WO1996038757A1 - Appareil optique, source de faisceau laser, equipement a laser et procede de production d'un appareil optique - Google Patents
Appareil optique, source de faisceau laser, equipement a laser et procede de production d'un appareil optique Download PDFInfo
- Publication number
- WO1996038757A1 WO1996038757A1 PCT/JP1996/001472 JP9601472W WO9638757A1 WO 1996038757 A1 WO1996038757 A1 WO 1996038757A1 JP 9601472 W JP9601472 W JP 9601472W WO 9638757 A1 WO9638757 A1 WO 9638757A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- laser
- laser light
- light source
- optical
- wavelength conversion
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/37—Non-linear optics for second-harmonic generation
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/355—Non-linear optics characterised by the materials used
- G02F1/3558—Poled materials, e.g. with periodic poling; Fabrication of domain inverted structures, e.g. for quasi-phase-matching [QPM]
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/37—Non-linear optics for second-harmonic generation
- G02F1/377—Non-linear optics for second-harmonic generation in an optical waveguide structure
- G02F1/3775—Non-linear optics for second-harmonic generation in an optical waveguide structure with a periodic structure, e.g. domain inversion, for quasi-phase-matching [QPM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/106—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
- H01S3/108—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using non-linear optical devices, e.g. exhibiting Brillouin or Raman scattering
- H01S3/109—Frequency multiplication, e.g. harmonic generation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/60—Temperature independent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/091—Processes or apparatus for excitation, e.g. pumping using optical pumping
- H01S3/094—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light
- H01S3/0941—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a laser diode
- H01S3/09415—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a laser diode the pumping beam being parallel to the lasing mode of the pumped medium, e.g. end-pumping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
- H01S5/0092—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping for nonlinear frequency conversion, e.g. second harmonic generation [SHG] or sum- or difference-frequency generation outside the laser cavity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4087—Array arrangements, e.g. constituted by discrete laser diodes or laser bar emitting more than one wavelength
Definitions
- the present invention relates to an optical information processing field using coherent light.
- the present invention relates to an optical element such as an optical wavelength conversion element suitable for use in the optical applied measurement control field, a laser light source and a laser device, and a manufacturing of an optical element. It is about the method. Background art
- the laser source is basically composed of a semiconductor laser 2 0 and the solid-state laser crystal 2 1 and non ⁇ KN b 0 3 optical wavelength conversion device 2 5 by an optical crystal.
- pump light P 1 a emitted from a semiconductor laser 20 oscillating at 807 nm is condensed by a lens 30 to excite the solid laser crystal 21, YAG.
- All the St mirrors 22 are formed on the incident surface of the solid-state laser crystal 21.
- the total reflection mirror reflects 99% of light having a wavelength of 947 nm, but transmits light having a wavelength of 800 nm.
- the pump light P 1a is efficiently introduced into the solid-state laser crystal 21, but light having a wavelength of 947 nm generated by the solid-state laser crystal 21 is directed to the semiconductor laser 20. Is reflected to the side of the light wavelength conversion element 25 without being emitted.
- a mirror 23 that reflects 99% of light having a wavelength of 947 nm and transmits light in the 400 nm band is arranged on the output side of the optical wavelength conversion element 25. These mirrors 22 and 23 form a cavity (cavity) with respect to the light having a wavelength of 947 nm. This can cause vibration.
- the optical wavelength conversion element 25 is inserted into the resonator defined by the mirrors 22 and 23. As a result, a harmonic P 2 is generated. The power of the fundamental wave P 1 inside the resonator reaches 1 W or more. For this reason, the conversion from the fundamental wave P1 to the harmonic wave P2 increases, and a harmonic having high power can be obtained. Using a semiconductor laser with 50 O mW output, harmonics of 1 mW can be obtained.
- a conventional optical wavelength conversion element having an optical waveguide will be described with reference to FIG.
- the illustrated optical wavelength conversion element generates a second harmonic (wavelength: 420 nm) for a fundamental wave having a wavelength of 840 nm.
- Such an optical wavelength conversion element is disclosed in K. Mizuuchi, K, Yamanioto and Taniuchi, Applied Physics Letters, Vol. 58, p. 2732, June 1991.
- Such an optical wavelength conversion element has, as a basic component, an optical waveguide 2 manufactured by a proton exchange method.
- step S10 of FIG. 3 a domain-inverted layer forming step is performed.
- a T a film deposited principal plane of L i T a 0 3 substrate 1 Migihitsuji a Ta mask is formed by patterning the Ta film into stripes using ordinary photolithography technology and dry etching technology.
- a heat treatment is performed for 1 minute at a temperature of 550 to form a domain-inverted layer in each proton exchange layer.
- the temperature rise rate of the heat treatment is 50 seconds and the cooling rate is 103 ⁇ 4 ⁇ seconds.
- L i TaO s Kurabete the portion proton exchange is not made of the substrate 1, in the portion where the proton exchange has been made has decreased the amount of L i.
- the Curie temperature of the proton exchange layer decreases, and a domain-inverted layer can be formed partially in the proton exchange layer S at a temperature of 550.
- step 2 of FIG. 3 an optical waveguide forming step is performed.
- Step 2 is broadly divided into Step S21, Step S22, and Step S23.
- a mask pattern is formed in step S21, a proton exchange treatment is performed in step S22, and a heating annealing is performed in step S23.
- a heating annealing is performed in step S23.
- a Ta mask for forming an optical waveguide is formed.
- This Ta mask has a Ta film (a slit-shaped opening (width 4; ⁇ , length 12 mm)).
- the Li Ta0 3 substrate 1 covered with the Ta mask is subjected to a proton exchange treatment for 260 minutes and 16 minutes to thereby provide a linearly extending ⁇ refractive index layer ( thickness 0.5 to 5 m) formed on the L i Ta0 3 substrate 1 ⁇ .
- This ⁇ refractive index layer will eventually function as a waveguide. Only However, in this state, the nonlinearity of the proton-exchanged portion (high-refractive-index layer) is degraded.
- annealing is performed for 420 minutes at step S22.
- the refractive index layer is wiped in the vertical and horizontal directions, and Li is diffused into the five refractive index layers.
- the nonlinearity can be recovered by lowering the proton exchange rate of the high refractive index layer.
- the refractive index of the region (high-refractive-index layer) located immediately below the slit of the Ta mask rises by about 0.33 from the refractive index of the other regions, and the ⁇ refractive-index layer serves as an optical waveguide. Function.
- a protective film forming step (step S30), an end face polishing step (step S40), and an AR coating step (step S50) are performed to complete the optical wavelength conversion element.
- the fundamental wave P 1 power 27 mW
- the fundamental wave P 2 having a wavelength of 840 nm
- a harmonic P 2 of 3 mW is obtained (conversion efficiency 0.5 0).
- the arrangement period of the domain-inverted layers may be set to 3.6 m.
- a harmonic P 2 of 0.3 mW is obtained with respect to the fundamental wave P 1 of '27 mW (conversion efficiency 1%).
- the present inventors have prototyped a laser light source that emits blue laser light by combining such a light wavelength conversion element and a semiconductor laser.
- An optical wavelength conversion element has a problem in that the phase matching wavelength changes over time, and as a result, it becomes impossible to obtain a harmonic.
- the wavelength of the fundamental wave emitted from the semiconductor laser is kept constant, if the phase matching wavelength of the optical wavelength converter shifts, the output of the harmonic wave gradually decreases and eventually goes to zero. become.
- An object of the present invention is to reduce the size and weight of laser devices by stabilizing the laser light source and increasing the output power, and by incorporating a high-power laser light source into a laser device or an optical disk device. And Disclosure of the invention
- the method for manufacturing an optical element according to the present invention comprises the steps of forming a proton exchange layer on a Li Nb.T a ⁇ .Os (0 X ⁇ 1) substrate; An annealing step for heat treatment is included.
- the annealing step is preferably performed at a temperature of 50 to 90.
- the annealing step may include a step of gradually lowering the temperature.
- the step of forming the proton exchange layer includes a step of performing a proton exchange treatment on the substrate, and a step of heat-treating the substrate at a temperature of 150 ° or more.
- the step of forming the proton exchange layer includes: forming a plurality of periodically arranged polarization reversals in the substrate; and forming an optical waveguide on a surface of the substrate. Is included.
- Another method for manufacturing an optical element according to the present invention includes a step of performing a proton exchange treatment on LiNb.TaL.Og (0 ⁇ X ⁇ 1), and at least a first and a second step on the substrate.
- the second annealing is preferably performed at a temperature of 50 to 90.
- An optical element according to the present invention is an optical device comprising: a 'LiNb x Ta 1 _ x 0 3 [0 ⁇ X ⁇ 1] substrate; and a proton exchange layer formed on the substrate. It is formed of a stable proton exchange layer whose refractive index does not change with time during use.
- At least a part of the proton exchange layer forms an optical waveguide are doing.
- the laser light source of the present invention is a light source comprising: a semiconductor laser; and an optical wavelength conversion element that receives laser light emitted from the semiconductor laser and converts the laser light into a harmonic.
- the device includes an optical waveguide for guiding the laser light, and a domain-inverted structure periodically arranged along the optical waveguide.
- the optical waveguide and the domain-inverted structure have a refractive index in use. Is formed from a stable proton exchange layer that does not change over time.
- Another laser light source of the present invention is a semiconductor laser that emits a fundamental wave, a single mode fiber that transmits the fundamental wave, and an optical wavelength conversion element that receives the fundamental wave emitted from the fiber and generates a ⁇ ⁇ wave. And a light wavelength conversion element having a periodically poled structure.
- the light wavelength conversion element has a modulation function.
- the optical wavelength conversion element is preferably formed on the L i Nb x T ai _ x O a (0 ⁇ X ⁇ 1) substrate.
- Still another laser light source of the present invention is a semiconductor laser that emits pump light, a fiber that transmits the pump light, a solid-state laser crystal that receives pump light emitted from the fiber and generates a fundamental wave, An optical wavelength conversion element that receives a fundamental wave and generates a harmonic, and includes an optical wavelength conversion element having a periodic component inversion structure. It is preferable that the light wavelength conversion element has a modulation function.
- the optical wavelength converting element is preferably formed in L iNb x T ai _ x 0 3 (0 ⁇ X ⁇ 1) substrate.
- the solid-state laser crystal and the optical wavelength conversion element are integrated.
- Still another laser light source of the present invention is a semiconductor laser that emits pump light, a solid-state laser crystal that receives the pump light and generates a fundamental wave, and a single-mode fino that transmits the fundamental wave.
- An optical wavelength conversion element that receives the fundamental wave from the fiber and generates a harmonic, wherein the optical wavelength conversion element has a periodically poled structure. Have.
- the light wavelength conversion element has a modulation function.
- Still another laser light source of the present invention is a distributed feedback semiconductor laser that emits laser light, a semiconductor laser amplifier that amplifies the laser light, and receives the amplified laser light and generates a harmonic.
- An optical wavelength conversion element comprising an optical wavelength conversion element having a periodically poled structure.
- the light wavelength conversion element has a modulation function.
- the optical wavelength converting element is preferably formed on the L i N b x T ai _ x 0 3 ( ⁇ X ⁇ 1 substrate.
- the semiconductor laser is wavelength-locked.
- Still another laser light source is a laser light source including a semiconductor laser that emits laser light, and an optical wavelength conversion element in which a periodic polarization inversion structure and an optical waveguide are formed, The width and the thickness of the optical waveguide are each 40 m or more.
- the light wavelength conversion element has a modulation function.
- the optical wavelength converting element is formed in L i N b x T a have x 0 3 (0 X 1) substrate.
- the optical waveguide is of a graded type.
- a laser device includes: a semiconductor laser that emits laser light; a laser light source having an optical wavelength conversion element that generates a harmonic based on the laser light; and a modulation that changes the output intensity of the harmonic. And a deflector for changing the direction of the subharmonic wave emitted from the laser light source, wherein the optical wavelength conversion element has a periodic polarization reversal structure. .
- a high frequency is applied to the semiconductor laser in operation.
- the laser light source includes a single mode fiber that transmits the laser light from the semiconductor laser to the optical wavelength conversion element.
- the laser light source transmits laser light from the semiconductor laser. And a solid-state laser crystal for receiving a laser beam emitted from the fiber and generating a fundamental wave.
- the semiconductor laser device is a distributed feedback semiconductor laser
- the laser light source further includes a semiconductor laser amplifier that amplifies laser light from the distributed feedback semiconductor laser.
