WO2002071083A3 - Circuit for improved test and calibration in automated test equipment. - Google Patents

Circuit for improved test and calibration in automated test equipment. Download PDF

Info

Publication number
WO2002071083A3
WO2002071083A3 PCT/US2002/006589 US0206589W WO02071083A3 WO 2002071083 A3 WO2002071083 A3 WO 2002071083A3 US 0206589 W US0206589 W US 0206589W WO 02071083 A3 WO02071083 A3 WO 02071083A3
Authority
WO
WIPO (PCT)
Prior art keywords
biasing
coupled
source
central resource
biasing source
Prior art date
Application number
PCT/US2002/006589
Other languages
French (fr)
Other versions
WO2002071083A2 (en
Inventor
Steven Hauptman
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Priority to DE60228214T priority Critical patent/DE60228214D1/en
Priority to EP02713739A priority patent/EP1373909B1/en
Priority to JP2002569949A priority patent/JP4187529B2/en
Priority to KR1020037011509A priority patent/KR100875459B1/en
Priority to AU2002245572A priority patent/AU2002245572A1/en
Publication of WO2002071083A2 publication Critical patent/WO2002071083A2/en
Publication of WO2002071083A3 publication Critical patent/WO2002071083A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Abstract

In at least one embodiment, a circuit for a multi-channel tester having a central resource, a plurality of outputs, and a switching matrix coupling the central resource to the plurality of outputs via a plurality of selectable channels. Each of the selectable channels having PIN diodes coupled in a half-bridge configuration. A first, a second, and a third biasing source for forward biasing the PIN diodes. The first and second biasing sources are coupled to a central resource coupled end and an output coupled end of the half-bridge, respectively. The third biasing source is coupled to a common node. The first and second biasing sources are constructed to provide substantially balanced outputs and such that the sum of the ouputs of the first and second biasing sources are substantially balanced with respect to the output of the third bias source. In some embodiments, the plurality of selectable channels comprises the same first biasing source. In some embodiments, each of the plurality of channels comprises a different second biasing source. In some embodiments, pin electronics drivers can be used as the second biasing source. In some embodiments, a single third biasing source can be coupled to each of the common nodes of the plurality of selectable channels via one of a plurality of switches. In some embodiments, the PIN diodes can be located near the central resource end of the channel and near the output pin end of the channel allowing cleaner and more accurate voltage/timing measurements.
PCT/US2002/006589 2001-03-02 2002-03-02 Circuit for improved test and calibration in automated test equipment. WO2002071083A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE60228214T DE60228214D1 (en) 2001-03-02 2002-03-02 CALIBRATION NETWORK FOR AC WITH PIN DIODE MATRIX
EP02713739A EP1373909B1 (en) 2001-03-02 2002-03-02 Circuit for improved test and calibration in automated test equipment.
JP2002569949A JP4187529B2 (en) 2001-03-02 2002-03-02 Circuit for improved testing and calibration in automatic test equipment.
KR1020037011509A KR100875459B1 (en) 2001-03-02 2002-03-02 AC Calibration Switching Device with PIN Diode Matrix
AU2002245572A AU2002245572A1 (en) 2001-03-02 2002-03-02 Circuit for improved test and calibration in automated test equipment.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/798,515 2001-03-02
US09/798,515 US6566890B2 (en) 2001-03-02 2001-03-02 Circuit for improved test and calibration in automated test equipment

Publications (2)

Publication Number Publication Date
WO2002071083A2 WO2002071083A2 (en) 2002-09-12
WO2002071083A3 true WO2002071083A3 (en) 2003-10-16

Family

ID=25173595

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/006589 WO2002071083A2 (en) 2001-03-02 2002-03-02 Circuit for improved test and calibration in automated test equipment.

Country Status (9)

Country Link
US (1) US6566890B2 (en)
EP (1) EP1373909B1 (en)
JP (1) JP4187529B2 (en)
KR (1) KR100875459B1 (en)
AU (1) AU2002245572A1 (en)
DE (1) DE60228214D1 (en)
MY (1) MY135437A (en)
TW (1) TW562949B (en)
WO (1) WO2002071083A2 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030046122A1 (en) * 2001-08-29 2003-03-06 Seymour Richard S. Systems and methods for managing printing device replaceable components for multiple organizations
US7026822B1 (en) 2005-01-04 2006-04-11 Associated Research, Inc. High voltage switching matrix for electrical safety compliance test equipment
US7957461B2 (en) * 2005-03-31 2011-06-07 Teradyne, Inc. Calibrating automatic test equipment
US7560947B2 (en) 2005-09-28 2009-07-14 Teradyne, Inc. Pin electronics driver
JP4929797B2 (en) * 2006-04-05 2012-05-09 株式会社デンソー Semiconductor evaluation equipment
JP4792375B2 (en) * 2006-11-13 2011-10-12 株式会社アドバンテスト Test apparatus, adjustment board, and adjustment method
DE102007045756B4 (en) * 2007-09-25 2014-05-15 Texas Instruments Deutschland Gmbh Electronic circuit board and method for automatic testing
US8692538B2 (en) 2011-06-09 2014-04-08 Teradyne, Inc. Test equipment calibration
JP6773283B2 (en) * 2016-11-17 2020-10-21 株式会社ダイヘン Impedance matching device
US10641820B1 (en) 2018-10-19 2020-05-05 Teradyne, Inc. Automated test equipment with relay hot-switch detection
CN111596194B (en) * 2020-04-23 2022-10-18 上海机电工程研究所 Test resource switching circuit device suitable for PCB board maintenance test equipment

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4430732A (en) * 1980-01-23 1984-02-07 Nippon Electric Co., Ltd. Switch matrix apparatus for satellite-switched TDMA system or the like
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
US5543728A (en) * 1993-06-15 1996-08-06 Grace; James W. Low leakage diode switches for a tester circuit for integrated circuits

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4251742A (en) * 1979-04-09 1981-02-17 Rca Corporation Current source, as for switching PIN diodes
US4249150A (en) * 1979-04-30 1981-02-03 Motorola, Inc. High power RF relay switch
US4629906A (en) * 1985-05-06 1986-12-16 Motorola, Inc. Bias sharing an electronic switch and an active device
US4649354A (en) * 1985-12-16 1987-03-10 Avantek, Inc. Switchable multi-frequency dielectric resonator oscillator
US4825081A (en) * 1987-12-01 1989-04-25 General Electric Company Light-activated series-connected pin diode switch
US5467021A (en) * 1993-05-24 1995-11-14 Atn Microwave, Inc. Calibration method and apparatus
US6229412B1 (en) * 1999-03-31 2001-05-08 Tektronix, Inc. PIN diode switch to AC ground with three biasing sources

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4430732A (en) * 1980-01-23 1984-02-07 Nippon Electric Co., Ltd. Switch matrix apparatus for satellite-switched TDMA system or the like
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
US5543728A (en) * 1993-06-15 1996-08-06 Grace; James W. Low leakage diode switches for a tester circuit for integrated circuits

Also Published As

Publication number Publication date
KR100875459B1 (en) 2008-12-22
US20020121904A1 (en) 2002-09-05
AU2002245572A1 (en) 2002-09-19
US6566890B2 (en) 2003-05-20
KR20030080058A (en) 2003-10-10
EP1373909B1 (en) 2008-08-13
MY135437A (en) 2008-04-30
JP4187529B2 (en) 2008-11-26
DE60228214D1 (en) 2008-09-25
WO2002071083A2 (en) 2002-09-12
TW562949B (en) 2003-11-21
EP1373909A2 (en) 2004-01-02
JP2004523755A (en) 2004-08-05

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