WO2002090907A3 - Apparatus and methods for measuring the intensity of light in selected wavelength bands - Google Patents

Apparatus and methods for measuring the intensity of light in selected wavelength bands Download PDF

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Publication number
WO2002090907A3
WO2002090907A3 PCT/US2002/013853 US0213853W WO02090907A3 WO 2002090907 A3 WO2002090907 A3 WO 2002090907A3 US 0213853 W US0213853 W US 0213853W WO 02090907 A3 WO02090907 A3 WO 02090907A3
Authority
WO
WIPO (PCT)
Prior art keywords
methods
intensity
measuring
light
wavelength bands
Prior art date
Application number
PCT/US2002/013853
Other languages
French (fr)
Other versions
WO2002090907A2 (en
Inventor
Alain Richard Comeau
Original Assignee
Microsemi Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microsemi Corp filed Critical Microsemi Corp
Priority to AU2002308563A priority Critical patent/AU2002308563A1/en
Publication of WO2002090907A2 publication Critical patent/WO2002090907A2/en
Publication of WO2002090907A3 publication Critical patent/WO2002090907A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation

Abstract

Disclosed are apparatus and methods for generating an electronic signal responsive to selected wavelengths of the optical spectrum. An optical thickness differential between two or more photoconductors is used to generate an electronic signal calibrated to be representative of light signals of a selected range of wavelengths.
PCT/US2002/013853 2001-05-03 2002-05-03 Apparatus and methods for measuring the intensity of light in selected wavelength bands WO2002090907A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002308563A AU2002308563A1 (en) 2001-05-03 2002-05-03 Apparatus and methods for measuring the intensity of light in selected wavelength bands

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/847,908 2001-05-03
US09/847,908 US6787757B2 (en) 2001-05-03 2001-05-03 Apparatus and methods for generating an electronic signal responsive to selected light

Publications (2)

Publication Number Publication Date
WO2002090907A2 WO2002090907A2 (en) 2002-11-14
WO2002090907A3 true WO2002090907A3 (en) 2003-07-03

Family

ID=25301789

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/013853 WO2002090907A2 (en) 2001-05-03 2002-05-03 Apparatus and methods for measuring the intensity of light in selected wavelength bands

Country Status (3)

Country Link
US (1) US6787757B2 (en)
AU (1) AU2002308563A1 (en)
WO (1) WO2002090907A2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050051727A1 (en) * 2003-09-05 2005-03-10 Jones Richard S. Infrared elimination system
US7964835B2 (en) 2005-08-25 2011-06-21 Protarius Filo Ag, L.L.C. Digital cameras with direct luminance and chrominance detection
CN101779109A (en) * 2007-07-25 2010-07-14 Nxp股份有限公司 indoor/outdoor detection
EP2186137A2 (en) * 2007-07-30 2010-05-19 Nxp B.V. Light sensor arrangement
IT1392502B1 (en) * 2008-12-31 2012-03-09 St Microelectronics Srl SENSOR INCLUDING AT LEAST ONE DOUBLE-JOINT VERTICAL PHOTODIOD INTEGRATED ON A SEMICONDUCTIVE SUBSTRATE AND ITS INTEGRATION PROCESS
US8384443B2 (en) * 2011-01-27 2013-02-26 Maxim Integrated Products, Inc. Current mirror and current cancellation circuit
US9212992B2 (en) 2012-07-18 2015-12-15 Microsemi Corporation Apparatus and method for sensing incident light having dual photodiode to absorb light in respective depletion regions controlled by different bias voltages
CN108344505B (en) * 2018-02-13 2019-08-09 清华大学 Device for detecting luminous flux

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130776A (en) * 1989-03-16 1992-07-14 Landis & Gyr Betriebs Ag Ultraviolet-light photodiode
US5507576A (en) * 1993-04-01 1996-04-16 European Gas Turbines Sa Bichromatic pyrometer

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US3617753A (en) * 1969-01-13 1971-11-02 Tokyo Shibaura Electric Co Semiconductor photoelectric converting device
JPH0660845B2 (en) * 1985-09-06 1994-08-10 ミノルタカメラ株式会社 Color discrimination method
US5545891A (en) 1993-04-20 1996-08-13 Smith; Marcus R. Circuit for increasing the sensitivity of a photodiode to received infrared signals in response to changes in ambient light
US5556423A (en) 1993-05-03 1996-09-17 Alan Y. Chow Independent photoelectric artificial retina device and method of using same
JP2701754B2 (en) 1994-10-03 1998-01-21 日本電気株式会社 Method for manufacturing silicon light receiving element
US5747860A (en) 1995-03-13 1998-05-05 Nec Corporation Method and apparatus for fabricating semiconductor device with photodiode
JP2748914B2 (en) 1996-01-25 1998-05-13 日本電気株式会社 Semiconductor device for photodetection
US5747863A (en) * 1996-07-08 1998-05-05 Nikon Corporation Infrared solid-state image pickup device and infrared solid-state image pickup apparatus equipped with this device
JPH10284753A (en) 1997-04-01 1998-10-23 Sony Corp Semiconductor device and manufacture therefor
US5999271A (en) * 1998-06-01 1999-12-07 Shih; Ishiang Methods and devices to determine the wavelength of a laser beam
US6455831B1 (en) * 1998-09-11 2002-09-24 The Research Foundation Of Suny At Buffalo CMOS foveal image sensor chip
US6249346B1 (en) 1998-12-21 2001-06-19 Xerox Corporation Monolithic spectrophotometer
US6140156A (en) 1999-07-13 2000-10-31 United Microelectronics Corp. Fabrication method of isolation structure photodiode
US6427087B1 (en) 2000-05-04 2002-07-30 Optobionics Corporation Artificial retina device with stimulating and ground return electrodes disposed on opposite sides of the neuroretina and method of attachment
US6445021B1 (en) 2000-09-20 2002-09-03 International Business Machines Corporation Negative differential resistance reoxidized nitride silicon-based photodiode and method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130776A (en) * 1989-03-16 1992-07-14 Landis & Gyr Betriebs Ag Ultraviolet-light photodiode
US5507576A (en) * 1993-04-01 1996-04-16 European Gas Turbines Sa Bichromatic pyrometer

Also Published As

Publication number Publication date
US6787757B2 (en) 2004-09-07
AU2002308563A1 (en) 2002-11-18
US20020162950A1 (en) 2002-11-07
WO2002090907A2 (en) 2002-11-14

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