WO2003065064A2 - Predictive, adaptive power supply for an integrated circuit under test - Google Patents
Predictive, adaptive power supply for an integrated circuit under test Download PDFInfo
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- WO2003065064A2 WO2003065064A2 PCT/US2003/002581 US0302581W WO03065064A2 WO 2003065064 A2 WO2003065064 A2 WO 2003065064A2 US 0302581 W US0302581 W US 0302581W WO 03065064 A2 WO03065064 A2 WO 03065064A2
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
Definitions
- the present invention relates in general to systems for testing integrated circuits and in particular to an apparatus for reducing power supply noise in an integrated circuit under test resulting from state transitions of the logic it implements.
- FIG. 1 is a block diagram illustrating a typical IC tester 10 connected through a probe card 12 to a set of similar IC devices under test (DUTs) 14 which may be formed on a semiconductor wafer.
- Tester 10 uses pogo pins 15 or other means to connect various input and output terminals to a set of contacts 16 on probe card 12.
- Probe card 12 includes a set of probes 18 for contacting input/output (I/O) pads 19 on the surface of each DUT 14 and provides conductive paths 20 linking contacts 16 to probes 18. The paths through probe card 12 allow tester 10 to transmit test signals to DUT 14 and to monitor output signals produced by the DUT.
- I/O input/output
- probe card 12 Since digital integrated circuits often include synchronous logic gates clocked in response to pulses of a periodic master clock signal (CLOCK), probe card 12 also provides a path 22 through which tester 10 may supply a CLOCK signal to each DUT 14.
- the test system also includes a power supply 24 for supplying power to DUTs 14 as they are being tested, and probe card 12 connects power supply 24 to a power input pad 26 of each DUT 14 through probes 18.
- Each switching transistor within a DUT 14 has an inherent input capacitance, and in order to turn on or off the transistor, the transistor's driver must either charge or discharge the transistor's input capacitance.
- a driver charges a transistor's input capacitance it draws charging current from power supply 24. Once the transistor's input capacitance is fully charged, its driver need only supply a relatively small amount of leakage current needed to keep the transistor's input capacitance charged so that the transistor remains turned on or off.
- DUTs implementing synchronous logic most transistor switching occurs immediately after an edge of each CLOCK signal pulse.
- FIG. 2 illustrates the behavior of supply voltage VB and current 11 at the power input 26 of IC 14 in response to a pulse of the CLOCK signal input to IC 14 when capacitor C1 is insufficiently large. Note that the temporary rise in 11 above its quiescent level IQ following an edge of the CLOCK signal at time T1 produces a temporary increase in voltage drop across R1 that in turn produces a temporary dip in supply voltage VC below its quiescent level VQ.
- FIG. 3 illustrates the behavior of VB and 11 when capacitor C1 is sufficiently large.
- capacitor C1 charges to the quiescent level VQ of VB.
- capacitor C1 supplies some its stored charge to DUT 14 thereby reducing the amount of additional current power supply 24 must provide to meet the increased demand.
- the presence of C1 reduces the magnitude of the temporary voltage drop across R1 and therefore reduces the magnitude of the dip in the supply voltage VB input to the DUT 14.
- FIG. 4 is a simplified plan view of a typical probe card 12.
- IC tester 10 resides above the probe card and the wafer containing DUTs 14 is held below the probe card. Since the I/O terminals of IC tester 10 of FIG. 1 are distributed over a relatively large area compared to the surface area of the wafer being tested, probe card 12 provides a relatively large upper surface 25 for holding the contacts 16 the tester accesses.
- the probes 18 (not shown) on the underside of probe card 12 that contact DUTs 14 on the wafer are concentrated under a relatively small central area 27 of probe card 12.
- the path impedance between contacts 16 on the upper surface 25 of card 12 and the probes 18 under area 27 is a function of the distance between each contact 16 and its corresponding probe.
- the capacitors should be mounted on probe card 12 near (or above) the small central area 27.
- a wafer includes a large number of ICs to be tested or an IC having a large number of densely packed terminals, there is not enough space to mount the required number of capacitors C1 of sufficient size sufficiently close to central area 27.
- the DUT experiences a temporary increase in its demand for power supply current after each successive leading or trailing edge of a clock signal input to the DUT.
