WO1997006599A1 - Efficient in-system programming structure and method for non-volatile programmable logic devices - Google Patents
Efficient in-system programming structure and method for non-volatile programmable logic devices Download PDFInfo
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- WO1997006599A1 WO1997006599A1 PCT/US1996/013036 US9613036W WO9706599A1 WO 1997006599 A1 WO1997006599 A1 WO 1997006599A1 US 9613036 W US9613036 W US 9613036W WO 9706599 A1 WO9706599 A1 WO 9706599A1
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Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
- H03K19/17748—Structural details of configuration resources
- H03K19/1776—Structural details of configuration resources for memories
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318516—Test of programmable logic devices [PLDs]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/34—Circuit design for reconfigurable circuits, e.g. field programmable gate arrays [FPGA] or programmable logic devices [PLD]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
- H03K19/17704—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form the logic functions being realised by the interconnection of rows and columns
Definitions
- the present invention relates to programmable logic device ⁇ and in particular to an in-system programming scheme for those devices.
- PLDs typically make use of one or more non-volatile memory cell (e.g. EPROM, EEPROM, Flash EPROM, or Flash EEPROM) arrays which programmably create data paths and logic functions within the device that are specific to the user's design. Typically, these arrays are erasable, thereby allowing the desired functionality of the PLD to be re-programmed many times.
- EPROM e.g. EPROM, EEPROM, Flash EPROM, or Flash EEPROM
- ISP In- System Programming
- the programming software is conventionally limited to serial access to the device through a small number of dedicated pins (typically 4 or 5) .
- This configuration immediately makes the program, erase, and verify operations less efficient because communication with the chip i ⁇ limited to a single serial port through which all address and data information, as well as the necessary ISP instructions, must enter the device.
- the high-voltage power supply bus for programming of the device is not available.
- internal charge-pumps are required on-chip to generate the necessary voltage levels from conventional internal standard Vcc levels (4.5 - 5.5V).
- the on-chip charge-pumps cannot provide the quick, strong drive of an external supply. Therefore, programming and erasing operations for ISP devices can be significantly less efficient than operations for out-of-system device ⁇ .
- an ISP device typically contains a number of different instruction and data shift registers which are accessed through the same serial port. These registers are used to hold the instruction code or the address and data values which might ordinarily be driven at the pins of the device in a parallel, out-of-system programming process.
- the controlling software includes ISP instructions which control access to the data registers and determine which ISP operation is currently active.
- a typical ISP algorithm may require that a LOAD instruction be entered serially into the ISP device, followed by the serial entry of an address/data packet. Then, the LOAD instruction is terminated and the actual PROGRAM instruction is shifted into the registers, thereby initiating the programming cycle for the current addres ⁇ /data. After the programming cycle, an additional VERIFY instruction may be required to verify that the intended data was successfully programmed at the given address.
- an in-system programming/erasing/verifying structure for non-volatile programmable logic devices include ⁇ a data input pin, a data output pin, an instruction register, a plurality of data registers including an ISP register, wherein said instruction register and said plurality of data registers are coupled in parallel between said data input pin and said data output pin, and a controller for synchronizing said instruction register and said plurality of data registers.
- the ISP register includes: an address field, a data field, and a status field.
- the status field stores a two-bit code.
- An ISP programming method in accordance with the present invention includes shifting a programming instruction into an in ⁇ truction regi ⁇ ter, thereby selecting the ISP register as the active data register. Then, an address, data, and a first statu ⁇ code are shifted into the ISP register. The first status code allows initiation of a programming pulse for the data at that address. After the programming pulse is terminated, a verify operation is automatically performed on the data at the current address. The verify operation determines whether a selected memory cell (or set of memory cells) was properly programmed. In one embodiment, the verify operation compares the states ⁇ tored by the selected memory cells to the data shifted into the ISP register. Depending on whether the states match the data values, another predetermined statu ⁇ code is loaded into the ISP register.
