WO2000076069A3 - Calibration techniques for a precision relaxation oscillator integrated circuit with temperature compensation - Google Patents

Calibration techniques for a precision relaxation oscillator integrated circuit with temperature compensation Download PDF

Info

Publication number
WO2000076069A3
WO2000076069A3 PCT/US2000/028180 US0028180W WO0076069A3 WO 2000076069 A3 WO2000076069 A3 WO 2000076069A3 US 0028180 W US0028180 W US 0028180W WO 0076069 A3 WO0076069 A3 WO 0076069A3
Authority
WO
WIPO (PCT)
Prior art keywords
calibration techniques
temperature compensation
ctat
ptat
relaxation oscillator
Prior art date
Application number
PCT/US2000/028180
Other languages
French (fr)
Other versions
WO2000076069A2 (en
Inventor
James B Nolan
Ryan Scott Ellison
Original Assignee
Microchip Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microchip Tech Inc filed Critical Microchip Tech Inc
Priority to EP00967353A priority Critical patent/EP1142114A2/en
Publication of WO2000076069A2 publication Critical patent/WO2000076069A2/en
Publication of WO2000076069A3 publication Critical patent/WO2000076069A3/en

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/023Generators characterised by the type of circuit or by the means used for producing pulses by the use of differential amplifiers or comparators, with internal or external positive feedback
    • H03K3/0231Astable circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01Details
    • H03K3/011Modifications of generator to compensate for variations in physical values, e.g. voltage, temperature
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G05F3/242Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
    • G05F3/245Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the temperature

Abstract

Several calibration techniques for a precision relaxation oscillator with temperature compensation produces a stable clock frequency over wide variations of ambient temperature. The calibration techniques provide for different methods of determining CTAT current, PTAT current or the ratio of PTAT current to CTAT current. The calibration techniques provide different methods for determining CTAT and PTAT calibration values and for setting CTAT and PTAT calibration select switches.
PCT/US2000/028180 1999-04-26 2000-04-26 Calibration techniques for a precision relaxation oscillator integrated circuit with temperature compensation WO2000076069A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP00967353A EP1142114A2 (en) 1999-04-26 2000-04-26 Calibration techniques for a precision relaxation oscillator integrated circuit with temperature compensation

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/299,338 1999-04-26
US09/299,338 US6356161B1 (en) 1998-03-19 1999-04-26 Calibration techniques for a precision relaxation oscillator integrated circuit with temperature compensation

Publications (2)

Publication Number Publication Date
WO2000076069A2 WO2000076069A2 (en) 2000-12-14
WO2000076069A3 true WO2000076069A3 (en) 2001-07-26

Family

ID=23154360

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2000/028180 WO2000076069A2 (en) 1999-04-26 2000-04-26 Calibration techniques for a precision relaxation oscillator integrated circuit with temperature compensation

Country Status (5)

Country Link
US (1) US6356161B1 (en)
EP (1) EP1142114A2 (en)
CN (1) CN1535499A (en)
TW (1) TW476190B (en)
WO (1) WO2000076069A2 (en)

