WO1984000252A1 - Power bus routing for gate arrays - Google Patents

Power bus routing for gate arrays Download PDF

Info

Publication number
WO1984000252A1
WO1984000252A1 PCT/US1983/000890 US8300890W WO8400252A1 WO 1984000252 A1 WO1984000252 A1 WO 1984000252A1 US 8300890 W US8300890 W US 8300890W WO 8400252 A1 WO8400252 A1 WO 8400252A1
Authority
WO
WIPO (PCT)
Prior art keywords
columns
power
busses
gate array
power busses
Prior art date
Application number
PCT/US1983/000890
Other languages
French (fr)
Inventor
James J Remedi
Don G Reid
Lynette Ure
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=23558128&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=WO1984000252(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Motorola Inc filed Critical Motorola Inc
Priority to DE8383902340T priority Critical patent/DE3370563D1/en
Priority to JP58502447A priority patent/JPH0695553B2/en
Publication of WO1984000252A1 publication Critical patent/WO1984000252A1/en
Priority to SG67289A priority patent/SG67289G/en
Priority to HK97389A priority patent/HK97389A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/07Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
    • H01L25/071Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next and on each other, i.e. mixed assemblies
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/10Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
    • H01L25/11Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L29/00
    • H01L25/112Mixed assemblies
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Definitions

