WO1987003696A1 - Optical angle of arrival measuring system - Google Patents
Optical angle of arrival measuring system Download PDFInfo
- Publication number
- WO1987003696A1 WO1987003696A1 PCT/US1986/002457 US8602457W WO8703696A1 WO 1987003696 A1 WO1987003696 A1 WO 1987003696A1 US 8602457 W US8602457 W US 8602457W WO 8703696 A1 WO8703696 A1 WO 8703696A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- detector elements
- detector
- arrival
- electromagnetic radiation
- arrival system
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S3/00—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received
- G01S3/78—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received using electromagnetic waves other than radio waves
- G01S3/782—Systems for determining direction or deviation from predetermined direction
- G01S3/783—Systems for determining direction or deviation from predetermined direction using amplitude comparison of signals derived from static detectors or detector systems
Definitions
- the disclosed invention relates to optical direction of arrival systems, and is particularly directed to a two-directional optical direction of arrival system having a wide angle of response.
- Optical direction of arrival systems are generally utilized to determine the direction of arrival of optical radiation such as laser radiation.
- Presently known direction of arrival systems include image forming optical systems with detector arrays and discrete electronic processing for each detector.
- Another advantage would be to provide a direction of arrival system which uses a small number of detectors.
- the foregoing and other advantages and features are provided by the invention in a direction of arrival system which includes simple, inexpensive optics, a simple assembly, a small number of detectors and very wide field coverage.
- FIG. 1 is a top plan view of a detector assembly of the disclosed direction of arrival system
- FIG. 2 is an elevational view of the detector assembly of FIG. 1;
- FIG. 3A is a top plan view of an alternative configuration of the detector assembly of FIG. 1;
- FIG. 5 is a top plan view of a detector assembly that is an alternative to that of FIG. 1 ;
- FIG. 6 is a side plan view of the detector assembly of FIG. 5;
- FIG. 6A is a side plan view of an alternative configuration of the detector assembly of FIG. 6. DESCRIPTION OF THE PREFERRED EMBODIMENTS
- FIG. 1 which is characterized as a top plan view, the X and Y axes are shown while the Z-axis is understood to be orthogonal.
- FIG. 2 In the elevational view of FIG. 2, the Y and Z axes are shown, while the X-axis is understood to be orthogonal.
- the Z-axis can be considered as being along the center line (line of sight) of the external field of view which refers to the section in space over which the detector array can receive incident radiation for which direction of arrival can be determined.
- the direction of arrival is measured in the respective orthogonal planes formed by (a) the Z and X axes, and (b) the Z and Y axes.
- the incidence angle in the ZX plane shall be called ⁇ x
- the incidence angle in the ZY plane shall be called ⁇ y .
- direction of arrival may be considered as a vector in three-dimensional space.
- Such direction vector includes components in the ZX and ZY planes. The angles formed by such components relative to the Z-axis are sufficient to define direction of arrival.
- direction of arrival may be considered an ordered pair ( ⁇ x , ⁇ y ).
- the detector assembly 10 provides information indicative of an incidence angle ⁇ y .
- the detector assembly 10 includes a first detector element 101 and a second detector element 102 which are separated by a mirror assembly 11.
- the detector elements 101, 102 respectively, have coplanar incident surfaces 101a, 102a.
- the mirror assembly includes parallel mirror surfaces 11a, lib which are orthogonal to the detector element incident surfaces 101a, 102a.
- Each of the detector elements 101, 102 is rectangular and has a length L that is parallel to the mirror surfaces 11a, lib and a width W that is perpendicular to the mirror surfaces.
- the mirror surfaces 11a, lib have a height H.
- Shown in FIG. 2 are rays A, B, C, D and E which are incident in a plane at an angle ⁇ y. Rays between A and B irradiate the entire incident surface 101a of the detector 101. Rays between B and C reflect off the mirror surface 11a onto an area that is proportional to (Htan ⁇ y ) and is doubly illuminated as shown by D of FIG. 2.
- the direct illumination contributes an amount proportional to the area of the incident surface which is (W x L); and the reflected illumination contributes an amount proportional to the incident surface area subject to the reflected illumination which is (Htan ⁇ y ).
