WO1991020097A1 - Tandem photovoltaic solar cell with iii-v diffused junction booster cell - Google Patents
Tandem photovoltaic solar cell with iii-v diffused junction booster cell Download PDFInfo
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- WO1991020097A1 WO1991020097A1 PCT/US1991/003277 US9103277W WO9120097A1 WO 1991020097 A1 WO1991020097 A1 WO 1991020097A1 US 9103277 W US9103277 W US 9103277W WO 9120097 A1 WO9120097 A1 WO 9120097A1
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- 229910001218 Gallium arsenide Inorganic materials 0.000 claims abstract description 71
- 229910005542 GaSb Inorganic materials 0.000 claims abstract description 65
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 7
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 5
- 239000003607 modifier Substances 0.000 claims description 5
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/068—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
- H01L31/0693—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells the devices including, apart from doping material or other impurities, only AIIIBV compounds, e.g. GaAs or InP solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/02168—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells the coatings being antireflective or having enhancing optical properties for the solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/043—Mechanically stacked PV cells
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/05—Electrical interconnection means between PV cells inside the PV module, e.g. series connection of PV cells
- H01L31/0504—Electrical interconnection means between PV cells inside the PV module, e.g. series connection of PV cells specially adapted for series or parallel connection of solar cells in a module
- H01L31/0508—Electrical interconnection means between PV cells inside the PV module, e.g. series connection of PV cells specially adapted for series or parallel connection of solar cells in a module the interconnection means having a particular shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/054—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means
- H01L31/0543—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means comprising light concentrating means of the refractive type, e.g. lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/054—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means
- H01L31/0547—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means comprising light concentrating means of the reflecting type, e.g. parabolic mirrors, concentrators using total internal reflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/184—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof the active layers comprising only AIIIBV compounds, e.g. GaAs, InP
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/52—PV systems with concentrators
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/544—Solar cells from Group III-V materials
Definitions
- This invention relates to mechanically stacked, tandem photovoltaic solar cells which convert incident sunlight to electric power preferably with high energy conversion efficiencies, and more particularly to a novel III- V diffused booster cell, its method of fabrication and the tandem interconnection with an improved transparent upper photovoltaic cell.
- GaSb gallium antimonide
- GaSb photodiodes fabricated by zinc diffusion from a zinc-silica spin on film is described by W. Schmidt auf. Altenstadt and C. Heinz in Physics 129B, p. 497, 1985. The zinc concentrations obtained by that process were too low for solar cells.
- a method for improving the energy conversion efficiency of a GaAs/GaSb tandem solar cell comprising the step of using a diffused junction GaSb cell.
- a GaAs/GaSb tandem solar cell having improved conversion efficiency, comprising: a GaAs upper cell having predetermined bandgap selected for optimal performance of the tandem solar cell; a GaSb booster cell positioned beneath the GaAs upper cell to receive light transmitted through the GaAs upper cell and responsive to such light; and light conditioning means associated with the upper cell and booster cell for achieving an energy conversion efficiency of at least 31% AMO.
- a solar cell array comprising: a solar energy collector; a plurality of solar cell units positioned with respect to one another and with respect to a solar energy collector; a first group of cells made of GaAs and a second group of cells made of GaSb that are each mechanically stacked relative to and physically separate from a corresponding one of the GaAs cells of the first group; the GaAs cells having on an upper surface nearest the collector a multiple layer of different materials to form an upper anti-reflective coating that passes solar energy having wavelengths longer than wavelengths of energy absorbed by GaAs in addition to one layer that also serves to reflect free electrons toward a p-n junction in the GaAs cell; parallel conductors on the upper surface of the GaAs cells which are connected to a first cell terminal; electrical contact means on the lower surface of the GaAs cells which are connected to a second cell terminal; the GaSb cells having a p-type diffusion layer and a radiation receiving area, the radiation receiving area having parallel
- a method for producing a III-V booster solar cell comprising the steps of: diffusing a conductivity type modifier into a first surface of a III-V semiconductor substrate of a predetermined conductivity type to form a diffused area portion; forming a bottom metal contact layer on a second surface of the substrate; forming a grid of conductive material on the first surface of the substrate overlying the diffused area portion; forming a bus conductor on a second portion of the area on the first surface of the substrate which is connected to the grid; etching the diffused area portion substrate by an amount sufficient to increase short circuit current; and depositing a layer of anti- reflective material on the etched diffused area portion.
- the present invention preferably provides a novel solar cell that may overcome the above deficiencies.
- AMO the best of the prior art GaAs satellite solar cells, where air mass effects are 0, i.e. AMO, convert about 22% (AMO) of the incident sunlight to electric power.
- this conversion efficiency may be increased to about 31% (AMO, 100 suns D) which is a new world record conversion efficiency for a satellite photovoltaic device.
- the improved result may come from a number of refinements constituting light conditioning means which may include modifying the upper or front GaAs cell of the tandem unit to be transparent to energy having a longer wavelength than the wavelength to which GaAs is responsive, use of multiple layers of anti-reflective coatings, placing a novel infrared- sensitive GaSb booster cell that has a band gap of about 0.72 eV behind the GaAs cell, and attaching a prism or prismatic coverglass that is aligned with cell grid lines of each cell or at least the GaAs cell, to deflect incident light rays into active cell area.
- the invention may also provide a method for improving the energy conversion efficiency of a GaAs/GaSb tandem solar cell by using a diffused junction GaSb cell which does not have an upper, passivating, epitaxial overcoat in a tandem concentrator configuration.
- the present invention provides a novel cell production method that is scaleable for efficient large volume production for GaSb cells, certain aspects of which are applicable to other III-V solar cells and to provide cells produced by that method.
- Yet another feature of the invention may be the provision of a photovoltaic GaSb cell which does not require a passivation layer, but instead uses a p-dopant such as zinc, the thickness of the layer being reduced in active areas between grid lines to nearly double the short circuit current.
- the invention may further provide a novel solar cell array composed of a solar collecting lens and multiple wafer type cells that are mechanically stacked with the upper cell being transparent to pass infrared energy to the lower cell.
- the mounting of the tandem cells and the current collecting and voltage matching arrangements may provide a two-terminal device which may be used also in terrestrial applications where a world record conversion efficiency of about 34-37% has been measured AM 1.5D (lOOsuns) .
- the preferred embodiment of the present invention may utilize a III-V compound semiconductor material, such as gallium antimonide (GaSb) , as a substrate for the booster cell.
- GaSb gallium antimonide
- a p-type doping material such as zinc
- a passivating layer for GaSb previously thought to be essential, is not used.
- a grid in the form of parallel lines of conductive material that are in direct contact with the p- type material in the diffused region of the semiconductor is connected to the front side metallization bus which is on an insulative mask of a suitable material such as silicon nitride.
- a metal contact is also formed on the back side of the substrate. Prior to coating with an anti-reflective material, the diffused area is etched back to reduce the emitter depth so that the short circuit current will be increased.
- the n-type semiconductor material may receive a patterned layer of insulative material containing an opening through which a p-type dopant is diffused.
- a grid of conductive material is thereafter formed on the diffused area and a bus is placed on the layer of insulative material to contact the grid, but not the semiconductor material.
- a metallized surface is formed on the opposite side of the semiconductor material. Non-metallized areas of the diffused portions are etched to increase the short circuit current and anti-reflective layers are applied to the etched areas to further increase the short circuit current.
- Fig. 1 is a pictorial view of a multi-cell solar energy array embodying a preferred embodiment of the present invention
- Fig. 2 is a diagrammatic view of a single cell of the array of Fig. 1;
- Fig. 3 is a view of a circuit ribbon that may be used for connecting the four terminals of a tandem cell unit to provide a two-terminal device;
- Fig. 4 is an elevation in cross section of the upper cell of a tandem cell unit;
- Fig. 5 is a curve showing the optical transparency properties of a gallium arsenide photovoltaic cell as shown in
- Fig. 6 is a top view of the lower cell of a tandem cell unit;
- Fig. 7 is an elevation in cross section of the lower cell taken along lines 7-7 of Fig. 6;
- Fig. 8A-8E are process flow diagrams outlining the novel process for fabricating a III-V booster solar cell in accord with one feature of the present invention.