- the DUT needs the extra current to charge input capacitance of transistors forming logic devices as they undergo state transitions in response to the clock signal edges.
- the invention limits variation in power supply voltage at the power input terminal of a DUT arising from the transient increase in power supply current following each clock signal pulse. The invention thereby reduces power supply noise at the DUTs power input terminal.
- a charging current pulse is supplied to the DUT's power input terminal after each clock signal edge to supplement a current continuously supplied by a main power supply during the test.
- the charging current pulse suitably powered by an auxiliary power supply, reduces the need for the main power supply to increase its output current to meet the DUT's increased demand. With the output current of the main power supply remaining substantially constant despite the DUT's increased demand for current, the voltage drop across path impedance between the main power supply and the DUT remains substantially constant. Thus the supply voltage at the DUT's power input terminal also remains substantially constant.
- the amount of additional charging current a DUT requires after each clock signal edge varies depending on the number and nature of state transitions its internal logic devices undergo in response to the clock signal edge. Since a test of an IC requires the IC to carry out a predetermined sequence of state changes, the ICs behavior during a test, including its demand for current during each clock signal edge, is predictable. The magnitude of the current pulse supplied after each clock signal edge is therefore adjusted to suit a predicted amount of additional charging current required by the DUT following each clock signal pulse.
- the prediction for the increase in current drawn by a DUT following each clock signal edge may be based, for example, on measurements of current drawn by a similar DUT under similar test conditions, or on simulations of the DUT undergoing an analogous test.
- the amount of charging current an IC of a particular type may draw during any test cycle can be predicted with a fairly high degree of accuracy, the actual amount of additional charging current drawn by any given DUT of that type can be somewhat higher or lower than the predicted amount.
- Random process variations in the fabrication of ICs make all ICs behave somewhat differently, particularly with respect to the amount of charging current their transistors require during state changes.
- a feedback circuit is provided to monitor the voltage at the DUT's power supply terminal and to appropriately scale the predicted magnitude of the current pulses so as to minimize variations in that voltage.
- the magnitude of the current pulse supplied to the power input terminal of a DUT following each clock signal cycle is a function of the predicted magnitude of the additional current drawn by a DUT of that type during that clock signal cycle, but the predicted pulse magnitude is scaled by feedback so as to adapt the prediction to accommodate the variation in charging current requirements for each particular DUT being tested.
- FIG. 1 is a block diagram illustrating a typical prior art test system including an integrated circuit tester connected through a probe card to a set of integrated circuit devices under test (DUTs);
- DUTs integrated circuit devices under test
- FIGS. 2 and 3 are timing diagrams illustrating behavior of signals within the prior art test system of FIG. 1 ;
- FIG. 4 is a simplified plan view of the prior art probe card of FIG. 1 ;
- FIG. 5 is a block diagram illustrating a test system implementing a system for reducing noise in the power supply inputs of a set of DUTs in accordance with a first embodiment of the present invention;
- FIG. 6 is a timing diagram illustrating behavior of signals within the test system of FIG. 5;
- FIG. 7 is a block diagram illustrating operation of the test system of FIG. 5 during a calibration procedure
- FIG. 8 is a simplified plan view of the probe card of FIG. 6;
- FIGS. 9 and 10 are block diagrams illustrating test systems implementing second and third embodiments of the present invention.
- FIG. 11 is a timing diagram illustrating behavior of signals within the test system of FIG. 10;
- FIG. 12 is a block diagram illustrating a test system implementing a fourth embodiment of the present invention.
- FIG. 13 is a timing diagram illustrating behavior of signals within the test system of FIG. 12;
- FIG. 14 is a block diagram illustrating a fifth embodiment of the present invention.
- FIG. 15 is a block diagram illustrating a sixth embodiment of the present invention
- FIG. 16 is a block diagram illustrating a seventh embodiment of the present invention.
- FIG. 17 is a timing diagram illustrating behavior of signals within the circuit of FIG. 16;
- FIG. 18 is a block diagram illustrating an eighth embodiment of the invention.
- FIG. 19 is a block diagram illustrating a ninth embodiment of the invention.