- the detector 102 is irradiated by rays between D & E.
- the area of surface 102A to the left of ray D is in shadow, the area of the shadow, indicated by S in FIG. 2, is Htan ⁇ y (L).
- the output of detector 102 is proportional to the full area minus the shaded area or:
- the incidence angle ⁇ may be determined by dividing the difference of the detector outputs by the sum of the detector outputs.
- the difference of the detector element outputs is:
- ⁇ y tan -1 (R y W/H) (8)
- the detector assembly 10 includes a first detector element 103 and a second detector element 104 which are separated by a mirror assembly 13.
- the detector elements 103, 104 respectively, have coplanar incident surfaces 103a, 104a which may be coplanar with the incident surfaces 101a, 102a of the detector assembly 10.
- the mirror assembly 13 includes parallel mirror surfaces 13a, 13b which are orthogonal to the detector element incident surfaces 103a, 104a. Thus, the mirror surfaces 13a, 13b are orthogonal to the mirror surfaces 11a, 11b of the detector assembly 10.
- R x is the ratio of difference to sum of the outputs D 103 , D 104 of the detector elements 103, 104:
- FIG. 3 could be bisected by a line through the mirror length center.
- the four halves thus created could have any non-intering physical location as long as they are in a homogeneous portion of the incoming irradiation pattern.
- One such configuration is shown as systems 10', 10'', 20', 20'' in FIG. 3A.
- FIGS. 5 and 6 shown therein is a detector assembly 200 which may be utilized instead of the detector assemblies 10 and 20 in the direction of arrival system of FIG. 2.
- the detector assembly 200 includes four detector elements 201, 202, 203, 204 which have incident surfaces 201a, 202a, 203a, 204a that are preferably coplanar.
- the detector elements are separated by a cross-shaped mirror assembly 23 which includes two legs 25, 27 that are orthogonal to each other. Specifically, the detector elements are positioned in the vertexes of the cross-shaped mirror assembly 23.
- the mirror assembly 23 includes mirror surfaces
- the mirror surfaces 23a through 23h which are orthogonal to the incident surfaces of the detector elements 201, 202, 203, 204.
- the mirror surfaces 23a, 23d, 23e, 23h are parallel, and the mirror surfaces 23b, 23c, 23f, 23g are parallel.
- Each of the mirror surfaces has a height H above the plane of the incident surfaces of the detector elements.
- Each of the detector elements 201, 202, 203, 204 has a width W parallel to the X-axis and a length L parallel to the Y-axis. From the previous analysis of the detector assemblies 10, 20, 200, it should be readily understood that each of the angles of incidence ⁇ x , ⁇ y can reach maximum values, beyond which angles of incidence cannot be discriminated. Since the detector elements 201, 202, 203, 204 are not necessrily square, such maximum values may be different.
- the output of the detector elements 201, 202, 203, 204 are selectively combined to determine the incidence angles ⁇ x , ⁇ y .
- the incident angle ⁇ x is determined by considering the detector elements 201, 202 as a single detector element.
- the outputs of the detector elements 201, 202 are summed to provide a detector output DS1:
- the difference/sum ratio R x is expressed as follows:
- the incident angle ⁇ y can be determined by considering the detector elements 201, 203 as a single detector element and by considering the detector elements 202, 204 as another single detector element.
- the outputs of the detector elements 201, 203 are summed together to provide a detector output DS3:
- the outputs of the detector elements 202, 204 are summed together to provide a detector autput DS4:
Abstract
An optical direction of arrival system responsive to incident electromagnetic radiation, comprising: a plurality of detector elements (101, 102) responsive to incident electromagnetic radiation for providing respective detector outputs, said detector elements being arranged in a predetermined configuration; reflecting means (11) for selectively reflecting and/or obscuring incident electromagnetic radiation to said detector elements so that the detector elements may receive direct and/or reflected incident electromagnetic radiation; and processing means responsive to said detector outputs for determining the direction of arrival (y) of incident optical signals as a function of the distribution of incident electromagnetic radiation on said detector elements.