Families Citing this family (107)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6535042B1 (en) * 2000-02-22 2003-03-18 Linear Technology Corporation High-speed, current-driven latch
JP2003008404A (en) * 2001-06-26 2003-01-10 Fujitsu Ltd Oscillation circuit
FR2842317B1 (en) * 2002-07-09 2004-10-01 Atmel Nantes Sa REFERENCE VOLTAGE SOURCE, TEMPERATURE SENSOR, TEMPERATURE THRESHOLD DETECTOR, CHIP AND CORRESPONDING SYSTEM
TWI233726B (en) * 2002-07-12 2005-06-01 Macronix Int Co Ltd Charge pump system and clock generator
US6917249B1 (en) * 2002-11-27 2005-07-12 National Semiconductor Corporation RC oscillator
CN1330090C (en) * 2002-12-17 2007-08-01 皇家飞利浦电子股份有限公司 Temperature compensated RC oscillator
US7234159B1 (en) 2003-01-07 2007-06-19 Altera Corporation Method and apparatus for controlling evaluation of protected intellectual property in hardware
JP2005026410A (en) * 2003-07-01 2005-01-27 Ricoh Co Ltd Semiconductor laser driver
TWI221616B (en) * 2003-08-06 2004-10-01 Ememory Technology Inc Delay circuits and related apparatus for extending delay time by active feedback elements
US6914494B1 (en) * 2003-08-26 2005-07-05 National Semiconductor Corporation Very low current oscillator with variable duty cycle
US7543253B2 (en) * 2003-10-07 2009-06-02 Analog Devices, Inc. Method and apparatus for compensating for temperature drift in semiconductor processes and circuitry
US6924709B2 (en) * 2003-10-10 2005-08-02 Standard Microsystems Corporation Integrated relaxation oscillator with improved sensitivity to component variation due to process-shift
US7026935B2 (en) 2003-11-10 2006-04-11 Impinj, Inc. Method and apparatus to configure an RFID system to be adaptable to a plurality of environmental conditions
US7061296B2 (en) * 2003-12-19 2006-06-13 Infineon Technologies Ag Circuit arrangement for generating a digital clock signal
TWI349439B (en) 2004-03-22 2011-09-21 Integrated Device Tech Monolithic clock generator and timing/frequency reference
US7253719B2 (en) * 2004-04-13 2007-08-07 Impinj, Inc. Multi-oscillator clock signals
US20050225436A1 (en) * 2004-04-13 2005-10-13 Diorio Christopher J Method and system to calibrate an oscillator within an RFID circuit responsive to a received update value
US7417548B2 (en) * 2004-04-13 2008-08-26 Impinj, Inc. Adjusting RFID waveform shape in view of signal from an RFID tag
US7408466B2 (en) * 2004-04-13 2008-08-05 Impinj, Inc. Adjusting RFID waveform shape in view of detected RF energy
US7432814B2 (en) * 2004-04-13 2008-10-07 Impinj, Inc. Reconstructing RFID waveform shape for reuse in individual channel
US7388468B2 (en) * 2004-04-13 2008-06-17 Impinj, Inc. Method and system to backscatter modulate a radio-frequency signal from an RFID tag in accordance with both an oscillation frequency signal and a command signal
US7120550B2 (en) * 2004-04-13 2006-10-10 Impinj, Inc. Radio-frequency identification circuit oscillator calibration
US7436308B2 (en) * 2004-04-13 2008-10-14 Impinj, Inc. Adjusting RFID waveform shape in view of signal from another reader
US7394324B2 (en) * 2004-04-13 2008-07-01 Impinj, Inc. Method and system to calibrate an oscillator within an RFID circuit utilizing a test signal supplied to the RFID circuit
US7391329B2 (en) * 2004-04-13 2008-06-24 Impinj, Inc. Performance driven adjustment of RFID waveform shape
US7274265B2 (en) * 2004-08-18 2007-09-25 International Rectifier Corporation PWM controller with temperature regulation of switching frequency
US7472835B2 (en) * 2005-01-21 2009-01-06 Impinj, Inc. RFID system components implementing adjusted backscatter calculations and methods
US7116181B2 (en) * 2004-12-21 2006-10-03 Actel Corporation Voltage- and temperature-compensated RC oscillator circuit
DE602005027436D1 (en) 2005-02-18 2011-05-26 St Microelectronics Srl Electronic circuit and oscillator with this electronic circuit
US7598822B2 (en) * 2005-04-07 2009-10-06 Texas Instruments Incorporated Process, supply, and temperature insensitive integrated time reference circuit
US7567071B1 (en) * 2005-05-10 2009-07-28 National Semiconductor Corporation Current and voltage source that is unaffected by temperature, power supply, and device process
KR100913974B1 (en) 2006-02-23 2009-08-25 내셔널 세미콘덕터 코포레이션 Frequency ratio digitizing temperature sensor with linearity correction
US7331708B2 (en) * 2006-02-23 2008-02-19 National Semiconductor Corporation Frequency ratio digitizing temperature sensor with linearity correction
