WO2002002269A1 - Polishing pad grooving method and apparatus - Google Patents

Polishing pad grooving method and apparatus Download PDF

Info

Publication number
WO2002002269A1
WO2002002269A1 PCT/US2001/020556 US0120556W WO0202269A1 WO 2002002269 A1 WO2002002269 A1 WO 2002002269A1 US 0120556 W US0120556 W US 0120556W WO 0202269 A1 WO0202269 A1 WO 0202269A1
Authority
WO
WIPO (PCT)
Prior art keywords
pad
bit
router
working surface
lateral movement
Prior art date
Application number
PCT/US2001/020556
Other languages
French (fr)
Inventor
Shyng-Tsong Chen
Alex Siu Keung Chung
Kenneth M. Davis
Oscar Kai Chi Hsu
Kenneth P. Rodbell
Original Assignee
International Business Machines Corporation
Freudenberg Non Wovens
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corporation, Freudenberg Non Wovens filed Critical International Business Machines Corporation
Priority to JP2002506885A priority Critical patent/JP2004514565A/en
Priority to AT01952272T priority patent/ATE307006T1/en
Priority to EP01952272A priority patent/EP1299210B1/en
Priority to DE60114201T priority patent/DE60114201D1/en
Priority to AU2001273045A priority patent/AU2001273045A1/en
Priority to CA002413803A priority patent/CA2413803A1/en
Publication of WO2002002269A1 publication Critical patent/WO2002002269A1/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T409/00Gear cutting, milling, or planing
    • Y10T409/30Milling
    • Y10T409/303752Process
    • Y10T409/303808Process including infeeding
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T409/00Gear cutting, milling, or planing
    • Y10T409/30Milling
    • Y10T409/306216Randomly manipulated, work supported, or work following device
    • Y10T409/306552Randomly manipulated
    • Y10T409/306608End mill [e.g., router, etc.]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T409/00Gear cutting, milling, or planing
    • Y10T409/30Milling
    • Y10T409/308624Milling with limit means to aid in positioning of cutter bit or work [e.g., gauge, stop, etc.]

