WO1997019416A1 - Illumination system for ocr of indicia on a substrate - Google Patents
Illumination system for ocr of indicia on a substrate Download PDFInfo
- Publication number
- WO1997019416A1 WO1997019416A1 PCT/US1996/018635 US9618635W WO9719416A1 WO 1997019416 A1 WO1997019416 A1 WO 1997019416A1 US 9618635 W US9618635 W US 9618635W WO 9719416 A1 WO9719416 A1 WO 9719416A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- substrate
- illumination system
- optical member
- light source
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
- G06K7/10544—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation by scanning of the records by radiation in the optical part of the electromagnetic spectrum
- G06K7/10712—Fixed beam scanning
- G06K7/10722—Photodetector array or CCD scanning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
- G06K7/10544—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation by scanning of the records by radiation in the optical part of the electromagnetic spectrum
- G06K7/10712—Fixed beam scanning
- G06K7/10722—Photodetector array or CCD scanning
- G06K7/10732—Light sources
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0812—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Toxicology (AREA)
- General Health & Medical Sciences (AREA)
- Artificial Intelligence (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Health & Medical Sciences (AREA)
- Theoretical Computer Science (AREA)
- Operations Research (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Studio Devices (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Input (AREA)
- Stroboscope Apparatuses (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019980703780A KR100275143B1 (en) | 1995-11-20 | 1996-11-19 | Illumination system for ocr of indicia on a substrate |
DE69626851T DE69626851T2 (en) | 1995-11-20 | 1996-11-19 | LIGHTING SYSTEM FOR THE OPTICAL READING OF CHARACTERISTICS ON A SUBSTRATE |
EP96941419A EP0873551B1 (en) | 1995-11-20 | 1996-11-19 | Illumination system for ocr of indicia on a substrate |
JP51987397A JP3908786B2 (en) | 1995-11-20 | 1996-11-19 | Lighting system for Indicia OCR on board |
HK99100016A HK1014926A1 (en) | 1995-11-20 | 1999-01-05 | Illumination system for ocr of indicia on a substrate |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/561,181 US5737122A (en) | 1992-05-01 | 1995-11-20 | Illumination system for OCR of indicia on a substrate |
US08/561,181 | 1995-11-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1997019416A1 true WO1997019416A1 (en) | 1997-05-29 |
Family
ID=24240961
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1996/018635 WO1997019416A1 (en) | 1995-11-20 | 1996-11-19 | Illumination system for ocr of indicia on a substrate |
Country Status (7)
Country | Link |
---|---|
US (1) | US5737122A (en) |
EP (1) | EP0873551B1 (en) |
JP (1) | JP3908786B2 (en) |
KR (1) | KR100275143B1 (en) |
DE (1) | DE69626851T2 (en) |
HK (1) | HK1014926A1 (en) |
WO (1) | WO1997019416A1 (en) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0962880A1 (en) * | 1998-06-01 | 1999-12-08 | Datalogic S.P.A. | An apparatus and method for reading an optical code |
WO2002029384A2 (en) * | 2000-10-06 | 2002-04-11 | Applied Materials, Inc. | Method and apparatus for embedded substrate and system status monitoring |
US6693708B1 (en) | 1999-09-07 | 2004-02-17 | Applied Materials, Inc. | Method and apparatus for substrate surface inspection using spectral profiling techniques |
US6697517B1 (en) | 1999-09-07 | 2004-02-24 | Applied Magerials, Inc. | Particle detection and embedded vision system to enhance substrate yield and throughput |
US6813032B1 (en) | 1999-09-07 | 2004-11-02 | Applied Materials, Inc. | Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques |
US7012684B1 (en) | 1999-09-07 | 2006-03-14 | Applied Materials, Inc. | Method and apparatus to provide for automated process verification and hierarchical substrate examination |