US7385453B2 (en) * 2006-03-31 2008-06-10 Silicon Laboratories Inc. Precision oscillator having improved temperature coefficient control
US7504902B2 (en) * 2006-03-31 2009-03-17 Silicon Laboratories Inc. Precision oscillator having linbus capabilities
US7830262B1 (en) 2006-04-25 2010-11-09 Impinj, Inc. Adjusting communication parameters while inventorying RFID tags
US7432771B2 (en) * 2006-06-02 2008-10-07 Smartech Worldwide Limited Oscillator circuit having temperature and supply voltage compensation
US8102201B2 (en) 2006-09-25 2012-01-24 Analog Devices, Inc. Reference circuit and method for providing a reference
US7576598B2 (en) * 2006-09-25 2009-08-18 Analog Devices, Inc. Bandgap voltage reference and method for providing same
JP4253739B2 (en) * 2006-10-05 2009-04-15 Okiセミコンダクタ株式会社 Oscillator circuit
KR100845780B1 (en) * 2006-12-07 2008-07-14 주식회사 하이닉스반도체 Circuit for Generating Clock of Semiconductor Memory Apparatus
US7579918B2 (en) * 2006-12-28 2009-08-25 Taiwan Semiconductor Manufacturing Co., Ltd. Clock generator with reduced electromagnetic interference for DC-DC converters
US7714563B2 (en) * 2007-03-13 2010-05-11 Analog Devices, Inc. Low noise voltage reference circuit
US20080265860A1 (en) * 2007-04-30 2008-10-30 Analog Devices, Inc. Low voltage bandgap reference source
US7605578B2 (en) 2007-07-23 2009-10-20 Analog Devices, Inc. Low noise bandgap voltage reference
WO2009070940A1 (en) * 2007-12-06 2009-06-11 Hong Kong Applied Science And Technology Research Institute Co. Ltd. Low-voltage oscillator with capacitor-ratio selectable duty cycle and single-input sub-threshold-conducting comparators to s-r latch
US7612606B2 (en) * 2007-12-21 2009-11-03 Analog Devices, Inc. Low voltage current and voltage generator
US7598799B2 (en) * 2007-12-21 2009-10-06 Analog Devices, Inc. Bandgap voltage reference circuit
US7902912B2 (en) * 2008-03-25 2011-03-08 Analog Devices, Inc. Bias current generator
US7750728B2 (en) * 2008-03-25 2010-07-06 Analog Devices, Inc. Reference voltage circuit
US7880533B2 (en) * 2008-03-25 2011-02-01 Analog Devices, Inc. Bandgap voltage reference circuit
US7728681B2 (en) * 2008-05-16 2010-06-01 Infineon Technologies Ag Temperature and process independent voltage controlled oscillator circuit
US8067992B2 (en) * 2008-06-06 2011-11-29 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Temperature compensation circuit and method
KR101060443B1 (en) * 2008-07-16 2011-08-29 주식회사 하이볼릭 Rc oscillator
WO2010033079A1 (en) * 2008-09-19 2010-03-25 Agency For Science, Technology And Research A relaxation oscillator
JP5213175B2 (en) * 2008-11-14 2013-06-19 セイコーインスツル株式会社 Temperature sensor
KR101520358B1 (en) * 2008-12-09 2015-05-14 삼성전자주식회사 A Temperature sensor with compensated output characteristics against variation of temperature and the compensating method used by the sensor
JP5250769B2 (en) * 2009-01-22 2013-07-31 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー Clock generation circuit
JP4929306B2 (en) * 2009-03-17 2012-05-09 株式会社東芝 Bias generation circuit and voltage controlled oscillator
US7884679B2 (en) * 2009-03-18 2011-02-08 Nxp B.V. Process, voltage, temperature compensated oscillator
DE102009031144B4 (en) * 2009-06-30 2013-08-01 Austriamicrosystems Ag Oscillator circuit and method for generating a clock signal
DE102009037486B3 (en) * 2009-08-13 2011-07-28 Texas Instruments Deutschland GmbH, 85356 Electronic device and method for efficient level shifting
CN102072737B (en) * 2009-11-25 2012-07-04 中国科学院电子学研究所 High accuracy capacitive readout circuit with temperature compensation
JP2011135349A (en) * 2009-12-24 2011-07-07 Fujitsu Semiconductor Ltd Oscillating apparatus
JP5533345B2 (en) * 2009-12-25 2014-06-25 ミツミ電機株式会社 Current source circuit and delay circuit and oscillation circuit using the same
US8085099B2 (en) * 2010-04-06 2011-12-27 Sandisk Technologies Inc. Self-calibrating relaxation oscillator based clock source
CN101877571B (en) * 2010-05-21 2012-06-20 西安电子科技大学 Multi-frequency oscillator applied to electronic ballast
TWI400884B (en) * 2010-05-28 2013-07-01 Macronix Int Co Ltd Clock integrated circuit
JP5451541B2 (en) * 2010-06-28 2014-03-26 スパンション エルエルシー Oscillator circuit
KR20120051442A (en) * 2010-11-12 2012-05-22 삼성전기주식회사 Current circuit having selective temperature coefficient
US20120223781A1 (en) * 2011-03-01 2012-09-06 Lsi Corporation Noise regulated linear voltage controlled oscillator