  • This invention relates generally to gate arrays, and, more particularly, to power bus routing for gate arrays.
  • Gate arrays are uniform patterns of hundreds or thousands of unconnected transistor-level gate cells. Due to the availability to a designer of means to connect the cells via interlevel contacts and interlevel routing performed at a late stage in processing, many custom circuits may be created from a basic gate array.
  • a basic design objective of gate arrays is to make the gate cells easily accessible to power and ground busses since the gate cells are typically placed on a level different from the power and ground busses.
  • power busses are not routed closely to the trans-istors, noise may exist on internal nodes and create logic errors in the gate array cells.
  • CMOS Uncommmitted Logic Arrays Are Part-Digital, Part-Analog" , by Yoder, Electronics, January 13, 1981.
  • CMOS Uncommmitted Logic Arrays Are Part-Digital, Part-Analog
  • Yoder Electronics, January 13, 1981.
  • large current spikes at the output may still generate noise errors in the internal digital circuitry.
  • Another object of the present invention is to increase current availability to transistor cells in a gate array without substantially modifying existing power bus routing.
  • a gate array having n parallel columns of a plurality of transistor cells, where n is an integer.
  • Each column in the preferred form, has first and second power busses which extend from end to end of the column and which provide power to the transistor cells.
  • the first and second power busses are coupled to first and second voltage potential lines.
  • a pair of output power busses are positioned parallel to an outer side of both a first and an nth column of the n columns.
  • Each pair of output power busses is substantially parallel to said n columns and coupled to the first and second voltage potential lines.
  • Separate power busses in the form of first and second input/internal logic power busses extend substantially around the perimeter of said n columns and betweeen the n columns and the output power busses. Additionally, at least one power strip extends
  • the single Figure illustrates in graphic form a gate array constructed in accordance with a preferred embodiment of the present invention.
  • a gate array 10 having n columns of transistor cells, such as column 12 having cells 14 and 16, where n is an integer. Although in a preferred form eighteen columns of transistor cells are shown, any number of columns and cells may be used to practise the invention. If gate array 10 is viewed from the left or right side of the drawing, the columns can be considered as rows. Extending the entire length of each of the n columns are first and second power busses, such as power bus 18 and power bus 20 in column 12. The first and second busses in the n columns are coupled to a first and a second voltage potential line, repectively, by coupling each power bus to either an input/internal logic power bus 22 or an input/internal logic power bus 24. It should be noted that not all gate arrays have a plurality of continuous columns of transistor cells, but rather may have columns of cells divided into two or more sections. For gate arrays having sectioned columns of transistor
  • OM ⁇ I cells power busses, such as power busses 18 and 20 may not extend the entire length of each column across the plural sections. However, this invention may be practised for gate arrays having any variety of structural organization of transistor cells.
  • input/internal logic power bus 22 is at a " ss potential and extends substantially around the perimeter of the n columns.
  • Input/internal logic power bus 24 is at a V-QD potential and also extends substantially around the perimeter of the n columns in a preferred form.
  • the V-QQ potential is a positive voltage potential and the Vgs potential is more negative than V-QQ although V ⁇ D is not necessarily a positive voltage potential.
  • input/internal logic power busses 22 and 24 encircle the n columns for noise reduction purposes, the input/internal logic power busses need only to be long enough to be physically connected to each pair of power busses of the n columns.
  • output power busses 30 and 32 are coupled to voltage potential VD * -).
  • Extending around the outside perimeter of gate array 10 is an output power bus 34 which is coupled to Vgs potential.
  • the output power busses are so designated because they primarily supply power to output circuits.
  • Output power busses 30 and 34 form a first pair of output busses which, in a preferred form, extend substantially parallel to and along the outside edge of first column 26.
  • output power busses 32 and 34 form a second pair of output busses which extend substantially parallel to and along the outside edge of nth column 28 in a preferred form.
  • output power busses 30 and 32 may be extended in part, or substantially around the perimeter of the n columns. Further, output power busses 30 and 32 may extend substantially parallel to output power bus 34 and be connected to function as a single power output power bus.
  • Power strips 36, 38 and 40 extend substantially perpendicular to the n columns and are coupled to busses 22 and 24 at each end at the outside edge of columns 26 and 28. Power strips 36, 38 and 40 each comprise first and second conductive busses, the first of which is connected to input/internal logic power bus 22 at the outside edge of columns 26 and 28.
  • the second conductive bus of power strips 36, 38 and 40 is connected to input/internal logic power bus 24 at the outside edge of columns 26 and 28.
  • the power busses in the n columns such as power busses 18 and 20, are routed on a first layer of metal which is covered by an insulating dielectric layer.
  • Power strips 36, 38 and 40 are routed on a second layer of metal so that power strips 36, 38 and 40 do not electrically short circuit the transistor cells of the n columns.
  • the conductive busses of strips 36, 38 and 40 which are connected to input/internal logic power bus 22 are also connected to the first power bus of each column, such as power bus 18 in column 12.
  • connection is made by cutting a hole, or a via, through the dielectric separating the n columns from power strips 36, 38 and 40.
  • the conductive busses of strips 36, 38 and 40 which are connected to internal logic power bus 24 are connected to the second power bus of each column, such as power bus 20 in column 12.
  • three power strips are utilized and the first and second conductive bus of power strip 38 is made twice as large as the conductive busses of power strips 36 and 40.
  • the invention may be practised with one or any plurality of power strips.
  • power strips 36, 38 and 40 need not necessarily extend across all the columns or gate array 10. Current availability may be increased by using some or all power strips across only a portion of
  • a gate array In operation, a gate array, regardless of what type of process is used to manufacture the array, will usually develop very large current spikes when the transistors in the transitor cells switch. An entire column of transistors may switch at the same time and generate current in the hundreds of illiamperes range. Such current spikes can change the internal logic circuitry and create erroneous data. Conventional power bus routing is not sufficient to keep voltage drops in the cells associated with the current spikes from becoming excessive. Furthermore, in gate arrays there are typically a large number of output cells on one or more sides of the gate array with each cell having a contact pad. With a large number of output cells existing, the possibility for large AC and DC loads to be applied thereto exists. Therefore to keep current spikes from entering the array matrix, power busses, such as busses 30, 32 and 34, which are separate from the power busses of the internal logic circuitry and input pads, such as busses 22 and 24, may be used for the output circuits.
  • the effective ohmic length of the power busses of the n columns is reduced by adding power strips 36, 38 and 40 and connecting them to the power busses of the n columns. If power strips 36, 38 and 40 are routed on a different layer of metal and separated from the power busses of the n columns by a dielectric layer, the logic routing of a conventional gate array has not been disrupted.

Abstract

A gate array (10) which has power bus routing for increasing current availability to a plurality of transistor cells (14, 16). The gate array (10) also has separate power busses for input/internal logic and output circuits. The gate array (10) comprises n columns of transistor cells with two power busses (18 and 20) extending substantially along each column to power the cells. Input/internal logic power busses (22 and 24) and separate output power busses (30 and 32) extend around the perimeter of the columns of transistor cells. At least one power strip (36) for increasing current availability to the transistor cells (14, 16) is routed across the transistor cells substantially perpendicular to the n columns and is connected to both the power busses of each column and to the input/internal logic power busses.