- an optical waveguide is formed in the optical wavelength conversion element, and the width and the thickness of the optical waveguide are each 40 mm or more.
- Another laser device is a laser device including a laser light source that emits modulated ultraviolet laser light, and a deflector that changes the direction of the ultraviolet laser light, wherein the polarizer includes the ultraviolet laser light. Irradiates the screen, thereby generating red, green or blue light from the phosphor applied on the screen.
- the laser light source includes a semiconductor laser, an optical wavelength conversion element for generating a harmonic, and a single mode fiber for transmitting laser light from the semiconductor laser to the optical wavelength conversion element.
- the laser light source includes: a semiconductor laser; a fiber that transmits laser light from the semiconductor laser; a solid-state laser crystal that receives laser light emitted from the fiber and generates a fundamental wave; And a light wavelength conversion element that generates harmonics from the light.
- the laser light source further includes a semiconductor laser, and a semiconductor laser amplifier that amplifies a laser beam from the distributed semiconductor laser.
- the laser light source includes: a semiconductor laser that emits laser light; an optical waveguide that guides the laser light; and an optical wavelength conversion element in which a periodically poled structure is formed.
- the width and thickness are each 40 ⁇ or more.
- Still another laser device includes three laser light sources that generate red, blue, and blue laser lights, a modulator that changes the intensity of each laser light, and changes the direction of each laser light.
- a laser device comprising: a semiconductor laser.
- the laser light source includes a semiconductor laser, an optical wavelength conversion element that generates a harmonic, and a single mode fiber that transmits laser light from the semiconductor laser to the optical wavelength conversion element.
- the laser light source includes: a semiconductor laser; a fin for transmitting laser light from the semiconductor laser; a solid-state laser crystal for receiving a laser light emitted from the fiber to generate a fundamental wave; An optical wavelength conversion element that generates a harmonic from a wave.
- the laser light source further includes a semiconductor laser, and a semiconductor laser amplifier that amplifies a laser beam from the distributed feedback semiconductor laser.
- the laser light source includes: a semiconductor laser that emits laser light; an optical waveguide that guides the laser light; and an optical wavelength conversion element in which a periodically poled structure is formed.
- the radiation and thickness of the wave path are each 40 or more.
- Still another laser device includes at least one or more laser light sources including a semiconductor laser, a sub-semiconductor laser, a modulator that changes the intensity of light from the laser light source, a screen, A deflector that changes the direction of light from a laser light source and scans the screen with the light, wherein the light emitted from the sub-semiconductor laser travels around the periphery of the screen.
- laser light sources including a semiconductor laser, a sub-semiconductor laser, a modulator that changes the intensity of light from the laser light source, a screen, A deflector that changes the direction of light from a laser light source and scans the screen with the light, wherein the light emitted from the sub-semiconductor laser travels around the periphery of the screen.
- the laser light source includes an optical wavelength conversion element that generates a harmonic, and a single mode fiber that transmits laser light from the semiconductor laser to the optical wavelength conversion element.
- the laser light source includes: the semiconductor laser; a fiber that transmits the laser light from the semiconductor laser; a solid-state laser crystal that receives the laser light emitted from the fiber and generates a fundamental wave; An optical wavelength conversion element for generating a harmonic from the fundamental wave.
- the laser light source is such that the semiconductor laser is a distributed feedback semiconductor laser, and further includes a semiconductor laser amplifier that amplifies laser light from the distributed feedback semiconductor laser.
- the laser light source comprises: an optical waveguide for guiding laser light from the semiconductor laser; and an optical wavelength conversion element having a periodically poled structure, and the width and the thickness of the optical waveguide. Are 40 m or more, respectively.
- the laser armor of the present invention comprises: at least one or more laser light sources including a semiconductor laser; changing a direction of laser light emitted from the laser light source; and scanning a screen with the laser light. And a deflector that scans the screen with the laser light.
- the deflector further includes two or more detectors that generate a signal when a part of the laser is received. In the meantime, if the detector does not generate a signal within a certain period of time, it stops generating laser light from the laser light source.
- the laser light source includes a light wavelength conversion element that generates a subharmonic wave, and a single mode fiber that transmits the laser light from the semiconductor laser to the light wavelength conversion element.
- the laser light source includes: the semiconductor laser; a fiber that transmits laser light from the semiconductor laser; a solid-state laser crystal that receives a laser light emitted from the fiber and generates a fundamental wave; An optical wavelength conversion element that generates a harmonic from a fundamental wave.
- the laser light source is such that the semiconductor laser is a distributed feedback semiconductor laser, and further includes a semiconductor laser amplifier that amplifies laser light from the distributed feedback semiconductor laser.
- the laser light source comprises: an optical waveguide for guiding laser light from the semiconductor laser; and an optical wavelength conversion element having a periodically poled structure, and the width and the thickness of the optical waveguide. Are more than 4 4 ⁇ , respectively.
- Still another laser device of the present invention includes at least one or more laser light sources including a semiconductor laser, a modulator that changes the intensity of each laser light, a deflector that changes the direction of each laser light, and The laser beam emitted from the laser light source is divided into two or more optical paths, and the screen is irradiated from two directions.
- laser light sources including a semiconductor laser, a modulator that changes the intensity of each laser light, a deflector that changes the direction of each laser light, and The laser beam emitted from the laser light source is divided into two or more optical paths, and the screen is irradiated from two directions.
- the laser light source includes an optical wavelength conversion element that generates a high-square wave, and a single mode fiber that transmits laser light from the semiconductor laser to the optical wavelength conversion element.
- the laser light source includes: the semiconductor laser; a fiber that transmits laser light from the semiconductor laser; a solid-state laser crystal that receives a laser light emitted from the fiber and generates a fundamental wave; And a light wavelength conversion element for generating a harmonic from a wave.
- the laser light source is such that the semiconductor laser is a distributed feedback semiconductor laser, and further includes a semiconductor laser amplifier that amplifies laser light from the distributed feedback semiconductor laser.
- the laser light source comprises: an optical waveguide for guiding laser light from the semiconductor laser; and an optical wavelength conversion element having a periodically poled structure, and the width and the thickness of the optical waveguide. Are 40 m or more, respectively.
- two laser light sources form two optical paths, and each laser light source is separately modulated.
- the two optical paths switch in time.
- Still another laser device includes at least one or more laser light sources including a semiconductor laser, a first optical system that converts a laser beam emitted from the laser light source into a parallel beam, and spatially transforms the parallel beam.
- a liquid crystal cell that is panned, and the light emitted from the liquid crystal cell is screened.
- a second optical system for performing irradiation includes at least one or more laser light sources including a semiconductor laser, a first optical system that converts a laser beam emitted from the laser light source into a parallel beam, and spatially transforms the parallel beam.
- the laser light source includes an optical wavelength conversion element for generating a harmonic, and a single mode fiber for transmitting laser light from the semiconductor laser to the optical wavelength conversion element.
- the laser light source includes: the semiconductor laser; a fiber that transmits laser light from the semiconductor laser; a solid-state laser crystal that receives a laser light emitted from the fiber and generates a fundamental wave; And a light wavelength conversion element for generating harmonics from the waves.
- the laser light source is such that the semiconductor laser is a distributed feedback semiconductor laser, and further includes a semiconductor laser amplifier that amplifies laser light from the distributed semiconductor laser.
- the laser light source comprises: an optical waveguide for guiding laser light from the semiconductor laser; and an optical wavelength conversion element having a periodically poled structure, and the width and the thickness of the optical waveguide. Are 40 or more, respectively.
- the sub semiconductor laser is an infrared semiconductor laser.
- laser light irradiation is stopped by shifting the phase matching wavelength of the light wavelength conversion element.
- An optical disc device includes a laser light source that generates a laser beam, an optical wavelength conversion element that converts a fundamental wave into a harmonic, an optical pickup that incorporates the optical wavelength conversion element, and an actuator that moves the optical pickup.
- the laser light source includes a semiconductor laser disposed outside the optical pickup.
- the laser light source is a laser beam emitted from the semiconductor laser.
- the semiconductor laser further includes a solid-state laser crystal that generates the fundamental wave using the light as pump light.
- the solid-state laser crystal is disposed outside the optical pickup, and a fundamental wave generated by the solid-state laser medium is incident on the optical wavelength conversion element via the optical fiber.
- the solid-state laser crystal is disposed inside the optical pickup, and the laser light emitted from the semiconductor laser is incident on the solid-state laser via the optical fiber.
- Figure 1 shows a conventional short-wavelength light source.
- Fig. 2 is a configuration diagram of a conventional optical wavelength conversion element.
- FIG. 3 is a process flow chart of a conventional method for manufacturing an optical wavelength conversion device.
- FIG. 4 is a diagram showing a time change of a harmonic output of a conventional optical wavelength conversion element.
- FIG. 5 is a diagram showing the change over time of the phase matching wavelength of a conventional optical wavelength conversion element.
- FIG. 6 is a diagram showing the change over time of the refractive index of a conventional optical element.
- FIG. 7 is a configuration diagram of the optical wavelength conversion element according to the first embodiment of the present invention.
- 8A, 8B, 8C, 8D, and 8E are diagrams illustrating a method of manufacturing the optical wavelength conversion element according to the first embodiment of the present invention.
- FIG. 9 is a process flowchart of a method for manufacturing an optical wavelength conversion device according to the first embodiment of the present invention.
- FIG. 10 is a characteristic diagram showing a change in the phase matching wavelength with respect to the annealing time when the annealing temperature is set as a parameter.
- FIG. 11 is a characteristic diagram showing a relationship between an annealing temperature and a phase matching wavelength change amount.
- FIG. 12 is a diagram showing output time characteristics of the optical wavelength conversion device according to the first embodiment of the present invention.
- FIG. 13 is a diagram showing the time characteristics of the phase matching wavelength and the effective refractive index of the optical wavelength conversion device according to the first embodiment of the present invention.
- FIG. 14 is a process flowchart of a method for manufacturing an optical wavelength conversion device according to a second embodiment of the present invention.
- FIGS. 15A, 5B and 15C are process diagrams of a method for manufacturing an optical device according to a fourth embodiment of the present invention.
- FIG. 16 is a process flowchart of a method for manufacturing an optical device according to a fifth embodiment of the present invention.
- FIG. 17 is a structural view of a practical example of the laser light source of the present invention.
- FIG. 18A, FIG. 18B, FIG. 81C, and FIG. 18D are manufacturing process diagrams of the optical wavelength conversion element in the laser light source of the present invention.
- FIG. 19 is a characteristic diagram showing the relationship between the thickness of the optical waveguide and the optical damage resistance of the optical wavelength conversion element used in the laser light source of the present invention.
- FIG. 20 is a configuration diagram of a laser device according to an embodiment of the present invention.
- FIG. 21 is a configuration diagram of a laser light source according to an embodiment of the present invention.
- FIG. 22 is a configuration diagram of a semiconductor laser used for the laser light source according to the embodiment of the present invention.
- FIG. 23 is a configuration diagram of a laser light source according to an embodiment of the present invention.
- FIG. 24 is a configuration diagram of a laser light source according to an embodiment of the present invention.
- FIG. 25 is a block diagram of a laser light source according to an embodiment of the present invention, which is of a shared type.
- FIG. 26 is a configuration diagram of a laser light source according to embodiment j of the present invention.
- FIG. 27 is a configuration diagram of a laser device according to an embodiment of the present invention.
- FIG. 28 is a configuration diagram of an automatic stop device of the laser device according to the embodiment of the present invention.
- FIG. 29 is a diagram of a control system of the automatic stop device of the laser device according to the embodiment of the present invention.
- FIG. 30 is a configuration diagram of a laser device according to the present invention.
- FIG. 31 is a configuration diagram of a laser device according to an embodiment of the present invention.
- FIG. 32 is a configuration diagram of a laser device according to an embodiment of the present invention.
- FIG. 33 is a configuration diagram of an optical disk device according to an embodiment of the present invention. ⁇ BEST MODE FOR CARRYING OUT THE INVENTION
- the inventors of the present application have considered the reason for the above-mentioned optical wavelength conversion element having an optical waveguide, that after a lapse of time, the phase matching wavelength becomes shorter, and that no harmonic is generated.
- FIG. 4 shows the relationship between the elapsed time immediately after the fabrication of the conventional optical wavelength conversion device and the output of the harmonic. It can be seen that as the time elapses, the harmonic output decreases rapidly.
- FIG. 5 shows the relationship between the i3 ⁇ 4a time and the phase matching wavelength. Harmonic output is halved three days after device fabrication. At this time, it can be seen that the phase matching wavelength shifts to the shorter wavelength side.
