WO1997005471A1 - High temperature light scattering measurement device - Google Patents

High temperature light scattering measurement device Download PDF

Info

Publication number
WO1997005471A1
WO1997005471A1 PCT/US1996/008272 US9608272W WO9705471A1 WO 1997005471 A1 WO1997005471 A1 WO 1997005471A1 US 9608272 W US9608272 W US 9608272W WO 9705471 A1 WO9705471 A1 WO 9705471A1
Authority
WO
WIPO (PCT)
Prior art keywords
extension tube
laser
oven
light
light scattering
Prior art date
Application number
PCT/US1996/008272
Other languages
French (fr)
Inventor
Robert E. Dion
Norman C. Ford, Jr.
Original Assignee
Precision Detectors, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Precision Detectors, Inc. filed Critical Precision Detectors, Inc.
Priority to EP96917898A priority Critical patent/EP0846260B1/en
Publication of WO1997005471A1 publication Critical patent/WO1997005471A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0332—Cuvette constructions with temperature control

Definitions

  • the invention relates to devices for characterizing • 5 physical characteristics of molecules and more specifically in devices for performing light scattering measurements on molecules.
  • a number of physical characteristics of polymers may be determined by the manner in which they scatter light. By comparing the intensity of light scattered at various angles, the molecular weight and the radius of gyration of a polymer may be determined. Additionally, the hydrodynamic radius of 5 a polymer may be determined from measurements of the time dependence of the intensity of the scattered light.
  • a number of instruments capable of making these measurements are available commercially and have been described in a number of publications and patents. One such instrument using a 0 laser as the source of light is described in U.S. Patent 5,305,073 to Ford. This patent is hereby incorporated herein by reference.
  • the invention relates to a high temperature light scattering measurement device fd
  • the device includes an oven within which is placed a light scattering chamber.
  • the light scattering chamber includes one or more optical fibers positioned about a sample chamber so as to collect light scattered by molecules located within the sample chamber and bring the collected light to detectors located outside the oven.
  • the oven maintains the sample chamber and associated optics at an elevated temperature.
  • Light to be scattered by molecules in the sample chamber is provided by a laser located outside the oven.
  • the placement of the laser outside the oven avoids the difficulties which occur when a laser is exposed to elevated temperatures.
  • Light from the laser is directed along an optical path through the oven wall where it is then focussed by optical elements in the sample chamber.
  • Fig. 1 is a perspective cutaway view of an embodiment of the light scattering system of the invention
  • 10 Fig. 2 is a cross-sectional view of the embodiment of the extension tube shown in Fig. 1;
  • Fig. 2a is a cross-sectional view of an embodiment of a laser assembly used with the embodiment of the extension tube shown in Fig. 2;
  • 15 Fig. 3 is a highly schematic longitudinal view of the optical elements of the light scattering system of the invention shown in Fig. 1; and
  • Fig. 3a is a highly schematic cross-sectional view through AA' of the optical elements of the light scattering 20 system of the invention shown in Fig. 3.
  • a light scattering system incorporating an embodiment of the invention includes
  • an oven 10 having insulated walls 14 (only a portion of the insulating wall shown) , within which is positioned a light scattering device 18, including a sample scattering chamber 22 having ports 26, 30, 34, 38 (only ports 26, 38 being visible in Fig. 1) for optical fibers (not shown) which carry
  • a laser assembly 42 is positioned outside of the oven 10, but is provided with an optical path in the form of an extension tube 46 (made, in one embodiment, of Invar or some other material having a low coefficient of expansion) which
  • the extension tube 46 is held rigidly in place by an invar nut 108 located within the oven 10, and a laser coupling member 50 located without the oven 10.
  • the nut 108 coacts with the laser coupling member 50 to hold the extension tube 46 rigidly to the insulating wall 14.
  • the laser coupling member 50 is fabricated from Invar and provides an opening for light to pass from the laser assembly 42 into the extension tube 46.
  • the laser coupling member 50 includes a series of fins 54 on its surface to help dissipate any heat conducted by the extension tube 46 from the oven 10.
  • a second gasket 176 is positioned between the outer oven wall and the laser coupling member 50.
  • the two gaskets 114, 176 serve to isolate the optical system from any vibrations in the oven wall and also to prevent undesirable exchange of air between the oven interior and exterior.