- Fig. 9 is an elevation to a large scale showing a prismatic lens which optically eliminates grid line obscuration losses for the solar cells;
- Fig. 10 is a curve showing current vs. voltage for an illuminated GaSb cell; and
- Fig. 11 is a curve showing current vs. voltage for an illuminated GaAs cell.
- the sunlight concentrating photovoltaic array of the present invention is illustrated by an arrangement of nine solar cell units 10 in a housing 11 which includes also a concentrating lens 12 which has nine focal regions, one for each cell.
- Each of the solar cell units 10 is substantially equidistant from its respective concentrating lens 12.
- Each solar cell unit 10 may be of a type illustrated in Fig. 2, and positioned in optical alignment with its portion of the concentrating lens.
- the cell unit 10 is shown to be formed of two cells, one being an upper cell 14 and the other being a lower cell 16.
- the cells 14,16 are mechanically separate so that during manufacture, an upper cell 14 may be selected for use with one of a group of lower cells 16.
- the cells 14,16 may have an active surface area of 0.049 cm 2 , although it should be understood that areas of other sizes are also useful.
- the upper cell 14 is ideally transparent to the radiation to which the lower cell has sensitivity.
- the cells 14,16 may be separated by a space which allows separate electrical terminals to be provided for the lower surface of the upper cell 14 and the upper surface of the lower cell 16.
- the cells 14,16 may be mounted over holes in a ceramic-double sided printed wiring card 18 which is supported at an index position on the housing 11 thereby to serve as part of the array structure.
- the upper cells 14 are mounted on the front side of card 18 and the lower cells 16 of the tandem arrangement are mounted on the back side of the same card 18 to be an optical alignment with its associated upper cell. Other mounting arrangements for the cells may be used.
- the upper cell may have two terminals 20, 22 and the lower cell may have two terminals 24,26.
- the terminal 22 may be connected with printed circuit wiring on the front side of card 18 while the terminal 24 is connected with an electrically separate printed circuit wiring on the back side of card 18.
- Card 18 may be a sapphire layer that serves also as a heat sink or spreader.
- A1 2 0 3 and A1N materials are suitable as a support between the upper and lower cells, because they have electrical insulating and thermal conducting properties.
- FIG. 3 An alternative interconnect between adjacent cells for terrestrial installations may be provided by a flex circuit ribbon 29 as shown in Figure 3 which comprises electrical conductors on a suitable synthetic resin material.
- Three elongated flexible strips 30,31,32 of conductive material extend along the length of ribbon 29.
- the strip 30 is formed with a flap 34 that may engage the metallized surface that is on the upper surface of upper cell 14.
- the strip 32 is formed with a flap 40 that serves as an electrical connection to the lower surface of the upper cell 14.
- the strip 31 is connected electrically to the upper and lower surfaces of the lower cell 16 so that all three lower cells 16 are connected electrically in series.
- the upper cells are connected electrically in parallel.
- GaAs Cell Conventional GaAs cells must be made transparent to achieve the highest conversion efficiency in a tandem or stacked cell application.
- Several methods of forming GaAs photovoltaic cells are known in the art as explained in the McLeod et al U.S. Patent 4,776,893. Further recent developments are reported in an article "Tertiary Butyl Arsine Grown GaAs Solar Cell", by Sundaram et al, Appl. Phys. lett. 54 (7), February 13, 1989, where growing p- and n-doped GaAs layers and p-AlGaAs layers for use as a concentrator solar cell structure is described. See also Fan et al, U.S. Patent No. 4,547,622.
- the conventional continuous back metallization should be replaced with a gridded metallization.
- the back grid should use fewer grid lines than the front grid because the thicker wafer conductivity is much higher than the thinner emitter conductivity. The shading from the back grid can thereby be negligible. In small cells, the back grid may be omitted entirely.
- the wafer n-dopant density of the GaAs material should be reduced from lxlO 18 cm *3 to about lxlO 17 cm "3 to reduce free electron absorption.
- the anti-reflective (AR) coatings on the front and back of the GaAs cell are modified in order to provide minimal reflection across a broader bandwidth to assure passage of longer wavelength energy to which the GaSb cells are responsive.
- the presently preferred transparent GaAs cell design incorporates a 450 micrometer (micron) thick n-type wafer doped to about lxlO 17 cm "3 with complete photovoltaic epitaxial structure grown on it including an AlGaAs window layer.
- a three layer AR coating on the front surface in addition to the AlGaAs window layer serves as the front side AR coating and a two layer AR coating has been applied to the back side in some embodiments.
- Important design parameters include the thickness and refractive index of each layer including the AlGaAs which functions not only as an electronic heteroface but also as one of the front AR layers.
- This multi-layer optical system produces a very broadband reflectance minimization through the visible energy range on out beyond the GaSb band edge at 1700 nm as illustrated in Figure 5.
- the GaAs cells and the GaSb cells may be of the same size.
- the chip size may be 3mm x 5mm and the cell active area diameter may be 2.5mm.
- Nineteen grid lines traverse the front active area of each such cell.
- the grid density is similar to that used with a GaAs cell designed for 2Ox sunlight concentration.
- Fig. 4 shows a cross section of one preferred GaAs solar cell that is adapted for use as part of the present invention.
- the solar energy along line 42 is directed toward the GaAs cell with a part being reflected along line R and a part being transmitted along line T.
- the upper AR layer includes the AlGaAs layer which may specifically be Al 05 Ga 05 As and about 0.05 microns thick.
- Three additional layers have been found effective to enhance the anti-reflective properties. Materials such as Ta 2 0 5 , MgO, MgF, Ti0 ⁇ and Si0 2 are materials that have been found effective. The thickness of each layer is but a fraction of the wavelength of the visible portion of the spectrum.
- the AR layer on the back side may require two equally thin layers of TiO ⁇ and Si0 2 . Deposition by electron beam evaporation at room temperature may be used for applying these layers.
- the electrical conducting grid pattern on the upper surface of the cell of Fig. 4 may consist of the usual parallel conductors applied by conventional photolithographic techniques. Pt/Au and Au/Ge/Ni/Au layers that are electron beam evaporated and appropriately heat treated to make p and n ohmic contacts on the front and back sides, respectively, may be used.
- the back electrode may be made with fewer conductors and larger spacings between conductors.
- the electrical conductors on the base surface may be omitted in cases where cell areas are small.
- Figs. 6 and 7 diagrammatically illustrate the lower cell which is preferably made of GaSb.
- the GaSb solar cell included the use of an AlGaSb window layer. Fabrication was by a liquid- phase epitaxy method.
- the photovoltaic GaSb cell used in the tandem cell of the present invention does not employ the AlGaSb window layer in a preferred form, but instead advantageously may use an n-type GaSb wafer with a p-dopant, such as zinc, that is added by a less costly diffusion process.
- the cell shown in Fig. 7 has a metallized base 44 which may be connected to the terminal 26 of Fig. 2.
- the bus conductor layer 46 is an upper metallized surface which may be connected to the terminal 24 of Fig. 2.
- Two important aspects are that only the grid lines 48 are in contact with the semiconductor at the zinc diffused region designated P GaSb in Fig. 8 and the bus conductor layer 46 must be isolated from the GaSb semiconductor substrate. Because the process is essentially planar, the front side metallization is on an insulation mask 50 of an insulative material such as silicon nitride.
- the anti-reflective coating 52 is important in achieving efficient energy conversion but is not essential to operability of the solar cell.
- the process for fabrication of the GaSb booster cell is generally applicable to III-V diffused junction photovoltaic cells.
- the reference to the specific gallium antimonide material is therefore to be construed as illustrative and not limiting. The process will be described with reference to Figs. 8A-8E.
- substrate 61 is composed of a III-V compound semiconductor material single crystal.
- n-type substrate with a room temperature carrier concentration of approximately 10 17 atoms/cm 3 is preferred and results in good device performance without a surface passivation layer.
- the surface of the n-type GaSb converts to p-type to an extent that degrades device performance.
- the GaSb wafer may be doped with Te to 4xl0 17 /cm 3 .