- An ISP erasing method in accordance with the present invention includes shifting an erase instruction into the instruction register, thereby once again selecting the ISP register as the active data register.
- the address of the sector to be erased is shifted into the ISP register with the first status code (the data code being a "don't care").
- the first status code allows the initiation of the erase pulse for the address of the sector indicated in the addres ⁇ field.
- the device automatically performs a self-blank check operation on the current sector to verify that it was properly erased. Depending on the success of the blank check, the status field of the ISP register is loaded with another predetermined code.
- An ISP verifying method in accordance with the present invention includes shifting a verify instruction into the instruction register, thereby once again selecting the ISP register as the active data register.
- the desired address is shifted into the ISP register with the first status code (data once again being a "don't care").
- the first status code allows initiation of a verify pulse of a specified length.
- the verify pulse is terminated, the states of the memory cells at the addressed location are loaded into the data field of the ISP register. These states may then be shifted out through the data output pin for inspection.
- an ISP architecture and instruction set advantageously allows a single ISP instruction to perform a number of different operations on each address/data packet, thereby significantly reducing the inefficiency of known ISP program, erase, and verify routines for a PLD.
- the appropriate ISP instruction need only be entered once to program/erase the entire device.
- the addres ⁇ /data packet ⁇ can be ⁇ hifted back to back into the ISP register without inserting multiple in ⁇ tructions between each packet at the data input pin, thereby dramatically decreasing the time required to program/erase the entire device in comparison to known ISP methods.
- the invention provides an efficient method for providing the status (i.e. result), of the ISP operations to either the end-user or the supporting software.
- the present invention facilitates multi-chip programming/erasing by connecting the data output pin of one device to the data input pin of another device.
- Figure 1 illustrates a conventional JTAG architecture.
- Figure 2 shows a state diagram of the TAP controller in the present invention.
- Figure 3 illustrates the fields of an ISP register of the present invention.
- Figure 4 shows a truth table for the two-bit code used in the status field of the ISP register.
- Figure 5 illustrates an ISP architecture in accordance with one embodiment of the present invention.
- Figure 6 shows an ISP configuration for multi-chip programming/erasing.
- Figure 7 illustrates another embodiment of the present invention including a shadow ISP register.
- the ISP architecture and instruction set of the present invention is compatible with the Joint Test Action Group (JTAG) standard described in IEEE Std. 1149.1, sections 3, 4, 5 and 7, which are incorporated by reference herein.
- JTAG Joint Test Action Group
- the mandatory JTAG architecture for a component adhering to IEEE Std. 1149.1 includes a single instruction register 103, a set of data registers 106 (including a bypass register 106A and a boundary scan register 106B) , and a TAP controller 101 (a 16-state finite state machine) .
- a TDI pin 105 the serial input terminal to the device, provides signals to instruction register 103, bypass register 106A, and boundary scan register 106B.
- a TDO pin 107 the serial output terminal of the device, is driven by active register 104, which i ⁇ triggered by the negative edge of clock signal TCK.
- a TMS pin 108 provides ⁇ ignals to control the state transitions of TAP controller 101, whereas a TCK pin 109 provide ⁇ clock ⁇ ignals (possibly modified via circuitry 110) to synchronize TAP controller 101, instruction register 103, bypass register 106A, and boundary scan register 106B (all of which are serial shift registers) .
- the ⁇ ystem logic 112 is ⁇ electively coupled to a plurality of input/output pin ⁇ 111. Specifically, either signals from system logic 112 or boundary scan register 106B drive input/output pins 111.
- a ⁇ tate diagram 200 of TAP controller 101 which controls the JTAG architecture of Figure 1, is shown in Figure 2.
- a first sequence 201 of state transition ⁇ , ⁇ hift ⁇ in ⁇ tructions to instruction register 103 and a second sequence 202 of state transition ⁇ shifts data to one of the test data registers 106.
- the Run-Test-Idle state 203 is u ⁇ ed to initiate each of the ISP operation ⁇ of the present invention (described below) .
