WO1994011931A1 - Apparatus for, and method of, maintaining a clean window in a laser - Google Patents
Apparatus for, and method of, maintaining a clean window in a laser Download PDFInfo
- Publication number
- WO1994011931A1 WO1994011931A1 PCT/US1993/010191 US9310191W WO9411931A1 WO 1994011931 A1 WO1994011931 A1 WO 1994011931A1 US 9310191 W US9310191 W US 9310191W WO 9411931 A1 WO9411931 A1 WO 9411931A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gases
- cavity
- optical element
- debris
- movement
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 11
- 230000003287 optical effect Effects 0.000 claims abstract description 157
- 230000005855 radiation Effects 0.000 claims abstract description 32
- 230000000694 effects Effects 0.000 claims abstract description 6
- 230000002401 inhibitory effect Effects 0.000 claims abstract description 4
- 150000002500 ions Chemical class 0.000 claims abstract description 4
- 239000007789 gas Substances 0.000 claims description 107
- 239000002245 particle Substances 0.000 claims description 20
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 230000002708 enhancing effect Effects 0.000 claims description 2
- 230000005764 inhibitory process Effects 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 claims description 2
- 230000001427 coherent effect Effects 0.000 claims 2
- 230000015572 biosynthetic process Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000001965 increasing effect Effects 0.000 description 2
- 229910052743 krypton Inorganic materials 0.000 description 2
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 2
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- VZPPHXVFMVZRTE-UHFFFAOYSA-N [Kr]F Chemical compound [Kr]F VZPPHXVFMVZRTE-UHFFFAOYSA-N 0.000 description 1
- 229910052729 chemical element Inorganic materials 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 229910000041 hydrogen chloride Inorganic materials 0.000 description 1
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/034—Optical devices within, or forming part of, the tube, e.g. windows, mirrors
- H01S3/0346—Protection of windows or mirrors against deleterious effects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/04—Arrangements for thermal management
- H01S3/0401—Arrangements for thermal management of optical elements being part of laser resonator, e.g. windows, mirrors, lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/223—Gases the active gas being polyatomic, i.e. containing two or more atoms
- H01S3/225—Gases the active gas being polyatomic, i.e. containing two or more atoms comprising an excimer or exciplex
Definitions
- This invention relates to apparatus for, and a method of, maintaining a clean optical element in a laser.
- the optical element may be a window or a mirror.
- Lasers are used for many different applications.
- the lasers are advantageous because they provide energy radiation at a particular wavelength. This energy radiation is advantageous because it can be produced with considerably greater directionality than can be produced by sources of other radiation.
- lasers have been used advantageously in a wide variety of different applications including medical applications for providing focussed energy of a high magnitude to fuse different elements in the eye such as to repair detached retinues and torn retinues in a patient's eye.
- Lasers have also been used in the manufacture of integrated circuit chips. Lasers have also been used to test the efficiency of splices of optical fibers.
- Lasers may employ optical elements at opposite ends of the cavity.
- the optical elements may constitute mirrors or windows.
- a mirror outside the window at one end generally reflects all of the radiation and a mirror outside the window at the other end reflects most of the radiation and passes some of the radiation.
- windows may be provided at the ends of the cavity and the windows may be coated with a material to make them partially or totally reflective. In this way, the radiation produced in the cavity may be amplified in successive reflections by the mirrors while a portion of the radiation passes through one of the windows in each cycle of such reflections. The radiation passing through such optical element is used in applications such as described in the previous paragraph.
- Some types of lasers employ chemical elements which react when an electrical discharge is produced in the laser.
- hydrogen and chlorine may be reacted to produce hydrogen chloride when an electrical discharge occurs in the laser, or krypton and fluorine may be reacted to produce krypton fluoride when the electrical discharge occurs.
- krypton and fluorine may be reacted to produce krypton fluoride when the electrical discharge occurs.
- Such a chemical reaction causes a large amount of energy to be generated at a particular wavelength dependent upon the characteristics of the gases.
- Lasers employing electrical discharges may have certain disadvantages.
- One disadvantage is that erosion of the electrodes can cause undesirable particles to be produced. These particles may be considered to constitute debris. The debris tends to migrate to the optical element and cloud the optical element. When the optical element becomes clouded, the efficiency in the operation of the laser becomes degraded.
- the gas directed against and past the surface of the optical element such as the window may not be completely clean.
- This gas is typically passed through a filtering device to remove debris prior to being directed to the surface of the optical element.
- filtering of debris is often not completely effective in removing the debris. Since the gas is moving along the optical element, it tends to deposit debris on the optical element even as it is attempting to inhibit the migration of debris to the optical element. The rate of deposition of debris on the optical element can therefore actually be increased, rather than inhibited.
- Filters used to clean the gas may produce gas which is electrically charged. When directed to the surface of the optical element, such charge may be transferred to the surface of the optical element. The charge on the optical element tends to attract and hold undesirable particles such as debris.
- Some types of filters used to clean the gas may employ hot or cold trapping elements which can elevate or reduce the temperature of the gas being directed to the surface of the optical element such as the window. This difference in temperature can produce a stress in the optical element thereby modifying its optical properties and impeding the operating efficiency of the optical element.