- the phase matching wavelength ⁇ is determined by the polarization inversion period ⁇ and the effective refractive indices n 2W and n w for harmonics and fundamental waves. More specifically, ⁇ -2 (n 2W -n w ) ⁇ ⁇ .
- FIG. 6 shows the relationship between the effective refractive index n 2W and the elapsed time. From FIG. 6, it can be seen that the effective refractive index n 2W decreases with the passage of time from the date of device fabrication.
- the present invention considers this cause as follows.
- the high-temperature treatment of about 400 which is performed when forming the optical waveguide, introduces a strain or the like into the proton exchange layer, and as a result, a layer (change layer) having an increased refractive index is formed in the keroton exchange layer. This strain is gradually released over time, and the refractive index of the variable layer approaches the original refractive index.
- the sample whose refractive index decreased due to aging was subjected to annealing for 301 minutes.
- the diffusion of protons and the like hardly occurs, so that the waveguide does not spread. Therefore, according to conventional thinking, the refractive index of the proton exchange layer should not change at all.
- the refractive index was increased again by annealing for 301 minutes. Furthermore, after this annealing, a phenomenon was observed in which the refractive index decreased again with time ⁇ 3 ⁇ 41.
- the present invention alleviates the strain generated in the proton exchange layer by the heat treatment at a relatively high temperature, thereby preventing the light wavelength conversion element from changing over time. Embodiments will be described below with reference to the drawings.
- an optical waveguide made from a stable proton exchange layer is formed on the L i T a 0 3 substrate 1, a plurality of polarization inversion eyebrows 3 along the optical waveguide is periodically sequence I have.
- the fundamental wave P1 enters the input end of the optical waveguide
- the harmonic P2 is emitted from the output end.
- the length of the optical wavelength conversion element (the length of the waveguide) of this embodiment is 9 mm. Further, the length of one period of the domain-inverted layer 3 is set to 3.7 m so as to operate at a wavelength of 850 nm.
- T a film have use a normal photolithography technique and dry etching technique (Thickness: about 200 to 300 nm) is patterned in a stripe shape to form a Ta mask 6.
- the Ta mask 6 used in this embodiment has a width of 1.2 ⁇ . It has a pattern in which strips with a length of 1 Omm are arranged at equal intervals, and the arrangement cycle of the strips is 3.7 / m.
- a proton exchange treatment is performed on the Li Ta03 substrate 1 whose main surface is covered with the Ta mask 6.
- This proton exchange treatment is carried out by immersing the surface of the substrate 1 in pyroepoxylic acid heated to 230 for 14 minutes.
- a Ta mask (not shown) for forming an optical waveguide is formed.
- This Ta mask has a slit-like opening (4 ⁇ in width, 12 mm in length) formed in Ta (thickness: about 200-30 Onm) deposited on the substrate 1.
- This opening defines the planar rate of the waveguide.
- the pattern of the Ta mask is determined according to the shape of the waveguide to be formed. Against L i Ding 3_Rei 3 substrate 1 We S in Ta mask, by performing a proton exchange treatment in 260 ° C, 16 min, as shown in FIG.
- L i Ta0 3 of the substrate 1 A linearly extending proton exchange layer (0.5 m thick, 5 / m wide, 1 Omm long) 5 is formed in a region located below the opening of the Ta mask.
- the linearly extended proton exchange debris 5 eventually It will function as a wave path.
- HF HNF 3 of 1: removing T a mask by etching for 2 minutes using a 1 mixture.
- annealing is performed for 1 minute at 420 at an infrared heating device.
- the nonlinearity of the proton exchange debris 5 is restored, and as shown in FIG. 8D, a variable layer 8b whose refractive index is increased by about 0.03 is formed.
- this anneal has a function of diffusing Li and protons in the substrate 1 and reducing the proton exchange rate of the proton exchange layer 5.
- a 300 nm thick SiO 2 film (not shown) functioning as a protective film is deposited on the main surface of the substrate 1.
- the surface of the substrate 1 perpendicular to the change debris 8b is optically polished to form the entrance and exit of the optical wavelength conversion element, and then, as shown in FIG.
- a non-reflective (AR) coat 15 is formed on the polished surface of the emission part.
- low-temperature annealing means a heat treatment performed at a temperature that does not substantially lower the proton exchange rate in the proton exchange calendar.
- cold Ani Le means a heat treatment at about 1 3 0 ° C or lower.
- heat treatment is performed for 60 to 40 hours in an air atmosphere using an oven.
- step S10 After the step of forming the domain-inverted layer on the substrate (step S10), the step of forming an optical waveguide (S20) is performed.
- the optical waveguide forming step (S20) is largely divided into step S21, step S22, and step S23.
- a mask pattern is formed in step S21, a proton exchange treatment is performed in step S22, and a high-temperature annealing is performed in step S23.
- a protective film forming step (Step S30), an end face polishing step (Step S40), and an AR coating step (Step S50) are performed. In this state, there is a temporal change of the wavelength conversion element, so a low-temperature annealing is performed in step S60, and a stable prototype is obtained.
- FIG. 10 shows the relationship between the annealing time when the temperature of the low-temperature anneal is 60 ° C. and 120 ° C.
- the amount of phase matching wavelength shift is almost constant in several hours according to 120 anneals, but takes several tens of hours to become almost constant according to 60 anneals.
- Fig. 11 shows the relationship between the amount of phase matching wavelength shift when returning to the stable state and the temperature of the low-temperature anneal. From FIG. 11, it can be seen that if the annealing of 120 is performed, the phase matching wavelength is stabilized by a shift of about 0.5 nm. If more than 150 times of annealing is performed, the shift S of the phase matching wavelength after stabilization becomes 0.8 nm or more. If such a large shift of the phase matching wavelength remains, it becomes difficult to use the optical wavelength conversion element for a long time. If the allowable range of the shift of the phase matching wavelength is set to 0.5 nm or less, even if annealing is performed at a temperature exceeding 120, the shift amount cannot be reduced within the allowable range.
- the shift amount of the phase matching wavelength decreases the conversion efficiency. If the shift amount of the phase matching wavelength exceeds 0.5 nm, only an output of about 1 Z 4 when the shift amount is zero can be obtained. If the low-temperature annealing temperature is set to 60, the annealing time becomes longer or the shift amount can be reduced to 0.1 nm or less, so that there is no problem of lowering the conversion efficiency. It is preferable that the shift amount of the phase matching wavelength be suppressed to about 0.2 nm or less. According to the present embodiment, the bending of the non-polarization inversion layer 4 and the polarization inversion layer 3 in the optical waveguide 2 The refractive index does not change with time, and the propagation loss when light is guided is small.
- Laser light (wavelength 850 nm) from a semiconductor laser is incident on the incident part as a fundamental wave P 1 and propagates through an optical waveguide.
- the light propagates in a single mode, and a harmonic P 2 having a wavelength of 425 nm is emitted.
- the propagation loss of the optical waveguide 2 was as small as 1 dBZcm, and a harmonic P 2 was effectively obtained.
- a harmonic of 1.2 mW (wavelength 425 nm) was obtained with a fundamental wave input of 27 mW. The conversion efficiency in this case is 4.5%.
- Figure 12 shows the relationship between the number of passages and the harmonic output.
- FIG. 13 shows the relationship between the elapsed days and the phase matching wavelength, and the relationship between the elapsed days and the change in the refractive index.
- an optical wavelength conversion device having a constant phase matching wavelength can be realized because a change in refractive index does not occur over time.
- this element is combined with a semiconductor laser, a stable short-wavelength laser can be manufactured. At a temperature of about 60, low temperature annealing for more than 40 hours is particularly effective.
- the Ta film is striped using ordinary photolithography, lithography and dry etching techniques. Then, a Ta mask is formed.
- the Ta mask used in this embodiment has six turns in which strips each having a width of 1.2 m and a length of 10 mm are arranged at equal intervals, and the rooster period of the strip is 3.c
- a proton exchange treatment is performed by immersing the surface of the substrate in phosphoric acid heated to 260 for 20 minutes.
- L i Ta0 3 of the substrate to form a proton-exchanged layer with a thickness of 0. 5 m in a portion not covered with T a mask.
- HF: HNF a 1 by etching for 2 minutes using a 1 mixture, to remove T a mask.
- a heat treatment is performed at a temperature of 550 'for 15 seconds to form a domain-inverted layer in each proton exchange layer 7.
- the temperature rise rate of the heat treatment is 50 seconds and the cooling rate is 10 seconds.
- a proton exchange treatment is performed on the surface of the substrate on which the domain-inverted layers are arranged, thereby forming an optical waveguide (step S100).
- a mask for forming an optical waveguide a Ta film having a slit having a width of 4 m and a length of 12 mm is used.
- proton exchange was performed in pyrophosphoric acid for 260 minutes for 16 minutes (Step S
- step S120 low-temperature annealing
- the polarization inversion and the optical waveguide are formed on the base.
- the thickness d of the optical waveguide is set to be smaller than the thickness of the polarization inversion layer, for example, 1.8 m in order to effectively perform wavelength conversion.
- the period of the domain-inverted layer is set to 3.6.
- the refractive index does not change temporally in the non-polarized layer and the domain-inverted field, and the light propagation loss is small.
- the plane perpendicular to the optical waveguide was optically polished to form an entrance and an exit.
- an optical wavelength conversion element can be manufactured.
- the length of this element is 9 mm.
- L i Nb0 3 substrate will be described using (thickness 0. 4 ⁇ 0 5 mm.) .
- a Ta film (second Ta electrode) is deposited on the entire back surface of the substrate.
- the first Ta electrode formed on the main surface of the substrate and the second Ta electrode formed on the back surface of the substrate constitute an electrode structure for applying an electric field to the substrate.
- first T a electrode and the voltage between the second Ta3 ⁇ 4 pole (e.g. 10 Kiroboru g) an electric field is formed L i Nb0 3 substrate.
- This voltage application forms a domain-inverted layer extending from the portion of the front surface of the substrate that is in contact with the first Ta electrode to the back surface of the substrate.
- a Ta mask having a slit-shaped opening (4 m in length, 12 mm in length) is formed on the substrate, and a proton exchange treatment using pyrophosphoric acid (230, 10 minutes) is performed, followed by photoconduction. Form a wave path.
- annealing is performed for 420 2 minutes using an infrared heating apparatus. By this annealing, the nonlinearity in the optical waveguide is recovered, but a change calendar in which the refractive index is increased by about 0.02 is formed.
- a SiO 2 film having a thickness of 30 O nm functioning as a protective film is deposited on the substrate.
- annealing was performed in air at 100 ° C for 20 hours (first-stage low-temperature annealing), followed by annealing for 60 to 10 hours. (2nd stage low temperature annealing).
- two-stage low temperature annealing is performed. The reason why the low-temperature annealing is performed in two stages is to reduce the total time required for the low-temperature annealing.
- the distortion is relieved earlier than the annealing at 60 °, but the distortion corresponding to the amount of phase matching wavelength shift at 100 ° as shown in FIG. Remains. Therefore, additional low-temperature annealing is performed at 60 mm to completely eliminate the strain.
- a "stable proton exchange layer" can be formed quickly and completely with little change over time.
- the thickness d of the optical waveguide formed by the above steps is 1.8 m.
- the arrangement period of the domain-inverted layers is 3 ⁇ m, and operates at a wavelength of 840 nm.
- the plane perpendicular to the optical waveguide was optically polished to form the entrance and exit. Thus, an optical wavelength conversion element can be manufactured.
- the length of this element is 1 O mm.
- a semiconductor laser beam (wavelength: 840 nm) was guided from the incident part as the fundamental wave P1
- a harmonic P2 having a wavelength of 420 nm was extracted outside the substrate from the emission part.
- a harmonic of 13 mW (wavelength: 42 O nm) was obtained with a fundamental wave of 80 mW ⁇ .
- the harmonic output was very stable with no change over time.
- two types of low-temperature annealing were performed at different temperatures.
- a low-temperature annealing method in which the temperature was gradually reduced from 100 to 60 over 30 hours was used. May be performed. (Example 4)
- the liquid layer Epitakisharu growth method as in Figure 1 5 A, a mixture film of L i Nb0 3 and L i '1,30 3 (i Nb 0, 5 Ta 0. 5 O a film) 16 'Is grown on the Li T a 03 substrate 1.
- the growth temperature exceeding 1,000 hand, strain mixture Monomaku 1 6 and L i T a0 3 remains at the interface between the substrate 1.