Definitions

  • the present invention relates to the field of making polishing pads, and more specifically to providing macrotextured surfaces on polishing pads used in the chemical- mechanical planarizarion (CMP) of semiconductor substrates.
  • CMP chemical- mechanical planarizarion
  • Chemical-mechanical polishing has been used for many years as a technique for polishing optical lenses and semiconductor wafers. More recendy, chemical-mechanicai polishing has been developed as a means for pianarizing intermetal dielectric layers of silicon dioxide and for removing portions of conductive layers within integrated circuit devices as they are fabricated on various substrates.
  • a silicon dioxide layer may cover a metal interconnect conformably such that the upper surface ⁇ f the silicon dioxide layer is characterized by a series of non-planar steps corresponding in height and width to the underlying metal interconnects.
  • step height variations in the upper surface of the intermetal dielectric layer have several undesirable characteristics. Such non-planar dielectric surfaces may interfere with the optical resolution of subsequent photolithographic processing steps, making it extremely difficult to print high resolution lines.
  • Another problem involves the step created in the coverage of a second metal layer over the intermetal dielectric layer. If the step height is relatively large, the metal coverage may be incomplete such that open circuits may be formed in the second metal layer.
  • One such approach is to employ abrasive polishing to remove the protruding steps along the upper surface of the dielectric layer.
  • a silicon substrate wafer is mounted face down beneath a carrier and pressed between the carrier and a table or platen covered with a polishing pad that is continuously coated with a slu ⁇ ied abrasive material- Means are also provided for depositing the abrasive slurry on the upper surface of the pad and for forcibly pressing the substrate wafer against the polishing pad, such that movement of the platen and the substrate wafer relative to each other in the presence of the slurry results in planarizatio ⁇ of the contacted face of the wafer. Both the wafer and the table may be rotated relative to each other to rub away the protruding steps. T is abrasive polishing process is continued until the upper surface of the dielectric layer is substantially flat.
  • Polishing pads may be made of a uniform material such as polyurethane or nonwoven fibers impregnated with a synthetic resin binder, or may be formed from multilayer laminations having non-uniform physical properties throughout the thickness of the pad.
  • Polyurethane polishing pads are typically formed by placing a reactive composition in a mold, curing the composition to form the pad material, and then die cutting the pad material into the desired size and shape. The reagents that form the polyurethane or the resin binder also may be reacted within a cylindrical container. After forming, a cylindrically shaped piece of pad material is cut into slices that are subsequently used as the polishing pad.
  • a typical laminated pad may have a plurality of layers, such as a spongy and resilient microporous polyurethane layer laminated onto a firm but resilient supporting layer comprising a porous polyester felt with a polyurethane binder.
  • Polishing pads typically may have a thickness in the range of 50-80 mils, preferably about 55 mils, and a diameter in the range of 10 to 36 inches, such as about 22.5 inches.
  • Polishing pads also may have macrotextured work surfaces made by surface machining using various techniques, many of which are expensive and produce undesirable surface features of widely varying depths. Surface features include waves, holes, creases, ridges, slits, depressions, protrusions, gaps, and recesses. Some other factors which influence the macroscopic surface texture of a polishing pad are the size, shape, and distribution frequency or spacing of the surface features. Polishing pads typically may also have micr ⁇ textured surfaces cause by a microscopic bulk texture of the pad resulting from factors intrinsic to the manufacturing process. Since polishing does not normally occur across the entire pad surface, any microtexture of the pad and the macrotextures made by surface machining, may only be formed into the portion of the pad over which polishing is to take place.
  • the material removed from the wafer surface and the abrasive, such as silica, in the slurry tend to become compacted and embedded in the recesses, pores, and other free spaces within the microscopic and macroscopic bulk texture of the polishing pad at and near its surface.
  • One factor in achieving and maintaining a high and stable polishing rate is providing and maintaining the pad surface in a clean condition.
  • Another factor is reducing or preventing a hydroplaning effect caused by the buildup of a layer of water between the abutting surfaces of the pad and the wafer. It has also been determined that increasing the flexibility of the pad in a controlled manner will increase polishing uniformiry, i.e., the uniformity of the polished wafer surface.
  • the present invention therefore, provides a pad grooving method and apparatus for producing a polishing pad that is capable of consistently forming uniformly polished surfaces on high quality wafers.
  • the apparatus comprises a platen with positioning post for holding a polishing pad in position for engagement by a router to machine grooves in the working surface of the pad.
  • a spacing mechanism provides a constant and precise separation between the working surface of the pad and the chuck for holding and rotating the router.
  • the pad is placed on the supporting surface of the platen with- its working surface in spaced relation opposite to the router bit.
  • the router chuck and drive motor are supported opposite to the pad by a frame.
  • the spacing mechanism comprises at least one. preferably two or more, stop members mounted on the frame adjacent to an aperture through which passes the router bit. An outer end portion of the bit projects beyond the stop member(s), which preferably are pins threaded within the frame so as to be axially adjustable.
  • a vacuum system is provided for applying a vacuum to the working surface of the pad to pull the pad first against the outer end of the router bit and then against the stop memberfs).
  • Rotation of the router bit by the motor while the vacuum is applied to the pad causes the outer end portion of the bit to cut an initial recess (hole) into the pad to a depth below its working surface.
  • the recess depth is precisely limited by the stop member(s), which comes into contact with the working surface of the pad as the rotating bit cuts into the pad to form the initial recess.
  • a lateral motion mechanism causes relative lateral movement between the rotating router bit and the pad while the vacuum maintains the pad in contact with the stop members).
  • the lateral motion mechanism may comprise upper and lower plates suspended from an overhead beam and arranged for relative movement in the x-y plane.
  • the upper plate may be mounted on the overhead beam and driven in the X-direction (along the X-axis) by one or more motorized screws; and the router frame suspended from the lower plate which, in mm, is mounted on the upper plate and driven in the Y-direction by one or more motorized screws.
  • the platen may be similarly mounted for such x-y movement instead of the router frame, or both the platen and router frame may be mounted for such movement
  • the platen may be rotated by a drive motor to provide an additional means for causing lateral movement between the router bit and the pad.
  • motion of the pad along the Z-axis may be guided by a plurality, preferably two or more, posts projecting outward from the platen along axes parallel to the rotational axis of the router bit.
  • These guideposts also may secure the pad for rotation when the platen is rotated by a platen drive motor, and are particularly usefui for grooving disks other than polishing pads, such as rigid disks of greater thickness and smaller diameter.
  • the upper and lower lateral motion plates provide for lateral movement of the router bit relative to the pad along the X-axis and along the Y-axis. Therefore, the router bit may be moved relative to the pad in accordance with the Cartesian coordinates x, y and z, or in accordance with the cylindrical coordinates R, ⁇ and Z.
  • the foregoing relative lateral movements permit the grooves cut in the working surface of the pad to have either left or right spiral patterns, zigzag patterns with different groove densities, each following a constant radius around the pad at different radii, inner and outer circle grooves with spiral grooves or zigzag in areas therebetween, inner and outer sectors at different radii and having different spiral or zigzag patterns, or any combinations of these and other patterns.
  • the patterned portions of the working surface of the pad may be confined only to those areas over which polishing of a wafer is to take place.
  • the depth of the grooves may also be varied for different patterns by axially adjusting the projecting length of the stop members, which are preferably symmetrical pins, or by axially adjusting the projecting length of the router bit relative to axially fixed stop members.
  • the grooves may penetrate into the pad for a depth up to 80% of the pad thickness.
  • Pad flexibility may also be adjusted by the overall number of grooves provided, such as, for example, a pattern of 8. 32. or 64 spirals. Grooves in the working surface of a CMP pad made according to the invention significantly reduce the hydroplaning effect during wafer polishing and. as a result, a much higher polishing rate can be achieved.
  • a pattern with a higher number of spiral grooves can reduce the hydroplaning effect more efficiently than a pattern with a lower number of spiral grooves because more grooves will pass across the wafer surface being polished in the same period of time.
  • An increase in pad flexibility due to the groove pattern selected may also help improve the polishing uniformity of the wafer surface.
  • the groove density of zigzag groove patterns also may be varied to control me poiishing rate distribution within different segments of the polishing pad surface and this may also improve polishing uniformity within the wafer surface.
  • the polishing pad provided by the present invention is ideal for polishing wafers of dielectric materials such as silicon dioxide, diamond-like carbon (DLC), spi ⁇ -on-glass
  • polishing pads also may be used to polish other wafers or disks such as those made of copper, aluminum, tungsten, and alloys of these and other metals.