- FIG. 20A illustrates an exemplary probe card
- FIG. 20B illustrates another exemplary probe card
- FIG. 21 is a block diagram illustrating a ninth embodiment of the invention.
- FIG. 22 is a block diagram illustrating an exemplary embodiment of the feedback control circuit of FIG. 21 ;
- FIGs 23-25 are block diagrams illustrating alternative exemplary embodiments of the current pulse generator of FIG. 21.
- FIG. 26 is a block diagram illustrating a tenth embodiment of the invention.
- FIG. 5 illustrates in block diagram form an integrated circuit (IC) tester 30 linked through a probe card 32 to a set of similar IC devices under test (DUTs) 34 in the form of die on a semiconductor wafer.
- Probe card 32 includes a set of probes 37 for accessing input/output terminal pads 39 on the surfaces of DUTs 34 and also includes signal paths 46 linking tester 30 to probes 37 to allow IC tester 30 to send a clock signal (CLOCK) and other test signals to DUTs 14 and to convey DUT output signals back to tester 30 so that the tester can monitor the behavior of the DUTs.
- CLOCK clock signal
- Probe card 34 also links a main power supply to a power input terminal 41 of each DUT 34 via conductors passing through the probe card leading to probes 37 extending to terminals 41.
- Power supply 36 produces a well-regulated output voltage VA and continuously supplies a current 12 to DUT 34.
- FIG. 5 represents the inherent impedances of the paths 43 through probe card 32 between main power supply 36 and each DUT 34 as resistors R1. Due to a voltage drop across each resistor R1 , the input supply voltage VB to each DUT 34 is always somewhat less than VA.
- a first transistor switch SW1 mounted on probe card 32 links an auxiliary power supply 38 to a set of capacitors C2 mounted in probe card 32.
- a set of second transistor switches SW2 also mounted on probe card 32 link each capacitor C2 to the power input terminal of a corresponding DUT 34.
- a resistor R2 shown in FIG. 5 represents the inherent signal path impedance within probe card 32 between each capacitor C1 and the power input terminal 41 of a DUT 34 when switch SW2 is closed.
- IC tester 30 provides an output control signal CNT1 for SW1, a control signal CNT2 for controlling switches SW2 and control data CNT3 for controlling the magnitude of the output voltage VC of auxiliary power supply 38.
- auxiliary power supply 38, switches SW1 and SW2 and capacitors C2 act as an auxiliary current source to inject a current pulse 13 into the power input terminal 41 of each DUT under control of IC tester 30 when necessary to meet any anticipated increase in the DUT's demand for supply current.
- DUTs 34 implement synchronous logic in which switching transistors forming logic gates turn on and off in response to pulses of the periodic master CLOCK signal provided by tester 30.
- Each switching transistor has an inherent input capacitance, and in order to turn on or off the transistor, its driver must either charge or discharge the transistor's input capacitance.
- drivers within DUTs 34 charge a transistor's input capacitance, they increase the amount of current 11 that must be supplied to each DUT's power input terminal 41.
- the transistor's input capacitance When the transistor's input capacitance is fully charged, its driver need only supply the relatively small amount of leakage current needed to keep the transistor's input capacitance charged so that the transistor remains turned on or off.
- each DUT 34 there is a temporary increase in the power supply current 11 input to each DUT 34 to provide the charging current necessary to change the switching states of various transistors. Later in a CLOCK signal cycle, after those transistors have changed state, the demand for power supply current falls to a "quiescent" steady state level and remains there until the beginning of the next CLOCK signal cycle. Since the amount of additional current 11 a DUT 34 needs at the start of each CLOCK signal cycle depends on the number and nature of transistors that turn on or off during that particular CLOCK signal cycle, the demand for charging current can vary from cycle-to-cycle.
- FIG. 2 represents the behavior of VB and 11 when SW2 is always open. Since the dip in supply voltage VB occurring after each CLOCK signal pulse edge is a form of noise that can adversely affect the performance of DUTs 34, it is desirable to limit the magnitude of that voltage dip.
- IC tester 30 controls auxiliary power supply 38 and the states of switches SW1 and SW2 so that capacitor C2 supplies additional charging current 13 to DUT 34 at the start of each test cycle.