Description

POWER BUS ROUTING FOR GATE ARRAYS
Technical Field
This invention relates generally to gate arrays, and, more particularly, to power bus routing for gate arrays.
Background Art
Gate arrays are uniform patterns of hundreds or thousands of unconnected transistor-level gate cells. Due to the availability to a designer of means to connect the cells via interlevel contacts and interlevel routing performed at a late stage in processing, many custom circuits may be created from a basic gate array. A basic design objective of gate arrays is to make the gate cells easily accessible to power and ground busses since the gate cells are typically placed on a level different from the power and ground busses. However, when hundreds or thousands of transistors are connected in an array, very large current spikes may develop in certain locations of the array when the transistors switch at the same time. When power busses are not routed closely to the trans-istors, noise may exist on internal nodes and create logic errors in the gate array cells. When current spikes exist at the inputs of the gate array, these spikes may also create logic errors in the internal portion of the gate array. Some gate arrays utilize separate digital and analog power and ground distribution busses to minimize analog circuit noise from digital circuitry as noted on page 166 of "CMOS Uncommmitted Logic Arrays Are Part-Digital, Part-Analog" , by Yoder, Electronics, January 13, 1981. However, when such gate arrays have a large plurality of input/output cells per side of the array, large current spikes at the output may still generate noise errors in the internal digital circuitry.
Brief Summary of the Invention
It is an object of the present invention to provide a gate array having improved power bus routing.
Another object of the present invention is to increase current availability to transistor cells in a gate array without substantially modifying existing power bus routing.
Another object of the present invention is to provide an improved gate array which reduces noise present in internal circuitry and which reduces the presence of current spikes from transistor switching. Yet another object of the present invention is to provide an improved gate array which isolates noise at the input/output cells from the internal circuitry.
In carrying out the above and other objects and advantages of the present invention, there is provided, in one form, a gate array having n parallel columns of a plurality of transistor cells, where n is an integer. Each column, in the preferred form, has first and second power busses which extend from end to end of the column and which provide power to the transistor cells. The first and second power busses are coupled to first and second voltage potential lines. A pair of output power busses are positioned parallel to an outer side of both a first and an nth column of the n columns. Each pair of output power busses is substantially parallel to said n columns and coupled to the first and second voltage potential lines. Separate power busses in the form of first and second input/internal logic power busses extend substantially around the perimeter of said n columns and betweeen the n columns and the output power busses. Additionally, at least one power strip extends
O FI substantially perpendicular to said n columns to connect input/internal power busses with the first and second power busses of each column to provide increased current availability to the transistor cells. The above and other objects, features and advantages of the present invention will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawing.
Brief Description of the Drawing
The single Figure illustrates in graphic form a gate array constructed in accordance with a preferred embodiment of the present invention.
Description Of A Preferred Embodiment
Shown i.n the single drawing is a gate array 10 having n columns of transistor cells, such as column 12 having cells 14 and 16, where n is an integer. Although in a preferred form eighteen columns of transistor cells are shown, any number of columns and cells may be used to practise the invention. If gate array 10 is viewed from the left or right side of the drawing, the columns can be considered as rows. Extending the entire length of each of the n columns are first and second power busses, such as power bus 18 and power bus 20 in column 12. The first and second busses in the n columns are coupled to a first and a second voltage potential line, repectively, by coupling each power bus to either an input/internal logic power bus 22 or an input/internal logic power bus 24. It should be noted that not all gate arrays have a plurality of continuous columns of transistor cells, but rather may have columns of cells divided into two or more sections. For gate arrays having sectioned columns of transistor
