WO2003044852A3 - Estimating reliability of components for testing and quality optimization - Google Patents

Estimating reliability of components for testing and quality optimization Download PDF

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Publication number
WO2003044852A3
WO2003044852A3 PCT/US2002/033451 US0233451W WO03044852A3 WO 2003044852 A3 WO2003044852 A3 WO 2003044852A3 US 0233451 W US0233451 W US 0233451W WO 03044852 A3 WO03044852 A3 WO 03044852A3
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WO
WIPO (PCT)
Prior art keywords
testing
components
electronic component
quality optimization
estimating
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PCT/US2002/033451
Other languages
French (fr)
Other versions
WO2003044852A2 (en
Inventor
Adit D Singh
Thomas S Barnett
Original Assignee
Univ Auburn
Adit D Singh
Thomas S Barnett
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Publication date
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27407030&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=WO2003044852(A3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Univ Auburn, Adit D Singh, Thomas S Barnett filed Critical Univ Auburn
Priority to AU2002343545A priority Critical patent/AU2002343545A1/en
Publication of WO2003044852A2 publication Critical patent/WO2003044852A2/en
Publication of WO2003044852A3 publication Critical patent/WO2003044852A3/en

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G01R31/287—Procedures; Software aspects

Abstract

A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.
PCT/US2002/033451 2001-10-19 2002-10-18 Estimating reliability of components for testing and quality optimization WO2003044852A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002343545A AU2002343545A1 (en) 2001-10-19 2002-10-18 Estimating reliability of components for testing and quality optimization

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US34797401P 2001-10-19 2001-10-19
US60/347,974 2001-10-19
US33510801P 2001-10-23 2001-10-23
US60/335,108 2001-10-23
US36610902P 2002-03-20 2002-03-20
US60/366,109 2002-03-20

Publications (2)

Publication Number Publication Date
WO2003044852A2 WO2003044852A2 (en) 2003-05-30
WO2003044852A3 true WO2003044852A3 (en) 2004-01-22

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/033451 WO2003044852A2 (en) 2001-10-19 2002-10-18 Estimating reliability of components for testing and quality optimization

Country Status (3)

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US (3) US7194366B2 (en)
AU (1) AU2002343545A1 (en)
WO (1) WO2003044852A2 (en)

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Also Published As

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AU2002343545A1 (en) 2003-06-10
WO2003044852A2 (en) 2003-05-30
US20080281541A1 (en) 2008-11-13
US20070162242A1 (en) 2007-07-12
AU2002343545A8 (en) 2003-06-10
US7194366B2 (en) 2007-03-20
US7409306B2 (en) 2008-08-05
US20030120457A1 (en) 2003-06-26

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