Description
Optical angle of arrival measuring system
BACKGROUND OF THE INVENTION
The disclosed invention relates to optical direction of arrival systems, and is particularly directed to a two-directional optical direction of arrival system having a wide angle of response.
Optical direction of arrival systems are generally utilized to determine the direction of arrival of optical radiation such as laser radiation. Presently known direction of arrival systems include image forming optical systems with detector arrays and discrete electronic processing for each detector.
Such presently known direction of arrival systems are complex, costly, and cumbersome. Further considerations of known direction of arrival systems include multiple detectors, each with its discrete electronics, spaced behind an aperture. In this method, angular resolution is determined by detector and slot size and the spacing between them. If orthogonal bar detectors are used, the number required is twice the ratio of the field of view to the resolution increment. If a matrix is used, the number required is the square of the ratio of the field of view to the resolution increment.
SUMMARY OF THE INVENTION
It would therefore be an advantage to provide a direction of arrival system which is compact and efficient. It would also be an advantage to provide a direction of arrival system which is responsive over a large incident solid angle.
Another advantage would be to provide a direction of arrival system which uses a small number of detectors. The foregoing and other advantages and features are provided by the invention in a direction of arrival system which includes simple, inexpensive optics, a simple assembly, a small number of detectors and very wide field coverage.
SRlEF DESCRIPTION OF THE DRAWINGS
The advantages and features of the disclosed invention will readily be appreciated by persons skilled in the art from the following detailed description when read in conjunction with the drawing wherein:
FIG. 1 is a top plan view of a detector assembly of the disclosed direction of arrival system;
FIG. 2 is an elevational view of the detector assembly of FIG. 1; FIG. 3A is a top plan view of an alternative configuration of the detector assembly of FIG. 1; FIG. 5 is a top plan view of a detector assembly that is an alternative to that of FIG. 1 ;
FIG. 6 is a side plan view of the detector assembly of FIG. 5; and
FIG. 6A is a side plan view of an alternative configuration of the detector assembly of FIG. 6.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
In the following detailed description and in the several figures of the drawing, like elements are identified with like reference numerals. The following discussion generally relates to determination of the direction of arrival of electromagnetic radiation on a detector array. For reference purposes, the direction of arrival shall be discussed relative to a three dimensional right-handed Cartesian coordinate system. In FIG. 1, which is characterized as a top plan view, the X and Y axes are shown while the Z-axis is understood to be orthogonal. In the elevational view of FIG. 2, the Y and Z axes are shown, while the X-axis is understood to be orthogonal. For reference, the Z-axis can be considered as being along the center line (line of sight) of the external field of view which refers to the section in space over which the detector array can receive incident radiation for which direction of arrival can be determined. The direction of arrival is measured in the respective orthogonal planes formed by (a) the Z and X axes, and (b) the Z and Y axes. The incidence angle in the ZX plane shall be called θx, and the incidence angle in the ZY plane shall be called θy. Stated another way , direction of arrival may be considered as a vector in three-dimensional space. Such direction vector includes components in the ZX and ZY planes. The angles formed by such components relative to the Z-axis are sufficient to define direction of arrival. Thus, direction of arrival may be considered an ordered pair ( θx, θy).
Referring now to FIGS. 1 and 2, shown therein is a one-dimensional detector assembly 10 for the disclosed direction of arrival system. As shown, the detector assembly 10 provides information indicative of an incidence angle θy.
The detector assembly 10 includes a first detector element 101 and a second detector element 102 which are separated by a mirror assembly 11. The detector elements 101, 102, respectively, have coplanar incident surfaces 101a, 102a. The mirror assembly includes parallel mirror surfaces 11a, lib which are orthogonal to the detector element incident surfaces 101a, 102a.
Each of the detector elements 101, 102 is rectangular and has a length L that is parallel to the mirror surfaces 11a, lib and a width W that is perpendicular to the mirror surfaces. The mirror surfaces 11a, lib have a height H. Shown in FIG. 2 are rays A, B, C, D and E which are incident in a plane at an angle θy. Rays between A and B irradiate the entire incident surface 101a of the detector 101. Rays between B and C reflect off the mirror surface 11a onto an area that is proportional to (Htan θy) and is doubly illuminated as shown by D of FIG. 2. The output D101 of the detector 101 is as follows: D101 = K(W + Htan θy)(L) (1) where K is a proportionality constant.