- the charging current 13 which only flows during an initial portion of each CLOCK signal cycle, combines with the current 12 output of the main power supply to provide the current input 11 to DUT 34.
- charging current 13 provides approximately the same amount of charge the capacitance of switching transistors within DUT 34 acquire following a CLOCK signal pulse, there is relatively little change in the current 12 produced by main power supply 36 following the CLOCK signal pulse and therefore very little variation in supply voltage VB.
- tester 30 supplies data CNT3 to auxiliary power supply 38 indicating a desired magnitude of auxiliary supply voltage VC and then closes switch SW1. Power supply 38 then charges all capacitors C2. The amount of charge capacitors C2 store is proportional to the magnitude of VC.
- tester 30 opens switch SW1. Thereafter, following the start of the next CLOCK signal cycle, tester 30 closes all switches SW2 so that charge stored in capacitors C2 can flow as currents 13 into DUTs 34. Thereafter, when the need for transient charging current has passed, tester 30 opens switches SW2 so that only main power supply 36 supplies current to DUTs 34 during the remaining portion of the CLOCK signal cycle.
- This process repeats during each cycle of the CLOCK signal with tester 30 adjusting the magnitude of VC via control data CNT3 for each clock cycle so as to provide a current pulse IC sized to satisfy the predicted charging current demand during that particular clock signal cycle.
- the magnitude of the IC current pulse can vary from cycle-to-cycie.
- FIG. 6 illustrates the behavior of supply voltage VB, and currents 11 , 12 and 13 during an initial portion of a CLOCK signal cycle.
- Current 11 exhibits a large temporarily increase above its quiescent level IQ1 after an edge of the CLOCK pulse at time T1 to charge capacitance within the DUT 34.
- Current 13 rises quickly to provide substantially all the additional charging current.
- the output current 12 of main power supply 38 exhibits only a relatively small perturbation from its quiescent value IQ2 resulting from small mismatches between 13 and the transient component of 12. Since the variation in 12 is small, the variation in VB is small. Thus the present invention substantially limits the power supply noise due to switching transients in DUTs 34.
- the amount of additional charging current each DUT 34 draws at the start of a CLOCK signal cycle depends on the number of transistors that turn on or off during the CLOCK signal cycle and charging current varies from cycle-to-cycle.
- tester 30 has to predict how much charge DUT 34 is going to store following each CLOCK signal edge because it has to adjust the magnitude of auxiliary power supply output VC so that capacitors C2 store the proper amount of charge prior to each CLOCK signal cycle.
- FIG. 7 depicts a test system set up that allows tester 30 to experimentally determine the level to which it should set VC for each test cycle.
- a reference DUT 40 that is known to operate properly and which is similar to the ICs to be tested, is connected to tester 30 via probe 32 in generally the same way DUTs 34 are to be connected so that tester 30 can perform the same test on reference IC 40.
- probe card 32 also links the power supply terminal of reference IC 40 to an input terminal of tester 30 so that tester 30 can monitor the power supply voltage VB. Tester 30 then executes only the first CLOCK cycle of the test while observing VB using the minimum value for VC.
- tester 38 repeats the first CLOCK signal cycle of the test using a higher value of VC. This process is repeated iteratively until an appropriate value of VC for the first CLOCK signal cycle is established. The tester then iteratively executes the first two CLOCK signal cycles of the test while monitoring VB during the second CLOCK signal cycle and adjusting VC accordingly. The same procedure is used to establish an appropriate value of VC for each successive CLOCK signal cycle of the test. Those values for VC may then be used when testing DUTs 34.
- Designers typically use circuit simulators to simulate ICs before they are fabricated. When a circuit simulator performs the same test on simulated ICs that an IC tester would perform on its real counterpart, the circuit simulator can be employed in an analogous manner to determine the sequence of VC values to be used during a test of the real IC. Prohe Card
- FIG. 4 illustrates a typical prior art probe card 12 that connects voltage regulating capacitors C1 to the power input terminals of DUTs to limit power supply noise.
- Such probe cards must minimize the distance between voltage regulating capacitors and the DUTs so as to minimize the impedance between the capacitors and the DUTs.