- a resist mask 17 is formed on the mixture film 16 ′ using a normal photolithography technique.
- FIG. 15C a portion of the mixture ⁇ 16 that is not covered with the resist mask 17 is removed by ion beam etching, and an optical waveguide 16 having a width of, for example, 4 ⁇ is left. ⁇
- low-temperature annealing is performed to alleviate the increase in the refractive index.
- This Aniru consists of one 00 and the first stage low temperature Aniru performed in e C in 30 hours, and the stage cold ⁇ Neil performed for 60 hours at 70 hands subsequent thereto.
- the thickness d of the optical waveguide formed by the above process is 1.8 m.
- the length of this element is 9 mm.
- the plane perpendicular to the optical waveguide was optically polished to form the entrance and exit.
- semiconductor laser light wavelength 840 nm
- the waveguide loss was very small.
- the change over time in the refractive index was below the measurement limit and was very stable.
- the ingredients of the mixture film L i Nb 0. S Ta 0. Not limited to 5 0 3, L i Nb x Ta (0 ⁇ x ⁇ 1) or another optical material.
- an optical waveguide forming step is performed.
- the optical waveguide forming process is roughly divided into step S200, step S210, and step S220.
- step S 200 A mask pattern is formed, proton exchange processing is performed in step S210, and high-temperature annealing is performed in step S220.
- step S230 an electrode forming step
- step S240 a low-temperature annealing step
- step S250 an end face polishing step
- an AR coating step step S260
- Ta is patterned into slits using a normal photo process and dry etching. Then Te L i T a 0 3 substrate 1 to 2 3 0 on which a pattern is formed by T a, to form a thickness 0. 5 m proton-exchanged layer of the slit bets directly below perform proton exchange for 10 minutes.
- HF HNF 3 of 1: removing 2 minutes etching T a at 1 mixture.
- annealing (first annealing) is performed at 400 for 1 hour to form a variable layer whose refractive index is increased by about 0.01.
- 30 nm of Si02 was added by vapor deposition.
- A1 was vapor-deposited in a stripe shape as an electrode mask, and then patterning was performed.
- low-temperature annealing was performed to mitigate the increase in the refractive index.
- the anneal was performed in air for 70 hours for 10 hours.
- the second annealing was performed at a temperature lower by 30 ° C. than the first annealing. It is effective to lower the distortion by 200 or more, since the distortion can be greatly reduced.
- polishing and AR coating were applied.
- the optical waveguide force with the pole was manufactured.
- the thickness of this optical waveguide is 8 m.
- the plane perpendicular to the optical waveguide was optically polished to form the entrance and exit.
- an optical element can be manufactured.
- the length of this element is 9 mm.
- a modulation signal was applied to the electrodes, and semiconductor laser light (wavelength: 1.56 m) was guided as a fundamental wave from the incident part. The modulated light was extracted from the emission part. There was no change with time, and the bias voltage was stable for more than 2000 hours.
- the present invention has been described with respect to an optical wavelength conversion element and an optical modulator as an example of an optical element, but the present invention is not limited thereto. It is also applicable to a planar device such as a Fresnel lens or a hologram.
- a planar device such as a Fresnel lens or a hologram. The change in refractive index with time due to the proton exchange treatment can be prevented, and the deterioration of characteristics can be suppressed.
- This embodiment is a short wavelength light source including a semiconductor laser and an optical wavelength conversion element.
- the pump light P 1 a emitted from the semiconductor laser 20 is condensed by the lens 30 and excites the solid-state laser crystal YAG 21.
- the YAG 21 is provided with a total reflection mirror 22 for 947 nm, oscillates at a wavelength of 947 nm, and emits a fundamental wave P 1.
- a total reflection mirror 23 for the fundamental wave P1 is formed on the emission side of the optical wavelength conversion element 25, and laser oscillation occurs during this period.
- the fundamental wave P 1 is condensed by the lens 31, and the fundamental wave P 1 is converted into the harmonic wave P 2 by the light wavelength conversion element 25. It is obtained using an optical waveguide 2 produced by proton exchange as the light wavelength conversion device in L i T a 0 3 substrate 1 having a periodic domain inversion structure in which the periodic structure is formed in this embodiment.
- the harmonic P 2 having increased power in the optical waveguide 2 in this manner is radiated from the radiation section 12.
- the divergent harmonic P 2 is collimated by the lens 32.
- the anode 14 is formed on the light wavelength conversion element 25 via the protective film 13.
- a method of manufacturing the optical wavelength conversion element 25 will be briefly described with reference to the drawings.
- a Ta electrode (first Ta electrode) 6 having a pattern similar to the pattern of the Ta mask used in each of the above-described embodiments was formed into a 0.3 mm thick LiNb. 0 8 formed on the main surface of the substrate 1.
- a Ta film (second Ta electrode) 6b is deposited on the entire back surface of the substrate 1.
- the first Ta electrode 6 formed on the main surface of the substrate 1 and the second Ta electrode 6 b formed on the back surface of the substrate 1 constitute an electrode structure for applying an electric field to the substrate 1 .
- an electric field is formed L i Nb0 3 in the substrate 1.
- the domain-inverted layer 3 extending from the portion of the front surface of the substrate 1 that is in contact with the first Ta T electrode 6 to the back surface of the substrate 1 ⁇ It is formed.
- the length L of the domain-inverted layer 3 along the direction in which light propagates is 2.5 m.
- etching is performed for 20 minutes using a 1: 1 mixture of HF and HNF3 to remove the Ta electrodes 6 and 6b.
- a proton exchange treatment using pyrophosphoric acid (260 ° C, 40 minutes)
- a proton exchange treatment using pyrophosphoric acid (260 ° C, 40 minutes)
- the Ta mask has a slit (width 6 m, length 1 Omm), and this slit defines the plane layout of the optical waveguide 2.
- annealing is performed at 460 for 5 hours using an infrared heating device. This annealing restores the nonlinearity of the proton-exchanged optical waveguide and increases the refractive index of that portion by about 0.002.
- the thickness d of the optical waveguide 2 is S 0 width 70 m.
- the arrangement period of the domain-inverted layers 3 along the direction in which the waveguide 2 extends is 5 ⁇ m, and this optical wavelength conversion element operates with respect to a fundamental wave having a wavelength of 947 ⁇ m.
- A1 electrode 14 is used for intensity modulation of output light.
- a plane perpendicular to the direction in which the optical waveguide 2 extends is optically polished to form an entrance 10 and an exit 12 shown in FIG. Further, the incident portion 10 is provided with an anti-reflection coating for the fundamental wave P1.
- the emission section 12 is provided with a reflection coat (99 mm) for the fundamental wave P1 and a non-reflection coat for the harmonic wave P2.
- the optical wavelength conversion element 25 (element length 1 O mm) shown in FIG. 17 can be manufactured.
- Possible causes of the loss reduction include the fact that a uniform optical waveguide was formed by phosphoric acid and the confinement of the waveguide was reduced. This weakly confined optical waveguide also reduced the density of harmonics and greatly improved optical damage. This is because by making the area 100 times larger than the conventional area, it is possible to withstand 100 times the optical damage.
- Figure 1'9 shows the relationship between the optical waveguide thickness and the optical power.
- the lightfast power is the power to withstand up to the harmonics, that is, no light fluctuation.
- the thickness of the optical waveguide is increased, the width is also increased by diffusion at the same time, so that the light damage resistance power is improved to almost the square of the optical waveguide wear. Since the power required for laser projection is at least 2 W, the thickness of the optical waveguide should be at least 40 m.
- a waveguide having a graded refractive index distribution is formed.
- the optical wavelength conversion element using the periodic domain-inverted structure it is possible to easily modulate the sine wave output by applying a voltage.
- Application voltage is low, and its industrial utility value is low.
- the modulator can be integrated, and the size and weight can be reduced;
- the nonlinear optical crystal is L i T a O s is also Toku ⁇ that large crystals it is easy to mass production of the optical wavelength conversion device was t, use a can light IC process obtained used in the present invention.
- the output of harmonics is unstable in multi-guide propagation with respect to the fundamental wave, which is not practical and single mode is effective.
- an optical wavelength conversion element having a periodic polarization reversal structure is used as in this embodiment, efficiency can be improved, the optical modulator can be integrated, and if the period is changed, only In addition, red and green laser light can be extracted, and its value is great. Note that the optical modulator may be separated.
- a blue laser light source shown in FIG. 17 was used as a light source of the laser projection device.
- Reference numeral 45 denotes a laser light source having a wavelength of 473 nm which is blue. You.
- the blue light is modulated by inputting a modulation signal to the modulation electrode.
- the modulated blue laser light enters the deflector.
- Reference numeral 56 denotes a vertical deflector and 57 denotes a horizontal deflector, both of which use a rotating multi-plane.
- a screen 70 with a gain of 3 a luminance of 300 cd / m 2, a contrast ratio of 100: 1, and a horizontal resolution of 1000 TV were obtained at a screen size of 4 m ⁇ 3 m.
- the resolution has been greatly improved compared to the past.
- the weight was reduced to 1/100, the capacity was reduced to 1/100, and the power consumption was significantly improved to 1/100. This is largely due to the small size and low power consumption of the laser light source used, and the fact that it is integrated with an optical modulator.
- the configuration using a semiconductor laser and an optical wavelength conversion element can be made ultra-small, and the conversion efficiency from air is about two orders of magnitude higher than that of a gas laser.
- an optical wavelength conversion element having a periodically poled structure high efficiency can be achieved, and the optical modulator can be integrated so that the effect is enormous.
- the laser beam is irradiated from the back of the screen, but the laser beam may be irradiated from the front.
- the fundamental wave P 1 emitted from the semiconductor laser 20 is guided to the optical wavelength conversion element 25 via the lens 30, the half-wave plate 37, and the condenser lens 31, and the harmonic wave Converted to P2.
- the configuration of the optical wavelength conversion element 25 is almost the same as that of the first embodiment.
- L i T a 0 3 groups plate in this embodiment uses an optical waveguide type optical wavelength conversion device.
- an electrode 14 and a protective layer 13 are formed for performing light modulation.
- the present embodiment does not have a resonator structure.
- FIG. 22 shows the internal configuration of the semiconductor laser 20.
- the semiconductor laser 20 is composed of a distributed return type (hereinafter abbreviated as DBR) semiconductor laser 20a and a semiconductor laser amplifier 2Ob.
- the DBR portion 27 is formed in the DBR semiconductor laser 20a by a grating and oscillates stably at a constant wavelength.
- This DBR semiconductor laser 20 The stabilized main wave P 0 emitted from a is guided to the semiconductor laser amplifier 20 b by the lens 30 a.
- the power is amplified by the active eyebrows 26b of the semiconductor laser amplifier 20b, and a stable fundamental wave P1 is obtained. By introducing this into the optical wavelength conversion element 25, the conversion efficiency and the harmonic output are greatly improved.
- the period of polarization inversion is 3 m, and the optical waveguide length is 7 mm.
- the oscillation wavelength of the semiconductor laser in this example was 960 nm, the wavelength of the generated harmonic P2 was 480 nm, and the color was blue.
- the conversion efficiency is 10% at 10W input. There was no light damage and the harmonic output was very stable.
- the DBR semiconductor laser has a stable oscillation wavelength, which is convenient for stabilizing the output of harmonics.
- the DBR semiconductor laser was RF-balanced (high-frequency heavy day).
- An 800MHz sinusoidal electric waveform was applied to the DBR semiconductor, and the semiconductor laser was converted to a pulse train using a relaxation oscillation.
- the peak output of the fundamental wave is greatly improved while the oscillation wavelength remains constant.
- a harmonic with a conversion efficiency of 50 °, 5W was obtained. The 5-fold conversion efficiency without RF superposition has been improved.
- the size can be further reduced by integration.
- the fundamental wave P 1 from the semiconductor laser 20 is gradually focused on the light wavelength conversion element 25 by the lens 30.
- L i Nb 0 3 instead of L i TA03 substrate as the substrate in this embodiment.
- a Balta type optical wavelength conversion element 25 is used.
- L iNb0 3 substrate 1 a has a feature that a large nonlinearity.
- the output of the harmonic P2 is stabilized using the optical feedback method.
- Wavelength tolerance of the optical wavelength conversion element 25 is the fundamental wave P 1 that has not been varying in c optical wavelength conversion element 25 is because narrow as about 0. 1 nm is collimated by the lens 32, The light is reflected by the grating 36 and returns to the semiconductor laser 20. As a result, the oscillation wavelength of the semiconductor laser 20 is locked to the reflection wavelength of the grating 36. To match the oscillation wavelength to the phase matching wavelength of the optical wavelength conversion element 25, the angle of the grating 36 may be changed.