  • FIG. 1 is an elevational view of the invention in partial section and in which its major components are illustrated diagrammatically;
  • Fig. 2 is a planar cross-sectional view as taken along line 2-2 of Fig. 1;
  • Fig. 3 is an enlarged partial sectional view of a portion of Fig. 1;
  • Fig. 4 shows a polishing pad made according to the present invention wherein the groove pattern comprises 8 lef -hand spiral grooves beginning near the center of the pad and ending near the outer edge of the working surf ce of the pad;
  • Fig. 5 shows a polishing pad made according to the present invention wherein the groove pattern comprises 32 left-hand spiral grooves beginning near the center and ending near the outer edge of the working surface of the pad;
  • Fig. 6 shows a polishing pad made according to the invention wherein the groove pattern comprises 64 right-hand spiral grooves beginning near the center and ending near the outer edge of the working surface of the pad; and.
  • Fig. 7 shows a polishing pad made according to the invention wherein the groove pattern comprises a plurality of radially spaced zigzag grooves each formed symmetrically along a substantially constant radius around the pad surface, and wherein the groove density of the innermost and outermost grooves are varied from each other and from intermediate grooves.
  • the polishing pad grooving method and apparatus of the present invention are illustrated best in Figs. 1-3.
  • the polishing apparatus has a platen 10 on which a polishing pad 12 is supported and held in a fixed radial position by a plurality of holding posts 14.
  • Each of the holding posts 14 fits within a channel or recess 16 (Fig.4) formed within the pad body or in the pad periphery and extending parallel to the central axis C of the pad so that the pad may be guided for axial movement away from the surface of the platen, as illustrated by the arrows Z and the air gap 17 shown in Fig. 3.
  • axially adjustable routers and/or flexible pads of sufficiently large diameter and small thickness to be axially adjustable routers and/or flexible pads of sufficiently large diameter and small thickness
  • the holding posts 14 may be replaced by non-guiding clamps.
  • a router bit 24 replaceably held in a chuck 26 and driven in rotation by a router motor 28.
  • Router motor 28 is carried by a frame 30 surrounded by a casing 32, such that an annular space 34 is provided between the concentric walls of the frame and the casing, both of which are preferably cylindrical.
  • a vacuum, represented by arrows V, V is provided in the annular space 34 by a blower 36 attached to the casing 32 by a flexible hose 38.
  • the platen 10 is carried for rotation in either direction by a drive shaft 18 driven by a platen motor 20.
  • Motors 20 and 28 may both be of the reversible type, such that the router bit 24 may be rotated in either direction, as indicated by the arrow Rl. and the platen 10 also may be rotated in either direction, as indicated by the arrow R2.
  • a plurality of stop pins 33 which project parallel to the router bit for a distance that is less than the projecting distance of the router bit itself.
  • the difference between the projecting distance of the pins 33 and the projecting distance of the router bit define the length of an end portion 37 of the bit equal to the desired depth of the groove to be cut by this end portion, as described more fully below in connection with operation of the invention.
  • the projecting length of bit end portion 37 may be changed by rotating a pair of pinions 27, 27 that engage a corresponding pair of racks 29, 29 mounted on router motor 28 as shown in Fig. 1.
  • the pins 33 are preferably threaded into the bottom wall 31 for axial adjustment, as an alternative means for changing the projecting length of bit end portion 37.
  • Pins 33 may have a hex head portion 39 permitting engagement for rotation by a corresponding tool.
  • the router is mounted to an overhead support or carrying member 40 by a lateral motion mechanism, generally designated 42, to provide for lateral movement of the router bit in an x-y plane perpendicular to the axis of router bit rotation and the corresponding central axis C of the polishing pad.
  • the lateral motion mechanism 42 may be any structure providing precise lateral movement of ⁇ e router 24 in the x-y plane, and may not be needed in instances where the router support member 40 is itself movable in the x-y plane, such as where the member 40 is attached to or part of a precisely controllable robotic arm.
  • the motion device illustrated in Figs. 1 and 2 comprises a lower piate 44 suspended from an upper plate 46 by two pairs of threaded eyelets 48, 48 and 50,
  • each eyelet pair 48, 48 and 50, 50 is threadedly engaged by a corresponding drive screw 58 driven in rotation by a reversible y-axis motor 59 to provide reciprocal motion of lower plate 44 along the y-axis, as illustrated by the double-ended arrow Y.
  • the eyelet pairs 54. 54. and 56. 56 are each threadedly engaged by a corresponding drive screw 60 rotated by a reversible x-axis electric motor 62 to provide reciprocal motion of upper piate 46 along the x-axis. as illustrated by the double-ended arrow X in Fig. 2.
  • the router bit 24 extends beyond the ends of stop pins 33 by the length of bit end portion 37, and will cut into the pad 12 when the bit is rotated by turning on the router motor 28.
  • the router is preferably turned on and vertically adjusted after the vacuum is applied. Any upward movement of the pad, in response to the vacuum V, is guided by the engagement between the holding posts 14 and corresponding recesses or channels 16, which may be in the body or the periphery of the pad 12.
  • the end portion 37 of the bit 24 may project beyond the tips of pins 33 by a length of up to 80% of the pad thickness, such that the end portion of the bit may penetrate to a depth up to 80% of the thickness of the pad.
  • the projecting length of bit end portion 37 may be changed to thereby change the groove depth by turning the pinions 27. 27 or by turning the pins 33.33, or by a combination of these adjustments
  • the bit is then moved radially relative to the pad in an x-y plane, as illustrated by the double-end arrows X and Y in Fig. 2.
  • This x-y movement may be achieved solely by moving the lower plate 44 and the upper plate 46 relative to each other by operation of the motors 59 and 62, or these lateral movements may be combined with rotation of the platen 10 about the center axis C, while the router bit 24 is moved in a radial direction to form spiral grooves.
  • the router bit 24 may be moved laterally in the x, y plane in the Cartesian coordinates x, y, or in the cylindrical coordinates R, ⁇ with respect to the polishing pad 12.
  • the router bit may be moved up and down along the Z-axis in both Cartesian and cylindrical coordinates by either hand or motorized rotation of the pinions 27 by conventional mechanisms that are not seen.
  • Upward movement along the z-axis in both Cartesian and cylindrical coordinates is also provided by movement of the pad 12 away from the surface 22 of platen 10 and against the tips of pins 33 in response to the creation of vacuum within annular passage 34.
  • the pad moves downward along the z-axis when the vacuum ceases upon stopping blower 36.
  • Such movement of the pad 12 along the z-axis is therefore produced by the pressure differential acroiss the pad thickness as generated by the vacuum V.
  • a pressure differential for causing such pad movement could be generated by ejecting pressurized air under the pad through a series of air holes or nozzles (not shown).
  • the spiral grooves formed by the present invention preferably (but not necessarily) start from the center of the pad and end near the outer edge thereof.
  • the direction of the spiral pattern can either be to the left, as shown by the eight spiral grooves in Fig. 4 and the 32 spiral grooves in Fig. 5, or to ⁇ e right, as illustrated by the 64 spiral grooves in Fig. 6.
  • the grooves are represented by heavy solid black lines for clarity because the opposing edges of the actual grooves are too close to be shown as double lines.
  • a single continuous groove forms the pattern 70 of Fig. 4, the pattern 72 of Fig. 5, and the pattern 74 of Fig. 6, such that, once inserted the router bit does not have to be withdrawn until the pattern is completed.
  • the spiral grooves in the surface of the pad will reduce the hydroplaning effect during polishing and, as a result, a much higher polishing rate can be achieved.
  • a higher number of spiral grooves within the same surface area can reduce the hydroplaning effect more efficiently than a lower number of spiral grooves because in the same period of time more grooves will pass across the surface of a wafer pressed against the pad surface during polishing of the former. It follows from this that the rate of removal of the slurried aorasive, which is used in combination with the pad for wafer polishing, will be greater the higher number of the spirai grooves per unit area of the pad working surface.
  • a high number of grooves can also make the pad more flexible, which can help improve the uniformity of wafer polishing.
  • Fig. 7 illustrates a zigzag groove pattern consisting of an outer groove 76, an inner groove 78, and three intermediate grooves 80, 81, and 82. These grooves are made separately by stopping the blower to withdraw the bit from the pad. repositioning the bit laterally relative to the pad, and then restarting the blower to insert the bit into the pad.
  • the grooves 76, 78, 80, 81, and 82 could be interconnected, in which case the pattern could instead be made by a single continuous groove to eliminate intermediate withdrawals of the bit from the pad
  • the groove pattern of Fig. 7 illustrates that the groove density may be varied over different portions of the pad surface.
  • the positioning motors 20. 59, and 62 are preferably controlled by a microprocessor (not shown).
  • the support structures for the pad and for the router, the namre and shape of the stop members for controlling the depth of the grooves, the arrangement for applying a pressure differential for holding the pad against the stop members, and the structures for providing relative lateral movement between the router bit and the pad all as described above by way of example may be varied widely in accordance with current and future technology for providing the functions of these systems and components.
  • the platen may include an array of air passages and outlets for providing a cushion of pressurized air under the pad to provide all or part of the pressure differential for holding the pad against the stop members.
  • both the platen and the pad may be moved in an x-y plane by mounting the platen drive motor on a lateral movement mechanism sirm ar to mechanism 42 for mounting the router motor as described above.