- State diagram 200 which is described in the IEEE Std. 1149.1 pages 5-1 to 5-16, is well known to those in the art and, therefore, is not explained in detail herein.
- an ISP register 300 which includes an address field 301, a data field 302, and a status field 303 of an ISP operation, is added to the conventional JTAG architecture.
- three instructions a function program (FPGM) instruction, a function erase (FERASE) instruction, and a function verify (FVFY) instruction, were added to the JTAG instruction set in the present invention. If any one of those in ⁇ truction ⁇ i ⁇ entered into instruction register 103, then ISP register 300 is selected as the active data register between TDI pin 105 and TDO pin 107.
- instruction decode circuitry 114 decodes the instruction bits in instruction register 113 and provides control/enable signals 114 to tristate buffers 115, for example. Note that multiplexer 116 is controlled by a Select signal provided by TAP controller 101.
- status field 303 receives a two-bit code which indicates the corresponding functions shown in Figure 4. Specifically, a status field input code of "10" indicates that address field 301 and/or data field 302 of ISP register 300 contain a valid addres ⁇ /data packet on which to operate. To prevent accidental programming or erasing of the device, no ISP operation is initiated unless this code is present in status field 303. This "10" code may also be present when contents are shifted out of ISP register 300. In this case, the "10" code indicates that the ISP operation was not allowed for some reason.
- controller 101 After TAP controller 101 transitions to the Run-Test-Idle state 203 ( Figure 2), controller 101 detects statu ⁇ code "10", thereby triggering a programming pulse for the data stored in data field 302 at the address specified in address field 301.
- An internal timer (not shown, but well known in the art) ends the programming pulse at the appropriate time if TAP controller 101 remains in Run-Test-Idle state 203. If TAP controller 101 leaves this state prematurely, the programming pulse is terminated as soon as this state is exited.
- the device automatically performs a verify operation on the address just programmed to verify whether the selected memory cell was successfully programmed. Specifically, additional random logic (not shown but well known in the art) compares the states stored by the currently addressed memory cells to the value ⁇ in data field 302 of ISP register 300. If those states match the values, thereby indicating that the programming was successful, the random logic indicates that the "11" code is the appropriate value for status field 303. TAP controller 101 then loads that value into ISP register 300. If the programming operation i ⁇ completed, but the verify operation indicate ⁇ that programming wa ⁇ not ⁇ uccessful, the status field is loaded with "01". Finally, if the value of status field 303 is checked before the entire program/verify operation has completed, ⁇ tatus field 303 i ⁇ loaded with a "00" code.
- the present invention provides a number of significant improvements to conventional ISP programming methods.
- the code in status field 303 provides an end-user an immediate indication of the success or failure of the programming operation.
- the FERASE instruction like the FPGM instruction if shifted into instruction register 103, select ⁇ ISP regi ⁇ ter 300 as the active data register.
- the FERASE in ⁇ truction activates an erase operation that typically operates on a large sector of memory cells (for example, 7920 memory cells) rather than programming only a few cells (in one embodiment, no more than eight memory cells) .
- the address of the sector to be erased is shifted into ISP register 300 with the "10" status code (note that the bits stored in data field 302 are a "don't care" in this operation) .
- controller 101 After TAP controller 101 transitions to the Run-Test-Idle state 203, controller 101 detect ⁇ this status code, thereby triggering the erase pulse for the address of the sector indicated in address field 301. An internal timer (not shown) ends the erase pulse at the appropriate time if TAP controller 101 remain ⁇ in Run- Te ⁇ t-Idle state 203. If TAP controller 101 leaves this state prematurely, the erase pulse terminates as soon as this state is exited.
- the device automatically performs a self- blank check operation on the current ⁇ ector to verify whether the sector wa ⁇ ⁇ ucce ⁇ fully era ⁇ ed by the random logic.