The foregoing follows from the fact that the direct illumination contributes an amount proportional to the area of the incident surface which is (W x L); and the reflected illumination contributes an amount proportional to the incident surface area subject to the reflected illumination which is (Htan θy).
For the shown incidence angle θy, the detector 102 is irradiated by rays between D & E. The area of surface 102A to the left of ray D is in shadow, the area of the shadow, indicated by S in FIG. 2, is Htan θy (L). (It is important to understanding the
concept to realize that the doubled area D and the shaded area S are equal.) The output of detector 102 is proportional to the full area minus the shaded area or:
D102 = K(W - Htan θy) L (2)
The incidence angle θ may be determined by dividing the difference of the detector outputs by the sum of the detector outputs. The difference of the detector element outputs is:
D101 - D102 = K(W + Htan θy)
- (W - Htan θy)) (3)
D101 - D102 = K(2Htan θy) (4)
The sum of the detector element outputs is: D101 + D102 = K(W + Htan θy)
+ (W - Htan θy)) (5)
D101 + D102 = K(2W) (6)
Thus, the ratio Ry of difference to sum is:
Ry = (Htan θy)/W (7)
The incidence angle θy is, therefore, determined as follows: θy = tan-1(RyW/H) (8)
It should be noted that for an incidence angle θy having a value greater than a maximum angle value θmax, the detector 102 will be totally in shadow and the incidence angle θy cannot be determined. Such maximum angle value θmax is related to the width and height dimensions as follows:
W = Htan θmax (9) tan θmax = W/H (10)
Since tan θmax is a constant for a given selection of width and height, the incidence angle may be determined as follows: θy = tan-1(RK1) (11) where K1 is tan θmax or (W/H). It should be apparent that for equal width W and height H, K1 is 1, and θ = 45°.
It should be understood that the rays A, B, C, D, and E represent planes perpendicular to the plane of FIG. 2. Within each plane, the angle of incidence θx may vary. Thus, in order to determine θx, another detector assembly similar to the detector assembly 10 and positioned orthogonally thereto is required.
Referring now to FIG. 3, shown therein is the detector assembly 10 and another detector assembly 20 positioned orthogonally thereto. The detector assembly 20 includes a first detector element 103 and a second detector element 104 which are separated by a mirror assembly 13. The detector elements 103, 104, respectively, have coplanar incident surfaces 103a, 104a which may be coplanar with the incident surfaces 101a, 102a of the detector assembly 10. The mirror assembly 13 includes parallel mirror surfaces 13a, 13b which are orthogonal to the detector element incident surfaces 103a, 104a. Thus, the mirror surfaces 13a, 13b are orthogonal to the mirror surfaces 11a, 11b of the detector assembly 10.
Each of the detector elements 103, 104 is rectangular. It should be readily understood that the incidence angle θx can be determined in a manner similar to the determination of the angle θy as discussed above. Thus, the incidence angle θx is as follows: θχ = tan-1(RχK2) (12)
In the foregoing Equation 12, Rx is the ratio of difference to sum of the outputs D103, D104 of the detector elements 103, 104:
Rx = (D103 - D104)/(D103 + D104) (13)
K2 is θmax or (W/H). It should be apparent that for the dimensions of the detector assembly 20 that the maximum angle value θmax for the incidence angle θx is the same as the maximum angle value for the incidence angle θy.