Abstract

Grooves (70, 76, 78, & 80-82) are formed in a CMP pad (12) by positioning the pad (12) on a supporting surface (10) with a working surface (22) of the pad (12) in spaced relation opposite to a router bit (24) and at least one projecting stop member (33) adjacent to the router bit (24), an outer end portion of the bit (24) projecting beyond the stop (33). When the bit (24) is rotated, relative axial movement between the bit (24) and the pad (12) causes the outer end portion of the bit (24) to cut an initial recess in the pad (12). Relative lateral movement between the rotating bit (24) and the pad (12) then forms a groove (70) which extends laterally away from the recess and has a depth substantially the same as that of the recess. The depths of the initial recess and the groove (70) are limited by applying a vacuum to the working surface (22) of the pad (12) to keep it in contact with the stop member(s) (33). Different lateral movements between the bit (24) and the pad (12) are used to form a variety of groove patterns (76, 78, & 80-82), the depths of which are precisely controlled by the stop member(s) (33).

Description

POLISHING PAD GROOVING METHOD AND APPARATUS
Shyng-Tsong Chen, A. Chung, Kenneth Davis, O. Hsu, and Kenneth P. Rodbell
HELD OF THE EWENTION The present invention relates to the field of making polishing pads, and more specifically to providing macrotextured surfaces on polishing pads used in the chemical- mechanical planarizarion (CMP) of semiconductor substrates.
BACKGROUND OF THE INVENTION
Chemical-mechanical polishing has been used for many years as a technique for polishing optical lenses and semiconductor wafers. More recendy, chemical-mechanicai polishing has been developed as a means for pianarizing intermetal dielectric layers of silicon dioxide and for removing portions of conductive layers within integrated circuit devices as they are fabricated on various substrates. For example, a silicon dioxide layer may cover a metal interconnect conformably such that the upper surface αf the silicon dioxide layer is characterized by a series of non-planar steps corresponding in height and width to the underlying metal interconnects.
The step height variations in the upper surface of the intermetal dielectric layer have several undesirable characteristics. Such non-planar dielectric surfaces may interfere with the optical resolution of subsequent photolithographic processing steps, making it extremely difficult to print high resolution lines. Another problem involves the step created in the coverage of a second metal layer over the intermetal dielectric layer. If the step height is relatively large, the metal coverage may be incomplete such that open circuits may be formed in the second metal layer.
To combat these problems, various techniques have been developed to planarize the upper surface of the intermetal dielectric layer. One such approach is to employ abrasive polishing to remove the protruding steps along the upper surface of the dielectric layer.
. I - According to this method, a silicon substrate wafer is mounted face down beneath a carrier and pressed between the carrier and a table or platen covered with a polishing pad that is continuously coated with a sluπied abrasive material- Means are also provided for depositing the abrasive slurry on the upper surface of the pad and for forcibly pressing the substrate wafer against the polishing pad, such that movement of the platen and the substrate wafer relative to each other in the presence of the slurry results in planarizatioπ of the contacted face of the wafer. Both the wafer and the table may be rotated relative to each other to rub away the protruding steps. T is abrasive polishing process is continued until the upper surface of the dielectric layer is substantially flat.
Polishing pads may be made of a uniform material such as polyurethane or nonwoven fibers impregnated with a synthetic resin binder, or may be formed from multilayer laminations having non-uniform physical properties throughout the thickness of the pad. Polyurethane polishing pads are typically formed by placing a reactive composition in a mold, curing the composition to form the pad material, and then die cutting the pad material into the desired size and shape. The reagents that form the polyurethane or the resin binder also may be reacted within a cylindrical container. After forming, a cylindrically shaped piece of pad material is cut into slices that are subsequently used as the polishing pad. A typical laminated pad may have a plurality of layers, such as a spongy and resilient microporous polyurethane layer laminated onto a firm but resilient supporting layer comprising a porous polyester felt with a polyurethane binder. Polishing pads typically may have a thickness in the range of 50-80 mils, preferably about 55 mils, and a diameter in the range of 10 to 36 inches, such as about 22.5 inches.
Polishing pads also may have macrotextured work surfaces made by surface machining using various techniques, many of which are expensive and produce undesirable surface features of widely varying depths. Surface features include waves, holes, creases, ridges, slits, depressions, protrusions, gaps, and recesses. Some other factors which influence the macroscopic surface texture of a polishing pad are the size, shape, and distribution frequency or spacing of the surface features. Polishing pads typically may also have micrαtextured surfaces cause by a microscopic bulk texture of the pad resulting from factors intrinsic to the manufacturing process. Since polishing does not normally occur across the entire pad surface, any microtexture of the pad and the macrotextures made by surface machining, may only be formed into the portion of the pad over which polishing is to take place.
During the polishing process, the material removed from the wafer surface and the abrasive, such as silica, in the slurry tend to become compacted and embedded in the recesses, pores, and other free spaces within the microscopic and macroscopic bulk texture of the polishing pad at and near its surface. One factor in achieving and maintaining a high and stable polishing rate is providing and maintaining the pad surface in a clean condition. Another factor is reducing or preventing a hydroplaning effect caused by the buildup of a layer of water between the abutting surfaces of the pad and the wafer. It has also been determined that increasing the flexibility of the pad in a controlled manner will increase polishing uniformiry, i.e., the uniformity of the polished wafer surface.
Thus, consistently achieving uniform and high quality polishing of wafer surfaces by conventional pads has presented three problems. The first of these is the buildup of abrasive particles and debris between the pad and the wafer causing uneven polishing and damage to both the pad and the wafer. Secondly, uneven polishing due to hydroplaning between the wafer and the pad during conventional processes has resulted in the relatively high loss of product yield due to the resulting wafer damage. Thirdly, uneven polishing and wafer damage has also resulted from overly rigid pads produced by prior art manufacturing techniques. Therefore, there is a need for a method and apparatus for providing polishing pads capable of consistently producing high quality wafers with unifoπnly polished surfaces. SUMMARY OF THE INVENTION The present invention, therefore, provides a pad grooving method and apparatus for producing a polishing pad that is capable of consistently forming uniformly polished surfaces on high quality wafers. The apparatus comprises a platen with positioning post for holding a polishing pad in position for engagement by a router to machine grooves in the working surface of the pad. In order to precisely control the depth of the grooves as they are routed in the pad, a spacing mechanism provides a constant and precise separation between the working surface of the pad and the chuck for holding and rotating the router.
The pad is placed on the supporting surface of the platen with- its working surface in spaced relation opposite to the router bit. The router chuck and drive motor are supported opposite to the pad by a frame. The spacing mechanism comprises at least one. preferably two or more, stop members mounted on the frame adjacent to an aperture through which passes the router bit. An outer end portion of the bit projects beyond the stop member(s), which preferably are pins threaded within the frame so as to be axially adjustable. A vacuum system is provided for applying a vacuum to the working surface of the pad to pull the pad first against the outer end of the router bit and then against the stop memberfs).
Rotation of the router bit by the motor while the vacuum is applied to the pad causes the outer end portion of the bit to cut an initial recess (hole) into the pad to a depth below its working surface. The recess depth is precisely limited by the stop member(s), which comes into contact with the working surface of the pad as the rotating bit cuts into the pad to form the initial recess. After formation of the initial recess, a lateral motion mechanism causes relative lateral movement between the rotating router bit and the pad while the vacuum maintains the pad in contact with the stop members).