- a first gas in a laser cavity is ionized by an electrical discharge in the cavity as a step in producing an energy radiation.
- Debris (particulated) is produced during the formation of the energy radiation.
- the energy radiation and the debris move toward an optical element in the cavity.
- the optical element may be a window or a mirror.
- the debris tends to deposit everywhere in the cavity, including on the optical element, thereby dirtying the optical element. This inhibits the efficiency in the operation of the laser.
- a clean gas is directed into the cavity through a passage at a position displaced from the optical element.
- the clean gas then passes in the cavity through an orifice further from the optical element than the passage.
- the flow of the first gas through the orifice creates a venturi effect on the clean gas to insure that the clean gas will move away from the optical element. In this way, the clean gas inhibits the first gas and the debris from moving to the optical element.
- Baffles in the cavity between the passage and the orifice provide irregularities in the movement of the first gas from the orifice to the optical element, thereby enhancing the inhibition against the movement of the debris to the optical element. Baffles in the cavity between the passage and the optical element also inhibit the movement of any gas to the optical element. An electrically grounded screen in the displaced passage attracts any ions present in the clean gas.
- Figure 1 is a schematic diagram showing certain features of a laser well known in the art
- Figure 2 is a schematic diagram of a system known in the prior art for cleaning an optical element such as a window or mirror in the laser system shown in Figure 1;
- Figure 3 is a schematic diagram of one embodiment of this invention for cleaning an optical element such as a window or mirror in the laser system shown in Figure 1;
- Figure 4 is a schematic view of an anode and a cathode and an electrical discharge between the anode and the cathode.
- the laser system shown in Figures 1 and 4 is well known in the prior art.
- the system includes a laser discharge housing 10 and optical elements 11 such as mirrors or windows at opposite ends of a cavity in the housing.
- the optical elements 11 may be windows which pass energy such as light or mirrors which are coated to pass energy partially or fully. When the optical elements 11 constitute windows, mirrors may be disposed outside of the cavity to partially or fully reflect the energy.
- An electrical discharge 12 is produced between the optical elements 11 by a voltage pulse provided periodically between a cathode 13 and an anode 14 in Figure 4.
- the electrical discharge 12 schematically illustrated at 12 in Figures 1 and 4 may be produced upon the application of a voltage pulse between an anode 13 and the cathode 14.
- a blower 18 may be disposed in the housing 10 to blow suitable gases 17 such as krypton and fluoride in a direction perpendicular to a figurative line between the optical elements 11.
- gases 17 are shown as being disposed outside of the area of the electrical discharge 12 but it will be appreciated that the gases may also be disposed in the electrical discharge area.
- the gases 17 are ionized by the electrical discharge and react chemically to generate radiation at a particular wavelength such as in the excimer range. These gases are heated by this discharge. The heated gases are cooled by a heat exchanger 20 in the housing 10.
- Debris is formed by the electrical discharge of the laser in the region 12 and by erosion of the electrodes.
- the debris may be in the form of particulates.
- the debris tends to migrate to the optical elements 11 and to cloud the optical elements.
- One optical element 11 can be considered as a mirror and window if it partially passes the radiation impinging on it and reflects the other portion of the radiation into the cavity.
- Figure 2 schematically illustrates a system known in the prior art for inhibiting the debris from moving to one of the optical elements 11.
- the system includes a shoulder 32 which is disposed in the housing 10 in contiguous relationship to the optical element 11.
- a finger 34 is disposed inwardly from the shoulder 32 in slightly spaced relationship to the optical element 11 to define a distribution manifold 31 and an orifice 36.
- Gas passing through a conduit 38 is accordingly forced to move into the manifold 31 and through the orifice 36 and is directed to the surface of the optical element or mirror 11. The gas then moves away from the optical element 11 through a channel 40.
- the system shown in the prior art has another significant disadvantage.
- the filter When filters are used to clean the gas moving through the orifice 38, the filter may produce an electrical charge in the gas. This charge may be transferred by the gas to the optical element 11, particularly since the gas moves against and past the optical element. The charge on the optical element tends to attract and hold debris. No attempt has been made in the prior art to eliminate such a charge or to prevent the debris from being attracted by such charge when such charge is transferred to the optical element 11.
- the optical element tends to become stressed by the heat generated when the filter is heated or cooled to enhance its ability to trap debris.
- the filter accordingly heats or cools the gas moving the filter.
- the heated or cooled gas in turn heats or cools the optical element 11 as the gas moves against or past the optical element 11.
- the heating or cooling stresses the optical element 11 and distorts the optical properties of the optical element. This reduces the operating efficiency of the optical element 11.
- apparatus generally indicated at 50 is provided for directing a gas into a channel 52 through a passage 54 which is displaced from an optical element 56 such as a window or mirror and which communicates with the channel.
- the passage 54 is disposed in a housing 58 which is provided with a shoulder 60 for receiving the optical element 56.
- the optical element 56 is preferably disposed snugly against the shoulder 60 in the housing 58.
