown in
A base metal deposition as given in step 9b isolates the base metal from the GaN material on the sides of the collector fingers so an additional etching after the SiNx deposition is needed to expose the sidewalls of the collector fingers, and to allow better base metal contact and, therefore, better base voltage control of the collector current resulting in higher transconductance in the device. This deposited SiNx is, for instance, less than 500 Å via PECVD. This thickness is decreased since the minimum base region width is 1500 Å and 1000 Å of SiNx on both sides would completely close the base region. This additional etch is a two-stage etch.
First, a CH4—O2 mix is used via RIE to directionally remove the SiNx since Cl2 has a much faster etch rate on GaN than on SiNx. Following SiNx removal, an ICP base etch for collector finger contact will be used to etch the GaN 0.07 μm as shown in
A fourth variation of the fabrication process includes the initial deposition of Ti/Al/Pt alignment markers. The addition of Al is to create an ohmic contact at the first layer for ohmic circular transmission line measurement (CTLM) and Schottky diode test structures that will be employed since the e-beam writer cannot write large areas during definition of the collector regions (otherwise, the first ohmic deposition). The addition of Al will not affect the e-beam alignment with the thick Pt (e.g., 1500 Å) deposited. He implantation under both base and collector contact pads is used due to the high conductivity of the material. This is shown in
The first SiNx deposition is similar to previous versions with the exception that it is now included under the base contact pad (as well as the collector pad) as shown in
Collector fingers were also changed from Schottky to ohmic since collector and base metals were no longer to be deposited simultaneously. The new metal scheme is Ti/Ni (100/400 Å). Process tests support the use of a thicker Ni layer and removal of the Al layer and are the reason for this increase in thickness. This thin metal is the maximum thickness allowed with the thin (e.g., 1500 Å) e-beam resist needed for fine features (e.g., 0.15 μm). Following this metal liftoff, SiNx is deposited (as previously described with the two stage etch).
After the base metallization, the emitter is etched. This requires a thick resist of, for instance, AZ4620 of about 4 μm. Dimensions of the emitter etch are given in
A fifth variation of the fabrication process includes a modification to the silicon nitride pad deposited in steps 5, 5a, and 5b. In this alternative embodiment, the SiNx pad is square such that, the He implanted region will extend out to the collector fingers, and no SiN will be under the fingers. This will reduce the difference in height between the fingers in the collector pad region (e.g., view 3 of
Probing of the various CTLM test structures shows ohmic metal contacts which have specific contact resistivity, ρc, of about 3×10−6Ω·cm2, which is an indication of the excellent contact quality.
The DC characteristic curve of a device with 1:1 finger pitch is shown in
The foregoing description of the embodiments of the invention has been presented for the purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise form disclosed. Many modifications and variations are possible in light of this disclosure. It is intended that the scope of the invention be limited not by this detailed description, but rather by the claims appended hereto.
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|U.S. Classification||438/347, 257/E21.402, 257/E21.246, 438/172, 257/E21.22, 438/173, 438/342, 438/718|
|International Classification||H01L29/772, H01L27/06, H01L21/461, H01L21/331, H01L29/20, H01L21/302|
|Cooperative Classification||H01L29/2003, H01L29/0692, H01L29/66454, H01L27/0605, H01L29/7722, H01L29/32, H01L21/265|
|European Classification||H01L27/06C, H01L29/772B, H01L29/06D3, H01L29/66M6T6E2, H01L21/265|
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