  • the extension tube 46 extends through the wall 14 of the oven 10 and is held in place against the inside of the oven 10 by the invar nut 108 which engages threads 112 on the outer surface of the extension tube 46.
  • a silicone foam shock absorbing gasket 114 capable of withstanding the temperatures of the oven, is positioned between the invar nut 108 and the inside wall 14 of the oven 10.
  • the extension tube 46 defines a bore 118 within which are positioned, in one embodiment, four black anodized aluminum tubular insert spacers 122, 126, 130, 134.
  • the center two spacers 126, 130 are oriented such that the ends of the spacers 126, 130, which are cut at 90° relative to the longitudinal axis of the spacers 126, 130, are adjacent one another.
  • the outermost tubular spacers 122, 134 are oriented such that the ends of the spacers 122, 134 which are cut at 75° relative to the longitudinal axis of the spacers 122, 134
  • the tubular spacers 122, 126, 130, 134 are anodized black to reduce any off axis reflection of the laser light.
  • a black anodized aluminum aperture disk 138 is positioned between the center two tubular spacers 126, 130.
  • aperture disk 138 defines, in one embodiment, a sixty degree conical opening 142.
  • the vertex of the conical opening 142 is oriented toward the inside of the oven 10.
  • the aperture disk 138 serves to reduce the amount of off axis light passing down the extension tube 46.
  • a disk of glass 146, 150 is placed between each of the outermost tubular spacers 122, 134 and its respective center tubular spacer 126, 130.
  • the glass disks 146, 150 serve to prevent convective air currents from passing down the extension tube and adversely affecting the laser within the
  • the glass disks 146, 150 are held at a 75° angle relative to the longitudinal axis of the extension tube to prevent light from being reflected back into the laser 42.
  • first recess 154 concentric with the longitudinal axis of the extension tube 46 and a second recess 158 concentric with and within the first recess 154.
  • a resilient washer 162 is located within the second recess 158 and is held in position by a black anodized
  • the aperture cap 166 defines a 45° conical opening 170 oriented such that the vertex of the conical opening 170 is away from the laser assembly 46.
  • the resilient washer 162 deforms as the four tubular inserts 122, 126, 130, 134 expand and thereby provides an expansion region
  • the aperture cap 166 in addition to retaining the resilient washer 162, also prevents off axis light from reaching the sample scattering chamber 22.
  • the end of the extension tube 46 which is located outside the oven wall 14 is enclosed within a first recess 174 of the laser coupling member 50.
  • a silicone foam shock absorbing gasket 176 is positioned between the outer wall 14 of the oven 10 and the laser coupling member 50.
  • a conical aperture 178 opens into the bore 118 of the extension tube 46 and provides the opening by which laser light enters the extension tube 46 from the laser assembly 42.
  • the laser assembly 42 is configured, in the embodiment shown, such that the light emitted by the laser is vertically polarized.
  • the glass disks 146, 150 are oriented so as not to disturb the polarization of laser light. With the arrangement shown, the focus and alignment of the laser beam may be adjusted from outside the oven.
  • a laser assembly 42 suitable for use with the extension tube described above is shown in Fig. 2a.
  • the laser beam is generated by laser diode 408 connected to electronics on a circuit board 409 and collimated by a lens 407.
  • the lens 407 is held in place by a lens cover 404 which includes a conical aperture 406.
  • the laser diode 408 is mounted on laser diode mounting plate 402 which is positioned by five adjustment screws 412 (only two shown) , biased by a spring 410 and locked in place by six screws 416 (only one shown) in a push-pull arrangement. All adjustments are accessible from outside the oven.
  • light from the laser assembly 42 passes through the extension tube 46 and is focussed by a lens 200 on the small sample scattering volume 204 of the sample scattering chamber 22.
  • a sample is introduced into and removed from the sample scattering chamber 22 through ports 208, 212, respectively.
  • Most of the light passes through the sample scattering volume 204 and is absorbed by a light beam absorber 216.
  • Light which is scattered by the molecules of the sample at a predetermined angle, in one embodiment between 14° and 16° (measured with respect to the direction of the light beam) avoids the light beam absorber
  • extension tube 46 permits the laser assembly 42 to remain outside the oven 10 and thus avoid the oven operating temperatures which range as high as 200°C or more.
  • convection stopping glass disks within the extension tube 46 prevents convection from transferring heat to the laser end of the tube.