This lateral movement causes the rotating bit to cut a groove in the pad extending away from the initial recess and having a depth substantially the same as the initial recess depth. The lateral motion mechanism may comprise upper and lower plates suspended from an overhead beam and arranged for relative movement in the x-y plane. For example, the upper plate may be mounted on the overhead beam and driven in the X-direction (along the X-axis) by one or more motorized screws; and the router frame suspended from the lower plate which, in mm, is mounted on the upper plate and driven in the Y-direction by one or more motorized screws. As an alternative, the platen may be similarly mounted for such x-y movement instead of the router frame, or both the platen and router frame may be mounted for such movement In addition, the platen may be rotated by a drive motor to provide an additional means for causing lateral movement between the router bit and the pad.
It follows from the foregoing that relative movement between the stop member(s) and the pad in the Z-direction (along Z-axis) may be provided by the vacuum as it pulls the pad toward the router bit and the stop member(s). Where the polishing pad is flexible due to its large diameter and small thickness, there may be no need to guide this pad movement.
Furthermore, significant pad movement along the Z-axis may be avoided by instead moving the router bit along the Z-axis, and then using :he vacuum to maintain the bit depth during lateral movement between the bit and pad.
However motion of the pad along the Z-axis may be guided by a plurality, preferably two or more, posts projecting outward from the platen along axes parallel to the rotational axis of the router bit. These guideposts also may secure the pad for rotation when the platen is rotated by a platen drive motor, and are particularly usefui for grooving disks other than polishing pads, such as rigid disks of greater thickness and smaller diameter. As already indicated the upper and lower lateral motion plates provide for lateral movement of the router bit relative to the pad along the X-axis and along the Y-axis. Therefore, the router bit may be moved relative to the pad in accordance with the Cartesian coordinates x, y and z, or in accordance with the cylindrical coordinates R, θ and Z.
The foregoing relative lateral movements permit the grooves cut in the working surface of the pad to have either left or right spiral patterns, zigzag patterns with different groove densities, each following a constant radius around the pad at different radii, inner and outer circle grooves with spiral grooves or zigzag in areas therebetween, inner and outer sectors at different radii and having different spiral or zigzag patterns, or any combinations of these and other patterns. In addition, the patterned portions of the working surface of the pad may be confined only to those areas over which polishing of a wafer is to take place.
The depth of the grooves may also be varied for different patterns by axially adjusting the projecting length of the stop members, which are preferably symmetrical pins, or by axially adjusting the projecting length of the router bit relative to axially fixed stop members. To provide pads of increased flexibility, the grooves may penetrate into the pad for a depth up to 80% of the pad thickness. Pad flexibility may also be adjusted by the overall number of grooves provided, such as, for example, a pattern of 8. 32. or 64 spirals. Grooves in the working surface of a CMP pad made according to the invention significantly reduce the hydroplaning effect during wafer polishing and. as a result, a much higher polishing rate can be achieved. A pattern with a higher number of spiral grooves can reduce the hydroplaning effect more efficiently than a pattern with a lower number of spiral grooves because more grooves will pass across the wafer surface being polished in the same period of time. An increase in pad flexibility due to the groove pattern selected may also help improve the polishing uniformity of the wafer surface. The groove density of zigzag groove patterns also may be varied to control me poiishing rate distribution within different segments of the polishing pad surface and this may also improve polishing uniformity within the wafer surface.
The polishing pad provided by the present invention is ideal for polishing wafers of dielectric materials such as silicon dioxide, diamond-like carbon (DLC), spiπ-on-glass
(SOG), polysilicon, and silicon nitride. The polishing pads also may be used to polish other wafers or disks such as those made of copper, aluminum, tungsten, and alloys of these and other metals.
BRIEF DESCRIPTION OF THE DRAWINGS The features, operation, and advantages of the invention may be better understood from the following detailed description of the preferred embodiments taken in conjunction with the attached drawings, in which:
'"""" " - 6 - Fig. 1 is an elevational view of the invention in partial section and in which its major components are illustrated diagrammatically;
Fig. 2 is a planar cross-sectional view as taken along line 2-2 of Fig. 1;
Fig. 3 is an enlarged partial sectional view of a portion of Fig. 1; Fig. 4 shows a polishing pad made according to the present invention wherein the groove pattern comprises 8 lef -hand spiral grooves beginning near the center of the pad and ending near the outer edge of the working surf ce of the pad;
Fig. 5 shows a polishing pad made according to the present invention wherein the groove pattern comprises 32 left-hand spiral grooves beginning near the center and ending near the outer edge of the working surface of the pad;
Fig. 6 shows a polishing pad made according to the invention wherein the groove pattern comprises 64 right-hand spiral grooves beginning near the center and ending near the outer edge of the working surface of the pad; and.
Fig. 7 shows a polishing pad made according to the invention wherein the groove pattern comprises a plurality of radially spaced zigzag grooves each formed symmetrically along a substantially constant radius around the pad surface, and wherein the groove density of the innermost and outermost grooves are varied from each other and from intermediate grooves.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The polishing pad grooving method and apparatus of the present invention are illustrated best in Figs. 1-3. The polishing apparatus has a platen 10 on which a polishing pad 12 is supported and held in a fixed radial position by a plurality of holding posts 14. Each of the holding posts 14 fits within a channel or recess 16 (Fig.4) formed within the pad body or in the pad periphery and extending parallel to the central axis C of the pad so that the pad may be guided for axial movement away from the surface of the platen, as illustrated by the arrows Z and the air gap 17 shown in Fig. 3. However, for axially adjustable routers and/or flexible pads of sufficiently large diameter and small thickness to
M. υυυuu j-j 1 permit movement of the portion thereof being grooved, the holding posts 14 may be replaced by non-guiding clamps.
Positioned opposite to the working surface 22 of pad 12 is a router bit 24 replaceably held in a chuck 26 and driven in rotation by a router motor 28. Router motor 28 is carried by a frame 30 surrounded by a casing 32, such that an annular space 34 is provided between the concentric walls of the frame and the casing, both of which are preferably cylindrical. A vacuum, represented by arrows V, V is provided in the annular space 34 by a blower 36 attached to the casing 32 by a flexible hose 38. The platen 10 is carried for rotation in either direction by a drive shaft 18 driven by a platen motor 20. Motors 20 and 28 may both be of the reversible type, such that the router bit 24 may be rotated in either direction, as indicated by the arrow Rl. and the platen 10 also may be rotated in either direction, as indicated by the arrow R2.
Mounted on the bottom wall 31 of the frame 30 adjacent to a passage 35 for the router bit 24 is a plurality of stop pins 33, which project parallel to the router bit for a distance that is less than the projecting distance of the router bit itself. The difference between the projecting distance of the pins 33 and the projecting distance of the router bit define the length of an end portion 37 of the bit equal to the desired depth of the groove to be cut by this end portion, as described more fully below in connection with operation of the invention. The projecting length of bit end portion 37 may be changed by rotating a pair of pinions 27, 27 that engage a corresponding pair of racks 29, 29 mounted on router motor 28 as shown in Fig. 1. The pins 33 are preferably threaded into the bottom wall 31 for axial adjustment, as an alternative means for changing the projecting length of bit end portion 37. Pins 33 may have a hex head portion 39 permitting engagement for rotation by a corresponding tool. The router is mounted to an overhead support or carrying member 40 by a lateral motion mechanism, generally designated 42, to provide for lateral movement of the router bit in an x-y plane perpendicular to the axis of router bit rotation and the corresponding central axis C of the polishing pad. The lateral motion mechanism 42 may be any structure providing precise lateral movement of ώe router 24 in the x-y plane, and may not be needed in instances where the router support member 40 is itself movable in the x-y plane, such as where the member 40 is attached to or part of a precisely controllable robotic arm.
