WO2001029571A1 - Circuit and method for improved test and calibration in automated test equipment - Google Patents
Circuit and method for improved test and calibration in automated test equipment Download PDFInfo
- Publication number
- WO2001029571A1 WO2001029571A1 PCT/US2000/028915 US0028915W WO0129571A1 WO 2001029571 A1 WO2001029571 A1 WO 2001029571A1 US 0028915 W US0028915 W US 0028915W WO 0129571 A1 WO0129571 A1 WO 0129571A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- circuit
- channel
- time varying
- solid state
- varying signal
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001532112A JP4689125B2 (en) | 1999-10-19 | 2000-10-18 | Improved test and calibration circuit and method in automatic test equipment |
DE60025247T DE60025247T2 (en) | 1999-10-19 | 2000-10-18 | CIRCUIT AND METHOD FOR TESTING AND CALIBRATION |
AT00972272T ATE314661T1 (en) | 1999-10-19 | 2000-10-18 | CIRCUIT AND METHOD FOR TESTING AND CALIBRATION |
EP00972272A EP1224487B1 (en) | 1999-10-19 | 2000-10-18 | Circuit and method for improved test and calibration in automated test equipment |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/420,497 US6331783B1 (en) | 1999-10-19 | 1999-10-19 | Circuit and method for improved test and calibration in automated test equipment |
US09/420,497 | 1999-10-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001029571A1 true WO2001029571A1 (en) | 2001-04-26 |
Family
ID=23666728
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/028915 WO2001029571A1 (en) | 1999-10-19 | 2000-10-18 | Circuit and method for improved test and calibration in automated test equipment |
Country Status (9)
Country | Link |
---|---|
US (1) | US6331783B1 (en) |
EP (1) | EP1224487B1 (en) |
JP (1) | JP4689125B2 (en) |
KR (1) | KR100731344B1 (en) |
AT (1) | ATE314661T1 (en) |
DE (1) | DE60025247T2 (en) |
MY (1) | MY124977A (en) |
TW (1) | TW589463B (en) |
WO (1) | WO2001029571A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6570397B2 (en) | 2001-08-07 | 2003-05-27 | Agilent Technologies, Inc. | Timing calibration and timing calibration verification of electronic circuit testers |
WO2005012933A1 (en) * | 2003-07-30 | 2005-02-10 | Infineon Technologies Ag | Device and method for testing integrated circuits |
CN104656003A (en) * | 2013-11-22 | 2015-05-27 | 英业达科技有限公司 | System and method for configuring signal circuit board and test circuit board |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3453133B2 (en) * | 1999-08-16 | 2003-10-06 | 株式会社アドバンテスト | Timing calibration method for IC test apparatus and IC test apparatus having calibration function using the calibration method |
JP4291494B2 (en) * | 2000-04-04 | 2009-07-08 | 株式会社アドバンテスト | IC test equipment timing calibration equipment |
US20030110427A1 (en) * | 2000-04-12 | 2003-06-12 | Advantest Corporation | Semiconductor test system storing pin calibration data in non-volatile memory |
US20040181731A1 (en) * | 2000-04-12 | 2004-09-16 | Advantest Corporation | Semiconductor test system storing pin calibration data, commands and other data in non-volatile memory |
US6563298B1 (en) | 2000-08-15 | 2003-05-13 | Ltx Corporation | Separating device response signals from composite signals |
US7337088B2 (en) * | 2001-05-23 | 2008-02-26 | Micron Technology, Inc. | Intelligent measurement modular semiconductor parametric test system |
US6661242B1 (en) * | 2001-12-20 | 2003-12-09 | Xilinx, Inc. | Using a DUT pin at known voltage to determine channel path resistance in automated test equipment test channels |
US7162386B2 (en) * | 2002-04-25 | 2007-01-09 | Micron Technology, Inc. | Dynamically adaptable semiconductor parametric testing |
US6836136B2 (en) * | 2002-12-18 | 2004-12-28 | Teradyne, Inc. | Pin driver for AC and DC semiconductor device testing |
US6879175B2 (en) * | 2003-03-31 | 2005-04-12 | Teradyne, Inc. | Hybrid AC/DC-coupled channel for automatic test equipment |
US7010451B2 (en) * | 2003-04-17 | 2006-03-07 | Micron Technology, Inc. | Dynamic creation and modification of wafer test maps during wafer testing |
US7508228B2 (en) * | 2004-12-21 | 2009-03-24 | Teradyne, Inc. | Method and system for monitoring test signals for semiconductor devices |
KR100618899B1 (en) * | 2005-06-08 | 2006-09-01 | 삼성전자주식회사 | Apparatus and method for supporting radio frequency(rf) and direct current(dc) test in rf device |
TW200831923A (en) * | 2007-01-19 | 2008-08-01 | King Yuan Electronics Co Ltd | Device and method for DC and system level test integration |
US7489125B2 (en) * | 2007-04-02 | 2009-02-10 | Teradyne, Inc. | Calibrating a tester using ESD protection circuitry |
WO2013068040A1 (en) | 2011-11-09 | 2013-05-16 | Advantest (Singapore) Pte. Ltd. | Concept for extracting a signal being exchanged between a device under test and an automatic test equipment |