Abstract

A high temperature light scattering measurement device (18) for characterizing certain physical properties of molecules which includes a sample scattering device (22) within an oven (10) and the light to be scattered by the molecules is provided by a laser (42) outside the oven and an extension tube (46) for guiding the light from the laser (42) to the sample scattering device.

Description

HIGH TEMPERATURE LIGHT SCATTERING MEASUREMENT DEVICE FIELD OF THE INVENTION
The invention relates to devices for characterizing •5 physical characteristics of molecules and more specifically in devices for performing light scattering measurements on molecules.
BACKGROUND OF THE INVENTION 0 A number of physical characteristics of polymers may be determined by the manner in which they scatter light. By comparing the intensity of light scattered at various angles, the molecular weight and the radius of gyration of a polymer may be determined. Additionally, the hydrodynamic radius of 5 a polymer may be determined from measurements of the time dependence of the intensity of the scattered light. A number of instruments capable of making these measurements are available commercially and have been described in a number of publications and patents. One such instrument using a 0 laser as the source of light is described in U.S. Patent 5,305,073 to Ford. This patent is hereby incorporated herein by reference.
One use for such instruments is in the characterization of molecules separated by chromatographic columns. When 5 examining molecules by chromatographic means, it may be necessary to heat the molecules. Generally, the molecules to be characterized need to be studied at elevated temperatures for two reasons. First, many polymers such as polyethylene and polypropylene are soluble only at elevated 0 temperatures and thus it is necessary to heat the polymers to separate them by column chromatography. Secondly, the viscosity of some solvents is too high to permit chromatographic techniques to be used unless the viscosity
* is reduced by elevating the temperature of the solvent. The 5 placement of the entire light scattering device within an oven used to maintain an elevated temperature is not possible because diode lasers, typically used with such instruments, cannot operate at temperatures above about 50°C. Attempts at using a polarization maintaining optical fiber to couple a laser source located outside the oven to the sample scattering chamber located within the oven have been unsuccessful due to the effect of elevated temperatures on the fiber. The elevated temperatures cause strains in the optical fiber which lead to sudden shifts in the direction of polarization of the laser beam. These shifts cause unacceptable shifts in the scattered light signal because of the dependence of scattered intensity on the direction of polarization of the incident light. This problem is particularly severe near the glass transition temperature of epoxy used to mount the optical fiber. The present invention seeks to avoid these problems.
SUMMARY OF THE INVENTION The invention relates to a high temperature light scattering measurement device fd|r characterizing certain physical properties of molecules. In one embodiment the device includes an oven within which is placed a light scattering chamber. The light scattering chamber includes one or more optical fibers positioned about a sample chamber so as to collect light scattered by molecules located within the sample chamber and bring the collected light to detectors located outside the oven. The oven maintains the sample chamber and associated optics at an elevated temperature.
Light to be scattered by molecules in the sample chamber is provided by a laser located outside the oven. The placement of the laser outside the oven avoids the difficulties which occur when a laser is exposed to elevated temperatures. Light from the laser is directed along an optical path through the oven wall where it is then focussed by optical elements in the sample chamber. BRIEF DESCRIPTION OF THE DRAWINGS
' This invention is pointed out with particularity in the appended claims. The above and further advantages of this
* 5 invention may be better understood by referring to the following description taken in conjunction with the accompanying drawing, in which:
Fig. 1 is a perspective cutaway view of an embodiment of the light scattering system of the invention; 10 Fig. 2 is a cross-sectional view of the embodiment of the extension tube shown in Fig. 1;
Fig. 2a is a cross-sectional view of an embodiment of a laser assembly used with the embodiment of the extension tube shown in Fig. 2; 15 Fig. 3 is a highly schematic longitudinal view of the optical elements of the light scattering system of the invention shown in Fig. 1; and
Fig. 3a is a highly schematic cross-sectional view through AA' of the optical elements of the light scattering 20 system of the invention shown in Fig. 3.
DESCRIPTION OF THE PREFERRED EMBODIMENT Briefly, and referring to Fig 1, a light scattering system incorporating an embodiment of the invention includes
25 an oven 10 having insulated walls 14 (only a portion of the insulating wall shown) , within which is positioned a light scattering device 18, including a sample scattering chamber 22 having ports 26, 30, 34, 38 (only ports 26, 38 being visible in Fig. 1) for optical fibers (not shown) which carry
30 the scattered light to detectors positioned outside the oven 10. A laser assembly 42 is positioned outside of the oven 10, but is provided with an optical path in the form of an extension tube 46 (made, in one embodiment, of Invar or some other material having a low coefficient of expansion) which
35 extends from the laser assembly 42 to the sample scattering chamber 22. By substantially eliminating the coefficient of expansion, the focus of the laser and the direction in which the laser beam is pointed are unaffected by thermal expansion of the extension tube 46. The extension tube 46 is held rigidly in place by an invar nut 108 located within the oven 10, and a laser coupling member 50 located without the oven 10. The nut 108 coacts with the laser coupling member 50 to hold the extension tube 46 rigidly to the insulating wall 14. The laser coupling member 50 is fabricated from Invar and provides an opening for light to pass from the laser assembly 42 into the extension tube 46. The laser coupling member 50 includes a series of fins 54 on its surface to help dissipate any heat conducted by the extension tube 46 from the oven 10.
A second gasket 176 is positioned between the outer oven wall and the laser coupling member 50. The two gaskets 114, 176 serve to isolate the optical system from any vibrations in the oven wall and also to prevent undesirable exchange of air between the oven interior and exterior.
In more detail, and referring to Fig. 2, the extension tube 46 extends through the wall 14 of the oven 10 and is held in place against the inside of the oven 10 by the invar nut 108 which engages threads 112 on the outer surface of the extension tube 46. A silicone foam shock absorbing gasket 114, capable of withstanding the temperatures of the oven, is positioned between the invar nut 108 and the inside wall 14 of the oven 10.
The extension tube 46 defines a bore 118 within which are positioned, in one embodiment, four black anodized aluminum tubular insert spacers 122, 126, 130, 134. One end of each of the tubular spacers 122, 126, 130, 134, is cut at 75° relative to the longitudinal axis of the tubular spacer 122, 126, 130, 134. In one embodiment, the center two spacers 126, 130 are oriented such that the ends of the spacers 126, 130, which are cut at 90° relative to the longitudinal axis of the spacers 126, 130, are adjacent one another. The outermost tubular spacers 122, 134 are oriented such that the ends of the spacers 122, 134 which are cut at 75° relative to the longitudinal axis of the spacers 122, 134
' are adjacent the ends of the center tubular spacers 126, 130 which are cut at 75° relative to the longitudinal axis of the 5 spacers 126, 130. The tubular spacers 122, 126, 130, 134 are anodized black to reduce any off axis reflection of the laser light.
Between the center two tubular spacers 126, 130 is positioned a black anodized aluminum aperture disk 138. The
10 aperture disk 138 defines, in one embodiment, a sixty degree conical opening 142. The vertex of the conical opening 142 is oriented toward the inside of the oven 10. The aperture disk 138 serves to reduce the amount of off axis light passing down the extension tube 46.