- Zinc is a preferred dopant material.
- Insulative layer 62 is then formed as a coating on the upper surface of substrate 61.
- Insulative layer 62 is preferably a two-layer coating of silicon nitride/silicon oxynitride. This two-layer system has been used in fabricating gallium arsenide lasers, and has been discovered here to be also effective for use in the method of the present invention.
- the first layer comprising silicon nitride is utilized to minimize any oxygen contact with substrate 61.
- the second layer comprising silicon oxynitride is much more stable and holds up to the high temperature excursion of a subsequent diffusion step.
- the two-layer insulating layer may be deposited using plasma chemical vapor deposition.
- the first layer of silicon nitride may be about 0.01 microns thick and the second layer of silicon oxynitride approximately 0.1 microns to perform effectively. Insulating layer 62 may also be applied by sputtering.
- Insulating layer 62 is next treated to form opening 63 exposing a portion of substrate 61 as by using standard photolithography techniques.
- a layer of photoresist may be deposited in a patterned form on the insulating layer 62. Thereafter the photoresist is developed to remove the insulating layer 62 at the opening 63.
- a p-type dopant material, such as zinc, is then diffused into the exposed surface of substrate 61 to serve as a conductivity type modifier and form a p/n junction and p-type emitter 64.
- the diffusion step may be accomplished using a quasi-closed graphite box, not shown, in a conventional manner.
- the box has an elemental zinc source and an elemental antimony source.
- the elemental Sb source is provided to build up the antimony pressure in the diffusion chamber to prevent portions of the antimony in substrate 61 from exiting substrate 61.
- the elemental Zn provides a source of p-type dopant atoms which diffuse through opening 63 into the lattice of substrate 61.
- the concentration versus depth into substrate 61 of the Zn dopant atoms is a function of time and temperature.
- the diffusion step preferably creates an emitter doped in the mid-10 20 /cm 3 range to a depth of approximately 0.5 micrometers (microns) .
- an unwanted zinc diffused region 65 forms on the back side of the substrate 61 as illustrated in Fig. 9A.
- a protective photoresist layer 66 is deposited on the surface of substrate 61 to form a patterned insulating layer 62 as shown in Fig. 9B.
- the back side or lower surface of substrate 61 is thereafter non-selectively etched to remove unwanted zinc that has diffused into region 65.
- Protective photoresist layer 66 is removed and a back side metallization contact layer 67 is formed.
- Metallization contact layer 67 must have low electrical resistance, be adherent to the lower surface of substrate 61 and meet the qualifications for use in space or terrestrial applications.
- a typical example may comprise three layers of metal: a layer of titanium (Ti) 68, a layer of palladium (Pd) 69, and a layer of gold (Au) 70. Platinum (Pt) would also be an acceptable alternative to palladium 69.
- Gold 70 is used because of its good electrical properties.
- Palladium 69 is used as a gold diffusion barrier to make contact between titanium 68 and gold 20 and to prevent gold 20 from diffusing into titanium 68 or substrate 61, FIG. 9B.
- the back side metal layers may be alloyed in a furnace.
- Top metal 71 consists of a grid portion of parallel lines 71A of conductive material and a bus portion 71B of conductive material.
- Top metal 71 may comprise a layer of Pt and a layer of Au.
- Top metal 71 is formed using standard metal liftoff techniques. In actual processing, the thickness of metal layer 71 may be approximately 0.3 microns. Only the grid lines touch the junction region. The bus pad is deposited only on the patterned insulative material and is isolated from the n-type semiconductor substrate.
- a front side etch is then performed to reduce the emitter thickness. This is illustrated in Fig. 8D but the drawing is not to scale. It should be noted that while the front side etch is not necessary, it has been found that with removal of emitter material to provide a recess between grid lines 71A beneficial results are obtained. For example, if the depth of the recess is sufficient so that the emitter material thickness is reduced from about 0.5 micrometers to about 0.1 micrometers, the device short circuit current rises by a factor of about 2.
- An anti-reflective coating 22 may be deposited as a coating over the emitter between the grid lines 71A as illustrated in Fig. 8E.
- Fig. 8E like Fig. 8D, is diagrammatic and not to scale.
- Anti-reflective coating 22 may comprise a single layer or double layers and is often deposited using a vacuum deposition process as discussed in conjunction with the upper GaAs layer fabrication. It should be apparent to those skilled in the art that anti-reflective coating 22 should be tailored specifically for a spectral region of interest for booster cell.
- One preferred embodiment of anti-reflective coating 22 is tantalum pentoxide (Ta 2 0 5 ) having a thickness of approximately 0.15 microns which was found to raise the short circuit current by another 1.5 times.
- a prismatic cover-glass 74 which optically eliminates grid line obscuration losses for concentrator cells is shown in Fig. 2, and on an enlarged scale in Fig. 9.
- Incoming light rays 76 that otherwise might hit parallel grid lines 78 are simply bent slightly toward active cell areas 80 as they enter the thin molded cover 74 which may have the form of a cylindrical lens and be made of a synthetic resin material.
- Fig. 9 shows the cover-glass 74 as it is applied by an adhesive 82 to both of the GaAS and GaSb cells to boost the light generated currents and efficiencies of both cells 14,16.
- the observed gain in the GaAs cell current is near 10%. Since the GaSb cell in the Fig. 2 configuration is shaded by both the GaSb grid lines and the GaAs cell grid lines, the current increase for the GaSb cell is more than 10%.
- the two cells are preferably mounted with their respective grid lines perpendicular to each other.
- the two sets of cylindrical lenses in the two prismatic covers are cross linear and such an arrangement contributes to the high energy conversion levels that have been obtained.
- Fig. 10 shows performance data for an individual GaSb cell with a cover 74 as described in connection with Fig. 9 and broadband anti-reflective coatings as described above and tested behind a GaAs radiation filter.
- the cell has an illuminated current versus voltage as illustrated and fill factor of 71.3%.
- the open circuit voltage is 480mV.
- the illuminated short circuit current density is 2702 mA/cm 2 .
- Boost efficiencies are 8.2% for space application where air mass effects are 0 (AMO) and 9.3% where air mass density is 1.5 directed (AM 1.5D). Concentrated light intensities of near 100 suns equivalent were used.
- Fig. 11 shows similar data for an individual GaAs cell with a prismatic cover 74 as described in connection with Fig. 10 and anti-reflective coatings as described above.
- the curve shows illuminated current versus voltage.
- the open circuit voltage is llOmV and the fill factor is 0.85.
- the illuminated short circuit current density is 3472 mA/cm 2 .
- Energy conversion efficiencies are 24.1% (AMO) and 28.9% (AM 1.5D) at a light concentration near 100 suns equivalent.
Abstract
A photovoltaic cell array (11) involving rows and columns of tandem or stacked solar cell units (10) composed of GaAs/GaSb associated with a radiation collector (12) has produced measured energy conversion efficiencies of 31 % AMO. The booster GaSb cell is manufactured by a process which produces a p-type diffusion region within an n-type substrate, has improved energy conversion efficiencies and can be mounted as part of a four terminal stacked solar cell unit.
Description
TANDEM PHOTOVOLTAIC SOLAR CELL WITH III-V DIFFUSED JUNCTION BOOSTER CELL
This invention relates to mechanically stacked, tandem photovoltaic solar cells which convert incident sunlight to electric power preferably with high energy conversion efficiencies, and more particularly to a novel III- V diffused booster cell, its method of fabrication and the tandem interconnection with an improved transparent upper photovoltaic cell. BACKGROUND
Several different types and methods of producing solar cells are known in the industry. An ongoing objective of solar cell manufacturers is to improve the conversion efficiencies of the solar cells in a cost effective manner. More recently, higher energy conversion efficiencies have been obtained with mechanically stacked multi-junction solar cells. This mechanical stacking generally consists of stacking a top cell that absorbs higher frequency light (i.e., a high bandgap cell) on a booster cell which will absorb the lower frequency light that passes through the top cell (i.e., a low bandgap cell) . See Fraas, "Current Topics In Photovoltaics", p. 169, Academic Press (1985) Partain et al, "26.1% Solar Cell Efficiency For Ge Mechanically Stacked Under GaAs", 62 J. Appl. Phys., p. 3010 (1987). One example of a lower band gap booster cell is germanium (Ge) . See Partain, supra. Another example of a lower band gap booster is gallium antimonide (GaSb). See Fraas et al., "GaSb Films Grown By Vacuum Chemical Epitaxy Using Triethyl Antimony And Triethyl Gallium Source", 61 J. Appl. Phys., p. 2861 (1987). Theoretical projections of the performance of a GaAs on GaSb
mechanical stack have been reported, see Fraas et al., "Near- Term Higher Efficiencies With Mechanically Stacked Two-Color Solar Batteries", 19 Solar Cells p. 73 (1986-87), but no high performance booster cells have previously been fabricated. Copper Indium Diselenide is another booster cell for GaAs. See U.S. Patent Nos. 4,680,422 and 4,795,501.