It should also be readily understood that the respective maximum values for the incidence angles θx, θy may be readily controlled by choosing appropriate detector widths and mirror surface heights. It should be understood that both systems 10 and
20 of FIG. 3 could be bisected by a line through the mirror length center. The four halves thus created could have any non-intering physical location as long as they are in a homogeneous portion of the incoming irradiation pattern. One such configuration is shown as systems 10', 10'', 20', 20'' in FIG. 3A. Normally, it is desirable to keep the detectors close together to minimize the possibility of error due to incoming field non-uniformities to and thereby minimize the package size, to facilitate cooling (when needed). Referring now to FIGS. 5 and 6 shown therein is a detector assembly 200 which may be utilized instead of the detector assemblies 10 and 20 in the direction of arrival system of FIG. 2. The detector assembly 200 includes four detector elements 201, 202, 203, 204 which have incident surfaces 201a, 202a, 203a, 204a that are preferably coplanar. The detector elements are separated by a cross-shaped mirror assembly 23 which includes two legs 25, 27 that are orthogonal to each other. Specifically, the detector elements are positioned in the vertexes of the cross-shaped mirror assembly 23.
The mirror assembly 23 includes mirror surfaces
23a through 23h, which are orthogonal to the incident surfaces of the detector elements 201, 202, 203, 204. The mirror surfaces 23a, 23d, 23e, 23h are parallel, and the mirror surfaces 23b, 23c, 23f, 23g are parallel. Each of the mirror surfaces has a height H above the plane of the incident surfaces of the detector elements.
Each of the detector elements 201, 202, 203, 204 has a width W parallel to the X-axis and a length L parallel to the Y-axis. From the previous analysis of the detector assemblies 10, 20, 200, it should be readily understood that each of the angles of incidence θx, θy can reach maximum values, beyond which angles of incidence cannot be discriminated. Since the detector elements 201, 202, 203, 204 are not necessrily square, such maximum values may be different.
The maximum value θymax for the incidence angle θx is expressed as follows: θymax = tan-1(H/W) (29) The maximum value θymax for the incidence angle θy is expressed as follows: θymax = tan-1H/L) (30)
In a manner similar to the techniques discussed above relative to the detector assembly 200, the output of the detector elements 201, 202, 203, 204 are selectively combined to determine the incidence angles θx, θy.
Particularly, the incident angle θx is determined by considering the detector elements 201, 202 as a single detector element. The outputs of the detector elements 201, 202 are summed to provide a detector output DS1:
DS1 = D201 + D202 (31)
The outputs of the detector elements 203, 204 are summed to provide a detector output DS2:
DS2 = D203 + D204 ( 32)
The difference/sum ratio Rx is expressed as follows:
Rx = (DS2 - DS2)/(DS1 + DS2) (33)
By analogy to Equation 17 above, the incidence angle θx is determined as follows: θχ = tan-1(Rχ W/H) (34)
In a similar manner, the incident angle θy can be determined by considering the detector elements 201, 203 as a single detector element and by considering the detector elements 202, 204 as another single detector element. The outputs of the detector elements 201, 203 are summed together to provide a detector output DS3:
DS3 = D201 + D203 (35)
The outputs of the detector elements 202, 204 are summed together to provide a detector autput DS4:
DS4 = D202 + D204 (36) The difference/sum ratio Ry is expressed as follows:
Ry = (DS3 - DS4)/(DS3 + DS4) (37)
The incidence angle θy is determined as follows: θy = tan-1(Ry L/H) (38) it should be understood that detector system 200 could be quadrisected by lines through the center of mirrors 25 and 27. The four sectors thus created could be placed anywhere, or randomly, in a homogeneous incoming field and the detector array would be the same; one such configuration is shown as system 200' (1-4) in FIG. 6A. Normally, it is desirable to keep the detectors close together to minimize the possibility of error due to incoming field non-uniformities, to minimize the package size and to facilitate cooling when needed.
Claims
1. An optical direction of arrival system responsive to incident electromagnetic radiation, comprising: a plurality of detector elements responsive to incident electromagnetic radiation for providing respective detector outputs, said detector elements being arranged in a predetermined configuration; reflecting means for selectively reflecting and/or obscuring incident electromagnetic radiation to said detector elements so that the detector elements may receive direct and/or reflected incident electromagnetic radiation; and processing means responsive to said detector outputs for determining the direction of arrival of incident optical signals as a function of the distribution of incident electromagnetic radiation on said detector elements.
2. The optical direction of arrival system of Claim 1 wherein said plurality of detector elements includes four detector elements.