15 A disk of glass 146, 150 is placed between each of the outermost tubular spacers 122, 134 and its respective center tubular spacer 126, 130. The glass disks 146, 150 serve to prevent convective air currents from passing down the extension tube and adversely affecting the laser within the
20 laser assembly 42. The glass disks 146, 150, are held at a 75° angle relative to the longitudinal axis of the extension tube to prevent light from being reflected back into the laser 42.
The end of the extension tube 46 which is positioned
25 within the oven 10 includes a first recess 154 concentric with the longitudinal axis of the extension tube 46 and a second recess 158 concentric with and within the first recess 154. A resilient washer 162 is located within the second recess 158 and is held in position by a black anodized
30 aperture cap 166. The aperture cap 166 defines a 45° conical opening 170 oriented such that the vertex of the conical opening 170 is away from the laser assembly 46. The resilient washer 162 deforms as the four tubular inserts 122, 126, 130, 134 expand and thereby provides an expansion region
35 for the four tubular inserts 122, 126, 130, 134, relieving the pressure on the glass disks 146, 150. The aperture cap 166, in addition to retaining the resilient washer 162, also prevents off axis light from reaching the sample scattering chamber 22.
The end of the extension tube 46 which is located outside the oven wall 14 is enclosed within a first recess 174 of the laser coupling member 50. A silicone foam shock absorbing gasket 176, is positioned between the outer wall 14 of the oven 10 and the laser coupling member 50. A conical aperture 178 opens into the bore 118 of the extension tube 46 and provides the opening by which laser light enters the extension tube 46 from the laser assembly 42. The laser assembly 42 is configured, in the embodiment shown, such that the light emitted by the laser is vertically polarized. The glass disks 146, 150 are oriented so as not to disturb the polarization of laser light. With the arrangement shown, the focus and alignment of the laser beam may be adjusted from outside the oven. An embodiment of a laser assembly 42 suitable for use with the extension tube described above is shown in Fig. 2a. In the embodiment shown, the laser beam is generated by laser diode 408 connected to electronics on a circuit board 409 and collimated by a lens 407. The lens 407 is held in place by a lens cover 404 which includes a conical aperture 406. The laser diode 408 is mounted on laser diode mounting plate 402 which is positioned by five adjustment screws 412 (only two shown) , biased by a spring 410 and locked in place by six screws 416 (only one shown) in a push-pull arrangement. All adjustments are accessible from outside the oven.
Referring to Fig. 3, light from the laser assembly 42 passes through the extension tube 46 and is focussed by a lens 200 on the small sample scattering volume 204 of the sample scattering chamber 22. A sample is introduced into and removed from the sample scattering chamber 22 through ports 208, 212, respectively. Most of the light passes through the sample scattering volume 204 and is absorbed by a light beam absorber 216. Light which is scattered by the molecules of the sample at a predetermined angle, in one embodiment between 14° and 16° (measured with respect to the direction of the light beam) , avoids the light beam absorber
216 and passes through a series of apertures 220. This light is focussed by a lens 224 onto an optical fiber 38 located in the path of the light beam which conveys the light to a detector. Referring to Fig. 3a, light which is scattered at 90°, that is, perpendicular to the direction of the light beam, passes through ports 26, 34, 30 where the light is carried by optical fibers to detectors located outside the oven 10.
The use of the extension tube 46 permits the laser assembly 42 to remain outside the oven 10 and thus avoid the oven operating temperatures which range as high as 200°C or more. The use of convection stopping glass disks within the extension tube 46 prevents convection from transferring heat to the laser end of the tube.
Having shown the preferred embodiment, those skilled in the art will realize many variations are possible which will still be within the scope and spirit of the claimed invention. Therefore, it is the intention to limit the invention only as indicated by the scope of the following claims.