OMΓI cells, power busses, such as power busses 18 and 20 may not extend the entire length of each column across the plural sections. However, this invention may be practised for gate arrays having any variety of structural organization of transistor cells. In a preferred form, input/internal logic power bus 22 is at a "ss potential and extends substantially around the perimeter of the n columns. Input/internal logic power bus 24 is at a V-QD potential and also extends substantially around the perimeter of the n columns in a preferred form. Conventionally, the V-QQ potential is a positive voltage potential and the Vgs potential is more negative than V-QQ although V^D is not necessarily a positive voltage potential. Although input/internal logic power busses 22 and 24 encircle the n columns for noise reduction purposes, the input/internal logic power busses need only to be long enough to be physically connected to each pair of power busses of the n columns. On the outer sides of a first column 26 and an nth column 28 are output power busses 30 and 32, respectively, which are coupled to voltage potential VD*-). Extending around the outside perimeter of gate array 10 is an output power bus 34 which is coupled to Vgs potential. The output power busses are so designated because they primarily supply power to output circuits. Output power busses 30 and 34 form a first pair of output busses which, in a preferred form, extend substantially parallel to and along the outside edge of first column 26. Similarly, output power busses 32 and 34 form a second pair of output busses which extend substantially parallel to and along the outside edge of nth column 28 in a preferred form. In yet another form of the invention, output power busses 30 and 32 may be extended in part, or substantially around the perimeter of the n columns. Further, output power busses 30 and 32 may extend substantially parallel to output power bus 34 and be connected to function as a single power output power bus. Power strips 36, 38 and 40 extend substantially perpendicular to the n columns and are coupled to busses 22 and 24 at each end at the outside edge of columns 26 and 28. Power strips 36, 38 and 40 each comprise first and second conductive busses, the first of which is connected to input/internal logic power bus 22 at the outside edge of columns 26 and 28. The second conductive bus of power strips 36, 38 and 40 is connected to input/internal logic power bus 24 at the outside edge of columns 26 and 28. In the preferred form, the power busses in the n columns, such as power busses 18 and 20, are routed on a first layer of metal which is covered by an insulating dielectric layer. Power strips 36, 38 and 40 are routed on a second layer of metal so that power strips 36, 38 and 40 do not electrically short circuit the transistor cells of the n columns. The conductive busses of strips 36, 38 and 40 which are connected to input/internal logic power bus 22 are also connected to the first power bus of each column, such as power bus 18 in column 12. This connection is made by cutting a hole, or a via, through the dielectric separating the n columns from power strips 36, 38 and 40. The conductive busses of strips 36, 38 and 40 which are connected to internal logic power bus 24 are connected to the second power bus of each column, such as power bus 20 in column 12. In the preferred form, three power strips are utilized and the first and second conductive bus of power strip 38 is made twice as large as the conductive busses of power strips 36 and 40. However, the invention may be practised with one or any plurality of power strips. It should also be noted that power strips 36, 38 and 40 need not necessarily extend across all the columns or gate array 10. Current availability may be increased by using some or all power strips across only a portion of
O TI the n columns.
In operation, a gate array, regardless of what type of process is used to manufacture the array, will usually develop very large current spikes when the transistors in the transitor cells switch. An entire column of transistors may switch at the same time and generate current in the hundreds of illiamperes range. Such current spikes can change the internal logic circuitry and create erroneous data. Conventional power bus routing is not sufficient to keep voltage drops in the cells associated with the current spikes from becoming excessive. Furthermore, in gate arrays there are typically a large number of output cells on one or more sides of the gate array with each cell having a contact pad. With a large number of output cells existing, the possibility for large AC and DC loads to be applied thereto exists. Therefore to keep current spikes from entering the array matrix, power busses, such as busses 30, 32 and 34, which are separate from the power busses of the internal logic circuitry and input pads, such as busses 22 and 24, may be used for the output circuits.
To substantially reduce the size of current spikes in each column, the effective ohmic length of the power busses of the n columns is reduced by adding power strips 36, 38 and 40 and connecting them to the power busses of the n columns. If power strips 36, 38 and 40 are routed on a different layer of metal and separated from the power busses of the n columns by a dielectric layer, the logic routing of a conventional gate array has not been disrupted. By now it should be appreciated that a gate array having power routing which separates current spikes in the output cells from internal digital logic and input pins and which minimizes current spikes in the digital logic has been provided. By having input/internal logic power busses which are separate from output power busses, noise external to gate array 10 is effectively isolated. Furthermore, when separate power busses are used in this manner, the busses may be coupled to different leads in an integrated circuit package and different voltage levels applied thereto.
While the invention has been described in the context of a preferred embodiment, it will be apparent to those skilled in the art that the present invention may be modified in numerous ways and may assume many embodiments other than that specifically set out and described above. Accordingly, it is intended by the appended claims to cover all modifications of the invention which fall within the true spirit and scope of the invention.