US7306155B2 (en) | 1998-07-08 | 2007-12-11 | Hand Held Products, Inc. | Image sensor assembly for optical reader |
US7324710B2 (en) | 2000-04-28 | 2008-01-29 | Mydata Automation Ab | Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nominal data |
WO2010002599A1 (en) * | 2008-06-30 | 2010-01-07 | Symbol Technologies, Inc. | Imaging module with folded illuminating and imaging paths |
WO2011111079A1 (en) | 2010-03-11 | 2011-09-15 | Datalogic Scanning Group Sr.L. | Image capturing device |
US10198647B2 (en) | 2015-09-25 | 2019-02-05 | Datalogic IP Tech, S.r.l. | Compact imaging module with range finder |
Families Citing this family (39)
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---|---|---|---|---|
US6661521B1 (en) * | 1998-09-11 | 2003-12-09 | Robotic Vision Systems, Inc. | Diffuse surface illumination apparatus and methods |
US6429934B1 (en) * | 1998-09-11 | 2002-08-06 | Robotic Vision Systems, Inc. | Optimal symbology illumination-apparatus and method |
US6633338B1 (en) * | 1999-04-27 | 2003-10-14 | Gsi Lumonics, Inc. | Programmable illuminator for vision system |
US6420675B1 (en) | 1999-10-08 | 2002-07-16 | Nanovia, Lp | Control system for ablating high-density array of vias or indentation in surface of object |
US6886284B2 (en) * | 1999-10-08 | 2005-05-03 | Identification Dynamics, Llc | Firearm microstamping and micromarking insert for stamping a firearm identification code and serial number into cartridge shell casings and projectiles |
US6310701B1 (en) | 1999-10-08 | 2001-10-30 | Nanovia Lp | Method and apparatus for ablating high-density array of vias or indentation in surface of object |
US6653593B2 (en) | 1999-10-08 | 2003-11-25 | Nanovia, Lp | Control system for ablating high-density array of vias or indentation in surface of object |
US6833911B2 (en) | 1999-10-08 | 2004-12-21 | Identification Dynamics, Inc. | Method and apparatus for reading firearm microstamping |
US6256121B1 (en) | 1999-10-08 | 2001-07-03 | Nanovia, Lp | Apparatus for ablating high-density array of vias or indentation in surface of object |
US7111423B2 (en) * | 1999-10-08 | 2006-09-26 | Identification Dynamics, Llc | Method and apparatus for reading firearm microstamping |
US20030024913A1 (en) * | 2002-04-15 | 2003-02-06 | Downes Joseph P. | Laser scanning method and system for marking articles such as printed circuit boards, integrated circuits and the like |
US6352349B1 (en) * | 2000-03-24 | 2002-03-05 | United Parcel Services Of America, Inc. | Illumination system for use in imaging moving articles |
KR100378988B1 (en) * | 2000-10-27 | 2003-04-08 | 한국과학기술연구원 | Three-dimensional Visual Inspection Method of Semiconductor Packages using Single Camera |
US20030029916A1 (en) * | 2001-08-10 | 2003-02-13 | John Merva | Apparatus and process for simultaneously handling a plurality of symbology encoded articles |
US7119351B2 (en) * | 2002-05-17 | 2006-10-10 | Gsi Group Corporation | Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system |
US20040076321A1 (en) * | 2002-07-16 | 2004-04-22 | Frank Evans | Non-oriented optical character recognition of a wafer mark |
US7204419B2 (en) * | 2003-05-01 | 2007-04-17 | Identifcation Dynamics, Llc | Method and apparatus for reading firearm microstamping |
JP3906194B2 (en) * | 2002-11-29 | 2007-04-18 | 株式会社東芝 | CALIBRATION METHOD, CALIBRATION SUPPORT DEVICE, CALIBRATION DEVICE, AND CAMERA SYSTEM MANUFACTURING METHOD |
US6870949B2 (en) * | 2003-02-26 | 2005-03-22 | Electro Scientific Industries | Coaxial narrow angle dark field lighting |
US20050241203A1 (en) * | 2003-05-01 | 2005-11-03 | Lizotte Todd E | Method and apparatus for cartridge identification imprinting in difficult contexts by recess protected indicia |
US7599576B2 (en) * | 2004-01-23 | 2009-10-06 | Electro Scientific Industries, Inc. | Image subtraction of illumination artifacts |
US20060189091A1 (en) * | 2004-11-11 | 2006-08-24 | Bo Gu | Method and system for laser hard marking |