In McLeod, etal., U.S. Patent No. 4,776,893, it was presumed that a passivation window of aluminum gallium antimonide (AlGaSb) would be required for the bottom cell. Forming such a passivation window would necessitate the use of a costly, low throughput epitaxial processing to produce the GaSb cells.
GaSb photodiodes fabricated by zinc diffusion from a zinc-silica spin on film is described by W. Schmidt auf. Altenstadt and C. Heinz in Physics 129B, p. 497, 1985. The zinc concentrations obtained by that process were too low for solar cells.
SUMMARY OF THE INVENTION
According to one aspect of the invention, there is provided a method for improving the energy conversion efficiency of a GaAs/GaSb tandem solar cell, comprising the step of using a diffused junction GaSb cell.
According to another aspect of the invention, there is provided a GaAs/GaSb tandem solar cell having improved conversion efficiency, comprising: a GaAs upper cell having predetermined bandgap selected for optimal performance of the tandem solar cell; a GaSb booster cell positioned beneath the GaAs upper cell to receive light transmitted through the GaAs upper cell and responsive to such light; and light conditioning means associated with the upper cell and booster cell for achieving an energy conversion efficiency of at least 31% AMO.
According to a further aspect of the invention, there is provided a solar cell array comprising: a solar energy collector; a plurality of solar cell units positioned with respect to one another and with respect to a solar energy collector; a first group of cells made of GaAs and a second group of cells made of GaSb that are each mechanically stacked relative to and physically separate from a corresponding one of the GaAs cells of the first group; the GaAs cells having on an upper surface nearest the collector a multiple layer of different materials to form an upper anti-reflective coating that passes solar energy having wavelengths longer than wavelengths of energy absorbed by GaAs in addition to one layer that also serves to reflect free electrons toward a p-n junction in the GaAs cell; parallel conductors on the upper surface of the GaAs cells which are connected to a first cell terminal; electrical contact means on the lower surface of the GaAs cells which are connected to a second cell terminal; the GaSb cells having a p-type diffusion layer and a radiation receiving area, the radiation receiving area having parallel conductors on an upper surface contacting the diffusion layer in each GaSb cell, the parallel conductors being connected to a third cell terminal that is electrically isolated from the second cell terminal; the GaSb cells having a metallized lower surface connected to a fourth cell terminal. According to yet a another aspect of the invention, there is provided a method for producing a III-V booster solar cell comprising the steps of: diffusing a conductivity type modifier into a first surface of a III-V semiconductor substrate of a predetermined conductivity type to form a diffused area portion; forming a bottom metal contact layer on a second surface of the substrate; forming a grid of conductive material on the first surface of the substrate overlying the diffused area portion; forming a bus conductor on a second portion of the area on the first surface of the
substrate which is connected to the grid; etching the diffused area portion substrate by an amount sufficient to increase short circuit current; and depositing a layer of anti- reflective material on the etched diffused area portion. The present invention preferably provides a novel solar cell that may overcome the above deficiencies. When located at the focus of a sunlight concentrating lens, the best of the prior art GaAs satellite solar cells, where air mass effects are 0, i.e. AMO, convert about 22% (AMO) of the incident sunlight to electric power. By the invention disclosed herein, this conversion efficiency may be increased to about 31% (AMO, 100 suns D) which is a new world record conversion efficiency for a satellite photovoltaic device. The improved result may come from a number of refinements constituting light conditioning means which may include modifying the upper or front GaAs cell of the tandem unit to be transparent to energy having a longer wavelength than the wavelength to which GaAs is responsive, use of multiple layers of anti-reflective coatings, placing a novel infrared- sensitive GaSb booster cell that has a band gap of about 0.72 eV behind the GaAs cell, and attaching a prism or prismatic coverglass that is aligned with cell grid lines of each cell or at least the GaAs cell, to deflect incident light rays into active cell area. The invention may also provide a method for improving the energy conversion efficiency of a GaAs/GaSb tandem solar cell by using a diffused junction GaSb cell which does not have an upper, passivating, epitaxial overcoat in a tandem concentrator configuration. Preferably, the present invention provides a novel cell production method that is scaleable for efficient large volume production for GaSb cells, certain aspects of which are applicable to other III-V solar cells and to provide cells produced by that method.
Yet another feature of the invention may be the provision of a photovoltaic GaSb cell which does not require a passivation layer, but instead uses a p-dopant such as zinc, the thickness of the layer being reduced in active areas between grid lines to nearly double the short circuit current.
The invention may further provide a novel solar cell array composed of a solar collecting lens and multiple wafer type cells that are mechanically stacked with the upper cell being transparent to pass infrared energy to the lower cell. The mounting of the tandem cells and the current collecting and voltage matching arrangements may provide a two-terminal device which may be used also in terrestrial applications where a world record conversion efficiency of about 34-37% has been measured AM 1.5D (lOOsuns) . The preferred embodiment of the present invention may utilize a III-V compound semiconductor material, such as gallium antimonide (GaSb) , as a substrate for the booster cell. Into a windowed portion of the n-type substrate surface a p-type doping material, such as zinc, is diffused. A passivating layer for GaSb, previously thought to be essential, is not used. A grid in the form of parallel lines of conductive material that are in direct contact with the p- type material in the diffused region of the semiconductor is connected to the front side metallization bus which is on an insulative mask of a suitable material such as silicon nitride. A metal contact is also formed on the back side of the substrate. Prior to coating with an anti-reflective material, the diffused area is etched back to reduce the emitter depth so that the short circuit current will be increased.
According to a preferred method of fabricating the GaSb cell, the n-type semiconductor material may receive a patterned layer of insulative material containing an opening through which a p-type dopant is diffused. A grid of
conductive material is thereafter formed on the diffused area and a bus is placed on the layer of insulative material to contact the grid, but not the semiconductor material. A metallized surface is formed on the opposite side of the semiconductor material. Non-metallized areas of the diffused portions are etched to increase the short circuit current and anti-reflective layers are applied to the etched areas to further increase the short circuit current.
BRIEF DESCRIPTION OF DRAWINGS
Fig. 1 is a pictorial view of a multi-cell solar energy array embodying a preferred embodiment of the present invention;
Fig. 2 is a diagrammatic view of a single cell of the array of Fig. 1; Fig. 3 is a view of a circuit ribbon that may be used for connecting the four terminals of a tandem cell unit to provide a two-terminal device;
Fig. 4 is an elevation in cross section of the upper cell of a tandem cell unit; Fig. 5 is a curve showing the optical transparency properties of a gallium arsenide photovoltaic cell as shown in
Fig. 4;
Fig. 6 is a top view of the lower cell of a tandem cell unit; Fig. 7 is an elevation in cross section of the lower cell taken along lines 7-7 of Fig. 6;
Fig. 8A-8E are process flow diagrams outlining the novel process for fabricating a III-V booster solar cell in accord with one feature of the present invention; Fig. 9 is an elevation to a large scale showing a prismatic lens which optically eliminates grid line obscuration losses for the solar cells;
Fig. 10 is a curve showing current vs. voltage for an illuminated GaSb cell; and
Fig. 11 is a curve showing current vs. voltage for an illuminated GaAs cell.