- the capacitors preferably are mounted on the probe card in or near a small area 27 above the probes that access the DUTs. Since there is little space on the probe card near the probes, the size and number of regulating capacitors C1 that can be deployed on probe card 12 is limited. This limitation on capacitor mounting space can limit the number of DUTs that can be concurrently tested.
- FIG. 8 is a simplified plan view of the probe card 32 of FIG. 5 in accordance with the invention.
- Contact points 45 accessed by IC tester 30 of FIG. 7 are distributed over a relatively large area of the upper surface 43 of probe card 32 while the probes 37 (not shown) that contact DUTs 34 are concentrated under a relatively small central area 47 of the probe card. Since the voltage VC to which capacitors C2 are charged can be adjusted to accommodate significant path impedance R2 (FIG. 5) between any switch SW2 and terminal 41 of DUT 34, capacitors C2 can be mounted on probe card 32 at a significantly greater distance from central area 47 above the DUT probes than capacitors C1 of FIG. 4.
- capacitors C2 are charged to a higher voltage than capacitors C1 , they can be smaller than capacitors C1. Since capacitors C2 of probe card 32 of FIG. 8 can be smaller and further from the center of the probe card than capacitors C1 of the prior art probe card 12 of FIG. 4, a larger number of capacitors C2 can be mounted on probe card 32. Thus a test system employing probe card 32 in accordance with the invention can concurrently test more DUTs than a test system employing a prior art probe card 12 of FIG. 4.
- FIG. 9 illustrates an alternative embodiment of the invention including a probe card 50 generally similar to probe card 32 of FIG. 7 except that it has mounted thereon a "power control IC" 52.
- Power control IC 52 includes a pattern generator 54 that carries out the pattern generation function of IC tester 30 of FIG. 7 with respect to producing the control signals and data CNT1 , CNT2 and CNT3 for controlling switches SW1 and SW2 and auxiliary power supply 38.
- Power control IC 52 includes a conventional pattern generator 54 programmed before the start of a test by externally generated programming data provided via a conventional computer bus 56.
- Pattern generator 54 begins generating its output data pattern in response to a START signal from an IC tester 58 marking the start of a test and produces its output CNT1, CNT2, CNT3 data pattern in response to the same system clock (SYSCLK) that clocks operations of tester 58.
- SYSCLK system clock
- switches SW1 and SW2 and capacitors C2 may be implemented within power control IC 52 as shown in FIG. 9.
- IC 52 should be mounted on the probe card as near as possible to the DUT probes. Merging switches SW1 and SW2 and capacitors C2 and the pattern generation function of tester 30 into a single IC 52 reduces the cost and complexity of probe card 32 and reduces the required number of tester 30 output channels. However when necessary capacitors C2 can be implemented by discrete components external to power control IC 52.
- FIG. 10 illustrates an embodiment of the invention that is generally similar to the embodiment of FIG. 5.
- switch SW1 is omitted from probe card 60 so that the VC output of auxiliary power supply 38 is directly connected to capacitors C2.
- the output voltage VC is fixed and not adjusted by IC tester 30 so that C2 charges to the same value prior to each CLOCK signal pulse.
- IC tester 30 controls the amount of charge capacitors C2 deliver to DUTs 34 at the start of each CLOCK pulse by pulse width modulating switches SW2 via control signal CNT2.
- the amount of time tester 30 closes switches SW2 following the leading edge of a CLOCK signal pulse determines the amount of charge capacitors C2 deliver to DUTs 34.
- the shape of the 13 current flow illustrated in FIG. 6 can be more closely approximated when tester 30 rapidly increases and then decreases the duty cycle of the CNT2 signal as illustrated in FIG. 11.
- FIG. 12 illustrates an embodiment of the invention that is generally similar to the embodiment of FIG. 10. However in FIG. 12 the transistor switches SW2 are replaced with transistors Q2 operated in their active regions when DUTs 34 are undergoing state changes and require additional current 13.
- the CNT2 output of IC tester 30 is a data sequence applied as input to an analog-to- digital (A/D) converter 63 mounted on probe card 61.
- the data sequence CNT2 represents a predicted demand for charging current 13 during each CLOCK signal cycle.
- a D converter 63 responds to the CNT2 data sequence by producing an analog signal CNT4 input to the bases of transistors Q2 that varies during each CLOCK signal cycle as illustrated in FIG. 13.