By way of example, the motion device illustrated in Figs. 1 and 2 comprises a lower piate 44 suspended from an upper plate 46 by two pairs of threaded eyelets 48, 48 and 50,
50. In turn, the upper plate 46 is suspended from two pairs of brackets 52.52 and 53, 53 by another two pair of threaded eyelets 54, 54 and 56. 56. Each eyelet pair 48, 48 and 50, 50 is threadedly engaged by a corresponding drive screw 58 driven in rotation by a reversible y-axis motor 59 to provide reciprocal motion of lower plate 44 along the y-axis, as illustrated by the double-ended arrow Y. Similarly, the eyelet pairs 54. 54. and 56. 56 are each threadedly engaged by a corresponding drive screw 60 rotated by a reversible x-axis electric motor 62 to provide reciprocal motion of upper piate 46 along the x-axis. as illustrated by the double-ended arrow X in Fig. 2.
Operation of the pad grooving apparatus will now be described with reference to Figs. 1-3. The blower 36 is turned on to generate a vacuum V in the annular passage 34.
This vacuum generates an upward force in the direction of arrows Z, Z to uplift and/or hold the pad 12 against the axially adjustable stop pins 33, which are thereby used to control the groove depth. The router bit 24 extends beyond the ends of stop pins 33 by the length of bit end portion 37, and will cut into the pad 12 when the bit is rotated by turning on the router motor 28. The router is preferably turned on and vertically adjusted after the vacuum is applied. Any upward movement of the pad, in response to the vacuum V, is guided by the engagement between the holding posts 14 and corresponding recesses or channels 16, which may be in the body or the periphery of the pad 12. The end portion 37 of the bit 24 may project beyond the tips of pins 33 by a length of up to 80% of the pad thickness, such that the end portion of the bit may penetrate to a depth up to 80% of the thickness of the pad.
The projecting length of bit end portion 37 may be changed to thereby change the groove depth by turning the pinions 27. 27 or by turning the pins 33.33, or by a combination of these adjustments After the router bit 24 has penetrated fully into the pad. as determined by abutment between the tips of stop pins 33 and the working surface 22 of pad 12, the bit is then moved radially relative to the pad in an x-y plane, as illustrated by the double-end arrows X and Y in Fig. 2. This x-y movement may be achieved solely by moving the lower plate 44 and the upper plate 46 relative to each other by operation of the motors 59 and 62, or these lateral movements may be combined with rotation of the platen 10 about the center axis C, while the router bit 24 is moved in a radial direction to form spiral grooves.
Lateral movement of the lower plate'44 along the y-axis is produced by the rotation of screws 58, 58 in threaded engagement with the respective eyes 48.48 and 50, 50. Lateral movement of the upper plate 46 along the x-axis is produced by rotation of screws 60-. 60 in threaded engagement with the eyes 54, 54 and 56. 56. Rotation of the platen 10 is provided by rotation of the shaft IS by platen motor 20. Accordingly, the router bit 24 may be moved laterally in the x, y plane in the Cartesian coordinates x, y, or in the cylindrical coordinates R, θ with respect to the polishing pad 12. In addition, the router bit may be moved up and down along the Z-axis in both Cartesian and cylindrical coordinates by either hand or motorized rotation of the pinions 27 by conventional mechanisms that are not seen.
Upward movement along the z-axis in both Cartesian and cylindrical coordinates is also provided by movement of the pad 12 away from the surface 22 of platen 10 and against the tips of pins 33 in response to the creation of vacuum within annular passage 34. The pad moves downward along the z-axis when the vacuum ceases upon stopping blower 36. Such movement of the pad 12 along the z-axis is therefore produced by the pressure differential acroiss the pad thickness as generated by the vacuum V. As an alternative, a pressure differential for causing such pad movement could be generated by ejecting pressurized air under the pad through a series of air holes or nozzles (not shown). Thus, the spiral grooves formed by the present invention preferably (but not necessarily) start from the center of the pad and end near the outer edge thereof. The direction of the spiral pattern can either be to the left, as shown by the eight spiral grooves in Fig. 4 and the 32 spiral grooves in Fig. 5, or to ώe right, as illustrated by the 64 spiral grooves in Fig. 6. In Figs. 4-7, the grooves are represented by heavy solid black lines for clarity because the opposing edges of the actual grooves are too close to be shown as double lines. As careful examination will reveal, a single continuous groove forms the pattern 70 of Fig. 4, the pattern 72 of Fig. 5, and the pattern 74 of Fig. 6, such that, once inserted the router bit does not have to be withdrawn until the pattern is completed.
The spiral grooves in the surface of the pad will reduce the hydroplaning effect during polishing and, as a result, a much higher polishing rate can be achieved. A higher number of spiral grooves within the same surface area can reduce the hydroplaning effect more efficiently than a lower number of spiral grooves because in the same period of time more grooves will pass across the surface of a wafer pressed against the pad surface during polishing of the former. It follows from this that the rate of removal of the slurried aorasive, which is used in combination with the pad for wafer polishing, will be greater the higher number of the spirai grooves per unit area of the pad working surface. A high number of grooves can also make the pad more flexible, which can help improve the uniformity of wafer polishing.
Fig. 7 illustrates a zigzag groove pattern consisting of an outer groove 76, an inner groove 78, and three intermediate grooves 80, 81, and 82. These grooves are made separately by stopping the blower to withdraw the bit from the pad. repositioning the bit laterally relative to the pad, and then restarting the blower to insert the bit into the pad. However, the grooves 76, 78, 80, 81, and 82 could be interconnected, in which case the pattern could instead be made by a single continuous groove to eliminate intermediate withdrawals of the bit from the pad The groove pattern of Fig. 7 illustrates that the groove density may be varied over different portions of the pad surface. Such variations in groove density can be used to control the polishing rate distribution in accordance with where a wafer is pressed against the polishing pad surface, and this, too, can help improve the uraTormity of wafer polishing. For generating the patterns shown in Figs. 4-7 and other complex groove patterns, the positioning motors 20. 59, and 62 are preferably controlled by a microprocessor (not shown).
- U - Persons skilled in the art, upon learning of the present disclosure, will recognize that various changes and modifications to the elements and steps of the invention are possible without significantly affecting their functions. For example, the support structures for the pad and for the router, the namre and shape of the stop members for controlling the depth of the grooves, the arrangement for applying a pressure differential for holding the pad against the stop members, and the structures for providing relative lateral movement between the router bit and the pad all as described above by way of example, may be varied widely in accordance with current and future technology for providing the functions of these systems and components. For example, the platen may include an array of air passages and outlets for providing a cushion of pressurized air under the pad to provide all or part of the pressure differential for holding the pad against the stop members. Also, in addition to being rotated, both the platen and the pad may be moved in an x-y plane by mounting the platen drive motor on a lateral movement mechanism sirm ar to mechanism 42 for mounting the router motor as described above. Accordingly, while the preferred embodiments have been shown and described above in detail by way of example, further modifications and embodiments are possible without departing from the scope af the invention as defined by the claims set forth below.