- the self-blank check i ⁇ de ⁇ cribed in detail in US Patent Application Serial No. 08/397,821, entitled "HIGH ⁇ SPEED MINIMAL LOGIC SELF BLANK CHECKING METHOD FOR PROGRAMMABLE LOGIC DEVICE", which i ⁇ incorporated by reference herein. If the blank check i ⁇ ⁇ uccessful, thereby al ⁇ o indicating that the erase operation was successful, status field 303 of ISP register 300 is loaded with the "11" code.
- statu ⁇ field 303 i ⁇ loaded with the "01" code. Finally, if the value of statu ⁇ field 303 is checked before the entire erase/blank check operation has completed, the field is loaded with a "00" code.
- the present invention provides a number of significant improvements to conventional ISP erase methods.
- the FERASE instruction need only be entered into instruction register 103 once to erase the entire device.
- sector addresses can be shifted back to back into ISP register 300 without inserting multiple instructions between each address at TDI pin 105, thereby dramatically decreasing the time required to erase the entire device in comparison to known ISP methods.
- the code of statu ⁇ field 303 immediately indicates the successive ⁇ or failure of the era ⁇ e operation to the end-user.
- the FVFY instruction is used to read back the data at any addre ⁇ ed location in the device when no prior program or erase operation is de ⁇ ired.
- the FVFY instruction like the FPGM and FERASE instructions, if shifted into instruction register 103, selects ISP register 300 as the active data register.
- the desired address is shifted into ISP register 300 with a code of "10" in status field 300 (note that the bits stored in data field 302 are again a "don't care").
- controller 101 enters the Run-Test-Idle ⁇ tate 203, controller 101 detect ⁇ thi ⁇ status code, thereby triggering a verify pulse of a specified length.
- the verify pulse is terminated, either by the internal timing or by leaving Run-Test-Idle state 203, the state of the memory cell at the
- io addressed location is loaded into data field 302 of ISP register 300.
- Thi ⁇ ⁇ tate may then be ⁇ hifted out through TDO pin 107 for in ⁇ pection.
- the code of ⁇ tatus field 303 in this case is "11", thereby indicating that the verify operation has completed.
- a code of "00" indicates that the status was checked before the operation was done.
- An ISP verify method as described above advantageously eliminates the need to shift in multiple instructions for each address.
- the FVFY instruction need only be entered once into instruction register 103 to verify the entire chip.
- addresses for the to-be- identified memory cells may be entered back to back into ISP register 300, without inserting multiple instructions between each addres ⁇ at TDI pin 105.
- the pre ⁇ ent invention facilitate ⁇ multi-chip programming/erasing by connecting a TDO pin 107A of device 600A to a TDI pin 105B of device 600B, and providing the instruction bits in instruction regi ⁇ ter 103A to active register 104A (and then to TDO pin 107A) .
- the time of programming/erasing multiple devices is approximately equal to the time of programming one device plus the time for propagating the appropriate signals from TDI pin 105 to TDO pin 107 for each device.
- the time to serially shift in data/in ⁇ truction ⁇ al ⁇ o grows.
- the actual operation i.e. programming, era ⁇ ing, or verifying
- a shadow ISP register 300A is coupled to ISP register 300.
- a status code "01" received by ISP register 300 triggers combinatorial logic 311 to transfer an enabling signal to logic gate 310.
- logic gate 310 is an AND gate which receives a logic one enabling signal from combinatorial logic 311 as well as a constant value (also a logic one signal) from memory 312. In this manner, AND gate 310 outputs a high signal to the clock terminal of shadow register 3OOA, thereby allowing shadow ISP register 3OOA to capture the bits of ISP register 300 (in this embodiment, 27 bits) . Shadow ISP register 300A stores such bits until another status code "01" is received, at which time shadow ISP register 300A stores the updated address/data packet of ISP regi ⁇ ter 300.
- the present invention ensure ⁇ that if more than one programming cycle i ⁇ nece ⁇ sary (for example, if flash EPROM arrays are used) and the code in the status field 303 ( Figure 3) (as verified through TDO pin 107) indicates that programming was unsuccessful, then the address/data packet in shadow register 3OOA (in this embodiment, 25 bits) i ⁇ accessed automatically without the need for a separate load cycle.