TWI452459B (en) * 2011-07-07 2014-09-11 Novatek Microelectronics Corp Device and module of triggering and generating temperature coefficient current
US8547122B2 (en) * 2011-07-11 2013-10-01 Microchip Technology Incorporated Temperature measurement of active device under test on strip tester
US20130223152A1 (en) * 2011-08-02 2013-08-29 Elpida Memory, Inc. Clock generator
CN102394565B (en) * 2011-10-31 2014-04-16 四川和芯微电子股份有限公司 Oscillating circuit and oscillating system
CN103312265B (en) 2012-03-12 2017-07-04 飞思卡尔半导体公司 Pierce circuit
EP2696500B1 (en) 2012-08-09 2019-04-24 ams AG Oscillator circuit and method for generating an oscillator signal
US9252709B2 (en) 2012-10-19 2016-02-02 Micron Technology, Inc. Apparatuses and methods for providing oscillation signals
KR101388827B1 (en) * 2012-11-01 2014-04-23 삼성전기주식회사 Circuit for generating pulse width modulation signal, and driving circuit for a motor
US9112513B2 (en) * 2013-11-20 2015-08-18 Atmel Corporation Calibrating temperature coefficients for integrated circuits
US9344070B2 (en) 2014-01-27 2016-05-17 Texas Instruments Incorporated Relaxation oscillator with low drift and native offset cancellation
US9514831B2 (en) 2014-01-29 2016-12-06 Sandisk Technologies Llc Multi-clock generation through phase locked loop (PLL) reference
US9325276B2 (en) 2014-03-03 2016-04-26 Sandisk Technologies Inc. Methods and apparatus for clock oscillator temperature coefficient trimming
US9385649B2 (en) * 2014-05-29 2016-07-05 Qualcomm Incorporated RC oscillator based on delay-free comparator
CN105551525B (en) * 2014-10-27 2020-12-01 爱思开海力士有限公司 Calibration apparatus and storage system having the same
US9660647B2 (en) * 2014-10-27 2017-05-23 Sk Hynix Memory Solutions Inc. Calibration device and memory system having the same
US9846446B2 (en) * 2015-01-21 2017-12-19 Samsung Electronics Co., Ltd Apparatus for compensating for temperature and method therefor
CN105071785A (en) * 2015-08-18 2015-11-18 珠海市一微半导体有限公司 On-chip accurate oscillator and temperature coefficient and frequency calibration method thereof
JP6407902B2 (en) * 2016-02-17 2018-10-17 株式会社東芝 Oscillator circuit
US9780736B1 (en) 2016-03-30 2017-10-03 Synaptics Incorporated Temperature compensated offset cancellation for high-speed amplifiers
CN108021173B (en) * 2016-11-02 2020-02-28 敦宏科技股份有限公司 Oscillator circuit with temperature compensation function
US10956538B2 (en) * 2016-12-03 2021-03-23 Verily Life Sciences Llc Low-power systems and methods for determining measurement times of values obtained by a measuring device
US10510393B2 (en) 2017-09-15 2019-12-17 Samsung Electronics Co., Ltd Resistive memory device including reference cell and operating method thereof
US10763832B2 (en) 2017-12-22 2020-09-01 Texas Instruments Incorporated Precision oscillators that use imprecise components
US10528070B2 (en) 2018-05-02 2020-01-07 Analog Devices Global Unlimited Company Power-cycling voltage reference
TWI650759B (en) * 2018-05-18 2019-02-11 華邦電子股份有限公司 Overdrive voltage generator
US10409312B1 (en) 2018-07-19 2019-09-10 Analog Devices Global Unlimited Company Low power duty-cycled reference
US10177746B1 (en) 2018-07-20 2019-01-08 Winbond Electronics Corp. Overdrive Voltage Generator
TWI673952B (en) * 2018-12-28 2019-10-01 大陸商北京集創北方科技股份有限公司 RC oscillator
TWI694675B (en) * 2019-04-19 2020-05-21 敦宏科技股份有限公司 Method for low-current oscillation circuit with wide operation voltage and temperature compensation
US11043936B1 (en) * 2020-03-27 2021-06-22 Macronix International Co., Ltd. Tuning method for current mode relaxation oscillator
EP3930191A1 (en) * 2020-06-25 2021-12-29 ams International AG Oscillator circuit, device and method for generating an oscillator signal
CN112285412A (en) * 2020-09-25 2021-01-29 北京智芯微电子科技有限公司 Band gap reference source measuring device and method
WO2024056576A1 (en) * 2022-09-12 2024-03-21 Nordic Semiconductor Asa Trimming technique for oscillators
CN115208359B (en) * 2022-09-13 2022-11-25 南京芯惠半导体有限公司 Relaxation oscillator based on digital-analog hybrid self-calibration loop
CN115494908B (en) * 2022-10-17 2023-11-17 中国电子科技集团公司第二十四研究所 Temperature-tracking current source mismatch foreground calibration circuit and method
TWI824794B (en) * 2022-10-26 2023-12-01 新唐科技股份有限公司 Calibration device and method for calibrating frequency drift and electronic device using the same