DESCRIPTION OF PREFERRED EMBODIMENTS
Referring to Fig. 1, the sunlight concentrating photovoltaic array of the present invention is illustrated by an arrangement of nine solar cell units 10 in a housing 11 which includes also a concentrating lens 12 which has nine focal regions, one for each cell. Each of the solar cell units 10 is substantially equidistant from its respective concentrating lens 12.
Each solar cell unit 10 may be of a type illustrated in Fig. 2, and positioned in optical alignment with its portion of the concentrating lens. The cell unit 10 is shown to be formed of two cells, one being an upper cell 14 and the other being a lower cell 16. The cells 14,16 are mechanically separate so that during manufacture, an upper cell 14 may be selected for use with one of a group of lower cells 16. The cells 14,16 may have an active surface area of 0.049 cm2, although it should be understood that areas of other sizes are also useful. The upper cell 14 is ideally transparent to the radiation to which the lower cell has sensitivity.
The cells 14,16 may be separated by a space which allows separate electrical terminals to be provided for the lower surface of the upper cell 14 and the upper surface of the lower cell 16. The cells 14,16 may be mounted over holes in a ceramic-double sided printed wiring card 18 which is supported at an index position on the housing 11 thereby to serve as part of the array structure. The upper cells 14 are mounted on the front side of card 18 and the lower cells 16 of the tandem arrangement are mounted on the back side of the
same card 18 to be an optical alignment with its associated upper cell. Other mounting arrangements for the cells may be used.
As illustrated in Fig. 2, the upper cell may have two terminals 20, 22 and the lower cell may have two terminals 24,26. The terminal 22 may be connected with printed circuit wiring on the front side of card 18 while the terminal 24 is connected with an electrically separate printed circuit wiring on the back side of card 18. Card 18 may be a sapphire layer that serves also as a heat sink or spreader. A1203 and A1N materials are suitable as a support between the upper and lower cells, because they have electrical insulating and thermal conducting properties.
An alternative interconnect between adjacent cells for terrestrial installations may be provided by a flex circuit ribbon 29 as shown in Figure 3 which comprises electrical conductors on a suitable synthetic resin material. Three elongated flexible strips 30,31,32 of conductive material extend along the length of ribbon 29. The strip 30 is formed with a flap 34 that may engage the metallized surface that is on the upper surface of upper cell 14. The strip 32 is formed with a flap 40 that serves as an electrical connection to the lower surface of the upper cell 14. The strip 31 is connected electrically to the upper and lower surfaces of the lower cell 16 so that all three lower cells 16 are connected electrically in series. The upper cells are connected electrically in parallel. Where the upper cell open circuit voltage is approximately three times the open circuit voltage of the lower cell, this series and parallel connection system allows the cells to be connected together to give a two terminal device. It may be noted from Figures 10 and 11 that a GaAs cell has a maximum power voltage of 971mV which is slightly less than the maximum power voltage for three series
connected GaSb cells where each has a corresponding voltage of 380mV.
GaAs Cell Conventional GaAs cells must be made transparent to achieve the highest conversion efficiency in a tandem or stacked cell application. Several methods of forming GaAs photovoltaic cells are known in the art as explained in the McLeod et al U.S. Patent 4,776,893. Further recent developments are reported in an article "Tertiary Butyl Arsine Grown GaAs Solar Cell", by Sundaram et al, Appl. Phys. lett. 54 (7), February 13, 1989, where growing p- and n-doped GaAs layers and p-AlGaAs layers for use as a concentrator solar cell structure is described. See also Fan et al, U.S. Patent No. 4,547,622. Three modifications to such GaAs cells are made when used with GaSb lower cells to optimize the conversion efficiency. First, the conventional continuous back metallization should be replaced with a gridded metallization. The back grid should use fewer grid lines than the front grid because the thicker wafer conductivity is much higher than the thinner emitter conductivity. The shading from the back grid can thereby be negligible. In small cells, the back grid may be omitted entirely.
Second, the wafer n-dopant density of the GaAs material should be reduced from lxlO18 cm*3 to about lxlO17 cm"3 to reduce free electron absorption.
Third, the anti-reflective (AR) coatings on the front and back of the GaAs cell are modified in order to provide minimal reflection across a broader bandwidth to assure passage of longer wavelength energy to which the GaSb cells are responsive.
The presently preferred transparent GaAs cell design incorporates a 450 micrometer (micron) thick n-type wafer
doped to about lxlO17 cm"3 with complete photovoltaic epitaxial structure grown on it including an AlGaAs window layer. A three layer AR coating on the front surface in addition to the AlGaAs window layer serves as the front side AR coating and a two layer AR coating has been applied to the back side in some embodiments. Important design parameters include the thickness and refractive index of each layer including the AlGaAs which functions not only as an electronic heteroface but also as one of the front AR layers. This multi-layer optical system produces a very broadband reflectance minimization through the visible energy range on out beyond the GaSb band edge at 1700 nm as illustrated in Figure 5.
The GaAs cells and the GaSb cells may be of the same size. The chip size may be 3mm x 5mm and the cell active area diameter may be 2.5mm. Nineteen grid lines traverse the front active area of each such cell. The grid density is similar to that used with a GaAs cell designed for 2Ox sunlight concentration. For an n-type GaAs wafer doping density of lxlO17 cm"3 and for a 20x sunlight concentration, it appears that no grid lines are required on the back side of the GaAs cell.
Fig. 4 shows a cross section of one preferred GaAs solar cell that is adapted for use as part of the present invention. The solar energy along line 42 is directed toward the GaAs cell with a part being reflected along line R and a part being transmitted along line T. With anti-reflective coating layers AR on both the front and back sides of the GaAs cell, the relative transmittance and reflectance can be made to have values indicated by Fig. 5. The upper AR layer includes the AlGaAs layer which may specifically be Al05Ga05As and about 0.05 microns thick. Three additional layers have been found effective to enhance the anti-reflective properties. Materials such as Ta205, MgO, MgF, Ti0χ and Si02 are materials that have been found
effective. The thickness of each layer is but a fraction of the wavelength of the visible portion of the spectrum.
For optimum anti-reflective properties, the AR layer on the back side may require two equally thin layers of TiOχ and Si02. Deposition by electron beam evaporation at room temperature may be used for applying these layers.
The electrical conducting grid pattern on the upper surface of the cell of Fig. 4 may consist of the usual parallel conductors applied by conventional photolithographic techniques. Pt/Au and Au/Ge/Ni/Au layers that are electron beam evaporated and appropriately heat treated to make p and n ohmic contacts on the front and back sides, respectively, may be used.
Because electrical conductivity of the n-type GaAs material is good, the back electrode may be made with fewer conductors and larger spacings between conductors. To provide maximum transparency properties to the upper GaAs cell, the electrical conductors on the base surface may be omitted in cases where cell areas are small.
GaSb Cell
Figs. 6 and 7 diagrammatically illustrate the lower cell which is preferably made of GaSb. In the prior art McLeod U.S. Patent 4,776,893, the GaSb solar cell included the use of an AlGaSb window layer. Fabrication was by a liquid- phase epitaxy method. The photovoltaic GaSb cell used in the tandem cell of the present invention does not employ the AlGaSb window layer in a preferred form, but instead advantageously may use an n-type GaSb wafer with a p-dopant, such as zinc, that is added by a less costly diffusion process.
The cell shown in Fig. 7, has a metallized base 44 which may be connected to the terminal 26 of Fig. 2.
The bus conductor layer 46 is an upper metallized surface which may be connected to the terminal 24 of Fig. 2. Two important aspects are that only the grid lines 48 are in contact with the semiconductor at the zinc diffused region designated P GaSb in Fig. 8 and the bus conductor layer 46 must be isolated from the GaSb semiconductor substrate. Because the process is essentially planar, the front side metallization is on an insulation mask 50 of an insulative material such as silicon nitride. The anti-reflective coating 52 is important in achieving efficient energy conversion but is not essential to operability of the solar cell.
The process for fabrication of the GaSb booster cell is generally applicable to III-V diffused junction photovoltaic cells. The reference to the specific gallium antimonide material is therefore to be construed as illustrative and not limiting. The process will be described with reference to Figs. 8A-8E.