Claims

1. A gate array having power bus routing for providing increased current capability, comprising: n columns of a plurality of transistor cells, where n is an integer, each of said n columns of transistor cells having first and second power busses coupled to first and second voltage potential lines, respectively, and extending substantially along each of the n columns; a pair of output power busses extending substantially parallel to said n columns, the pair being coupled to said first and second voltage potential lines, respectively, and located along an outer side of both a first and an nth column of said n columns; first and second input/internal power busses coupled to said first and second voltage potential lines, respectively, and extending substantially around the perimeter of said n columns, and extending between said n columns and said output power busses; and at least one power strip extending substantially perpendicular to said n columns, coupling said pair of input/internal power busses and coupled to said first and second power busses of one or more columns, for providing increased current to said plurality of transistor cells.
2. The gate array of claim 1 wherein said pair of output power busses further extend substantially around the perimeter of said n columns.
OMP WIP
3. The gate array of claim 1 wherein said first and second power busses of each said n columns are routed on a first conductive layer and said power strips are routed on a second conductive layer and separated from said first conductive layer by a dielectric layer.
4. The gate array of claim 1 wherein said at least one power strip comprises three power strips extending substantially perpendicular to said n columns and spaced apart to divide said gate array into four sections of substantially equal area.
5. A gate array having n columns of a plurality of transistor cells, where n is an integer, each of said n columns of transistor cells having first and second power busses coupled to first and second voltage potential lines, respectively, and extending substantially along each of the columns, comprising: a power strip, extending substantially perpendicular to said n columns, and coupling said first and second power busses to said first and second voltage potential lines, respectively, for providing increased current capability to said plurality of transistor cells.
6. The gate array of claim 5 further comprising three power strips extending substantially perpendicular to said n columns from the first to the nth column and spaced a substantially equal distance apart, said second power strip "located between said first and third power strips, wherein the width of said second power strip is substantially larger than the width of said first and third power strips.
7. A gate array comprising: n columns of plurality of transistor cells, where n is an integer, each of said n columns of transistor cells having first and second power busses extending substantially along the columns and coupled to first and second voltage potential lines, respectively; a pair of output power busses positioned on each side of said n columns and extending substantially parallel to said n columns, the pair being coupled to said first and second voltage potential lines, respectively; and first and second input/internal power busses coupled to said first and second voltage potentials, respectively, and extending substantially around the perimeter of said n columns and extending between said n columns and said output power busses.
8. The gate array of claim 7 wherein said pair of output power busses which are positioned on each side of said n columns further extend substantially around the perimeter of said n columns.
9. A method of increasing the current availability to a plurality of transistor cells arranged in n columns, where n is an integer, each columr having first and second power busses extending substantially along each of said columns, comprising the step of; routing a plurality of power strips substantially perpendicular to said n columns and electrically coupled to the first and second power busses of said n columns.
PCT/US1983/000890 1982-07-01 1983-06-06 Power bus routing for gate arrays WO1984000252A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE8383902340T DE3370563D1 (en) 1982-07-01 1983-06-06 Power bus routing for gate arrays
JP58502447A JPH0695553B2 (en) 1982-07-01 1983-06-06 Gate array
SG67289A SG67289G (en) 1982-07-01 1989-09-30 Power bus routing for gate arrays
HK97389A HK97389A (en) 1982-07-01 1989-12-07 Power bus routing for gate arrays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/394,239 US4511914A (en) 1982-07-01 1982-07-01 Power bus routing for providing noise isolation in gate arrays

Publications (1)

Publication Number Publication Date
WO1984000252A1 true WO1984000252A1 (en) 1984-01-19

Family

ID=23558128

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1983/000890 WO1984000252A1 (en) 1982-07-01 1983-06-06 Power bus routing for gate arrays

Country Status (6)

Country Link
US (1) US4511914A (en)
EP (1) EP0112894B1 (en)
JP (1) JPH0695553B2 (en)
DE (1) DE3370563D1 (en)
SG (1) SG67289G (en)
WO (1) WO1984000252A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0138650A1 (en) * 1983-09-09 1985-04-24 Fairchild Semiconductor Corporation Integrated circuit chip wiring arrangement providing reduced circuit inductance and controlled voltage gradients