- the harmonic P 2 is reflected by the dichroic mirror 35 and taken out in another direction.
- the oscillation wavelength of the semiconductor laser was 980 nm
- the harmonic P 2 extracted was 4 ° Onm at night.
- an RF waveform of 810 MHz and an output of 5 W were used.
- 3 W harmonics were obtained with an average output of 15 W of the fundamental wave.
- There is no optical damage because the fundamental wave is focused only to about 100 m, and the harmonics are not so large in terms of density.
- wavelength locking is performed by optical feedback using a grating.
- the present invention is not limited to this, such as selecting a wavelength with a filter and performing optical feedback.
- the size, weight, and cost can be reduced.
- the harmonic can be modulated by directly modulating the semiconductor laser, so that the configuration is simple and the cost can be reduced.
- FIG. 24 shows a cross section of an optical wavelength conversion element (bulk type) 25. Pump light P 1 a emitted from the semiconductor laser 20 having a wavelength of 806 nm enters the fiber 40 and propagates through the fiber 40.
- the pump light P 1 a emitted from the fiber 40 enters the optical wavelength conversion device 25.
- Material of the optical wavelength conversion element 25 is L i Ta0 3 substrate 1 b which Nd is a rare earth doped, polarization inversion structure period 5.1 are formed. The doping amount of Nd is lmo]%.
- Reference numeral 22 denotes a total reflection mirror that totally reflects 99% of light having a wavelength of 947 nm and transmits light in the 800 nm band.
- 23 is a total reflection mirror that reflects 947-nm light for 991 ⁇ 2 and transmits light in the 470-nm band. You. Further, the part of the total reflection mirror 23 is processed into a spherical shape.
- the optical wavelength conversion element 25 oscillates at a wavelength of 947 ⁇ ⁇ excited by the semiconductor laser 20, and is further converted into a harmonic P 2 by the periodic domain inversion structure by the domain inversion layer 3 and emitted to the outside.
- the pump light P 1 was 20 W
- a harmonic of 2 W was obtained.
- the temperature is stabilized by a Peltier device so that the temperature of the optical wavelength conversion device does not greatly change.
- the length of the conversion section of the laser light source of this embodiment is 1 Omm, and it can be made very compact by doping the optical wavelength conversion element with a rare earth element and propagating pump light by a fiber. Further, the temperature change can be prevented by keeping the optical wavelength conversion element away from heat generated by the semiconductor laser.
- FIG. 25 shows a configuration in which the solid-state laser crystal and the optical wavelength conversion element are separated.
- ⁇ laser crystal 2 1 as N d: YV 0 4 was affixed to the output side of the fiber scratch.
- L i T a 0 3 poled structure periodic in the optical wavelength conversion element 2 5 of the substrate 1 is formed. Even with the laser light source having this configuration, a 2 W blue laser beam could be stably obtained.
- FIG. 26 shows a configuration diagram of the laser light source of this embodiment.
- the pump light P 1 a emitted from the semiconductor laser 20 having a wavelength of 806 nm is converted into a fundamental wave P 1 by the solid-state laser crystal 21, enters the fiber 40, and propagates through the fiber 40.
- This fiber 40 is a single mode fiber.
- the fundamental wave P 1 emitted from the fiber 40 enters the optical wavelength conversion element 25. This In an embodiment it is obtained using an optical waveguide 2 produced by proton exchange in L i T a O a board 1 as an optical wavelength conversion element 2 5 having a periodic domain-inverted structure.
- LT a 0 3 substrate 1 is Z plate in the figure, an optical waveguide formed in 2, 3 poled layer, 1 0 incident portion of the fundamental wave P 1, 1 2 at the exit of the harmonics P 2 is there.
- the fundamental wave P 1 entering the optical waveguide 2 is converted into a higher harmonic P 2 at the polarization inversion eyebrow 3.
- the harmonic P 2 having increased power in the optical waveguide 2 is radiated from the emission unit 12.
- the divergent harmonic P 2 is collimated by the lens 32.
- an electrode 14 is formed on the element via a protective film 13.
- the pump light P1a was 30 W
- a 10-W harmonic harmonic P2 was obtained.
- the blue laser light was modulated at 30 MHz.
- the length of the conversion section of the laser light source of this embodiment is 10 mm, and it can be made very compact by propagating the fundamental wave P1 through a fiber. Further, the temperature rise can be prevented by moving the optical wavelength conversion element away from the semiconductor laser.
- FIG. 26 shows an embodiment using no solid-state laser crystal.
- a semiconductor laser with a wavelength of 980 nm and an output of 10 W is used. This is coupled to an optical wavelength conversion element 25 through a fiber 40 to perform direct conversion. At a wavelength of 4 9 0 n m, output 2 W were obtained.
- the laser projection device of the present invention will be described with reference to FIG.
- the light source three colors of the blue laser light source, the green laser light source, and the red laser light source of Example 5 were used.
- Reference numeral 45 denotes a laser light source having a wavelength of 473 nm, which is a blue color.
- Reference numeral 46 denotes a laser light source having a wavelength of 530 nm
- reference numeral 47 denotes a red laser light source having a wavelength of 650 nm.
- Each light wavelength conversion element is provided with a modulation electrode. By inputting a modulation signal to this modulation electrode, each light source output is modulated.
- the green laser light is combined with the blue laser light by the dichroic mirror 61.
- the laser beam and the other two colors are multiplexed by the dichroic mirror.
- 5 6 is vertical bias
- And 57 are horizontal deflectors, both of which use rotating polygon guns.
- the luminance is 2 0 0 c ⁇ / K
- the contrast ratio is 1 0 0: 1
- the horizontal resolution is 1 0 0 0 TV lines
- the vertical resolution is 1 0 0 0 Got a TV book.
- the laser projection device of the present invention is bright, has low resolution, consumes very little power, and has a great effect.
- a polarization inversion type optical wavelength conversion element is used, but the present invention is not limited to this. If a laser light source that emits red light from a semiconductor laser is used, the cost can be further reduced. In addition, a semiconductor laser directly oscillating can be used as a color-growing or green laser. The combination is free.
- the laser power is automatically turned off when scanning of the laser beam stops.
- an infrared laser beam which is a sub-semiconductor laser with a weak output, scans around the projected laser beam, and when an object touches this beam, the laser beam automatically turns off.
- Infrared semiconductor lasers are characterized by low cost and long life. Next, these will be described with reference to FIG. Three laser beams of three primary colors are scanned by a deflector in a drawing range 71 on a screen 70. This laser beam passes over sensors A and B located around the drawing area 71. The ffi signal of sensors A and B is constantly monitored.
- the laser light from the infrared laser light source by the infrared semiconductor laser is constantly scanned around the screen 70 by the deflector 58.
- This Si light enters the sensor C.
- the light reflected at all points in the periphery enters the sensor C.
- the light source of the laser light source is turned off, but the optical path of the laser may be cut off. Further, the generation of the short-wavelength laser light may be stopped by shifting the phase matching wavelength of the optical wavelength conversion element by voltage or the like, or by changing the oscillation wavelength of the semiconductor laser which is the fundamental light source. According to this method, the time until the return can be greatly reduced.
- FIG. 30 shows a configuration diagram of the laser projection apparatus of the present embodiment.
- the laser light is split in two directions by inserting the prism type optical path converter 66 into the three-color laser light.
- the split laser light is reflected by respective mirrors 64 and 65, modulated by modulators 5a and 5b, and enters screen 70. Images viewed from the right direction and surface image information viewed from the left direction are put by the transformers 5a and 5b, respectively, and light enters the screen 70 from different directions and looks three-dimensional.
- the optical path 1 and the optical path 2 are switched at a certain time, and the human feels as if images from two directions come in different directions, and the stereoscopic image becomes clearer.
- a stereoscopic image can be easily viewed without a stereoscopic viewing screen.
- the light may be divided into two by a half mirror or the like to be three-dimensional.
- one light source is divided, two laser light sources of the same color may be used to irradiate the screen from different directions. In this case, the output of one light source can be halved.
- FIG. 31 shows a configuration diagram of the laser projection apparatus of the present embodiment.
- An ultraviolet laser light source based on a light wavelength conversion element is used as a light source. By irradiating this on the screen 70 coated with a phosphor, red, green and blue RGB light is emitted.
- laser The configuration of the light source was a half wavelength of 3250 nm of red laser light of 65 nm, which is a direct oscillation of a semiconductor laser, using a LiTaOa light wavelength conversion element.
- This light wavelength conversion element is a Balta type having a polarization inversion structure.
- Reference numeral 48 denotes this laser light source.
- an ultraviolet modulation signal is obtained by directly modulating a red semiconductor laser. The modulated ultraviolet laser light enters the deflector.
- Reference numeral 56 denotes a vertical deflector
- 57 denotes a horizontal deflector, both of which use a rotating polygon mirror.
- the screen 70 is coated with a phosphor that generates red, green, and blue, and generates fluorescent light.
- a luminance of 300 cd / m with a contrast ratio of 100: 1 and a horizontal resolution of 60 OTV was obtained at a surface size of lmx O.5 m.
- three primary color lights of red, green, and blue can be generated by one laser light source, and the size and cost can be reduced. At this time, it is also effective to omit the dichroic mirror for multiplexing.
- a blue laser light source 45 based on a light wavelength conversion element is used as a light source.
- the laser light emitted from the laser light source 45 is collimated by the lens 30.
- a liquid crystal light bubble 68 is inserted into the parallel laser beam.
- the signal is spatially modulated by applying a signal to the liquid crystal light valve 68, and the image can be viewed by enlarging this light with the lens 31 and projecting it on the screen. It should be noted that colorization can be achieved by using laser light sources of three primary colors.
- the external configuration is the same as that of the laser projection embodiment shown in FIG.
- the blue laser light source shown in Fig. 23 is used, and the semiconductor laser here is RF-superimposed.
- blue light is modulated by inputting a modulation convention in addition to RF superimposition.
- the modulated blue laser light enters the deflector. Using a screen with a gain of 2, a luminance of 200 cd / m 2 was obtained at a screen size of 2 mx 1 m. Laser light on the screen No speckle noise caused by interference was observed.
- the RF weight ⁇ is effective for a laser projection apparatus using a laser light source by direct wavelength conversion of a semiconductor laser. Speckle noise can also be prevented when a red, green, or blue laser beam is directly generated by a semiconductor laser beam. Needless to say, it is effective for a color laser projector.
- L i Nb0 3 and L i TaO 3, KNb0 3, ferroelectric KTP or the like a rare earth organic material and its these materials such as MNA It is also applicable to doped ones. Also, rare earths are promising not only for Nd used in the examples, but also for Er and T1. Although using a YAG as a solid-state laser crystal or some crystals effects of YLF. YV0 4 like other. LiSAF and UCAF are also effective as solid-state lasers.
- This optical disc apparatus has an optical pickup 104 having an optical wavelength conversion element 25 having a periodic inversion structure.
- the laser light emitted from the semiconductor laser 20 passes through a fiber 40 to an optical pickup 104.
- an optical pickup 104 Provided to conversion element 25.
- the optical pickup 104 includes, in addition to the optical wavelength conversion element 25, a collimator lens 32 that converts high-frequency waves emitted from the optical wavelength conversion element 25 into parallel light, and a polarization beam splitter that transmits the collimated light toward an optical disc. 105, a condenser lens 106 for collecting the light on the optical disk, and a detector 103 for detecting the reflected light from the optical disk.
- the polarizing beam splitter 105 selectively reflects the reflected light from the optical disc and supplies the reflected light to the detector 103.
- the optical pickup 104 is driven by an actuator, while the semiconductor laser 20 is fixed in the optical disk.
- the optical pickup 104 can reliably receive the laser beam from the semiconductor laser 20 fixed in the optical disk device by using a flexible optical fiber.
- Light (pump light) emitted from the semiconductor laser 20 is converted into a fundamental wave P 1 by the solid-state laser 21, and is applied to the optical wavelength conversion element 25 through the optical fiber 40.
- the optical wavelength conversion element 25 has a configuration similar to that of the above-described embodiment, and converts the fundamental wave P1 into a harmonic P2.
- the fifth harmonic P 2 is collimated by the collimating lens 32, passes through the polarizing beam splitter 105, and is condensed on the optical disc medium 102 via the condensing lens 106.
- the reflected light from the optical disk medium 102 returns to the same optical path again, is reflected by the polarization beam splitter 105, and is detected by the detector 103.