- the present invention also provides that if the results of statu ⁇ field 303 are a "don't care" (for example, if all memory cells receive one programming cycle) , the addresse ⁇ of tho ⁇ e cells which did not program are accessed externally (via ISP register 300) and then subjected to an additional programming cycle at a later point in time.
- shadow ISP register 300A stores the bits from the previous enabling cycle until another status code "01" is received, at which time shadow ISP register 3OOA store ⁇ the updated address/data packet of ISP regi ⁇ ter 300.
Abstract
Description
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9508692A JPH11511307A (en) | 1995-08-09 | 1996-08-09 | Efficient in-system programming constructs and methods for nonvolatile programmable logic devices |
EP96927385A EP0843915A1 (en) | 1995-08-09 | 1996-08-09 | Efficient in-system programming structure and method for non-volatile programmable logic devices |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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US08/512,796 | 1995-08-09 | ||
US08/512,796 US5734868A (en) | 1995-08-09 | 1995-08-09 | Efficient in-system programming structure and method for non-volatile programmable logic devices |
Publications (2)
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WO1997006599A1 true WO1997006599A1 (en) | 1997-02-20 |
WO1997006599B1 WO1997006599B1 (en) | 1997-03-20 |
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PCT/US1996/013036 WO1997006599A1 (en) | 1995-08-09 | 1996-08-09 | Efficient in-system programming structure and method for non-volatile programmable logic devices |
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US (2) | US5734868A (en) |
EP (1) | EP0843915A1 (en) |
JP (1) | JPH11511307A (en) |
WO (1) | WO1997006599A1 (en) |
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WO1999034515A1 (en) * | 1997-12-29 | 1999-07-08 | Advanced Micro Devices, Inc. | Electrically erasable and reprogrammable, nonvolatile integrated storage device with in-system programming and verification (ispav) capabilities for supporting in-system reconfiguring of pld's |
US6314550B1 (en) | 1997-06-10 | 2001-11-06 | Altera Corporation | Cascaded programming with multiple-purpose pins |
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US6538469B1 (en) | 1997-06-10 | 2003-03-25 | Altera Corporation | Technique to test an integrated circuit using fewer pins |
US6681378B2 (en) | 1997-06-10 | 2004-01-20 | Altera Corporation | Programming mode selection with JTAG circuits |
US6691267B1 (en) | 1997-06-10 | 2004-02-10 | Altera Corporation | Technique to test an integrated circuit using fewer pins |
WO1999034515A1 (en) * | 1997-12-29 | 1999-07-08 | Advanced Micro Devices, Inc. | Electrically erasable and reprogrammable, nonvolatile integrated storage device with in-system programming and verification (ispav) capabilities for supporting in-system reconfiguring of pld's |
EP1667327A2 (en) * | 2004-12-02 | 2006-06-07 | Altera Corporation | Techniques for combining volatile and non-volatile programmable logic circuits on an integrated circuit |
EP1667327A3 (en) * | 2004-12-02 | 2010-05-19 | Altera Corporation | Techniques for combining volatile and non-volatile programmable logic circuits on an integrated circuit |
EP2207100A1 (en) * | 2008-12-31 | 2010-07-14 | Pitney Bowes Inc. | System and method for data recovery in a disabled integrated circuit |
US8055936B2 (en) | 2008-12-31 | 2011-11-08 | Pitney Bowes Inc. | System and method for data recovery in a disabled integrated circuit |
US8060453B2 (en) | 2008-12-31 | 2011-11-15 | Pitney Bowes Inc. | System and method for funds recovery from an integrated postal security device |
Also Published As
Publication number | Publication date |
---|---|
EP0843915A1 (en) | 1998-05-27 |
US5734868A (en) | 1998-03-31 |
US5949987A (en) | 1999-09-07 |
JPH11511307A (en) | 1999-09-28 |
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