Claims

1. A light scattering apparatus for characterizing molecules at an elevated temperature, said apparatus comprising: an oven having insulated walls, one of said walls defining an opening; a light scattering device located within said oven; a laser located proximate to and without said oven; and an extension tube extending from said laser to said light scattering device through said opening in one said oven wall and defining a bore configured to permit light from said laser to reach said light scattering device.
2. The apparatus of claim 1 wherein said extension tube is made of a material having a low coefficient of expansion
3. The apparatus of claim 2 wherein said extension tube is made of a material having substantially no coefficient of expansion.
4. The apparatus of claim 3, wherein said extension tube is made of Invar.
5. The apparatus of claim 1 wherein said extension tube includes at least one transparent barrier within said bore of said extension tube to prevent convection of air from said oven to said laser.
6. The apparatus of claim 5, wherein said at least one transparent barrier is constructed of glass.
7. The apparatus of claim 5 wherein said at least one transparent barrier is held in position within said bore by a tubular spacer.
8. The apparatus of claim 5 wherein said at least one transparent barrier has at least one surface and a normal to said surface of said at least one transparent barrier is tilted with respect to the direction of light from said laser.
9. An extension tube for use with a light scattering device for characterizing molecules at an elevated temperature, said light scattering device located within an oven having insulated walls, one of said walls defining an opening, said extension tube defining a bore, one end of said extension tube attached to said scattering device, the other end of said tube attached to a laser located without said oven, said extension tube configured to permit light from said laser to reach said light scattering device.
10. The extension tube of claim 9 wherein said extension tube is made of a material having a low coefficient of expansion.
11. The extension tube of claim 10 wherein said extension tube has substantially no coefficient of expansion.
12. The extension tube of claim 11, wherein said extension tube is made of Invar.
13. The extension tube of claim 9 further comprising at least one transparent barrier within said bore of said extension tube to prevent convection of air from said oven to said laser.
14. The extension tube of claim 13, wherein said at least one transparent barrier is constructed of glass.
15. The extension tube of claim 13 wherein said at least one transparent barrier is held in position within said bore by a tubular spacer.
16. The extension tube of claim 13 wherein said at least one transparent barrier has at least one surface and a normal to said surface of said at least one transparent barrier is tilted with respect to the direction of light from said laser.
PCT/US1996/008272 1995-07-28 1996-05-31 High temperature light scattering measurement device WO1997005471A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP96917898A EP0846260B1 (en) 1995-07-28 1996-05-31 High temperature light scattering measurement device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/508,592 US5701176A (en) 1995-07-28 1995-07-28 High temperature light scattering measurement device comprising a rigid extension tube
US08/508,592 1995-07-28

Publications (1)

Publication Number Publication Date
WO1997005471A1 true WO1997005471A1 (en) 1997-02-13

Family

ID=24023332

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1996/008272 WO1997005471A1 (en) 1995-07-28 1996-05-31 High temperature light scattering measurement device

Country Status (3)

Country Link
US (1) US5701176A (en)
EP (1) EP0846260B1 (en)
WO (1) WO1997005471A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19735749C1 (en) * 1997-08-18 1998-10-01 Siemens Ag Power amplifier esp. gradient amplifier of nuclear resonance tomograph
US7002682B2 (en) * 2004-02-13 2006-02-21 Hach Ultra Analytics, Inc. Method and apparatus for operating a laser in an extinction-type optical particle detector
WO2015026984A1 (en) * 2013-08-20 2015-02-26 Advanced Polymer Monitoring Technologies, Inc. Characterization of polymer and colloid solutions

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3653738A (en) * 1970-06-29 1972-04-04 Bell Telephone Labor Inc Optical waveguide with unequally spaced lenses
US4975237A (en) * 1987-03-12 1990-12-04 The Secretary Of State For Defence In Her Britannic Majesty's Government Of The United Kingdom Of Great Britain And Northern Ireland Dynamic light scattering apparatus
US5054869A (en) * 1990-03-02 1991-10-08 Axiom Analytical, Inc. Light pipe system having maximum radiation throughput