- Analog signal CNT4 controls the amount of current 13 each transistor Q2 allows to flow out of a capacitor C2 so that it substantially matches the predicted transient component of the current 11 demanded by DUT 34.
- A/D converter 63 may be implemented within IC tester 30 instead of being mounted on probe card 61. Charge Prediction Using Reference DUT
- FIG. 14 illustrate an embodiment of the invention wherein a reference DUT 60 similar to DUTs 34 is tested in a similar way except that tester 30 tests the reference DUT 60 slightly in advance of the other DUTs by advancing the CLOCK and other input signals it supplies to reference DUT 60.
- a main power supply 62 powers all DUTs 34 while an auxiliary power supply 64 powers reference DUT 60.
- a capacitor C4 mounted on probe card 66 near reference DUT 60 regulates the voltage VREF at its power input terminal 68 in a conventional manner so that it stays within its allowed operating range.
- a capacitor C5 links VREF to a set of amplifier's A1, and a capacitor C6 links the output of each amplifier A1 to the power input terminal 70 of each DUT 34.
- the supply voltage VREF at the input terminal 68 of reference DUT 60 falls below its quiescent level by a small amount following the start of each CLOCK signal cycle due to the reference DUT's transient charging current demand.
- the amount of voltage decline in VREF is proportional to the amount of transient charging current drawn by reference DUT 60. Since reference DUT 60 is similar to DUTs 34 and is tested slightly in advance of DUTs 34, a decline in VREF predicts the amount of transient charging current each DUT 34 a short time later.
- Amplifiers A1 acting through capacitors C5 and C6, amplify the AC component of VREF to produce output currents 13 that augment the current outputs 12 of main power supply 62 to provide the current input 11 to each DUT 34.
- the amount of time by which tester 30 advances the test of reference DUT 60 is set to equal the delay between variations in reference voltage VREF and corresponding variations in currents 13. With the (negative) gain of each amplifier A1 appropriately adjusted by an externally generated signal (GAIN), currents 13 will substantially match the transient charging currents required by DUTs 34.
- embodiments of the present invention can also be employed to reduce power supply noise in application in which an integrated circuit passes though a succession of states that can be predicted.
- FIG. 15 illustrates an example embodiment of the invention in which an integrated circuit 80 passes through a predictable succession of states in response to edges of an externally generated CLOCK signal supplied as input thereto.
- IC 80 receives power from a main power supply 82.
- An auxiliary power supply 84 charges a capacitor C2 via a switch SW1 when switch SW1 is closed.
- Capacitor C2 supplies its charge as additional current input to IC 80 when a switch SW2 is closed.
- a "charge predictor" circuit 86 responds to the CLOCK signal by asserting a signal CNT1 to close switch SW1 and deasserting a control signal CNT2 to open switch SW2 during a portion of each CLOCK signal cycle in which IC 80 is not changing state.
- Charge predictor circuit 86 asserts control signal CNT2 to close switch SW2 and deasserts control signal CNT1 to open switch SW1 during a portion of each CLOCK signal cycle in which IC 80 is changing state, thereby allowing capacitor C2 to deliver current to the power input of IC 80 to provide its transient current needs.
- Charge predictor 86 also provides control data CNT2 to auxiliary power supply 84 to adjust its output voltage VC so that it charges capacitor C2 to a level determined in accordance with an amount of current IC 80 is expected to draw during a next state change.
- Charge predictor 86 is suitably implemented by a conventional pattern generator or any other device capable of producing output data sequences CNT1 , CNT2 and CNT3 that are appropriate for transient current requirements of IC 80 for its expected sequence of states.
- Switches SW1 and SW2 and/or capacitor C2 may be implemented either external to IC 80 as illustrated in FIG. 15 or may be implemented internal to IC 80.
- FIG. 16 illustrates a simple version of the invention suitable for use in applications wherein the amount of charging current an IC 80 is expected to draw at the start of each CLOCK signal cycle lies within a relatively limited, predictable range.
- an inverter 90 inverts the CLOCK signal to provide the CNT1 control signal input to a switch SW1 coupling a main power supply to a capacitor C2.