3. The optical direction of arrival system of
Claim 2 wherein said reflecting means provides reflections at planes which are perpendicular to said detector.
4. The optical direction of arrival system of
Claim 2 wherein said four detector elements are separated from each other by said reflecting means which includes reflecting surfaces perpendicular to the incident surfaces of said four detector elements.
5. The optical direction of arrival system of Claim 2 wherein said four detector elements may be placed randomly.
6. The optical direction of arrival system of Claim 4 wherein said reflecting means is a cross-shaped mirror, assembly having two orthogonal legs respectively having parallel reflecting surfaces, and wherein each of said four detector elements is rectangular and positioned in one of the vertexes of said cross-shaped mirror assembly.
7. The optical director of arrival system of Claim 4 wherein said four detector elements may be placed randomly.
8. The optical direction of arrival system of Claim 1 wherein said plurality of detector elements includes two detector elements.
9. The optical direction of arrival system of Claim 8 wherein said reflecting means separates said two detector elements and includes first and second reflecting surfaces which are respectively orthogonal to said two detector elements.
10. The optical direction of arrival system of Claim 9 wherein said reflecting means comprises a mirror assembly having parallel reflecting surfaces.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO872891A NO872891L (en) | 1985-12-10 | 1987-07-10 | TWO-WAY ARRIVAL ANGLE SYSTEM. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/807,377 US4804832A (en) | 1985-12-10 | 1985-12-10 | Two directional angle of arrival system |
US807,377 | 1985-12-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1987003696A1 true WO1987003696A1 (en) | 1987-06-18 |
Family
ID=25196229
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1986/002457 WO1987003696A1 (en) | 1985-12-10 | 1986-11-14 | Optical angle of arrival measuring system |
Country Status (6)
Country | Link |
---|---|
US (1) | US4804832A (en) |
EP (1) | EP0248842A1 (en) |
JP (1) | JPS63501901A (en) |
ES (1) | ES2003965A6 (en) |
IL (1) | IL80544A0 (en) |
WO (1) | WO1987003696A1 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989004972A1 (en) * | 1987-11-27 | 1989-06-01 | Försvarets Forskningsanstalt | A method to detect radiation and measure its angle of incidence and a detector arrangement to carry out the method |
WO1989004973A1 (en) * | 1987-11-27 | 1989-06-01 | Försvarets Forskningsanstalt | A method to measure the angle of incidence for radiation and a detector to carry out the method |
WO1989006806A1 (en) * | 1988-01-19 | 1989-07-27 | Peter Frederick Bradbeer | Direction sensitive energy detecting apparatus |
WO1990007102A1 (en) * | 1988-12-22 | 1990-06-28 | Saab Automobile Aktiebolag | Sensor for an air-conditioning system in a vehicle |
GB2232550A (en) * | 1988-11-03 | 1990-12-12 | Hughes Microelectronics Ltd | Optical sensor |
DE3913369A1 (en) * | 1988-07-04 | 2008-11-20 | Electronique Serge Dassault | Device for detecting laser pulses, in particular for aircraft |
EP2568510A3 (en) * | 2011-09-08 | 2013-10-09 | Freescale Semiconductor, Inc. | Capacitive sensor device for measuring radiation |
US8933711B2 (en) | 2011-09-08 | 2015-01-13 | Freescale Semiconductor, Inc. | Capacitive sensor radiation measurement |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5264910A (en) * | 1990-07-30 | 1993-11-23 | Fmc Corporation | Apparatus and method for angle measurement |
US6058223A (en) * | 1996-06-27 | 2000-05-02 | The Johns Hopkins University | Video-centroid integrated circuit |
US5959727A (en) * | 1997-08-01 | 1999-09-28 | Raytheon Company | System and method for discriminating between direct and reflected electromagnetic energy |