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2427996A (en) * 1944-09-28 1947-09-23 American Cyanamid Co Temperature compensator for refractometers
US2816479A (en) * 1954-07-06 1957-12-17 Du Pont Particle measurement
US3624835A (en) * 1968-11-21 1971-11-30 Science Spectrum Microparticle analyzer employing a spherical detector array
US3730842A (en) * 1970-05-04 1973-05-01 Science Spectrum Process for determining bacterial drug sensitivity
CA1006711A (en) * 1971-05-03 1977-03-15 Herman H. Brooks Light scattering photometer recording unit
US3754830A (en) * 1971-10-21 1973-08-28 Science Spectrum Scattering cell employing electrostatic means for supporting a particle
US3815000A (en) * 1971-10-21 1974-06-04 Science Spectrum Levitator
US3701620A (en) * 1971-10-21 1972-10-31 Science Spectrum Sample scattering cell for a photometer
US3770351A (en) * 1971-11-23 1973-11-06 Science Spectrum Optical analyzer for microparticles
GB1389247A (en) * 1972-03-03 1975-04-03 Dittrich W Device for counting and characterising small particles
US4314347A (en) * 1973-01-22 1982-02-02 Texaco Inc. Seismic signal processing machine and method for noise removal
US4027973A (en) * 1973-07-02 1977-06-07 Beckman Instruments, Inc. Detector apparatus for laser light scattering photometers
US3843268A (en) * 1973-07-05 1974-10-22 Beckman Instruments Inc Sample container for laser light scattering photometers
US3850525A (en) * 1973-07-09 1974-11-26 Beckman Instruments Inc Simultaneous multiple measurements in laser photometers
US3928140A (en) * 1974-05-10 1975-12-23 Philip J Wyatt Apparatus and process for testing microparticle response to its environment
US4053229A (en) * 1976-01-13 1977-10-11 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration 2°/90° Laboratory scattering photometer
US4070113A (en) * 1976-05-05 1978-01-24 California Institute Of Technology Coherent optics blood cell classification system
US4173415A (en) * 1976-08-20 1979-11-06 Science Spectrum, Inc. Apparatus and process for rapidly characterizing and differentiating large organic cells
US4174952A (en) * 1978-01-23 1979-11-20 Massachusetts Institute Of Technology Immunoassay by light scattering intensity anisotropy measurements
US4204837A (en) * 1978-03-14 1980-05-27 Beckman Instruments, Inc. Method of rate immunonephelometric analysis
JPS5925460B2 (en) * 1978-05-19 1984-06-18 株式会社日立製作所 Nephelometric immunoassay method and device
US4490042A (en) * 1981-06-04 1984-12-25 Wyatt Philip J Method for determining the properties of wine
WO1983004098A1 (en) * 1982-05-10 1983-11-24 United Technologies Corporation Forward scattering laser particulate sensor
US4548500A (en) * 1982-06-22 1985-10-22 Wyatt Philip J Process and apparatus for identifying or characterizing small particles
US4710025A (en) * 1982-06-22 1987-12-01 Wyatt Technology Company Process for characterizing suspensions of small particles
US4541719A (en) * 1982-07-20 1985-09-17 Wyatt Philip J Method and apparatus for characterizing microparticles and measuring their response to their environment
US4565446A (en) * 1982-09-29 1986-01-21 The Research Foundation Of State University Of New York Scattering cells
US4621063A (en) * 1982-10-12 1986-11-04 The Center For Immunological Studies Methods for the detection and quantitation of immunological substances
US4571079A (en) * 1983-12-29 1986-02-18 Particle Measuring Systems, Inc. Aerosol sampling device and method with improved sample flow characteristics
US4693602A (en) * 1984-11-06 1987-09-15 Wyatt Technology Corporation Method and apparatus for measuring the light scattering properties of small particles
US4907884A (en) * 1984-11-15 1990-03-13 Wyatt Technology Corporation Sample cell monitoring system
US4616927A (en) * 1984-11-15 1986-10-14 Wyatt Technology Corporation Sample cell for light scattering measurements
US4649274A (en) 1985-08-22 1987-03-10 The United States Of America As Represented By The Secretary Of The Army Temperature stable boresight module
CH668483A5 (en) * 1985-12-17 1988-12-30 Zellweger Uster Ag METHOD AND DEVICE FOR DETERMINING THE SURFACE STRUCTURE OF A LONG STRETCH TEST BODY, IN PARTICULAR FOR MEASURING THE HAIRNESS OF A YARN.
JPS63186126A (en) * 1987-01-28 1988-08-01 Shimadzu Corp Dynamic scattered light detector
US4810875A (en) * 1987-02-02 1989-03-07 Wyatt Technology Corporation Method and apparatus for examining the interior of semi-opaque objects
US4804853A (en) * 1987-04-23 1989-02-14 High Yield Technology Compact particle flux monitor
JP2635992B2 (en) * 1988-03-24 1997-07-30 興和株式会社 Particle measurement device
US4896048A (en) * 1988-05-27 1990-01-23 High Yield Technology Scattering-type particle detection device for use in high temperature process chambers
US4952055A (en) * 1988-10-03 1990-08-28 Wyatt Technology Corporation Differential refractometer
JPH03197841A (en) * 1989-12-26 1991-08-29 Canon Inc Inspection device for body to be inspected
DE4017465C2 (en) * 1990-05-30 2001-08-30 Phywe Systeme Gmbh Scattered light photometer, especially for the total kinetic protein determination
US5129723A (en) * 1991-04-11 1992-07-14 Wyatt Technology Corporation High performance Zimm chromatography--HPZC
US5305073A (en) * 1992-02-12 1994-04-19 Precision Detectors, Inc. Methods and apparatus for molecular characterization