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5984542A (en) * 1982-11-08 1984-05-16 Nec Corp High-frequency semiconductor integrated circuit
JPS59167049A (en) * 1983-03-14 1984-09-20 Nec Corp Semiconductor logic device
JPS6110269A (en) * 1984-06-26 1986-01-17 Nec Corp Semiconductor ic
JPS6344742A (en) * 1986-08-12 1988-02-25 Fujitsu Ltd Semiconductor device
JP2936542B2 (en) * 1990-01-30 1999-08-23 株式会社日立製作所 Power trunk layout
US5063429A (en) * 1990-09-17 1991-11-05 Ncr Corporation High density input/output cell arrangement for integrated circuits
JP2742735B2 (en) * 1991-07-30 1998-04-22 三菱電機株式会社 Semiconductor integrated circuit device and layout design method thereof
JP3052519B2 (en) * 1992-01-14 2000-06-12 日本電気株式会社 Power supply wiring design method for integrated circuits
JP2822781B2 (en) * 1992-06-11 1998-11-11 三菱電機株式会社 Master slice type semiconductor integrated circuit device
US5648661A (en) * 1992-07-02 1997-07-15 Lsi Logic Corporation Integrated circuit wafer comprising unsingulated dies, and decoder arrangement for individually testing the dies
US5442282A (en) * 1992-07-02 1995-08-15 Lsi Logic Corporation Testing and exercising individual, unsingulated dies on a wafer
US5389556A (en) * 1992-07-02 1995-02-14 Lsi Logic Corporation Individually powering-up unsingulated dies on a wafer
US5532174A (en) * 1994-04-22 1996-07-02 Lsi Logic Corporation Wafer level integrated circuit testing with a sacrificial metal layer
US5757208A (en) * 1996-05-01 1998-05-26 Motorola, Inc. Programmable array and method for routing power busses therein
US6437441B1 (en) 1997-07-10 2002-08-20 Kawasaki Microelectronics, Inc. Wiring structure of a semiconductor integrated circuit and a method of forming the wiring structure
US6617620B1 (en) 1999-09-29 2003-09-09 Oki Electric Industry Co., Ltd. Gate array with border element
US6598216B2 (en) 2001-08-08 2003-07-22 International Business Machines Corporation Method for enhancing a power bus in I/O regions of an ASIC device
US7750500B2 (en) * 2004-06-28 2010-07-06 Broadcom Corporation Integrated circuit with multiple independent power supply zones
EP2603931B1 (en) * 2010-08-10 2016-03-23 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Silicon photoelectric multiplier with multiple "isochronic" read-out
US8987788B2 (en) 2011-09-26 2015-03-24 Semiconductor Components Industries, Llc Metal-strapped CCD image sensors

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3808475A (en) * 1972-07-10 1974-04-30 Amdahl Corp Lsi chip construction and method
US3999214A (en) * 1974-06-26 1976-12-21 Ibm Corporation Wireable planar integrated circuit chip structure
US4161662A (en) * 1976-01-22 1979-07-17 Motorola, Inc. Standardized digital logic chip
JPS5582448A (en) * 1978-12-15 1980-06-21 Nec Corp Master slice semiconductor integrated circuit
US4212026A (en) * 1977-06-24 1980-07-08 International Business Machines Corporation Merged array PLA device, circuit, fabrication method and testing technique
US4218693A (en) * 1977-01-17 1980-08-19 U.S. Philips Corporation Integrated logic circuit having interconnections of various lengths between field effect transistors of enhancement and depletion modes
US4249193A (en) * 1978-05-25 1981-02-03 International Business Machines Corporation LSI Semiconductor device and fabrication thereof
JPS57100747A (en) * 1980-12-16 1982-06-23 Nec Corp Semiconductor device
US4393464A (en) * 1980-12-12 1983-07-12 Ncr Corporation Chip topography for integrated circuit communication controller

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1440512A (en) * 1973-04-30 1976-06-23 Rca Corp Universal array using complementary transistors
JPS5371584A (en) * 1976-12-08 1978-06-26 Hitachi Ltd Semiconductor integrated circuit device
JPS53140983A (en) * 1977-05-16 1978-12-08 Hitachi Ltd Semiconductor integrated circuit
JPS5420680A (en) * 1977-07-18 1979-02-16 Hitachi Ltd Large scale integrated circuit
JPS5925381B2 (en) * 1977-12-30 1984-06-16 富士通株式会社 Semiconductor integrated circuit device
JPS57121250A (en) * 1981-01-20 1982-07-28 Toshiba Corp Semiconductor integrated circuit