Claims

. CLAIMS What is claimed is:
1. A method for forming a groove in a pad comprising steps of: placing said pad on a supporting surface with a working surface of the pad in spaced relation opposite to a router bit and to at least one stop member adjacent to said router bit, an outer end portion of said bit projecting towards said pad beyond said stop member; applying a pressure differential to said pad to cause the working surface thereof to move toward said stop member; providing axial movement between said router bit and said pad and rotating said router bit to cause said outer end portion to form an initial recess by cutting into said pad to a depth below its working surface, said recess depth being limited by said pressure differential causing the working surface of said pad to move into contact with said stop member; and providing lateral movement between said rotating router bit and said pad while the working surface of said pad is maintained in contact with said stop member by said pressure differential to cause said rotating bit to cut a groove that extends laterally away from said initial recess and has a depth substantially the same as said recess depth.
2. A method according to claim 1 , wherein said pressure differential is created at least in part by applying a vacuum to the working surface of said pad.
3. A method according to claim 1, wherein said lateral movement between said router bit and said pad is such that the outer end portion of said bit cuts at least one spiral groove in the working surface of said pad.
1 4. A method according to claim 3, wherein said lateral movement between said router
2 bit and said pad is such that the outer end portion of said bit cuts at least 8 spiral grooves in
3 the working surface of said pad.
1 5. A method according to claim 4, wherein said lateral movement between said router
2 bit and said pad is such that the outer end portion of said bit cuts at least 32 spiral grooves in
3 the working surface of said pad
1 6. A method accordin jg» to claim 4, wherein said lateral movement between sai router
-> bit and said pad is such that the outer end portion of said bit cuts at least 64 spiral grooves in the working surface of said pad.
1 7. A method according to claim 1, wherein said lateral movement between said router bit and said pad is such that the outer end portion said bit cuts at least one zigzag groove extending to either side of a substantially constant radius to provide an annular segment of said pad working surface with a zigzag groove pattern.
8. A method according to claim 1 further comprising steps of stopping said pressure differential, repositioning said pad relative to said bit, and reapplying said pressure differential to said pad such that the outer end portion of said bit is periodically withdrawn from and reinserted in said pad to form a plurality of said grooves.
. A method according to claim 1, wherein, said lateral movement comprises moving said rotating bit laterally relative to said pad while simultaneously rotating said pad about said central axis.
10. An apparatus for forming a groove in a pad comprising: a router and at least one projecting stop member mounted on a frame, said router comprising a bit positioned adjacent to said stop member and a drive motor for rotating said router bit, and said bit having an outer end portion of a length projecting beyond said stop member; a surface for supporting the pad with a working surface thereof in spaced relation opposite to said router bit and said stop member; an axial movement means for providing axial movement between said router bit and said pad such that rotation of said bit forms an initial recess by cutting into said pad to a depth below its working surface; a fluid system for applying a pressure differential to said pad to cause the working surface of said pad to contact said stop member to limit said recess depth; and a lateral movement mechanism for causing lateral movement between said rotating router bit and said pad while the working surface of said pad is maintained in contact with said stop member by said differential pressure to cause said rotating bit to cut a groove that extends laterally away from said initial recess and has a depth substantially the same as said recess depth.
11. An apparatus according to claim 10, wherein said fluid system comprises a vacuum system for applying a vacuum to the working surface of said pad.
12. An apparatus according to claim 10, wherein said supporting surface is provided by a platen, wherein at least part of said axial movement is provided by said differential pressure, and wherein said axial movement means further comprises at least one guide post mounted on said platen for engaging a corresponding channel in said pad for guiding said pad for movement against said bit and said stop member.
13. An apparatus according to ciaim 10 comprising a plurality of stop members each including a pin threaded within a member of said frame so as to be axially adjustable for changing the depth of said recess and said groove.
14. An apparatus according to claim 10, wherein said lateral movement mechanism comprises a platform for supporting said router and moving said rotating router bit laterally in at least one direction transverse to a rotational axis of said router bit.
15. An apparatus according to claim 10, wherein said lateral movement mechanism comprises a drive motor for rotating said supporting surface and means on said supporting surface for engaging said pad for rotation therewith, such that the lateral movement of said rotating bit while said platen is rotating forms a spiral groove in the working surface of said pad.
16. An apparatus according to claim 15, wherein said lateral movement mechanism further comprises a platform for supporting said router and providing lateral movement of said rotating bit in a plurality of directions in an x-y plane transverse to a rotational axis of said bit, such that the location of said router bit relative to said pad working surface may .be defined by cylindrical coordinates R, θ and said lateral movement is capable of forming one or more spiral grooves in said pad working surface.
17. An apparatus according to claim 10, wherein said lateral movement mechanism comprises a platform for supporting said router for movement in a plane transverse to an axis of rotation of said router bit such that the location of said router bit relative to said pad working surface may be defined by the Cartesian coordinates x, y, and said lateral movement is capable of forming one or more grooves in said working surface.
18. An apparatus according to claim 17, wherein the lateral movement provided by said lateral movement mechanism is capable of causing said rotating router bit to form at least one zigzag groove extending to either side of a substantially constant radius to provide an annular segment of said pad working surface with a zigzag groove pattern.
1 . An apparatus according to claim 10, wherein said axial movement means comprises an axial movement mechanism for changing the projecting length of the outer end portion of said bit by moving said bit along an axis of ts rotation.
PCT/US2001/020556 2000-06-29 2001-06-27 Polishing pad grooving method and apparatus WO2002002269A1 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2002506885A JP2004514565A (en) 2000-06-29 2001-06-27 Polishing pad grooving method and apparatus
AT01952272T ATE307006T1 (en) 2000-06-29 2001-06-27 METHOD AND DEVICE FOR GROOVE POLISHING PAD
EP01952272A EP1299210B1 (en) 2000-06-29 2001-06-27 Polishing pad grooving method and apparatus
DE60114201T DE60114201D1 (en) 2000-06-29 2001-06-27 METHOD AND DEVICE FOR ROLLING POLISHING PILLOWS
AU2001273045A AU2001273045A1 (en) 2000-06-29 2001-06-27 Polishing pad grooving method and apparatus
CA002413803A CA2413803A1 (en) 2000-06-29 2001-06-27 Polishing pad grooving method and apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/605,869 US6340325B1 (en) 2000-06-29 2000-06-29 Polishing pad grooving method and apparatus
US09/605,869 2000-06-29