US5995214A (en) * | 1997-08-13 | 1999-11-30 | Lucent Technologies | Process for pose estimation of a camera viewing an image scene |
US5909275A (en) * | 1997-12-02 | 1999-06-01 | The United States Of America As Represented By The Secretary Of The Army | G-hardened optical alignment sensor |
ES2171097B1 (en) * | 1999-06-21 | 2003-11-01 | Univ Sevilla | ELECTRONIC SENSOR FOR MEASURING THE ANGLE POSITION OF A LUMINISCENT OBJECT. |
AU2003255976A1 (en) * | 2002-02-06 | 2003-11-17 | Beamcontrol Aps | Signal source tracking method and system |
SE0301857D0 (en) * | 2003-06-24 | 2003-06-24 | Uab Accel Elektronika | An optical radiation intensity sensor |
DE102004017775B4 (en) * | 2004-04-13 | 2006-03-16 | Siemens Ag | Sun sensor has photodetectors at end of divided cone collector with reflecting surfaces collecting light falling transverse to long axis |
DE102004017774B3 (en) * | 2004-04-13 | 2005-10-20 | Siemens Ag | Sun sensor, e.g. for use in controlling a vehicle air conditioning system, has a screen arrangement and a number of light guiding bodies each allocated to a photodetector so that the screen casts a shadow dependent on sun position |
US7834303B2 (en) * | 2008-06-09 | 2010-11-16 | Ahura Energy Concentrating Systems | Multi-element concentrator system |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3370293A (en) * | 1966-02-02 | 1968-02-20 | Green Milton | Direction finder |
US3855474A (en) * | 1973-06-28 | 1974-12-17 | Barnes Eng Co | Non-scanning object position indicating radiometric device independent of object irradiance variations |
FR2389847A1 (en) * | 1977-05-05 | 1978-12-01 | Vironneau Pierre | Solar radiation energy absorber - has cell mounted on rotating base driven by servo system to keep panel perpendicular to sun |
DE3144823A1 (en) * | 1981-11-11 | 1983-05-26 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Photoelectronic device for measuring the angle of incidence of light |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5226859A (en) * | 1975-08-25 | 1977-02-28 | Matsushita Electric Works Ltd | Light source tracer |
US4027651A (en) * | 1976-02-17 | 1977-06-07 | Robbins Jr Roland W | Solar-energy-powered sun tracker |
US4549078A (en) * | 1978-10-02 | 1985-10-22 | Monahan Daniel E | Automatic tracking system with infrared and ultraviolet detection |
JPS5849610Y2 (en) * | 1979-08-24 | 1983-11-12 | 株式会社村田製作所 | variable resistor |
US4349733A (en) * | 1980-07-03 | 1982-09-14 | Beam Engineering, Inc. | Sun tracker |
JPS5818059A (en) * | 1981-07-24 | 1983-02-02 | Hitachi Zosen Corp | Solar ray tracking apparatus |
US4498768A (en) * | 1982-02-16 | 1985-02-12 | The United States Of America As Represented By The Secretary Of The Army | Angle of arrival meter |
JPS60147663A (en) * | 1984-01-13 | 1985-08-03 | Matsushita Electric Ind Co Ltd | Automatic tracking device |
-
1985
- 1985-12-10 US US06/807,377 patent/US4804832A/en not_active Expired - Lifetime
-
1986
- 1986-11-07 IL IL80544A patent/IL80544A0/en unknown
- 1986-11-14 WO PCT/US1986/002457 patent/WO1987003696A1/en not_active Application Discontinuation
- 1986-11-14 JP JP61506306A patent/JPS63501901A/en active Pending
- 1986-11-14 EP EP86907179A patent/EP0248842A1/en not_active Withdrawn
- 1986-12-09 ES ES8603323A patent/ES2003965A6/en not_active Expired
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3370293A (en) * | 1966-02-02 | 1968-02-20 | Green Milton | Direction finder |
US3855474A (en) * | 1973-06-28 | 1974-12-17 | Barnes Eng Co | Non-scanning object position indicating radiometric device independent of object irradiance variations |
FR2389847A1 (en) * | 1977-05-05 | 1978-12-01 | Vironneau Pierre | Solar radiation energy absorber - has cell mounted on rotating base driven by servo system to keep panel perpendicular to sun |