Preferably, substrate 61 is composed of a III-V compound semiconductor material single crystal. The use of an n-type substrate with a room temperature carrier concentration of approximately 1017 atoms/cm3 is preferred and results in good device performance without a surface passivation layer. At lower doping levels, the surface of the n-type GaSb converts to p-type to an extent that degrades device performance. At higher doping levels excessive tunneling through a junction degrades device performance. In one embodiment, the GaSb wafer may be doped with Te to 4xl017/cm3. Zinc is a preferred dopant material.
An insulating layer 62 is then formed as a coating on the upper surface of substrate 61. Insulative layer 62 is preferably a two-layer coating of silicon nitride/silicon oxynitride. This two-layer system has been used in fabricating gallium arsenide lasers, and has been discovered here to be also effective for use in the method of the present
invention. The first layer comprising silicon nitride is utilized to minimize any oxygen contact with substrate 61. The second layer comprising silicon oxynitride is much more stable and holds up to the high temperature excursion of a subsequent diffusion step. The two-layer insulating layer may be deposited using plasma chemical vapor deposition. The first layer of silicon nitride may be about 0.01 microns thick and the second layer of silicon oxynitride approximately 0.1 microns to perform effectively. Insulating layer 62 may also be applied by sputtering.
Insulating layer 62 is next treated to form opening 63 exposing a portion of substrate 61 as by using standard photolithography techniques. Thus, a layer of photoresist may be deposited in a patterned form on the insulating layer 62. Thereafter the photoresist is developed to remove the insulating layer 62 at the opening 63. A p-type dopant material, such as zinc, is then diffused into the exposed surface of substrate 61 to serve as a conductivity type modifier and form a p/n junction and p-type emitter 64. The diffusion step may be accomplished using a quasi-closed graphite box, not shown, in a conventional manner. The box has an elemental zinc source and an elemental antimony source. The elemental Sb source is provided to build up the antimony pressure in the diffusion chamber to prevent portions of the antimony in substrate 61 from exiting substrate 61. The elemental Zn provides a source of p-type dopant atoms which diffuse through opening 63 into the lattice of substrate 61. The concentration versus depth into substrate 61 of the Zn dopant atoms is a function of time and temperature. The diffusion step preferably creates an emitter doped in the mid-1020/cm3 range to a depth of approximately 0.5 micrometers (microns) . During the diffusion process, an unwanted zinc diffused region 65 forms on the back side of the substrate 61 as illustrated in Fig. 9A.
Following the diffusion step, a protective photoresist layer 66 is deposited on the surface of substrate 61 to form a patterned insulating layer 62 as shown in Fig. 9B. The back side or lower surface of substrate 61 is thereafter non-selectively etched to remove unwanted zinc that has diffused into region 65. Protective photoresist layer 66 is removed and a back side metallization contact layer 67 is formed.
Metallization contact layer 67 must have low electrical resistance, be adherent to the lower surface of substrate 61 and meet the qualifications for use in space or terrestrial applications. A typical example may comprise three layers of metal: a layer of titanium (Ti) 68, a layer of palladium (Pd) 69, and a layer of gold (Au) 70. Platinum (Pt) would also be an acceptable alternative to palladium 69. Gold 70 is used because of its good electrical properties. Palladium 69 is used as a gold diffusion barrier to make contact between titanium 68 and gold 20 and to prevent gold 20 from diffusing into titanium 68 or substrate 61, FIG. 9B. The back side metal layers may be alloyed in a furnace.
A second photolithographic step is used to form the grid pattern for a top metal 71. Top metal 71 consists of a grid portion of parallel lines 71A of conductive material and a bus portion 71B of conductive material. Top metal 71 may comprise a layer of Pt and a layer of Au. Top metal 71 is formed using standard metal liftoff techniques. In actual processing, the thickness of metal layer 71 may be approximately 0.3 microns. Only the grid lines touch the junction region. The bus pad is deposited only on the patterned insulative material and is isolated from the n-type semiconductor substrate.
A front side etch is then performed to reduce the emitter thickness. This is illustrated in Fig. 8D but the drawing is not to scale. It should be noted that while the
front side etch is not necessary, it has been found that with removal of emitter material to provide a recess between grid lines 71A beneficial results are obtained. For example, if the depth of the recess is sufficient so that the emitter material thickness is reduced from about 0.5 micrometers to about 0.1 micrometers, the device short circuit current rises by a factor of about 2.
An anti-reflective coating 22 may be deposited as a coating over the emitter between the grid lines 71A as illustrated in Fig. 8E. Fig. 8E, like Fig. 8D, is diagrammatic and not to scale. Anti-reflective coating 22 may comprise a single layer or double layers and is often deposited using a vacuum deposition process as discussed in conjunction with the upper GaAs layer fabrication. It should be apparent to those skilled in the art that anti-reflective coating 22 should be tailored specifically for a spectral region of interest for booster cell. One preferred embodiment of anti-reflective coating 22 is tantalum pentoxide (Ta205) having a thickness of approximately 0.15 microns which was found to raise the short circuit current by another 1.5 times.
A prismatic cover-glass 74 which optically eliminates grid line obscuration losses for concentrator cells is shown in Fig. 2, and on an enlarged scale in Fig. 9. Incoming light rays 76 that otherwise might hit parallel grid lines 78 are simply bent slightly toward active cell areas 80 as they enter the thin molded cover 74 which may have the form of a cylindrical lens and be made of a synthetic resin material.
Fig. 9 shows the cover-glass 74 as it is applied by an adhesive 82 to both of the GaAS and GaSb cells to boost the light generated currents and efficiencies of both cells 14,16. The observed gain in the GaAs cell current is near 10%. Since the GaSb cell in the Fig. 2 configuration is shaded by both the GaSb grid lines and the GaAs cell grid lines, the current
increase for the GaSb cell is more than 10%. For assembled GaAs/GaSb tandem stacks the two cells are preferably mounted with their respective grid lines perpendicular to each other. The two sets of cylindrical lenses in the two prismatic covers are cross linear and such an arrangement contributes to the high energy conversion levels that have been obtained.
Fig. 10 shows performance data for an individual GaSb cell with a cover 74 as described in connection with Fig. 9 and broadband anti-reflective coatings as described above and tested behind a GaAs radiation filter. The cell has an illuminated current versus voltage as illustrated and fill factor of 71.3%. The open circuit voltage is 480mV. The illuminated short circuit current density is 2702 mA/cm2. Boost efficiencies are 8.2% for space application where air mass effects are 0 (AMO) and 9.3% where air mass density is 1.5 directed (AM 1.5D). Concentrated light intensities of near 100 suns equivalent were used.
Fig. 11 shows similar data for an individual GaAs cell with a prismatic cover 74 as described in connection with Fig. 10 and anti-reflective coatings as described above. The curve shows illuminated current versus voltage. The open circuit voltage is llOmV and the fill factor is 0.85. The illuminated short circuit current density is 3472 mA/cm2. Energy conversion efficiencies are 24.1% (AMO) and 28.9% (AM 1.5D) at a light concentration near 100 suns equivalent.
Theoretical tandem cell stack efficiencies sum to 9.3% + 28.9% = 38.2 at AM 1.5D. This conversion efficiency translates to 8.2% + 24.1% = 32.3% for space (AMO). Several tandem cell stacks actually have been fabricated with AMO energy conversion efficiencies of at least 31% and with AM
1.5D energy conversion efficiencies of between 34% and 37%.
The higher efficiencies are achieved with the best cells used.
While preferred embodiments have been shown and described, those skilled in the art will readily recognize
alterations, variations, or modifications that might be made to the particular embodiments that have been described without departing from the inventive concept. This description and the drawings are intended to illustrate the invention (and its preferred embodiments) , and are not meant to limit the invention.
Claims
1. A method for improving the energy conversion efficiency of a GaAs/GaSb tandem solar cell, comprising the step of using a diffused junction GaSb cell.
2. A method for improving the energy conversion efficiency of a GaaS/GaSb tandem solar cell, comprising the step of eliminating an upper, passivating, epitaxial overcoat from the GaSb cell.