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3808475A (en) * 1972-07-10 1974-04-30 Amdahl Corp Lsi chip construction and method
US3999214A (en) * 1974-06-26 1976-12-21 Ibm Corporation Wireable planar integrated circuit chip structure
US4161662A (en) * 1976-01-22 1979-07-17 Motorola, Inc. Standardized digital logic chip
US4218693A (en) * 1977-01-17 1980-08-19 U.S. Philips Corporation Integrated logic circuit having interconnections of various lengths between field effect transistors of enhancement and depletion modes
US4212026A (en) * 1977-06-24 1980-07-08 International Business Machines Corporation Merged array PLA device, circuit, fabrication method and testing technique
US4249193A (en) * 1978-05-25 1981-02-03 International Business Machines Corporation LSI Semiconductor device and fabrication thereof
JPS5582448A (en) * 1978-12-15 1980-06-21 Nec Corp Master slice semiconductor integrated circuit
US4393464A (en) * 1980-12-12 1983-07-12 Ncr Corporation Chip topography for integrated circuit communication controller
JPS57100747A (en) * 1980-12-16 1982-06-23 Nec Corp Semiconductor device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP0112894A4 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0138650A1 (en) * 1983-09-09 1985-04-24 Fairchild Semiconductor Corporation Integrated circuit chip wiring arrangement providing reduced circuit inductance and controlled voltage gradients

Also Published As

Publication number Publication date
EP0112894A4 (en) 1984-09-14
US4511914A (en) 1985-04-16
EP0112894A1 (en) 1984-07-11
EP0112894B1 (en) 1987-03-25
SG67289G (en) 1990-01-26
JPS59501238A (en) 1984-07-12
DE3370563D1 (en) 1987-04-30
JPH0695553B2 (en) 1994-11-24

Similar Documents

Publication Publication Date Title
EP0112894B1 (en) Power bus routing for gate arrays
US5045725A (en) Integrated standard cell including clock lines
EP0080361A2 (en) Complementary metal-oxide semiconductor integrated circuit device of master slice type
US5378941A (en) Bipolar transistor MOS transistor hybrid semiconductor integrated circuit device
KR100302529B1 (en) Thin Film Semiconductor Integrated Circuits
US5083181A (en) Semiconductor integrated circuit device and wiring method thereof
EP0335697B1 (en) Integrated circuit device comprising interconnection wiring
US4862241A (en) Semiconductor integrated circuit device
US4958092A (en) Integrated circuit device having row structure with clock driver at end of each row
US5416431A (en) Integrated circuit clock driver having improved layout
US5539246A (en) Microelectronic integrated circuit including hexagonal semiconductor "gate " device
EP0046197B1 (en) Fet convolved logic
US5434436A (en) Master-slice type semiconductor integrated circuit device having multi-power supply voltage
EP0012244A1 (en) Programmable logic array
JPH0630377B2 (en) Semiconductor integrated circuit device
US5656850A (en) Microelectronic integrated circuit including hexagonal semiconductor "and"g
EP0074804B1 (en) Semiconductor integrated circuit comprising a semiconductor substrate and interconnecting layers
EP0278463A2 (en) Gate array having transistor buried in interconnection region
EP0466176A1 (en) Compound semiconductor integrated circuit device
EP0553726B1 (en) Semiconductor logic circuit
JPH01152642A (en) Semiconductor integrated circuit
JPS60103643A (en) Semiconductor device
JP2652948B2 (en) Semiconductor integrated circuit
JPH01144649A (en) Wiring structure of integrated circuit
EP0425032A1 (en) Integrated CMOS circuit

Legal Events

Date Code Title Description
AK Designated states

Designated state(s): JP

AL Designated countries for regional patents

Designated state(s): DE FR GB NL SE

WWE Wipo information: entry into national phase

Ref document number: 1983902340

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 1983902340

Country of ref document: EP

WWG Wipo information: grant in national office

Ref document number: 1983902340

Country of ref document: EP