WO2000020823A3 - Atomic force microscope for profiling high aspect ratio samples - Google Patents

Atomic force microscope for profiling high aspect ratio samples Download PDF

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Publication number
WO2000020823A3
WO2000020823A3 PCT/US1999/022720 US9922720W WO0020823A3 WO 2000020823 A3 WO2000020823 A3 WO 2000020823A3 US 9922720 W US9922720 W US 9922720W WO 0020823 A3 WO0020823 A3 WO 0020823A3
Authority
WO
WIPO (PCT)
Prior art keywords
probe
feature
aspect ratio
high aspect
atomic force
Prior art date
Application number
PCT/US1999/022720
Other languages
French (fr)
Other versions
WO2000020823A2 (en
WO2000020823B1 (en
Inventor
Bernardo D Aumond
Kamal Youcef-Toumi
Original Assignee
Massachusetts Inst Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Massachusetts Inst Technology filed Critical Massachusetts Inst Technology
Publication of WO2000020823A2 publication Critical patent/WO2000020823A2/en
Publication of WO2000020823A3 publication Critical patent/WO2000020823A3/en
Publication of WO2000020823B1 publication Critical patent/WO2000020823B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q40/00—Calibration, e.g. of probes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/85—Scanning probe control process
    • Y10S977/851—Particular movement or positioning of scanning tip
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/88—Manufacture, treatment, or detection of nanostructure with arrangement, process, or apparatus for testing
    • Y10S977/881—Microscopy or spectroscopy, e.g. sem, tem

Abstract

Apparatus and methods are provided for using atomic force microscopy for profiling high aspect ratio features. Probe landing techniques include scanning prior to bringing the probe into contact with the feature. In one embodiment, the probe assembly cantilever is brought into contact with the feature and subsequent scanning is used to locate the feature with the probe. In another embodiment, the probe is moved in a scanning pattern in progressively lower horizontal planes until the probe contacts the sample feature. Also described is a deconvolution technique for deconvolving the sample image and a technique for measuring the tip radius of the feature.
PCT/US1999/022720 1998-10-07 1999-09-30 Atomic force microscope for profiling high aspect ratio samples WO2000020823A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10346398P 1998-10-07 1998-10-07
US60/103,463 1998-10-07

Publications (3)

Publication Number Publication Date
WO2000020823A2 WO2000020823A2 (en) 2000-04-13
WO2000020823A3 true WO2000020823A3 (en) 2000-09-21
WO2000020823B1 WO2000020823B1 (en) 2000-11-02

Family

ID=22295329

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1999/022720 WO2000020823A2 (en) 1998-10-07 1999-09-30 Atomic force microscope for profiling high aspect ratio samples

Country Status (2)

Country Link
US (1) US6489611B1 (en)
WO (1) WO2000020823A2 (en)