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5352934A (en) * 1991-01-22 1994-10-04 Information Storage Devices, Inc. Integrated mosfet resistance and oscillator frequency control and trim methods and apparatus
US5563928A (en) * 1993-09-30 1996-10-08 Lsi Logic Corporation Method and apparatus for optimizing the performance of digital systems
US5699024A (en) * 1996-05-06 1997-12-16 Delco Electronics Corporation Accurate integrated oscillator circuit
US5912593A (en) * 1997-06-09 1999-06-15 Microchip Technology, Incorporated IC (current-capacitor) precision oscillator having frequency and duty cycle controls
EP0944169A2 (en) * 1998-03-19 1999-09-22 Microchip Technology Inc. A precision relaxation oscillator integrated circuit with temperature compensation
US6020790A (en) * 1998-07-30 2000-02-01 Motorola, Inc. Oscillator calibration method and circuit and radio with oscillator
US6052035A (en) * 1998-03-19 2000-04-18 Microchip Technology Incorporated Oscillator with clock output inhibition control

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2682470B2 (en) 1994-10-24 1997-11-26 日本電気株式会社 Reference current circuit

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5352934A (en) * 1991-01-22 1994-10-04 Information Storage Devices, Inc. Integrated mosfet resistance and oscillator frequency control and trim methods and apparatus
US5563928A (en) * 1993-09-30 1996-10-08 Lsi Logic Corporation Method and apparatus for optimizing the performance of digital systems
US5699024A (en) * 1996-05-06 1997-12-16 Delco Electronics Corporation Accurate integrated oscillator circuit
US5912593A (en) * 1997-06-09 1999-06-15 Microchip Technology, Incorporated IC (current-capacitor) precision oscillator having frequency and duty cycle controls
EP0944169A2 (en) * 1998-03-19 1999-09-22 Microchip Technology Inc. A precision relaxation oscillator integrated circuit with temperature compensation
US6052035A (en) * 1998-03-19 2000-04-18 Microchip Technology Incorporated Oscillator with clock output inhibition control
WO2000036745A1 (en) * 1998-03-19 2000-06-22 Microchip Technology Incorporated A precision relaxation oscillator with temperature compensation and various operating modes
US6020790A (en) * 1998-07-30 2000-02-01 Motorola, Inc. Oscillator calibration method and circuit and radio with oscillator