Publications (1)

Publication Number Publication Date
WO2002002269A1 true WO2002002269A1 (en) 2002-01-10

Family

ID=24425528

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/020556 WO2002002269A1 (en) 2000-06-29 2001-06-27 Polishing pad grooving method and apparatus

Country Status (8)

Country Link
US (1) US6340325B1 (en)
EP (1) EP1299210B1 (en)
JP (1) JP2004514565A (en)
AT (1) ATE307006T1 (en)
AU (1) AU2001273045A1 (en)
CA (1) CA2413803A1 (en)
DE (1) DE60114201D1 (en)
WO (1) WO2002002269A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108941713A (en) * 2018-08-30 2018-12-07 惠州市正耀科技有限公司 Double-station vertical slot milling machine
CN112091817A (en) * 2020-09-08 2020-12-18 中国航发贵州黎阳航空动力有限公司 Thin wall annular part terminal surface grinding tool

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6869343B2 (en) * 2001-12-19 2005-03-22 Toho Engineering Kabushiki Kaisha Turning tool for grooving polishing pad, apparatus and method of producing polishing pad using the tool, and polishing pad produced by using the tool
US7516536B2 (en) * 1999-07-08 2009-04-14 Toho Engineering Kabushiki Kaisha Method of producing polishing pad
US6539277B1 (en) * 2000-07-18 2003-03-25 Agilent Technologies, Inc. Lapping surface patterning system
JP2002200555A (en) * 2000-12-28 2002-07-16 Ebara Corp Polishing tool and polishing device with polishing tool
US6783436B1 (en) 2003-04-29 2004-08-31 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad with optimized grooves and method of forming same
US7086932B2 (en) * 2004-05-11 2006-08-08 Freudenberg Nonwovens Polishing pad
US7258602B2 (en) * 2003-10-22 2007-08-21 Iv Technologies Co., Ltd. Polishing pad having grooved window therein and method of forming the same
JP4641781B2 (en) * 2003-11-04 2011-03-02 三星電子株式会社 Chemical mechanical polishing apparatus and method using polishing surface having non-uniform strength
US6951510B1 (en) * 2004-03-12 2005-10-04 Agere Systems, Inc. Chemical mechanical polishing pad with grooves alternating between a larger groove size and a smaller groove size
US7234224B1 (en) * 2006-11-03 2007-06-26 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Curved grooving of polishing pads
DE102006053165A1 (en) * 2006-11-09 2008-05-15 Carl Freudenberg Kg Mechanical seal, mechanical seal assembly and their use
US9180570B2 (en) 2008-03-14 2015-11-10 Nexplanar Corporation Grooved CMP pad
US8881768B2 (en) 2009-05-27 2014-11-11 Flowserve Management Company Fluid flow control devices and systems, and methods of flowing fluids therethrough
US20140264132A1 (en) 2013-03-15 2014-09-18 Flowserve Management Company Fluid flow control devices and systems, and methods of flowing fluids therethrough
CN108747802A (en) * 2018-06-23 2018-11-06 芜湖乾凯材料科技有限公司 A kind of numerical control double-sided precision lapping machine for workpiece
CN109093396A (en) * 2018-07-23 2018-12-28 安徽六方重联机械股份有限公司 A kind of automatic lathe cutter device for nut production
CN109702257A (en) * 2019-02-19 2019-05-03 桐城市畅润电力工程有限公司 A kind of wiring board slotting attachment

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5216843A (en) * 1992-09-24 1993-06-08 Intel Corporation Polishing pad conditioning apparatus for wafer planarization process
US5882251A (en) * 1997-08-19 1999-03-16 Lsi Logic Corporation Chemical mechanical polishing pad slurry distribution grooves
US5888121A (en) * 1997-09-23 1999-03-30 Lsi Logic Corporation Controlling groove dimensions for enhanced slurry flow

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5699707A (en) * 1995-02-01 1997-12-23 Automated Solutions, Llc High speed sheet material cutter and method of using same
US6254456B1 (en) * 1997-09-26 2001-07-03 Lsi Logic Corporation Modifying contact areas of a polishing pad to promote uniform removal rates

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5216843A (en) * 1992-09-24 1993-06-08 Intel Corporation Polishing pad conditioning apparatus for wafer planarization process
US5882251A (en) * 1997-08-19 1999-03-16 Lsi Logic Corporation Chemical mechanical polishing pad slurry distribution grooves
US5888121A (en) * 1997-09-23 1999-03-30 Lsi Logic Corporation Controlling groove dimensions for enhanced slurry flow

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108941713A (en) * 2018-08-30 2018-12-07 惠州市正耀科技有限公司 Double-station vertical slot milling machine
CN112091817A (en) * 2020-09-08 2020-12-18 中国航发贵州黎阳航空动力有限公司 Thin wall annular part terminal surface grinding tool

Also Published As

Publication number Publication date
EP1299210A4 (en) 2004-11-17
DE60114201D1 (en) 2006-03-02
AU2001273045A1 (en) 2002-01-14
JP2004514565A (en) 2004-05-20
CA2413803A1 (en) 2002-01-10
EP1299210A1 (en) 2003-04-09
US6340325B1 (en) 2002-01-22
EP1299210B1 (en) 2005-10-19
ATE307006T1 (en) 2005-11-15

Similar Documents

Publication Publication Date Title
US6685548B2 (en) Grooved polishing pads and methods of use
US6340325B1 (en) Polishing pad grooving method and apparatus
KR101279819B1 (en) Radial-biased polishing pad
EP2532478B1 (en) Method and appartus for conditioning a polishing pad
US7156727B2 (en) Web-format polishing pads and methods for manufacturing and using web-format polishing pads in mechanical and chemical-mechanical planarization of microelectronic substrates
DE60102891T2 (en) DEVICE AND METHOD FOR CONTROLLED POLISHING AND PLANARIZATION OF SEMICONDUCTOR GRINDING
US6364752B1 (en) Method and apparatus for dressing polishing cloth
KR20010005993A (en) Polishing media magazine for improved polishing
US20010029157A1 (en) Polishing pads and planarizing machines for mechanical and/or chemical-mechanical planarization of microelectronic substrate assemblies
KR20010020807A (en) Pre-conditioning fixed abrasive articles
KR100525652B1 (en) Polishing apparatus
JP2006108710A (en) Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrate
KR20010013142A (en) Chemical Mechanical Planarization Tool Having Linear Polishing Roller
US8591289B2 (en) Multi-spindle chemical mechanical planarization tool
KR20030047905A (en) Grooved polishing pads and methods of use

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

WWE Wipo information: entry into national phase

Ref document number: 2413803

Country of ref document: CA

WWE Wipo information: entry into national phase

Ref document number: 2001952272

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 2001952272

Country of ref document: EP

WWG Wipo information: grant in national office

Ref document number: 2001952272

Country of ref document: EP