- a signal is recorded on the optical disk medium, Alternatively, the recorded signal can be reproduced.
- a quarter-wave plate 108 is inserted between the polarization beam splitter 105 and the condenser lens 106 to rotate the polarization direction by 90 degrees on the forward and return paths of the harmonic. .
- a harmonic P 2 of 200 niW was obtained.
- the wavelength of the light emitted from the solid-state laser 21 is 947 nm, and the wavelength of the harmonic is 473 nm.
- the semiconductor laser 20 that generates heat during operation is fixed to the housing of the optical disk device and is insulated from the optical pickup. Therefore, as a result of the removal of the semiconductor laser from the optical pickup, a special ripening structure for the semiconductor laser was set up. There is no need to open. Therefore, an ultra-small and lightweight optical pickup can be configured. As a result, the optical pickup can drive the actuator at high speed, so that high-speed recording at a high transfer rate can be achieved.
- the solid-state laser is arranged on the semiconductor laser side in the present embodiment, it may be arranged on the optical wavelength conversion element side. Instead of using a solid-state laser, light from a semiconductor laser may be directly converted into a harmonic as a fundamental wave.
- the internal configuration of the optical pickup 104 is not limited to that of the present embodiment.
- a lens and a polarization beam splitter can be omitted. Then, the optical pickup can be further miniaturized.
- the optical wavelength conversion device of the present invention L i N b x T ai _ x 0 3 C 0 ⁇ X ⁇ 1) optical element after fabricated substrate, ⁇ by cold Aniru Aniru
- the stable proton exchange layer can be formed by increasing the refractive index caused during the heat treatment, and thereby, a stable optical element can be formed.
- the present invention is indispensable for practical use of an optical wavelength conversion element whose phase matching wavelength changes with a change in the refractive index.
- the two-stage annealing in which the T temperature is set to two stages by using a low-temperature annealing, is effective in quickly returning the stable proton-exchange layer to a state in which there is no change with time.
- the strain can be greatly reduced, and a stable proton exchange layer can be formed, which is effective.
- the low-temperature annealing temperature is less than or equal to 120, and if it is performed for at least one hour, the temporal change is less than 0.5 nm, which is effective. . If the value is less than 50, the annealing time becomes extremely long and causes a problem.
- a distributed feedback semiconductor laser and an optical wavelength conversion element are provided. It is possible to stabilize the oscillation wavelength of the semiconductor laser and increase the output of the fundamental wave by using a semiconductor laser amplifier during the operation, and to use an optical wavelength converter having a highly efficient domain-inverted structure. ⁇ Harmonic output power is obtained stably.
- the optical wavelength conversion element can be made very compact by transmitting the pump light or the fundamental wave through the fiber. Further, the optical wavelength conversion element can be kept away from heat generated by the semiconductor laser, a temperature change can be prevented, and a high-power semiconductor laser can be used.
- a periodically poled structure When a periodically poled structure is used as an optical wavelength conversion element, not only the conversion efficiency is greatly improved, but also it is possible to easily modulate by applying a voltage, and the voltage is low for industrial use. It is. As a result, the modulator can be integrated, and the size, weight, and cost can be reduced. Also, by using an optical waveguide with weak confinement as an optical wavelength conversion probe, the density of harmonics was reduced, and light damage was greatly improved. For example, by making the area 100 times larger than the conventional area, it is possible to withstand a 100 times light loss image. ⁇ According to the laser light source of the present invention, By converting the pump light to the fundamental wave, a multi-stripe or wide-stripe high-output semiconductor laser can be used, and a higher harmonic of the output can be obtained.
- the conversion efficiency when the RF weight is low is improved by a factor of five.
- the laser projection device of the present invention since it is based on a semiconductor laser, it is possible to significantly reduce its size, weight, and cost.
- a high-power laser light source based on a semiconductor laser and an optical wavelength conversion element the size, weight, and cost of the device can be reduced at once.
- the power consumption can be extremely small.
- This device has no laser light modulator and is integrated with the optical wavelength conversion device.
- the resolution is greatly improved compared to the past. For example, mo Compared to the configuration using a laser, the weight was greatly reduced to 1/100, the capacity was reduced to 1/100, and the power consumption was reduced to 1/100.
- the configuration using the semiconductor laser and the optical wavelength conversion element can be miniaturized, and the conversion efficiency from electricity is about two orders of magnitude higher than that of a gas laser.
- the three primary colors can be emitted by striking the phosphor with an ultraviolet laser light source, the size and cost can be further reduced and its industrial value is great. In this way, three primary colors of red, green and blue can be generated by one laser light source. At this time, it is also effective to omit the dichroic mirror for multiplexing.
- the laser projection device of the present invention when scanning is stopped, a laser beam stop or cut function is provided to prevent a specific portion from being intensively irradiated with laser light. Also, if the sensor signal is interrupted even for a moment, the control circuit turns off the laser light source. In other words, humans and the like do not touch the high-output short-wavelength laser light, which is safe. As described above, the safety of the laser projection device is maintained.
- RF superposition is effective for a laser projection device using a laser light source by direct wavelength conversion of a semiconductor laser. This is because speckle noise can be prevented and a clear gouge image can be reproduced. Speckle noise can also be prevented when red, blue, or blue laser light is directly generated by semiconductor laser light.
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/973,380 US6333943B1 (en) | 1995-06-02 | 1996-05-30 | Optical device, laser beam source, laser apparatus and method of producing optical device |
JP53637596A JP3460840B2 (ja) | 1995-06-02 | 1996-05-30 | 光素子、レーザ光源及びレーザ装置並びに光素子の製造方法 |
KR1019970708930A KR100283829B1 (ko) | 1995-06-02 | 1996-05-30 | 광소자, 레이저 광원 및 레이저 장치와 광소자의 제조방법 |
US11/965,170 US7570677B2 (en) | 1995-06-02 | 2007-12-27 | Optical device, laser beam source, laser apparatus and method of producing optical device |
US12/018,485 US7623559B2 (en) | 1995-06-02 | 2008-01-23 | Optical device, laser beam source, laser apparatus and method of producing optical device |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7/136471 | 1995-06-02 | ||
JP13647195 | 1995-06-02 | ||
JP16846195 | 1995-07-04 | ||
JP7/168461 | 1995-07-04 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US08973380 A-371-Of-International | 1996-05-30 | ||
US09/922,978 Division US6914918B2 (en) | 1995-06-02 | 2001-08-06 | Optical device, laser beam source, laser apparatus and method of producing optical device |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1996038757A1 true WO1996038757A1 (fr) | 1996-12-05 |
Family
ID=26470046
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1996/001472 WO1996038757A1 (fr) | 1995-06-02 | 1996-05-30 | Appareil optique, source de faisceau laser, equipement a laser et procede de production d'un appareil optique |
Country Status (5)
Country | Link |
---|---|
US (10) | US6333943B1 (ja) |
JP (1) | JP3460840B2 (ja) |
KR (1) | KR100283829B1 (ja) |
CN (7) | CN1305183C (ja) |
WO (1) | WO1996038757A1 (ja) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005083492A1 (ja) * | 2004-02-27 | 2005-09-09 | Matsushita Electric Industrial Co., Ltd. | 照明光源及びそれを用いた2次元画像表示装置 |
WO2006092965A1 (ja) * | 2005-03-02 | 2006-09-08 | Matsushita Electric Industrial Co., Ltd. | コヒーレント光源及びそれを用いた記録再生装置 |
US7327768B2 (en) | 2002-09-10 | 2008-02-05 | The Furukawa Electric Co., Ltd. | Wavelength conversion module |
US7416306B2 (en) | 2003-06-06 | 2008-08-26 | Matsushita Electric Industrial Co., Ltd. | Laser projector |
US7426223B2 (en) | 2004-04-09 | 2008-09-16 | Matsushita Electric Industrial, Co., Ltd. | Coherent light source and optical device |
WO2010125866A1 (ja) * | 2009-04-27 | 2010-11-04 | コニカミノルタオプト株式会社 | 画像表示装置およびレーザ投射装置 |
US7988304B2 (en) | 2004-02-27 | 2011-08-02 | Panasonic Corporation | Video projector |
CN105144413A (zh) * | 2013-04-26 | 2015-12-09 | 欧司朗光电半导体有限公司 | 具有带有柱状结构上的有源区的半导体层序列的发光装置 |
WO2017119313A1 (ja) * | 2016-01-08 | 2017-07-13 | 日本碍子株式会社 | 蛍光体素子および照明装置 |
JP2018041103A (ja) * | 2011-07-22 | 2018-03-15 | ケーエルエー−テンカー コーポレイション | 周波数変換結晶アニール方法 |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1996038757A1 (fr) * | 1995-06-02 | 1996-12-05 | Matsushita Electric Industrial Co., Ltd. | Appareil optique, source de faisceau laser, equipement a laser et procede de production d'un appareil optique |
JP2000066050A (ja) * | 1998-08-19 | 2000-03-03 | Ngk Insulators Ltd | 光導波路部品の製造方法及び光導波路部品 |
US6490309B1 (en) * | 1999-07-21 | 2002-12-03 | Fuji Photo Film Co., Ltd. | Laser-diode-pumped laser apparatus in which Pr3+-doped laser medium is pumped with GaN-based compound laser diode |
