WO2000045125A8 - Method of determining an illuminated surface - Google Patents
Method of determining an illuminated surfaceInfo
- Publication number
- WO2000045125A8 WO2000045125A8 PCT/SE2000/000024 SE0000024W WO0045125A8 WO 2000045125 A8 WO2000045125 A8 WO 2000045125A8 SE 0000024 W SE0000024 W SE 0000024W WO 0045125 A8 WO0045125 A8 WO 0045125A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- recorded
- determining
- light
- intensity
- representation
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
Abstract
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU24693/00A AU2469300A (en) | 1999-01-28 | 2000-01-10 | Method of determining an illuminated surface |
JP2000596332A JP2002535668A (en) | 1999-01-28 | 2000-01-10 | How to determine the light receiving surface |
US09/890,056 US6757065B1 (en) | 1999-01-28 | 2000-01-10 | Method of determining an illuminated surface |
CA002359263A CA2359263A1 (en) | 1999-01-28 | 2000-01-10 | Method of determining an illuminated surface |
EP00903057A EP1155284A1 (en) | 1999-01-28 | 2000-01-10 | Method of determining an illuminated surface |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9900276A SE9900276L (en) | 1999-01-28 | 1999-01-28 | Topographic determination of a surface illuminated by incident light |
SE9900276-8 | 1999-01-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2000045125A1 WO2000045125A1 (en) | 2000-08-03 |
WO2000045125A8 true WO2000045125A8 (en) | 2000-12-07 |
Family
ID=20414269
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/SE2000/000024 WO2000045125A1 (en) | 1999-01-28 | 2000-01-10 | Method of determining an illuminated surface |
Country Status (7)
Country | Link |
---|---|
US (1) | US6757065B1 (en) |
EP (1) | EP1155284A1 (en) |
JP (1) | JP2002535668A (en) |
AU (1) | AU2469300A (en) |
CA (1) | CA2359263A1 (en) |
SE (1) | SE9900276L (en) |
WO (1) | WO2000045125A1 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE515711C2 (en) | 2000-02-09 | 2001-10-01 | Volvo Personvagnar Ab | Apparatus and method for measuring surface roughness of a measuring object |
SE0003904L (en) * | 2000-05-05 | 2001-11-06 | Roger Tuomas | Ways of measuring surface roughness |
EP1400802A1 (en) * | 2002-09-23 | 2004-03-24 | Ford Global Technologies, Inc. | Method and arrangement for detecting and evaluating surface irregularities |
DE102004050355A1 (en) * | 2004-10-15 | 2006-04-27 | Steinbichler Optotechnik Gmbh | Method and device for testing the surface of a tire |
FI20060331A0 (en) * | 2006-04-05 | 2006-04-05 | Kari Seppaelae | Method and device for shape measurement / shape identification |
US20090027648A1 (en) * | 2007-07-25 | 2009-01-29 | Asml Netherlands B.V. | Method of reducing noise in an original signal, and signal processing device therefor |
FI122448B (en) | 2008-07-23 | 2012-01-31 | Labvision Technologies Ltd Oy | Figure ring arrangement |
JP5436431B2 (en) * | 2008-08-26 | 2014-03-05 | 株式会社ブリヂストン | Method and apparatus for detecting unevenness of subject |
ES2670333T3 (en) * | 2009-11-14 | 2018-05-30 | Vmt Vision Machine Technic Bildverarbeitungssysteme Gmbh | Procedure for detecting the front edge surfaces of hollow fibers and procedure for detecting the interior spaces of hollow, unobstructed fibers of a bundle of hollow fibers |
JP6635674B2 (en) * | 2015-05-11 | 2020-01-29 | キヤノン株式会社 | Measuring device, measuring method and program |
EP3182060B1 (en) * | 2015-06-05 | 2023-07-26 | Nippon Steel Corporation | Shape inspection apparatus for metallic body and shape inspection method for metallic body |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4162126A (en) * | 1976-12-10 | 1979-07-24 | Hitachi, Ltd. | Surface detect test apparatus |
JPS5892904A (en) * | 1981-11-30 | 1983-06-02 | Hitachi Ltd | Surface direction detecting method and detector thereof |
JPS60135704A (en) * | 1983-12-23 | 1985-07-19 | Hitachi Ltd | Pattern detector |
JPS6182106A (en) * | 1984-09-28 | 1986-04-25 | Tokyo Doro Enjinia Kk | Detecting method of road surface difference |
JPH071164B2 (en) * | 1985-02-28 | 1995-01-11 | ソニー株式会社 | 3D shape recognition device |
JPH02243911A (en) * | 1989-03-17 | 1990-09-28 | Hitachi Ltd | Soldering inspection device |
US5463464A (en) * | 1991-10-04 | 1995-10-31 | Kms Fusion, Inc. | Electro-optical system for gauging surface profile deviations using infrared radiation |
US5465153A (en) * | 1991-10-04 | 1995-11-07 | Kms Fusion, Inc. | Electro-optical system for gauging specular surface profile deviations |
US5311286A (en) * | 1992-04-01 | 1994-05-10 | Materials Technologies Corporation | Apparatus and method for optically measuring a surface |
WO1995035506A2 (en) * | 1994-06-17 | 1995-12-28 | Kensington Laboratories, Inc. | Scribe mark reader |
DE19534716C2 (en) * | 1995-09-19 | 1999-06-17 | Autronic Bildverarbeitung | Device for detecting defects on a smooth surface |
HU224946B1 (en) | 1995-09-22 | 2006-04-28 | Owens Brockway Glass Container | System for checking containers by a field programmable gate array logic |
JP3509377B2 (en) | 1996-04-12 | 2004-03-22 | 株式会社ニコン | Curvature measuring device |
US5930383A (en) * | 1996-09-24 | 1999-07-27 | Netzer; Yishay | Depth sensing camera systems and methods |
SE508822C2 (en) | 1997-02-17 | 1998-11-09 | Volvo Ab | Method and apparatus for measuring and quantifying surface defects on a test surface |
WO1999058930A1 (en) * | 1998-05-14 | 1999-11-18 | Metacreations Corporation | Structured-light, triangulation-based three-dimensional digitizer |
WO2000003357A1 (en) * | 1998-07-08 | 2000-01-20 | Ppt Vision, Inc. | Identifying and handling device tilt in a three-dimensional machine-vision image |
US6552783B1 (en) * | 2000-06-28 | 2003-04-22 | Teradyne, Inc. | Optical system |
-
1999
- 1999-01-28 SE SE9900276A patent/SE9900276L/en unknown
-
2000
- 2000-01-10 AU AU24693/00A patent/AU2469300A/en not_active Abandoned
- 2000-01-10 EP EP00903057A patent/EP1155284A1/en not_active Withdrawn
- 2000-01-10 WO PCT/SE2000/000024 patent/WO2000045125A1/en active Application Filing
- 2000-01-10 JP JP2000596332A patent/JP2002535668A/en active Pending
- 2000-01-10 CA CA002359263A patent/CA2359263A1/en not_active Abandoned
- 2000-01-10 US US09/890,056 patent/US6757065B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
SE511985C2 (en) | 2000-01-10 |
CA2359263A1 (en) | 2000-08-03 |
WO2000045125A1 (en) | 2000-08-03 |
SE9900276D0 (en) | 1999-01-28 |
AU2469300A (en) | 2000-08-18 |
SE9900276L (en) | 2000-01-10 |
US6757065B1 (en) | 2004-06-29 |
EP1155284A1 (en) | 2001-11-21 |
JP2002535668A (en) | 2002-10-22 |
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