US7705268B2 (en) * | 2004-11-11 | 2010-04-27 | Gsi Group Corporation | Method and system for laser soft marking |
CN101208594B (en) | 2005-07-08 | 2010-10-13 | 伊雷克托科学工业股份有限公司 | Achieving convergent light rays emitted by planar array of light sources |
JP2009500631A (en) | 2005-07-08 | 2009-01-08 | エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド | Optimal use and performance of optical systems implemented with dark field illumination on the telecentric axis |
US20070125863A1 (en) * | 2005-12-05 | 2007-06-07 | Jakoboski Timothy A | System and method for employing infrared illumination for machine vision |
DE102005061834B4 (en) * | 2005-12-23 | 2007-11-08 | Ioss Intelligente Optische Sensoren & Systeme Gmbh | Apparatus and method for optically examining a surface |
US20070153084A1 (en) * | 2005-12-30 | 2007-07-05 | George Deveau | Semiconductor wafer reader and illumination system |
US7589869B2 (en) * | 2006-04-28 | 2009-09-15 | Electro Scientific Industries, Inc. | Adjusting image quality using multi-wavelength light |
US8233696B2 (en) * | 2007-09-22 | 2012-07-31 | Dynamic Micro System Semiconductor Equipment GmbH | Simultaneous wafer ID reading |
US8353457B2 (en) * | 2008-02-12 | 2013-01-15 | Datalogic ADC, Inc. | Systems and methods for forming a composite image of multiple portions of an object from multiple perspectives |
EP2248069B1 (en) | 2008-02-12 | 2013-08-28 | Datalogic ADC, Inc. | Systems and methods for forming a composite image of multiple portions of an object from multiple perspectives |
US8678287B2 (en) * | 2008-02-12 | 2014-03-25 | Datalogic ADC, Inc. | Two-plane optical code reader for acquisition of multiple views of an object |
US8608076B2 (en) * | 2008-02-12 | 2013-12-17 | Datalogic ADC, Inc. | Monolithic mirror structure for use in a multi-perspective optical code reader |
JP5069191B2 (en) * | 2008-08-22 | 2012-11-07 | 興和株式会社 | Optical reader |
US8322621B2 (en) * | 2008-12-26 | 2012-12-04 | Datalogic ADC, Inc. | Image-based code reader for acquisition of multiple views of an object and methods for employing same |
US8261990B2 (en) | 2008-12-26 | 2012-09-11 | Datalogic ADC, Inc. | Data reader having compact arrangement for acquisition of multiple views of an object |
US9269035B2 (en) | 2014-02-28 | 2016-02-23 | Electro Scientific Industries, Inc. | Modified two-dimensional codes, and laser systems and methods for producing such codes |
US9594937B2 (en) | 2014-02-28 | 2017-03-14 | Electro Scientific Industries, Inc. | Optical mark reader |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6180471A (en) * | 1984-09-28 | 1986-04-24 | Hamamatsu Photonics Kk | Scan head of bar code reader |
US5231536A (en) * | 1992-05-01 | 1993-07-27 | Xrl, Inc. | Robust, LED illumination system for OCR of indicia on a substrate |
US5469294A (en) * | 1992-05-01 | 1995-11-21 | Xrl, Inc. | Illumination system for OCR of indicia on a substrate |
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-
1995
- 1995-11-20 US US08/561,181 patent/US5737122A/en not_active Expired - Lifetime
-
1996
- 1996-11-19 JP JP51987397A patent/JP3908786B2/en not_active Expired - Fee Related
- 1996-11-19 KR KR1019980703780A patent/KR100275143B1/en not_active IP Right Cessation
- 1996-11-19 WO PCT/US1996/018635 patent/WO1997019416A1/en active IP Right Grant
- 1996-11-19 EP EP96941419A patent/EP0873551B1/en not_active Expired - Lifetime
- 1996-11-19 DE DE69626851T patent/DE69626851T2/en not_active Expired - Lifetime
-
1999
- 1999-01-05 HK HK99100016A patent/HK1014926A1/en not_active IP Right Cessation
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JPS6180471A (en) * | 1984-09-28 | 1986-04-24 | Hamamatsu Photonics Kk | Scan head of bar code reader |
US5231536A (en) * | 1992-05-01 | 1993-07-27 | Xrl, Inc. | Robust, LED illumination system for OCR of indicia on a substrate |
US5469294A (en) * | 1992-05-01 | 1995-11-21 | Xrl, Inc. | Illumination system for OCR of indicia on a substrate |