- the CLOCK signal directly provides a CNT2 control signal input to a switch SW2 connecting capacitor C2 to a power input of IC 80 normally driven by a main power supply 82.
- FIG. 16 illustrates a simple version of the invention suitable for use in applications wherein the amount of charging current an IC 80 is expected to draw at the start of each CLOCK signal cycle lies within a relatively limited, predictable range.
- an inverter 90 inverts the CLOCK signal to provide the CNT1 control signal input to a switch SW1 coupling a main power supply to a capacitor C2.
- the CLOCK signal directly provides a CNT2 control
- the CLOCK signal drives the CNT2 signal high to close switch SW2 during a first half of each CLOCK signal cycle and drives CNT1 high to close switch SW1 during a second half of each CLOCK signal cycle.
- the output voltage VC of auxiliary power supply 84 is set to a constant value so that it charges capacitor C2 to the same level prior to the start of each CLOCK signal cycle.
- the level of VC is set to appropriately position the range over which power supply input voltage VB swings when IC 80 is drawing additional charging current at the start of each CLOCK signal cycle.
- FIG. 18 illustrates another exemplary embodiment of the invention.
- a power supply 36 provides power through a probe card 50 to a power input terminal 1806 on a semiconductor device under test (DUT) 34.
- a representation of the inherent impedance through power line 1812 on the probe card 50 is illustrated in FIG. 18 as R1.
- an IC tester 58 provides clock and other signals through the probe card 50 to the DUT 34.
- a clock input terminal on exemplary DUT 34 is illustrated as terminal 1808.
- the IC tester 58 also receives signals through the probe card 50 from the DUT 34.
- One input/output (I/O) terminal 1810 is shown on DUT 34 in FIG. 18.
- DUT 34 may have additional I/O terminals 1810 or may have terminals dedicated solely to inputs and other solely to outputs or a combination of terminals dedicated to solely inputs or outputs and other terminals that function as both input and output terminals. It should be apparent that probe card 50 may make connections with one DUT as shown in FIG. 18 or a plurality of DUTs, for example, as shown in FIG. 14.
- a current sensing device 1804 senses current through bypass capacitor C1.
- Amplifier 1802 which is preferably an inverting amplifier (e.g., the amplifier has a gain of minus one) provides current through capacitor C7 into transmission line 1812.
- An auxiliary power supply 38 provides power to amplifier 1802.
- power may be supplied to amplifier 1802 by other means, including from power supply 36, IC tester 58, a power supply located on the probe card 50, or a power supply located other than with the power supply 36, IC tester 58, or probe card 50.
- power terminal 1806 typically draws little current, as described above (assuming DUT 34 includes primarily field effect transistors). Only under certain circumstances does power terminal 1806 draw a significant amount of current. As discussed above, the most common of these circumstances arises when at least one transistor in DUT 34 changes state, which typically occurs in correspondence with a rising or falling edge of the clock at clock terminal 1808. While DUT 34 is not changing states, the small amount of current drawn at power terminal 1806 typically results in only a small and predominantly static direct current (DC) flow or no current flow through bypass capacitor C1. This results in little to no current sensed by current sensing device 1804, and consequently little to no current from inverting amplifier 1802. While DUT 34 is changing states, however, power terminal 1806 temporarily draws a significant amount of current, as described above.
- DC direct current
- bypass capacitor C1 This results in a temporary significant and changing flow of current through bypass capacitor C1 , as described above. That current is sensed by current sensing device 1804 and inverted and amplified by inverting amplifier 1802 and ultimately provided through isolation capacitor C7 into power line 1812. As described above, this extra current provided on power line 1812 by amplifier 1802 reduces variations in the voltage at power terminal 1806.
- FIG. 19 illustrates a variation of the exemplary embodiment shown in FIG. 18.
- FIG. 19 is generally similar to FIG. 18 and also includes a current sensing element 1804 and an inverting amplifier 1802 configured to provide current to power line 1812 on probe card 50.
- the current sensing element 1804 senses current flow through the power line 1812 rather than through bypass capacitor C1.