- a tubular member 61 may be provided at the interior of the housing 58 to define the channel 52.
- Baffles 62 are provided in the channel 52. Some of the baffles 62 may be disposed between the passage 54 and an inwardly turned lip 64 which is disposed on the tubular member 61 and which is further ' displaced from the optical element 56 than the passage 54. The inwardly turned lip 64 defines an orifice 65. Other baffles 68 may be disposed between the passage 54 and the optical element 56. A screen 66 may be extended across the passage 54 and may be electrically grounded. The baffles 62 and 68 and the screen 66 may be supported by the tubular member 61.
- the flow of the gases through the channel 52 in a direction away from the optical element 56 is facilitated by the venturi effect created by the flow of the gases with the debris in the electrical discharge area corresponding to the area 12 in Figure 1.
- the venturi effect is created because the gases with the debris flows past the orifice 65 in Figure 3.
- the gases flowing through the passage 54 do not contact the window. This prevents any dirt or debris in the gases from contacting the optical element 56 and dirtying the optical element. Furthermore, since the gas flow is in a direction away from the optical element 56, it inhibits the movement of any debris or charged particles in the channel 52 from moving to the optical element. As the gases flow through the passage 54, they move past the screen 66. Any charged particles in the gas flow are attracted and removed by the screen 66, particularly since the screen is grounded. The removal of the charged particles inhibits the optical element 56 from becoming charged.
- any heating or cooling of the gases does not contact the optical element 56 in the area where light contacts the optical element. This is true even though the screen 66 may be heated or cooled. Because of this, the optical element 56 does not become heated and accordingly does not become stressed. Since the optical element 56 does not become stressed, the optical properties in the optical element are preserved.
- the baffles 62 are also instrumental in inhibiting the movement of debris to the optical element 56.
- the baffles 62 between the passage 54 and the orifice 65 create a turbulence in the gas moving from the passage 54 through the channel 52 and in any gases moving with the debris toward the optical element 56. This turbulence inhibits the movement of the debris to the optical element 56.
- the baffles 68 between the passage 54 and the optical element 56 also produce a turbulence in the gases flowing from the passage 54 and thereby inhibit the movement of such gases to the optical element 56.
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP93924408A EP0669047B1 (en) | 1992-11-12 | 1993-10-25 | Apparatus for, and method of, maintaining a clean window in a laser |
DE69323211T DE69323211T2 (en) | 1992-11-12 | 1993-10-25 | Method and device for maintaining a clean laser window |
JP06512106A JP3103595B2 (en) | 1992-11-12 | 1993-10-25 | Apparatus and method for maintaining clean window of laser |
CA002149215A CA2149215C (en) | 1992-11-12 | 1993-10-25 | Apparatus for, and method of, maintaining a clean window in a laser |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/975,385 US5359620A (en) | 1992-11-12 | 1992-11-12 | Apparatus for, and method of, maintaining a clean window in a laser |
US975,385 | 1992-11-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO1994011931A1 true WO1994011931A1 (en) | 1994-05-26 |
WO1994011931B1 WO1994011931B1 (en) | 1994-08-04 |
Family
ID=25522974
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1993/010191 WO1994011931A1 (en) | 1992-11-12 | 1993-10-25 | Apparatus for, and method of, maintaining a clean window in a laser |
Country Status (7)
Country | Link |
---|---|
US (1) | US5359620A (en) |
EP (1) | EP0669047B1 (en) |
JP (1) | JP3103595B2 (en) |
CA (1) | CA2149215C (en) |
DE (1) | DE69323211T2 (en) |
SG (1) | SG54129A1 (en) |
WO (1) | WO1994011931A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE29716875U1 (en) * | 1997-09-19 | 1997-11-20 | Tui Laser Ag | Excimer laser |
US6798814B2 (en) | 2001-07-25 | 2004-09-28 | Tuilaser Ag | Gas discharge laser, method of operating a gas discharge laser, and use of a sintered filter |
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- 1993-10-25 CA CA002149215A patent/CA2149215C/en not_active Expired - Lifetime
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DE29716875U1 (en) * | 1997-09-19 | 1997-11-20 | Tui Laser Ag | Excimer laser |
DE19840035C2 (en) * | 1997-09-19 | 2002-01-24 | Tui Laser Ag | excimer |
US6798814B2 (en) | 2001-07-25 | 2004-09-28 | Tuilaser Ag | Gas discharge laser, method of operating a gas discharge laser, and use of a sintered filter |
Also Published As
Publication number | Publication date |
---|---|
US5359620A (en) | 1994-10-25 |
JPH08505005A (en) | 1996-05-28 |
DE69323211D1 (en) | 1999-03-04 |
DE69323211T2 (en) | 1999-05-27 |
CA2149215C (en) | 2003-03-11 |
SG54129A1 (en) | 1998-11-16 |
EP0669047A1 (en) | 1995-08-30 |
CA2149215A1 (en) | 1994-05-26 |
EP0669047B1 (en) | 1999-01-20 |
JP3103595B2 (en) | 2000-10-30 |
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