DE10006286C1 (de) * | 2000-02-14 | 2001-10-18 | 3M Espe Ag | Lichtwellenkonvertervorrichtung und deren Verwendung im Dentalbereich |
KR100425682B1 (ko) * | 2001-08-07 | 2004-04-03 | 엘지전자 주식회사 | 공간 광변조 어레이 제조방법 및 이를 이용한 레이저 표시장치 |
US7693194B2 (en) * | 2004-08-12 | 2010-04-06 | Mitsubishi Electric Corporation | Fundamental-wave light source and wavelength converter |
WO2006109687A1 (ja) | 2005-04-11 | 2006-10-19 | Matsushita Electric Industrial Co., Ltd. | 微小機械構造体 |
JP5124978B2 (ja) | 2005-06-13 | 2013-01-23 | 日亜化学工業株式会社 | 発光装置 |
WO2007013513A1 (ja) * | 2005-07-28 | 2007-02-01 | Matsushita Electric Industrial Co., Ltd. | 波長変換素子、レーザ光源装置、2次元画像表示装置及びレーザ加工装置 |
JPWO2007040089A1 (ja) * | 2005-09-30 | 2009-04-16 | パナソニック株式会社 | レーザ投射装置及び液晶テレビ装置 |
WO2007039850A1 (en) * | 2005-10-04 | 2007-04-12 | Philips Intellectual Property & Standards Gmbh | A laser projection system based on a luminescent screen |
JP4605507B2 (ja) * | 2005-12-14 | 2011-01-05 | 富士電機デバイステクノロジー株式会社 | 三次元立体像の表示装置 |
KR100748690B1 (ko) * | 2006-01-02 | 2007-08-13 | 삼성전자주식회사 | 스펙클을 감소시키는 광모듈 및 이를 이용한 스펙클 감소방법 |
US20070165683A1 (en) * | 2006-01-16 | 2007-07-19 | Samsung Electronics Co., Ltd | Green laser optical module |
US20100254154A1 (en) * | 2006-04-12 | 2010-10-07 | Flight Safety Technologies, Inc | Central laser source based passive countermeasure system |
US20080020083A1 (en) * | 2006-06-06 | 2008-01-24 | Kabushiki Kaisha Topcon | Method for joining optical members, structure for integrating optical members and laser oscillation device |
US7697577B2 (en) * | 2006-06-23 | 2010-04-13 | Panasonic Corporation | Wavelength conversion apparatus and two-dimensional image display apparatus |
US20080297731A1 (en) * | 2007-06-01 | 2008-12-04 | Microvision, Inc. | Apparent speckle reduction apparatus and method for mems laser projection system |
DE102007046611A1 (de) * | 2007-09-28 | 2009-04-02 | Osram Opto Semiconductors Gmbh | Lichtquelle mit Konversionselement und Lichtwellenleiter, Verfahren zur Herstellung der Lichtquelle und deren Verwendung |
US20090154508A1 (en) * | 2007-12-12 | 2009-06-18 | Hc Photonics Corp. | Light-generating apparatus with broadband pumping laser and quasi-phase matching waveguide |
KR100950277B1 (ko) * | 2008-01-28 | 2010-03-31 | 광주과학기술원 | 녹색광원 생성장치 및 이를 이용한 레이저 프로젝션디스플레이를 구비하는 휴대용 전자기기 |
US8179934B2 (en) * | 2008-05-12 | 2012-05-15 | Ipg Photonics Corporation | Frequency conversion laser head |
JP5040849B2 (ja) * | 2008-08-06 | 2012-10-03 | 住友電気工業株式会社 | 波長変換素子の製造方法 |
JP5362301B2 (ja) * | 2008-09-19 | 2013-12-11 | 株式会社Qdレーザ | レーザシステム |
WO2011108256A1 (ja) * | 2010-03-02 | 2011-09-09 | パナソニック株式会社 | 波長変換装置およびそれを用いた画像表示装置 |
JP5594192B2 (ja) * | 2011-03-08 | 2014-09-24 | 住友大阪セメント株式会社 | 光変調器 |
KR101905852B1 (ko) * | 2011-04-13 | 2018-10-08 | 엘지이노텍 주식회사 | 광학 시트 및 이를 포함하는 표시장치 |
US9868979B2 (en) | 2013-06-25 | 2018-01-16 | Prognosys Biosciences, Inc. | Spatially encoded biological assays using a microfluidic device |
DE102014100723A1 (de) * | 2014-01-23 | 2015-07-23 | Hella Kgaa Hueck & Co. | Beleuchtungsvorrichtung für Fahrzeuge |
CN107532207B (zh) | 2015-04-10 | 2021-05-07 | 空间转录公司 | 生物样本的空间区别、多重核酸分析 |
CN110286439B (zh) * | 2019-07-02 | 2020-07-24 | 山东大学 | 采用质子交换方法在渐变周期极化钽酸锂上形成光波导量子芯片的方法 |
CN113471802B (zh) * | 2021-07-12 | 2023-01-24 | 河南工程学院 | 一种低电压双块晶体电光q开关 |
Citations (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6122518B2 (ja) * | 1977-12-27 | 1986-05-31 | Sony Corp | |
JPS62274788A (ja) * | 1986-05-19 | 1987-11-28 | スペクトラ−フィジックス・インコ−ポレイテッド | 小型急速脱着式レ−ザ−ヘッドを有し、レ−ザ−ダイオ−ドでポンプされる固体レ−ザ− |
JPH02199975A (ja) * | 1989-01-27 | 1990-08-08 | Sony Corp | ディスプレイ装置 |
JPH02221995A (ja) * | 1989-02-22 | 1990-09-04 | Sony Corp | 画像表示装置 |
JPH0338984A (ja) * | 1989-07-05 | 1991-02-20 | Pioneer Electron Corp | 投射型表示装置 |
JPH03191332A (ja) * | 1989-12-20 | 1991-08-21 | Matsushita Electric Ind Co Ltd | 光波長変換素子およびその製造方法 |
JPH0445478A (ja) * | 1990-06-13 | 1992-02-14 | Ibiden Co Ltd | レーザディスプレイ |
JPH0418823U (ja) * | 1990-06-05 | 1992-02-17 | ||
JPH04100088A (ja) * | 1990-08-20 | 1992-04-02 | Sony Corp | 直視型画像表示装置 |
JPH04296731A (ja) * | 1991-03-27 | 1992-10-21 | Matsushita Electric Ind Co Ltd | 短波長レーザ光源 |
JPH04315120A (ja) * | 1991-04-15 | 1992-11-06 | Matsushita Electric Ind Co Ltd | 顕微鏡用光源 |
JPH04507299A (ja) * | 1989-02-01 | 1992-12-17 | ザ ボード オブ トラスティーズ オブ ザ リーランド スタンフォード ジュニア ユニバーシティ | 非線形光発振器と半導体の強誘電分極領域の制御方法 |
JPH05107421A (ja) * | 1991-10-21 | 1993-04-30 | Fujitsu Ltd | 部分的分極反転層の形成方法および第二高調波発生素子 の製造方法 |
JPH05173094A (ja) * | 1991-12-20 | 1993-07-13 | Sony Corp | レーザ表示装置 |
JPH06148444A (ja) * | 1992-11-06 | 1994-05-27 | Fujitsu Ltd | 光多重信号分離器 |
JPH06265956A (ja) * | 1993-03-17 | 1994-09-22 | Fuji Photo Film Co Ltd | 光波長変換方法 |
JPH06273814A (ja) * | 1992-03-11 | 1994-09-30 | Matsushita Electric Ind Co Ltd | 光波長変換素子およびそれを用いた短波長レーザ光源 |
JPH06350168A (ja) * | 1993-06-08 | 1994-12-22 | Hitachi Metals Ltd | 固体レーザ発振器 |
JPH0723329U (ja) * | 1993-09-30 | 1995-04-25 | 三洋電機株式会社 | Lcdプロジェクタ |
Family Cites Families (70)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3634614A (en) * | 1969-04-16 | 1972-01-11 | Bell Telephone Labor Inc | Infrared-energized visual displays using up-converting phosphor |
JPS6134145B2 (ja) | 1975-02-13 | 1986-08-06 | Canon Kk | |
US4285569A (en) * | 1979-10-03 | 1981-08-25 | Rockwell International Corporation | CCD Driven integrated optical modulator array |
JPS5844785A (ja) | 1981-08-27 | 1983-03-15 | Kokusai Denshin Denwa Co Ltd <Kdd> | 半導体レ−ザ |
US4667331A (en) * | 1984-01-20 | 1987-05-19 | At&T Company And At&T Bell Laboratories | Composite cavity laser utilizing an intra-cavity electrooptic waveguide device |
JPS6122518A (ja) | 1984-07-09 | 1986-01-31 | オムロン株式会社 | キ−トツプの製造方法 |
FR2572176B1 (fr) | 1984-10-19 | 1987-02-20 | Inst Textile De France | Procede et dispositif de mesure par radiometrie micro-onde de la temperature d'un materiau plan en defilement, notamment textile |
US5042909A (en) * | 1987-10-07 | 1991-08-27 | Texas Instruments Incorporated | Real time three dimensional display with angled rotating screen and method |
US4925263A (en) * | 1987-11-05 | 1990-05-15 | Polaroid Corporation | Proton-exchanged waveguides for sum-frequency generation |
US5198994A (en) | 1988-08-31 | 1993-03-30 | Kabushiki Kaisha Toshiba | Ferroelectric memory device |
JP2591099B2 (ja) * | 1988-09-29 | 1997-03-19 | 旭硝子株式会社 | レーザ共振型光ピックアップ |
US5113524A (en) * | 1988-09-30 | 1992-05-12 | Hitachi, Ltd. | Quantum state control apparatus, optical receiver and optical communication system |
US4919506A (en) * | 1989-02-24 | 1990-04-24 | General Electric Company | Single mode optical fiber coupler |
US5223911A (en) * | 1989-03-27 | 1993-06-29 | United Technologies Corporation | Single-polarization, integrated optical components for optical gyroscopes |
JPH04783A (ja) * | 1989-06-14 | 1992-01-06 | Hitachi Ltd | 半導体光素子 |
US5177758A (en) * | 1989-06-14 | 1993-01-05 | Hitachi, Ltd. | Semiconductor laser device with plural active layers and changing optical properties |
US4907238A (en) * | 1989-06-26 | 1990-03-06 | United States Of America As Represented By The Secretary Of The Navy | Apparatus for the efficient wavelength conversion of laser radiation |
US5043991A (en) * | 1989-12-28 | 1991-08-27 | General Dynamics Corp. Electronics Division | Device for compensating for thermal instabilities of laser diodes |
JP2755334B2 (ja) | 1990-05-14 | 1998-05-20 | 日本電気株式会社 | 無線呼出選択受信機 |
JPH05249521A (ja) | 1992-03-04 | 1993-09-28 | Hitachi Ltd | 導波路型高調波変調装置 |
JPH0451011A (ja) * | 1990-06-18 | 1992-02-19 | Pioneer Electron Corp | レーザ投射型表示装置 |
JP2750231B2 (ja) * | 1990-11-05 | 1998-05-13 | 富士通株式会社 | 導波路型第2高調波発生素子の製造方法 |
JP3052501B2 (ja) * | 1990-11-30 | 2000-06-12 | 松下電器産業株式会社 | 波長変換素子の製造方法 |
US5253259A (en) * | 1991-02-07 | 1993-10-12 | Matsushita Electric Industrial Co., Ltd. | Frequency doubler and visible laser source having a heater |
JPH0645669A (ja) | 1991-03-08 | 1994-02-18 | Nec Corp | 端面励起型固体レーザ |
US5295209A (en) * | 1991-03-12 | 1994-03-15 | General Instrument Corporation | Spontaneous emission source having high spectral density at a desired wavelength |
JPH05297428A (ja) * | 1991-03-27 | 1993-11-12 | Matsushita Electric Ind Co Ltd | 波長変換方法 |
US5691989A (en) * | 1991-07-26 | 1997-11-25 | Accuwave Corporation | Wavelength stabilized laser sources using feedback from volume holograms |
JP2728990B2 (ja) | 1991-07-30 | 1998-03-18 | 富士写真フイルム株式会社 | 画像記録方法 |
US5363117A (en) * | 1991-09-04 | 1994-11-08 | Sony Corporation | Laser-addressed liquid crystal display |
ATE156623T1 (de) | 1991-12-30 | 1997-08-15 | Philips Electronics Nv | Einrichtung, in der frequenzerhöhung von elektromagnetischer strahlung auftritt, und eine solche einrichtung enthaltendes gerät zum optischen abtasten einer informationsebene |
JP2962024B2 (ja) * | 1992-02-04 | 1999-10-12 | 松下電器産業株式会社 | 光導波路の製造方法および光波長変換素子の製造方法 |
JPH05215927A (ja) * | 1992-02-05 | 1993-08-27 | Sumitomo Metal Mining Co Ltd | 光集積回路及びその作製方法 |
JPH05232536A (ja) | 1992-02-18 | 1993-09-10 | Ricoh Co Ltd | 波長変換装置 |
JP2704080B2 (ja) | 1992-02-21 | 1998-01-26 | 富士写真フイルム株式会社 | 立体画像記録方法および立体画像記録装置 |
US5303247A (en) * | 1992-03-11 | 1994-04-12 | Matsushita Electric Industrial Co., Ltd. | Optical harmonic generating device for generating harmonic wave from fundamental wave and shorter wavelength laser generating apparatus in which fundamental wave of laser is converted to harmonic wave with the device |
JPH05333395A (ja) * | 1992-04-03 | 1993-12-17 | Fuji Photo Film Co Ltd | 光波長変換装置 |
US5295143A (en) * | 1992-05-06 | 1994-03-15 | Excel Quantronix | Three color laser |
JPH05323405A (ja) * | 1992-05-25 | 1993-12-07 | Matsushita Electric Ind Co Ltd | 波長変換素子およびレーザ光源 |
US5313479A (en) * | 1992-07-29 | 1994-05-17 | Texas Instruments Incorporated | Speckle-free display system using coherent light |
JPH0618823U (ja) | 1992-08-24 | 1994-03-11 | シャープ株式会社 | 空気調和機の室外機 |
JP3198649B2 (ja) * | 1992-08-26 | 2001-08-13 | ソニー株式会社 | 光導波路装置 |
US5295218A (en) * | 1992-09-29 | 1994-03-15 | Eastman Kodak Company | Frequency conversion in inorganic thin film waveguides by quasi-phase-matching |