KR101279737B1 (en) * | 2012-03-29 | 2013-06-27 | 주식회사 에프티랩 | The inspection apparatus for the capacitive touch screen panel using switching device and the inspection method using the same |
CN102944858B (en) * | 2012-11-12 | 2014-12-03 | 无锡市计量测试中心 | Residual current device action characteristic detector calibration instrument separating switch |
TWI490512B (en) * | 2013-11-28 | 2015-07-01 | 英業達股份有限公司 | Signal circuit board and test circuit board disposing system and method thereof |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4799008A (en) * | 1986-04-14 | 1989-01-17 | Advantest Corporation | AC level calibration apparatus |
US5621329A (en) * | 1995-04-13 | 1997-04-15 | Industrial Technology Research Institute | Automatic self-calibration system for digital teraohmmeter |
JPH09281188A (en) * | 1996-04-15 | 1997-10-31 | Advantest Corp | Ic-testing apparatus |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4354268A (en) * | 1980-04-03 | 1982-10-12 | Santek, Inc. | Intelligent test head for automatic test system |
US4806852A (en) * | 1984-09-07 | 1989-02-21 | Megatest Corporation | Automatic test system with enhanced performance of timing generators |
JP2515914Y2 (en) * | 1988-06-15 | 1996-11-06 | 株式会社アドバンテスト | IC tester timing calibration device |
JP2582906B2 (en) | 1989-10-21 | 1997-02-19 | 東芝マイクロエレクトロニクス株式会社 | Method for measuring DC current / voltage characteristics of semiconductor device |
JPH0712940Y2 (en) * | 1989-11-06 | 1995-03-29 | 株式会社アドバンテスト | IC test equipment |
US5200696A (en) * | 1990-09-10 | 1993-04-06 | Ltx Corporation | Test system apparatus with Schottky diodes with programmable voltages |
US5101153A (en) | 1991-01-09 | 1992-03-31 | National Semiconductor Corporation | Pin electronics test circuit for IC device testing |
US5402079A (en) | 1992-12-18 | 1995-03-28 | Vlsi Technology, Inc. | Integrated circuit relay control system |
JP3075135B2 (en) * | 1995-04-14 | 2000-08-07 | 横河電機株式会社 | LSI tester |
US5917331A (en) | 1995-10-23 | 1999-06-29 | Megatest Corporation | Integrated circuit test method and structure |
JP3134745B2 (en) | 1995-10-31 | 2001-02-13 | 安藤電気株式会社 | Relay control circuit |
JPH09281182A (en) | 1996-04-10 | 1997-10-31 | Advantest Corp | Measuring board and i/o terminal testing system using the measuring board |
JPH1082837A (en) * | 1996-09-06 | 1998-03-31 | Advantest Corp | Lsi test device |
US6133725A (en) * | 1998-03-26 | 2000-10-17 | Teradyne, Inc. | Compensating for the effects of round-trip delay in automatic test equipment |
-
1999
- 1999-10-19 US US09/420,497 patent/US6331783B1/en not_active Expired - Lifetime
-
2000
- 2000-10-18 KR KR1020027005004A patent/KR100731344B1/en active IP Right Grant
- 2000-10-18 WO PCT/US2000/028915 patent/WO2001029571A1/en active IP Right Grant
- 2000-10-18 AT AT00972272T patent/ATE314661T1/en not_active IP Right Cessation
- 2000-10-18 TW TW089121793A patent/TW589463B/en not_active IP Right Cessation
- 2000-10-18 DE DE60025247T patent/DE60025247T2/en not_active Expired - Fee Related
- 2000-10-18 EP EP00972272A patent/EP1224487B1/en not_active Expired - Lifetime
- 2000-10-18 JP JP2001532112A patent/JP4689125B2/en not_active Expired - Lifetime
- 2000-10-19 MY MYPI20004913A patent/MY124977A/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4799008A (en) * | 1986-04-14 | 1989-01-17 | Advantest Corporation | AC level calibration apparatus |
US5621329A (en) * | 1995-04-13 | 1997-04-15 | Industrial Technology Research Institute | Automatic self-calibration system for digital teraohmmeter |
JPH09281188A (en) * | 1996-04-15 | 1997-10-31 | Advantest Corp | Ic-testing apparatus |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 1998, no. 02 30 January 1998 (1998-01-30) * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6570397B2 (en) | 2001-08-07 | 2003-05-27 | Agilent Technologies, Inc. | Timing calibration and timing calibration verification of electronic circuit testers |
WO2005012933A1 (en) * | 2003-07-30 | 2005-02-10 | Infineon Technologies Ag | Device and method for testing integrated circuits |
US7400995B2 (en) | 2003-07-30 | 2008-07-15 | Infineon Technologies Ag | Device and method for testing integrated circuits |
CN104656003A (en) * | 2013-11-22 | 2015-05-27 | 英业达科技有限公司 | System and method for configuring signal circuit board and test circuit board |
Also Published As
Publication number | Publication date |
---|---|
KR20020062630A (en) | 2002-07-26 |
US6331783B1 (en) | 2001-12-18 |
JP2003512630A (en) | 2003-04-02 |
ATE314661T1 (en) | 2006-01-15 |
TW589463B (en) | 2004-06-01 |
JP4689125B2 (en) | 2011-05-25 |
KR100731344B1 (en) | 2007-06-21 |
EP1224487A1 (en) | 2002-07-24 |
DE60025247T2 (en) | 2006-08-31 |
EP1224487B1 (en) | 2005-12-28 |
MY124977A (en) | 2006-07-31 |
DE60025247D1 (en) | 2006-02-02 |
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