3. The method of claim 2, wherein the GaSb cell is a diffused junction cell.
4. The product of the method of claim 1.
5. The product of the method of claim 2.
6. The product of the method of claim 3.
7. A solar concentrator module comprising: (a) the product of claim 6; and
(b) a solar concentrating means for focusing and concentrating incident light upon the product.
8. A GaAs/GaSb tandem solar cell having improved conversion efficiency, comprising: (a) a GaAs upper cell having predetermined bandgap selected for optimal performance of the tandem solar cell;
(b) a GaSb booster cell positioned beneath the GaAs upper cell to receive light transmitted through the GaAs upper cell and responsive to such light; and
(c) light conditioning means associated with the upper cell and booster cell for achieving an energy conversion efficiency of at least 31% AMO.
9. The cell as defined in claim 8, wherein the light conditioning means includes a prismatic coverglass for optically eliminating grid line obscuration losses on at least said upper cell and a concentrating lens for focusing solar energy onto an upper surface of said upper cell.
10. The cell as defined in claim 9, further having multiple layers of anti-reflective materials on each of opposite surfaces of said upper cell.
11. A tandem solar cell unit for efficient conversion of solar energy into electrical energy comprising: an upper solar cell that is transparent to radiation energy at a wavelength longer than the wavelength to which said upper cell is sensitive, said upper cell having parallel grid lines of conductive material on an upper surface thereof; a lower solar cell sensitive to said longer wavelength energy mounted in optical alignment with said upper cell to receive said longer wavelength energy, said lower cell having parallel grid lines of conductive material on an upper surface thereof; multiple anti-reflective layers of difference materials on an upper surface of said upper cell; multiple anti-reflective layers of different materials positioned between the upper and lower cells; and means for optically eliminating grid line obscuration losses on at least said upper cell.
12. The solar cell unit as defined in claim 11, wherein the lower cell is made of GaSb semiconductor material
with an n-type conductivity having said upper surface coated with an insulating layer which has an aperture that serves as a mask opening for diffusion of a p-type emitter dopant into said semiconductor under the aperture but not under the insulating layer; and said upper surface has a bus conductor overlying said insulative layer and electrically connected to said grid lines which extend across a dopant layer surface so that the bus conductor is electrically isolated from said semiconductor.
13. The solar cell unit as defined in claim 12, wherein the diffused p-type dopant forms a doped layer has a depth of approximately 0.5 micrometers, the grid lines are deposited on a surface of said doped layer and the doped layer between the grid lines is removed to provide an emitter depth sufficiently small to cause the short circuit current to rise.
14. The solar cell unit as defined in claim 13, wherein the doped layer between the grid lines contains an anti-reflective coating that is effective to further increase the short circuit current.
15. The solar cell unit as defined in claim 14, wherein the anti-reflective layer on the doped layer includes tantalum pentoxide.
16. The solar cell unit as defined in claim 11, wherein the upper cell is made of GaAs with an n-type dopant density to reduce free electron absorption, said upper cell having fewer grid lines on its lower surface than on the upper surface.
17. The solar cell unit as defined in claim 11, further comprising a solar concentrating means.
18. A solar cell array comprising: a solar energy collector; a plurality of solar cell units positioned with respect to one another and with respect to a solar energy collector; a first group of cells made of GaAs and a second group of cells made of GaSb that are each mechanically stacked relative to and physically separate from a corresponding one of the GaAs cells of the first group; said GaAs cells having on an upper surface nearest said collector a multiple layer of different materials to form an upper anti-reflective coating that passes solar energy having wavelengths longer than wavelengths of energy absorbed by GaAs in addition to one layer that also serves to reflect free electrons toward a p-n junction in said GaAs cell; parallel conductors on the upper surface of the GaAs cells which are connected to a first cell terminal; electrical contact means on the lower surface of the
GaAs cells which are connected to a second cell terminal; said GaSb cells having a p-type diffusion layer and a radiation receiving area, said radiation receiving area having parallel conductors on an upper surface contacting the diffusion layer in each GaSb cell, said parallel conductors being connected to a third cell terminal that is electrically isolated from said second cell terminal; and said GaSb cells having a metallized lower surface connected to a fourth cell terminal.
19. The array as defined in claim 18, wherein the
GaAs cell of each cell pair is in optical alignment with the GaSb cell of the same cell pair and physically spaced so that
the facing lower surface of the GaAs cell is electrically isolated from the facing upper surface of the GaSb cell.
20. The array as defined in claim 19, wherein said plurality of cell pairs are arranged in rows and columns to be substantially equidistant from said collector, there being layers of different materials to form a second lower anti- reflective coating located between the stacked cells.
21. The array as defined in claim 20, wherein the physical space between the facing surfaces of the GaAs and GaSb cells is provided by a printed circuit board which has conductors on opposite sides that are connected to said second and third terminals.
22. The array as defined in claim 20, having a prismatic cell cover-glass associated with the upper cell which reduces obscuration losses due to said parallel conductors on the upper GaAs surface.
23. The array as defined in claim 22, wherein a second prismatic cell cover-glass is associated with the GaSb cell, said prismatic cell cover-glass being shaped and oriented to reduce obscuration losses of the parallel conductors on the upper GaSb surface.
24. The array as defined in claim 18, wherein the electrical contact means on the lower surface of the GaAs cells is free of electrically conductive material to provide maximum transparency to the wavelength spectrum to which the GaSb cell is responsive.
25. The array as defined in claim 24, furthe having on the lower surface of the GaAs cells layers o different materials to form a lower anti-reflective coating.
26. The array as defined in claim 18, furthe having on a lower surface of the GaAs cells that is remot from said solar energy collector layers of different material to form a lower anti-reflective coating.
27. A tandem solar cell unit that is adapted fo use with a solar energy collector and comprises: an upper solar cell that is transparent to radiation energy at a wavelength longer than the wavelength to which said upper cell is sensitive and a lower solar cell comprising a diffused junction GaSb layer substrate, said cells being in optical alignment so that substantially all radiation energy that passes through the upper cell is received by the lower cell; means to enhance anti-reflective properties for the wavelengths of energy to which both solar cells are responsive including a plurality of thin layers of different materials on an upper surface of said upper solar cell; said lower cell having a p-type diffusion layer free of any passivating layer; conductive material on an upper surface of each cell that is connected to first and second electrical terminals; the lower surface of the upper cell having electrical current conductive properties and being connected to a third terminal; and the lower surface of the lower cell having a metallized layer connected to a fourth terminal.
28. The solar cell as defined in claim 27, wherein the conductive material on the upper surface of the upper cell
is in the form of parallel conductors that are positioned to be between said upper cell upper surface and a prismatic cover-glass that is shaped to reduce obscuration losses due to said parallel conductors.
29. The solar cell as defined in claim 28, wherein the conductive material on the upper surface of the lower cell is in the form of parallel conductors that are between the p- type diffusion layer and a second prismatic cover-glass that is shaped to reduce obscuration losses due to the parallel conductors on said lower cell.
30. The solar cell as defined in claim 27, wherein the lower solar cell substrate upper surface contains a layer of electrical insulating material that has a central opening; said p-type diffusion layer on the upper substrate surface is within said opening; the 'conductive material on the lower solar cell substrate upper surface comprises a plurality of conductors on the diffusion layer and a bus portion that is on top of said insulating material layer, said bus portion providing an electrical current path between said parallel conductors on the diffusion layer and one of said different terminals.
31. The solar cell as defined in claim 30, wherein an upper surface portion of said diffusion layer that is located between said parallel conductors contains depressions formed by removal of an amount of said diffusion layer that is sufficient to increase the short circuit current of the lower solar cell.
32. The solar cell as defined in claim 31, further comprising an anti-reflective coating material is applied in said depressions between said parallel conductors that is
effective to increase further the short circuit current of the lower solar cell.
33. The solar cell as defined in claim 32, wherein the anti-reflective coating applied in said depressions comprises at least two layers of different materials which serve as the plurality of thin layers of different materials between the lower surface of said upper solar cell and the upper surface of the lower cell.
34. The solar cell as defined in claim 27, wherein the means to enhance anti-reflective properties include layers on the lower surface of the upper solar cell.