Also Published As

Publication number Publication date
WO2000076069A2 (en) 2000-12-14
US6356161B1 (en) 2002-03-12
CN1535499A (en) 2004-10-06
TW476190B (en) 2002-02-11
EP1142114A2 (en) 2001-10-10

Similar Documents

Publication Publication Date Title
WO2000076069A3 (en) Calibration techniques for a precision relaxation oscillator integrated circuit with temperature compensation
EP0944169A3 (en) A precision relaxation oscillator integrated circuit with temperature compensation
Chiang et al. A submicrowatt 1.1-MHz CMOS relaxation oscillator with temperature compensation
AU2001251499A1 (en) Methods, systems, wireless terminals, and computer program products for calibrating an electronic clock using a base reference signal and a non-continuous calibration reference signal having greater accuracy than the base reference signal
GB2363269B (en) Temperature-compensated crystal oscillator and method of compensating temperature thereof
WO2002048663A3 (en) Digital sensor for miniature medical thermometer, and body temperature monitor
DE69608461D1 (en) CURRENT PROBE WITH COMPENSATION FOR THE TEMPERATURE DEPENDENCY OF THE VERDET CONSTANT
BR9712641A (en) Apparatus and process for regulating the frequency of an oscillating output signal, phase loop loop circuit, and, calibration process for calibrating a device responsive to values of a reference signal
DE69837354D1 (en) TDMA terminal with adjustment of the transmission clock by using measured delay
EP1115000A3 (en) Fibre optic current sensor
AU2001239299A1 (en) Voltage controlled crystal oscillator temperature compensating circuit
CH650636GA3 (en)
DE68915355T2 (en) Quartz oscillator with temperature compensated frequency characteristics.
GB9928544D0 (en) Approximate third-order function generator temperature compensation quartz oscillation circuit made by using the same, and temperature compensation method
JPS5560865A (en) Frequency counter
EP1412716A4 (en) Very low phase noise temperature stable voltage controlled oscillator
DE69011961D1 (en) Quartz oscillator circuit with temperature compensation.
CH640996B (en) TIME-GUARD COMBINED WITH A THERMOMETER.
ATE218769T1 (en) TEMPERATURE COMPENSATED OSCILLATOR
US10763830B2 (en) Current controlled oscillator
TW334620B (en) Timing circuit
EP1233520A3 (en) Phase and frequency-locked loop circuits
FR2783372B1 (en) TEMPERATURE STABILIZED RC OSCILLATOR
JPS647596A (en) Electronic component
WO2002063685A3 (en) Voltage adjustment system and method

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 00801090.0

Country of ref document: CN

AK Designated states

Kind code of ref document: A2

Designated state(s): CN JP KR

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE

WWE Wipo information: entry into national phase

Ref document number: 2000967353

Country of ref document: EP

121 Ep: the epo has been informed by wipo that ep was designated in this application
AK Designated states

Kind code of ref document: A3

Designated state(s): CN JP KR

AL Designated countries for regional patents

Kind code of ref document: A3

Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE

WWP Wipo information: published in national office

Ref document number: 2000967353

Country of ref document: EP

WWW Wipo information: withdrawn in national office

Ref document number: 2000967353

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: JP