Non-Patent Citations (2)
Title |
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PATENT ABSTRACTS OF JAPAN vol. 010, no. 254 (P - 492) 30 August 1986 (1986-08-30) * |
Cited By (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0962880A1 (en) * | 1998-06-01 | 1999-12-08 | Datalogic S.P.A. | An apparatus and method for reading an optical code |
USRE41349E1 (en) * | 1998-06-01 | 2010-05-25 | Datalogic S.P.A. | Apparatus and method for reading an optical code |
US6631846B2 (en) | 1998-06-01 | 2003-10-14 | Datalogic S.P.A. | Apparatus and method for reading an optical code |
US6817525B2 (en) | 1998-06-01 | 2004-11-16 | Datalogic S.P.A. | Apparatus and method for reading an optical code |
US8096472B2 (en) | 1998-07-08 | 2012-01-17 | Hand Held Products, Inc. | Image sensor assembly for optical reader |
US7306155B2 (en) | 1998-07-08 | 2007-12-11 | Hand Held Products, Inc. | Image sensor assembly for optical reader |
US6630995B1 (en) | 1999-09-07 | 2003-10-07 | Applied Materials, Inc. | Method and apparatus for embedded substrate and system status monitoring |
US6693708B1 (en) | 1999-09-07 | 2004-02-17 | Applied Materials, Inc. | Method and apparatus for substrate surface inspection using spectral profiling techniques |
US6697517B1 (en) | 1999-09-07 | 2004-02-24 | Applied Magerials, Inc. | Particle detection and embedded vision system to enhance substrate yield and throughput |
US6707544B1 (en) | 1999-09-07 | 2004-03-16 | Applied Materials, Inc. | Particle detection and embedded vision system to enhance substrate yield and throughput |
US6813032B1 (en) | 1999-09-07 | 2004-11-02 | Applied Materials, Inc. | Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques |
US7012684B1 (en) | 1999-09-07 | 2006-03-14 | Applied Materials, Inc. | Method and apparatus to provide for automated process verification and hierarchical substrate examination |
US7324710B2 (en) | 2000-04-28 | 2008-01-29 | Mydata Automation Ab | Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nominal data |
WO2002029384A3 (en) * | 2000-10-06 | 2002-10-31 | Applied Materials Inc | Method and apparatus for embedded substrate and system status monitoring |
WO2002029384A2 (en) * | 2000-10-06 | 2002-04-11 | Applied Materials, Inc. | Method and apparatus for embedded substrate and system status monitoring |
WO2010002599A1 (en) * | 2008-06-30 | 2010-01-07 | Symbol Technologies, Inc. | Imaging module with folded illuminating and imaging paths |
CN102077216A (en) * | 2008-06-30 | 2011-05-25 | 符号技术有限公司 | Imaging module with folded illuminating and imaging paths |
US8618468B2 (en) | 2008-06-30 | 2013-12-31 | Symbol Technologies, Inc. | Imaging module with folded illuminating and imaging paths |
EP2545491A1 (en) * | 2010-03-11 | 2013-01-16 | Datalogic IP TECH S.r.l. | Image capturing device |
CN102870121A (en) * | 2010-03-11 | 2013-01-09 | 得利捷Ip科技有限公司 | Image capturing device |
WO2011111079A1 (en) | 2010-03-11 | 2011-09-15 | Datalogic Scanning Group Sr.L. | Image capturing device |
EP2545491B1 (en) | 2010-03-11 | 2015-05-06 | Datalogic IP TECH S.r.l. | Image capturing device |
EP2793163B1 (en) | 2010-03-11 | 2016-05-18 | Datalogic IP TECH S.r.l. | Image capturing device |
US9373016B2 (en) | 2010-03-11 | 2016-06-21 | Datalogic Ip Tech S.R.L. | Image capturing device |
US9852321B2 (en) | 2010-03-11 | 2017-12-26 | Datalogic Ip Tech S.R.L. | Image capturing device |
US10198647B2 (en) | 2015-09-25 | 2019-02-05 | Datalogic IP Tech, S.r.l. | Compact imaging module with range finder |
Also Published As
Publication number | Publication date |
---|---|
KR19990071508A (en) | 1999-09-27 |
EP0873551B1 (en) | 2003-03-19 |
DE69626851D1 (en) | 2003-04-24 |
JP3908786B2 (en) | 2007-04-25 |
EP0873551A1 (en) | 1998-10-28 |
DE69626851T2 (en) | 2003-09-11 |
JP2000500890A (en) | 2000-01-25 |
US5737122A (en) | 1998-04-07 |
KR100275143B1 (en) | 2000-12-15 |
HK1014926A1 (en) | 1999-10-08 |
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