35. An array of tandem solar cell units in a housing comprising: rows and columns of discrete solar cell units including an upper cell having a first pair of terminals, a lower cell mounted in optical alignment with and beneath a corresponding upper cell, said lower cell having a second pair of terminals; a support member of electrically insulating thermally conducting material anchored to said housing and contacting the lower side of the upper cell and the upper side of the lower cell said support member having an aperture optically aligned with the said upper and lower cells for transmission of solar energy between the upper cell to the lower cell; electrical conductors carried by said support member which provide electrical current paths between the upper and lower surfaces of the upper and lower cells and said first and second pairs of terminals; solar energy concentrating elements associated with each solar cell unit; and
a first anti-reflective material on an upper surface of an upper cell and a second anti-reflective material between the lower surface of the upper cell and the upper surface of the lower cell.
36. The solar cell array as defined in claim 35, wherein the lower cell is a III-V n-type semiconductor which has: a layer of electrical insulating material that has a central opening on an upper surface of said lower cell; a p-type dopant material diffused in the upper surface through said central opening to form a diffusion layer; and conductive material on the cell upper surface which comprises a plurality of parallel conductors that are on the diffusion layer and a bus portion that is on top of said insulating material, said bus portion providing an electrical current path between said parallel conductors on the diffusion layer and one of said electrical conductors carried by said support member.
37. The solar cell array as defined in claim 36, wherein an upper surface portion of the diffusion layer that is located between said parallel conductors is removed to form surface depressions to increase short circuit current and an anti-reflective coating material is applied in said depressions between the parallel conductors.
38. The solar cell array in claim 37, further comprising a prismatic cover-glass which optically eliminates grid line obscuration losses having a lower surface that is adhered to the top surface of the lower solar cell.
39. The solar cell array as defined in claim 38, wherein the upper cell has an upper surface having conductive material in the form of parallel conductors that are positioned to be optically covered by a prismatic cover-glass, said cover-glass being shaped to reduce obscuration losses in said upper cell due to said parallel conductors.
40. A method for producing a III-V booster solar cell comprising the steps of: diffusing a conductivity type modifier into a first surface of a III-V semiconductor substrate of a predetermined conductivity type to form a diffused area portion; forming a bottom metal contact layer on a second surface of said substrate; forming a grid of conductive material on said first surface of said substrate overlying said diffused area portion; forming a bus conductor on a second portion of the area on said first surface of said substrate which is connected to said grid; etching said diffused area portion substrate by an amount sufficient to increase short circuit current; and depositing a layer of anti-reflective material on said etched diffused area portion.
41. The method of claim 40, additionally comprising the step of: patterning an insulating layer on said first surface of said substrate; and wherein said diffusing step occurs through said patterned insulating layer and said step of forming a bus conductor occurs on said first surface of said patterned insulating layer substrate overlying said insulator area of said substrate.
42. The method of claim 41, wherein said compound semiconductor material is gallium antimonide.
43. The method of claim 41, wherein said material comprises zinc.
44. The method of claim 40, wherein said step of forming a bottom metal comprises the steps of: depositing a protective material on said first surface of said substrate; etching said second surface of said substrate; removing said protective layer material; depositing a first metal layer on a second surface of said substrate; depositing a second metal layer on said first metal layer; depositing a third metal layer on said second metal layer; and alloying said metal layers.
45. The method of claim 40, where in said step of forming a grid comprises the steps of: depositing a layer of photoresist on said diffused area portion of said substrate; exposing preselected portions of said photoresist to define grid openings; developing said resist thereby forming openings therethrough exposing portions of said diffused area of said substrate; depositing a grid metal on said photoresist and in said openings defined therethrough; and removing said photoresist and said metal deposited thereon while leaving the metal on said diffused area.
46. The method of claim 40, wherein said step of forming said bus conductor comprises the steps of: providing an insulating layer on said first surface of said substrate; depositing a layer of photoresist on a said insulating layer; exposing a portion of said photoresist to define an opening therethrough; developing said exposed photoresist to form the openings and to expose as portion of said insulating layer; depositing a metal on said photoresist and in said opening in electrical contact with the grid; and removing said photoresist and said metal deposited thereon while leaving the metal on the insulating layer in electrical contact with the grid.
47. The method of claim 40, wherein the steps of forming said grid and said bus are performed in a single operation.
48. The product of the method of claim 40.
49. The product of the method of claim 43.
50. The product formed by the method of claim 45.
51. A method for producing a III-V booster solar cell comprising the steps of: providing a III-V substrate of a first conductivity type; depositing an insulating layer on a first surface of said substrate; depositing a layer of photoresist on said insulating layer;
developing said photoresist to form an opening therethrough and to expose a portion of said insulating layer; etching said exposed portion of said insulating layer to expose a portion of said substrate; diffusing a conductivity type modifier into said exposed portion of said substrate to form a diffused area; depositing a protective material on said diffused area; non-selectively etching a second surface of said substrate to remove any unwanted conductivity type modifier; depositing a contact metal layer on said second surface of said substrate; depositing a layer of photoresist on the first surface of said substrate; exposing said photoresist to define a grid opening and a bus opening therethrough; developing said photoresist to form openings therethrough which expose portions of said diffused and non- diffused areas of said substrate first surface; depositing a metal on said photoresist and in said openings defined therethrough; removing said photoresist and said metal deposited thereon; and etching non-metallized portions of said diffused area of said substrate by an amount sufficient to increase short circuit current of the cell.
52. The method of claim 51, wherein said substrate is gallium antimonide and said diffused material comprises zinc doped in a mid-1020/cm3 range to a depth of approximatel 0.5 micrometers.
53. The method of claim 52, wherein the depth o the etch in the diffused area is about 0.4 microns to for
recesses between the metallized portions, and the method further comprises depositing a layer of anti-reflective material in said recesses.
54. The method of claim 53, wherein said insulating layer comprises a silicon nitride layer and a silicon oxynitride layer.
55. A III-V booster solar cell comprising: a substrate having a first surface and a second surface; a zinc diffused region in said substrate surrounded by a non-diffused portion adjacent said first surface; a back metal contact layer adhered to said second surface of said substrate; first conductor means for providing electrical coupling to said zinc diffused region of said substrate, said first conductor means being disposed on a first portion of said zinc diffused region of said substrate; an insulator disposed on a non-diffused portion of said first surface; and second conductor means for providing electrical coupling to said first conductor means, said second conductor means being disposed on said insulator.
56. The solar cell of claim 55, wherein said first conductor means includes parallel strips of conductive material separated by recesses having depth sufficient to increase the short circuit current of said cell.
57. The solar cell of claim 55, wherein said first conductor means comprises a metal grid disposed on said first portion of said zinc diffused region of said substrate.
58. The solar cell of claim 55, further comprising recesses between said first conductor means and anti- reflective material in said recesses to increase the short circuit current of said cell.
59. The solar cell of claim 58, wherein said anti- reflective material comprises a layer of tantalum oxide.
60. The solar cell of claim 54, wherein said insulator is a double layered material comprising silicon nitride and silicon oxynitride.
61. The solar cell of claim 54, wherein said substrate is gallium antimonide, the first conductor means includes parallel strips of conductive material and portions of the diffused region between said strips of conductive material are etched to increase short circuit current.
62. The solar cell of claim 54, mounted in tandem with an upper cell to receive concentrated solar energy through the upper solar cell.
63. The solar cell of claim 62, mounted in tandem with an upper solar cell is GaAs and the booster cell is GaSb.
64. A solar cell comprising a gallium antimonide substrate having a zinc emitter region diffused therein.
65. The solar cell of claim 64, wherein said zinc emitter region is a patterned zinc emitter region, with parallel strips of conductive material separated by recesses having a depth sufficient to increase cell short circuit current.
66. The solar cell of claim 65, further having a layer of anti-reflective material in said recesses to increase further the cell short circuit current.
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US07/523,710 US5091018A (en) | 1989-04-17 | 1990-05-14 | Tandem photovoltaic solar cell with III-V diffused junction booster cell |
US523,710 | 1990-05-14 |
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WO1991020097A1 true WO1991020097A1 (en) | 1991-12-26 |
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