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US7498564B2 (en) * 2001-02-06 2009-03-03 University Of Bristol Of Senate House Resonant scanning near-field optical microscope
US7053369B1 (en) * 2001-10-19 2006-05-30 Rave Llc Scan data collection for better overall data accuracy
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US7473887B2 (en) * 2002-07-04 2009-01-06 University Of Bristol Of Senate House Resonant scanning probe microscope
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JP2004264039A (en) * 2003-01-30 2004-09-24 Hitachi Ltd Scanning probe microscope, and compact disk/cross-sectional profile measuring method as well as semiconductor device manufacturing method
US7268542B1 (en) 2004-02-20 2007-09-11 United States Of America As Represented By The Secretary Of The Air Force Scanning SQUID microscope having position noise compensation
US7096711B2 (en) * 2004-05-12 2006-08-29 Veeco Instruments Inc. Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby
US20060186874A1 (en) * 2004-12-02 2006-08-24 The Board Of Trustees Of The University Of Illinois System and method for mechanical testing of freestanding microscale to nanoscale thin films
US7767961B2 (en) * 2005-06-09 2010-08-03 Hitachi Global Storage Technologies Netherlands B.V. Method for determining material interfacial and metrology information of a sample using atomic force microscopy
US7647822B2 (en) * 2006-02-21 2010-01-19 Wayne A Bonin Coaxial imaging for indentation instruments
US7406860B2 (en) * 2006-04-28 2008-08-05 Seagate Technology Llc Atomic force microscopy scanning and image processing
US7397030B1 (en) 2006-06-01 2008-07-08 N&K Technology, Inc. Integrated local and global optical metrology for samples having miniature features
US7423264B2 (en) * 2006-09-08 2008-09-09 Kla-Tencor Technologies Corporation Atomic force microscope
KR100761059B1 (en) * 2006-09-29 2007-09-21 파크시스템스 주식회사 Scanning probe microscope being able to measure samples having overhang structure
US7770439B2 (en) * 2006-10-17 2010-08-10 Veeco Instruments Inc. Method and apparatus of scanning a sample using a scanning probe microscope
US8720256B2 (en) * 2007-02-20 2014-05-13 Wayne Allen Bonin Off-axis imaging for indentation instruments
EP2122317A4 (en) * 2007-02-21 2012-09-19 Univ Illinois Stress micro mechanical test cell, device, system and methods
TWI322884B (en) * 2007-03-27 2010-04-01 Ind Tech Res Inst Singal analysis method for vibratory interferometry
US8156568B2 (en) * 2007-04-27 2012-04-10 Picocal, Inc. Hybrid contact mode scanning cantilever system
US8296860B2 (en) * 2009-03-16 2012-10-23 Seagate Technology Llc Atomic force microscopy true shape measurement method
US9586817B2 (en) 2011-07-28 2017-03-07 Seagate Technology Llc Semi-auto scanning probe microscopy scanning
US20130081159A1 (en) * 2011-07-29 2013-03-28 Seagate Technology Llc Advanced atomic force microscopy scanning for obtaining a true shape
GB201117138D0 (en) 2011-10-05 2011-11-16 Infinitesima Ltd Probe mounting system for a scanning probe microscope
US9958327B2 (en) 2014-10-01 2018-05-01 Nanometrics Incorporated Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device
US9395387B1 (en) * 2015-06-19 2016-07-19 Shimadzu Corporation Scanning probe microscope
EP3324194B1 (en) 2016-11-22 2019-06-26 Anton Paar GmbH Imaging a gap between sample and probe of a scanning probe microscope in substantially horizontal side view
EP3441773B1 (en) 2017-08-11 2022-11-23 Anton Paar GmbH Characterizing a height profile of a sample by side view imaging
EP3537161B1 (en) * 2018-03-08 2022-10-19 IMEC vzw A method for determining the shape of a sample tip for atom probe tomography using a scanning probe microscope and scanning probe microscope for performing said method
EP3671224B1 (en) * 2018-12-20 2022-06-08 IMEC vzw A method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample
DE102019200696B4 (en) 2019-01-21 2022-02-10 Carl Zeiss Smt Gmbh Apparatus, method and computer program for determining a position of an element on a photolithographic mask
WO2022137600A1 (en) * 2020-12-21 2022-06-30 株式会社島津製作所 Probe assessment method and spm
CN114236181B (en) * 2021-12-02 2023-10-20 中国电子科技集团公司第十三研究所 AFM probe measuring method, device, control equipment and storage medium

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EP0497288A2 (en) * 1991-01-29 1992-08-05 Canon Kabushiki Kaisha Probe scanning system
US5614712A (en) * 1995-03-24 1997-03-25 Quesant Instrument Corporation Method of engaging the scanning probe of a scanning probe microscope with a sample surface
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US5801381A (en) * 1997-05-21 1998-09-01 International Business Machines Corporation Method for protecting a probe tip using active lateral scanning control

Also Published As

Publication number Publication date
WO2000020823A2 (en) 2000-04-13
WO2000020823B1 (en) 2000-11-02
US6489611B1 (en) 2002-12-03

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