US5523964A (en) | 1994-04-07 | 1996-06-04 | Symetrix Corporation | Ferroelectric non-volatile memory unit |
JPH06194708A (ja) | 1992-11-04 | 1994-07-15 | Oki Electric Ind Co Ltd | Shg素子、shg装置およびshg素子の実効屈折率決定方法 |
EP0764869B1 (en) | 1992-12-17 | 2001-11-07 | Sharp Kabushiki Kaisha | Autostereoscopic display apparatus |
FR2699690B1 (fr) * | 1992-12-22 | 1995-01-27 | Thomson Csf | Projecteur d'images mobiles à faible champ. |
JPH06214351A (ja) * | 1993-01-14 | 1994-08-05 | Fuji Photo Film Co Ltd | 画像形成方法 |
CA2155310A1 (en) * | 1993-02-03 | 1994-08-18 | Frank C. Gibeau | Methods and apparatus for image projection |
JPH06295159A (ja) * | 1993-04-09 | 1994-10-21 | Matsushita Electric Ind Co Ltd | レーザディスプレイ装置 |
JPH06308408A (ja) | 1993-04-19 | 1994-11-04 | Olympus Optical Co Ltd | 映像表示装置 |
JP3329066B2 (ja) | 1993-05-18 | 2002-09-30 | 松下電器産業株式会社 | レーザ装置 |
JPH0715077A (ja) | 1993-06-23 | 1995-01-17 | Asahi Glass Co Ltd | 高調波発生装置 |
JPH0723329A (ja) | 1993-07-01 | 1995-01-24 | Roland Corp | 映像編集装置 |
US5430756A (en) * | 1993-08-05 | 1995-07-04 | Nec Corporation | Solid state laser excited by laser diode |
US5452312A (en) | 1993-10-18 | 1995-09-19 | Matsushita Electric Industrial Co., Ltd. | Short-wavelength laser light source and optical information processing aparatus |
JP3263553B2 (ja) * | 1994-02-23 | 2002-03-04 | キヤノン株式会社 | 光送信機 |
FR2725081B1 (fr) * | 1994-09-23 | 1996-11-15 | Thomson Csf | Source optique compacte, basee sur le doublage de frequence d'un laser et auto-stabilisee par depeuplement de la pompe |
JP3544020B2 (ja) | 1995-01-13 | 2004-07-21 | 富士通株式会社 | 光導波路デバイスの製造方法 |
WO1996038757A1 (fr) * | 1995-06-02 | 1996-12-05 | Matsushita Electric Industrial Co., Ltd. | Appareil optique, source de faisceau laser, equipement a laser et procede de production d'un appareil optique |
US5838709A (en) * | 1995-06-07 | 1998-11-17 | Nikon Corporation | Ultraviolet laser source |
EP0774684A3 (en) * | 1995-11-16 | 1998-04-22 | Matsushita Electric Industrial Co., Ltd. | Optical apparatus and method for producing the same |
US5745284A (en) * | 1996-02-23 | 1998-04-28 | President And Fellows Of Harvard College | Solid-state laser source of tunable narrow-bandwidth ultraviolet radiation |
DE69725914T2 (de) * | 1996-03-11 | 2004-11-04 | Fuji Photo Film Co., Ltd., Minami-Ashigara | Bilderzeugungsverfahren und System |
US5682398A (en) * | 1996-05-03 | 1997-10-28 | Eastman Kodak Company | Frequency conversion laser devices |
AU722995B2 (en) * | 1997-01-28 | 2000-08-17 | Christie Digital Systems Usa, Inc. | Laser video display system and method |
US6188705B1 (en) * | 1997-05-16 | 2001-02-13 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Fiber grating coupled light source capable of tunable, single frequency operation |
US5990925A (en) * | 1997-11-07 | 1999-11-23 | Presstek, Inc. | Diode-pumped system and method for producing image spots of constant size |
JP2000066050A (ja) * | 1998-08-19 | 2000-03-03 | Ngk Insulators Ltd | 光導波路部品の製造方法及び光導波路部品 |
US6490309B1 (en) * | 1999-07-21 | 2002-12-03 | Fuji Photo Film Co., Ltd. | Laser-diode-pumped laser apparatus in which Pr3+-doped laser medium is pumped with GaN-based compound laser diode |
-
1996
- 1996-05-30 WO PCT/JP1996/001472 patent/WO1996038757A1/ja active IP Right Grant
- 1996-05-30 CN CNB2004100282199A patent/CN1305183C/zh not_active Expired - Fee Related
- 1996-05-30 CN CNB2004100282216A patent/CN1304877C/zh not_active Expired - Fee Related
- 1996-05-30 CN CNB2004100282201A patent/CN1305184C/zh not_active Expired - Fee Related
- 1996-05-30 CN CNB200410028224XA patent/CN100351670C/zh not_active Expired - Fee Related
- 1996-05-30 US US08/973,380 patent/US6333943B1/en not_active Expired - Fee Related
- 1996-05-30 CN CNB961954337A patent/CN1154878C/zh not_active Expired - Fee Related
- 1996-05-30 CN CNB2004100282220A patent/CN1305185C/zh not_active Expired - Fee Related
- 1996-05-30 JP JP53637596A patent/JP3460840B2/ja not_active Expired - Fee Related
- 1996-05-30 CN CNB2004100282235A patent/CN100394298C/zh not_active Expired - Fee Related
- 1996-05-30 KR KR1019970708930A patent/KR100283829B1/ko not_active IP Right Cessation
-
2001
- 2001-08-06 US US09/922,978 patent/US6914918B2/en not_active Expired - Fee Related
-
2003
- 2003-11-13 US US10/712,086 patent/US7101723B2/en not_active Expired - Fee Related
- 2003-11-13 US US10/712,634 patent/US7339960B2/en not_active Expired - Fee Related
- 2003-11-13 US US10/712,635 patent/US7382811B2/en not_active Expired - Fee Related
- 2003-11-13 US US10/712,087 patent/US20040095971A1/en not_active Abandoned
- 2003-11-13 US US10/712,126 patent/US7295583B2/en not_active Expired - Fee Related
-
2007
- 2007-08-06 US US11/834,176 patent/US20120183006A1/en not_active Abandoned
- 2007-12-27 US US11/965,170 patent/US7570677B2/en not_active Expired - Fee Related
-
2008
- 2008-01-23 US US12/018,485 patent/US7623559B2/en not_active Expired - Fee Related
Patent Citations (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6122518B2 (ja) * | 1977-12-27 | 1986-05-31 | Sony Corp | |
JPS62274788A (ja) * | 1986-05-19 | 1987-11-28 | スペクトラ−フィジックス・インコ−ポレイテッド | 小型急速脱着式レ−ザ−ヘッドを有し、レ−ザ−ダイオ−ドでポンプされる固体レ−ザ− |
JPH02199975A (ja) * | 1989-01-27 | 1990-08-08 | Sony Corp | ディスプレイ装置 |
JPH04507299A (ja) * | 1989-02-01 | 1992-12-17 | ザ ボード オブ トラスティーズ オブ ザ リーランド スタンフォード ジュニア ユニバーシティ | 非線形光発振器と半導体の強誘電分極領域の制御方法 |
JPH02221995A (ja) * | 1989-02-22 | 1990-09-04 | Sony Corp | 画像表示装置 |
JPH0338984A (ja) * | 1989-07-05 | 1991-02-20 | Pioneer Electron Corp | 投射型表示装置 |
JPH03191332A (ja) * | 1989-12-20 | 1991-08-21 | Matsushita Electric Ind Co Ltd | 光波長変換素子およびその製造方法 |
JPH0418823U (ja) * | 1990-06-05 | 1992-02-17 | ||
JPH0445478A (ja) * | 1990-06-13 | 1992-02-14 | Ibiden Co Ltd | レーザディスプレイ |
JPH04100088A (ja) * | 1990-08-20 | 1992-04-02 | Sony Corp | 直視型画像表示装置 |
JPH04296731A (ja) * | 1991-03-27 | 1992-10-21 | Matsushita Electric Ind Co Ltd | 短波長レーザ光源 |
JPH04315120A (ja) * | 1991-04-15 | 1992-11-06 | Matsushita Electric Ind Co Ltd | 顕微鏡用光源 |
JPH05107421A (ja) * | 1991-10-21 | 1993-04-30 | Fujitsu Ltd | 部分的分極反転層の形成方法および第二高調波発生素子 の製造方法 |
JPH05173094A (ja) * | 1991-12-20 | 1993-07-13 | Sony Corp | レーザ表示装置 |
JPH06273814A (ja) * | 1992-03-11 | 1994-09-30 | Matsushita Electric Ind Co Ltd | 光波長変換素子およびそれを用いた短波長レーザ光源 |
JPH06148444A (ja) * | 1992-11-06 | 1994-05-27 | Fujitsu Ltd | 光多重信号分離器 |
JPH06265956A (ja) * | 1993-03-17 | 1994-09-22 | Fuji Photo Film Co Ltd | 光波長変換方法 |
JPH06350168A (ja) * | 1993-06-08 | 1994-12-22 | Hitachi Metals Ltd | 固体レーザ発振器 |
JPH0723329U (ja) * | 1993-09-30 | 1995-04-25 | 三洋電機株式会社 | Lcdプロジェクタ |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7327768B2 (en) | 2002-09-10 | 2008-02-05 | The Furukawa Electric Co., Ltd. | Wavelength conversion module |
US7729395B2 (en) | 2002-09-10 | 2010-06-01 | The Furukawa Electric Co., Ltd. | Wavelength conversion module |
US7416306B2 (en) | 2003-06-06 | 2008-08-26 | Matsushita Electric Industrial Co., Ltd. | Laser projector |
WO2005083492A1 (ja) * | 2004-02-27 | 2005-09-09 | Matsushita Electric Industrial Co., Ltd. | 照明光源及びそれを用いた2次元画像表示装置 |
US7988304B2 (en) | 2004-02-27 | 2011-08-02 | Panasonic Corporation | Video projector |
JPWO2005083492A1 (ja) * | 2004-02-27 | 2007-11-22 | 松下電器産業株式会社 | 照明光源及びそれを用いた2次元画像表示装置 |
US7679799B2 (en) | 2004-02-27 | 2010-03-16 | Panasonic Corporation | Illuminating light source including a light intensity modulator that oscillates a light from a coherent light source in a non-integral multiple of one cycle and two- dimensional image display using the same |
US7426223B2 (en) | 2004-04-09 | 2008-09-16 | Matsushita Electric Industrial, Co., Ltd. | Coherent light source and optical device |
US7792160B2 (en) | 2005-03-02 | 2010-09-07 | Panasonic Corporation | Coherent light source and recording and reproduction device using the same |
WO2006092965A1 (ja) * | 2005-03-02 | 2006-09-08 | Matsushita Electric Industrial Co., Ltd. | コヒーレント光源及びそれを用いた記録再生装置 |
WO2010125866A1 (ja) * | 2009-04-27 | 2010-11-04 | コニカミノルタオプト株式会社 | 画像表示装置およびレーザ投射装置 |
JP4900512B2 (ja) * | 2009-04-27 | 2012-03-21 | コニカミノルタオプト株式会社 | 画像表示装置およびレーザ投射装置 |
JP2018041103A (ja) * | 2011-07-22 | 2018-03-15 | ケーエルエー−テンカー コーポレイション | 周波数変換結晶アニール方法 |
CN105144413A (zh) * | 2013-04-26 | 2015-12-09 | 欧司朗光电半导体有限公司 | 具有带有柱状结构上的有源区的半导体层序列的发光装置 |
CN105144413B (zh) * | 2013-04-26 | 2018-03-13 | 欧司朗光电半导体有限公司 | 具有带有柱状结构上的有源区的半导体层序列的发光装置 |
WO2017119313A1 (ja) * | 2016-01-08 | 2017-07-13 | 日本碍子株式会社 | 蛍光体素子および照明装置 |
Also Published As
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO1996038757A1 (fr) | Appareil optique, source de faisceau laser, equipement a laser et procede de production d'un appareil optique | |
JP2004219845A (ja) | 光導波路デバイスならびにそれを用いたコヒーレント光源およびそれを備えた光学装置 | |
JP3156444B2 (ja) | 短波長レーザ光源およびその製造方法 | |
JP3884402B2 (ja) | レーザ装置 | |
JP3971342B2 (ja) | レーザ光源およびレーザ投射装置 | |
JP3884405B2 (ja) | レーザ装置 | |
JP3366160B2 (ja) | 高調波出力安定化方法及びそれを利用する短波長レーザ光源 | |
JP3884404B2 (ja) | レーザ装置 | |
JP3884403B2 (ja) | レーザ装置 | |
JP4156644B2 (ja) | レーザ装置 | |
JP3884401B2 (ja) | レーザ光源および光ディスク装置 | |
JP3454810B2 (ja) | 短波長レーザ光源 | |
JP3526282B2 (ja) | 高調波出力安定化方法及びそれを利用する短波長レーザ光源 | |
JP3264056B2 (ja) | 短波長レーザ光源 | |
JP3492337B2 (ja) | 短波長レーザ光源 | |
JP2002084034A (ja) | 高調波出力制御方法及びそれを利用する短波長レーザ光源 | |
JP2000356794A (ja) | レーザ光源およびレーザ光源の製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 96195433.7 Country of ref document: CN |
|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): CN JP KR US |
|
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
WWE | Wipo information: entry into national phase |
Ref document number: 1019970708930 Country of ref document: KR |
|
WWE | Wipo information: entry into national phase |
Ref document number: 08973380 Country of ref document: US |
|
WWP | Wipo information: published in national office |
Ref document number: 1019970708930 Country of ref document: KR |
|
WWG | Wipo information: grant in national office |
Ref document number: 1019970708930 Country of ref document: KR |