DE3144823A1 (en) * | 1981-11-11 | 1983-05-26 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Photoelectronic device for measuring the angle of incidence of light |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989004972A1 (en) * | 1987-11-27 | 1989-06-01 | Försvarets Forskningsanstalt | A method to detect radiation and measure its angle of incidence and a detector arrangement to carry out the method |
WO1989004973A1 (en) * | 1987-11-27 | 1989-06-01 | Försvarets Forskningsanstalt | A method to measure the angle of incidence for radiation and a detector to carry out the method |
US5010244A (en) * | 1987-11-27 | 1991-04-23 | Forsvarets Forskningsanstalt | Method to detect radiation and measure its angle of incidence and a detector arrangement to carry out the method |
WO1989006806A1 (en) * | 1988-01-19 | 1989-07-27 | Peter Frederick Bradbeer | Direction sensitive energy detecting apparatus |
US5130543A (en) * | 1988-01-19 | 1992-07-14 | Bradbeer Peter F | Direction sensitive energy detecting apparatus |
DE3913369A1 (en) * | 1988-07-04 | 2008-11-20 | Electronique Serge Dassault | Device for detecting laser pulses, in particular for aircraft |
GB2232550A (en) * | 1988-11-03 | 1990-12-12 | Hughes Microelectronics Ltd | Optical sensor |
WO1990007102A1 (en) * | 1988-12-22 | 1990-06-28 | Saab Automobile Aktiebolag | Sensor for an air-conditioning system in a vehicle |
EP2568510A3 (en) * | 2011-09-08 | 2013-10-09 | Freescale Semiconductor, Inc. | Capacitive sensor device for measuring radiation |
US8884241B2 (en) | 2011-09-08 | 2014-11-11 | Freescale Semiconductor, Inc. | Incident capacitive sensor |
US8933711B2 (en) | 2011-09-08 | 2015-01-13 | Freescale Semiconductor, Inc. | Capacitive sensor radiation measurement |
Also Published As
Publication number | Publication date |
---|---|
ES2003965A6 (en) | 1988-12-01 |
US4804832A (en) | 1989-02-14 |
EP0248842A1 (en) | 1987-12-16 |
IL80544A0 (en) | 1987-02-27 |
JPS63501901A (en) | 1988-07-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4804832A (en) | Two directional angle of arrival system | |
US5604695A (en) | Analog high resolution laser irradiation detector (HARLID) | |
US5877490A (en) | Quadrant light detector | |
US6815651B2 (en) | Optical position measurement system employing one or more linear detector arrays | |
CA2101996C (en) | Validation of optical ranging of a target surface in a cluttered environment | |
US4672564A (en) | Method and apparatus for determining location and orientation of objects | |
US4711998A (en) | Direction finder system with mirror array | |
US7170442B2 (en) | Video rate passive millimeter wave imaging system | |
JPS59211128A (en) | Optical position detector | |
US5719670A (en) | Integrated direction finder | |
GB2176282A (en) | Optical position locating device | |
EP0054353B1 (en) | Apparatus for reception and radiation of electromagnetic energy in predetermined fields of view | |
US4325633A (en) | Apparatus for determining of angle of incidence of electromagnetic energy | |
US5771092A (en) | Wavelength agile receiver with noise neutralization and angular localization capabilities (WARNALOC) | |
EP0122503B1 (en) | Attitude transfer system | |
WO1990009560A1 (en) | Distance gauge | |
US5946135A (en) | Retroreflector | |
US4778990A (en) | Radiant energy receiving and directing apparatus and method | |
US4498768A (en) | Angle of arrival meter | |
US4621924A (en) | Optical alignment apparatus | |
EP0930512B1 (en) | Vectorial photosensor | |
US4222632A (en) | Light receiving and reflecting device | |
US4944588A (en) | System for detecting laser radiation | |
US4513201A (en) | Thermocouple detector | |
NO872891L (en) | TWO-WAY ARRIVAL ANGLE SYSTEM. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): JP NO |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): DE FR GB IT |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1986907179 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 1986907179 Country of ref document: EP |
|
WWW | Wipo information: withdrawn in national office |
Ref document number: 1986907179 Country of ref document: EP |