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3653738A (en) * 1970-06-29 1972-04-04 Bell Telephone Labor Inc Optical waveguide with unequally spaced lenses
US4975237A (en) * 1987-03-12 1990-12-04 The Secretary Of State For Defence In Her Britannic Majesty's Government Of The United Kingdom Of Great Britain And Northern Ireland Dynamic light scattering apparatus
US5054869A (en) * 1990-03-02 1991-10-08 Axiom Analytical, Inc. Light pipe system having maximum radiation throughput

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP0846260A1 *

Also Published As

Publication number Publication date
EP0846260B1 (en) 2002-09-11
EP0846260A1 (en) 1998-06-10
US5701176A (en) 1997-12-23
EP0846260A4 (en) 1998-11-11

Similar Documents

Publication Publication Date Title
US11526001B2 (en) Laser systems and optical devices for manipulating laser beams
US4989938A (en) Continuously variable fiber optic attenuator
US5497234A (en) Inspection apparatus
US7230701B2 (en) Compact spectroscopic ellipsometer
US4904044A (en) Continuously variable fiber optic attenuator
EP0896216A2 (en) Method and apparatus for infrared sensing of gas
CA2527113A1 (en) Laser distance measuring device
EP1605252B1 (en) Method and apparatus for eliminating and compensating thermal transients in gas analyzer
EP3752854A1 (en) Compact test range for active optical target detectors
PT97713B (en) GAS DETECTOR
US5701176A (en) High temperature light scattering measurement device comprising a rigid extension tube
US3531205A (en) Light beam aiming device
JP2739632B2 (en) Optical switching device
US3120608A (en) Gas microcell in the form of a light pipe for use with an infrared spectrometer
CN115014526B (en) Multichannel optical measurement equipment, installation method and application method
US6094262A (en) High temperature differential refractometry apparatus
US20040001200A1 (en) Measurement chamber with adjustable optical window
US4572665A (en) Apparatus for measuring the refractive index of an optical fiber
CN115031840A (en) Measuring equipment, installation method and application method
CN115031841A (en) Optical measurement equipment, installation method and application method
Dimock et al. A compact Thomson scattering system
JP2004502927A (en) Method and apparatus for suppressing multiple scattering during inspection of turbid media by three-dimensional cross-correlation technique
JPH1172416A (en) Apparatus for measuring absorbance of optical part
Riedel Optics for tunable diode laser spectrometers
CN109470638A (en) Laser gas detection device

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): CA JP KR

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE

DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 1996917898

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 1996917898

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: CA

WWG Wipo information: grant in national office

Ref document number: 1996917898

Country of ref document: EP