- FIG. 19 operates similarly to that of FIG. 18. While DUT 34 is not changing states, little of the typically small, predominately static direct current (DC) drawn at power terminal 1806 via line 1804 is sensed by current sensing device 1804. Consequently, little or no charging current is provided by inverting amplifier 1802. However, while DUT 34 is changing states, current sensing device 1804 senses the significant variation in current drawn at power terminal 1806 through power line 1804. Inverting amplifier 1802 amplifies and inverts the sensed current to provide additional charging current through isolation capacitor C7 into power line 1812. As described above, the additional charging current reduces variation in the voltage at power terminal 1806. Interconnect Systems
- FIG. 20A illustrates a relatively simple probe card comprising a substrate 2002 with terminals 2004 for connecting to an IC tester (not shown in FIG. 20A) and probe elements 2008 for making electrical connections with a DUT (not shown in FIG. 20A). As shown, terminals 2004 are electrically connected to probe elements 2008 by interconnect elements 2006.
- Substrate 2002 may be, for example, a single or multilayered printed circuit board or ceramic or other material. It should be apparent that the material composition of the substrate is not critical to the invention.
- Probes elements 2008 may be any type of probe capable of making electrical connections with a DUT including without limitation needle probes, COBRA style probes, bumps, studs, posts, spring contacts, etc. Non-limiting examples of suitable spring contacts are disclosed in U.S. Patent No. 5,476,211, U.S. Patent Application No. 08/802,054, filed February 18, 1997, which corresponds to PCT publication WO 97/44676, U.S. Patent No. 6,268,015 B1, and U.S. Patent Application No.
- Non-limiting examples of interconnection paths 2006 include vias and/or a combination of vias and conductive traces located on a surface of substrate 2002 or within substrate 2002.
- FIG. 20B illustrates another non-limiting example of a probe card that may be used with the present invention.
- the exemplary probe card shown in FIG. 20B includes a substrate 2018, an interposer 2012, and a probe head 2032.
- Terminals 2022 make contact with an IC tester (not shown in FIG. 20B) and probe elements 2034, which may be similar to probe elements 2008 discussed above, make contact with a DUT (not shown in FIG. 20B).
- Interconnection paths 2020, resilient connection elements 2016, interconnection paths 2014, resilient connection elements 2010, and interconnection paths 2036 provide electrically conductive paths from terminals 2022 to probe elements 2034.
- Substrate 2018, interposer 2012, and probe head 2032 may be made of materials similar to those described above with regard to 2002. Indeed, the material composition of substrate 2018, interposer 2012, and probe head 2032 are not critical to the invention, and any composition may be used. Interconnection paths 2020, 2014, 2036 may be similar to interconnection paths 2006 as described above.
- Resilient connection elements 2016 and 2010 are preferably elongate, resilient elements. Non-limiting examples of such elements are illustrated in U.S. Patent No. 5,476,211; U.S. Patent Application No. 08/802,054, filed February 18, 1997, which corresponds to PCT publication WO 97/44676; U.S. Patent No. 6,268,015 B1; and U.S. Patent Application No.
- interconnection path 2014 may be replaced with a hole and one or more resilient elements 2016 and/or 2010 fixed within the hole and extending out of the hole to make contact with substrate 2018 and probe head 2032.
- circuitry for reducing variations in the voltage at a power terminal on a DUT is preferably disposed on the probe card. If a multiple-substrate probe card is used, such as the exemplary probe shown in FIG. 20B, the circuitry may be located on any one of the substrates or may be distributed among two or more of the substrates. Thus, for example, the circuitry may be located on one of the probe head 2032, interposer 2012, or substrate 2018 illustrated in FIG. 20B, or the circuitry may be located on a combination of two or more of the probe head, the interposer, and/or the substrate. It should be apparent that the circuitry may be formed entirely of interconnected discrete circuit elements, may be formed entirely on an integrated circuit, or may consist in part of discrete circuit elements and in part of elements formed on an integrated circuit. Predictive/Adaptive Current Compensation
- a predictive system for controlling variation in supply voltages at a DUT's power input terminal predicts the amount of charging current the DUT will require during each clock signal cycle and then sizes the supplemental current pulse applied to the DUT's power input terminal during that clock signal cycle in accordance with the prediction.
- An adaptive system monitors the power signal applied to the DUT's terminal and uses feedback to adjust the magnitude of the supplemental current pulse to keep the power signal's voltage constant.
- FIG. 21 illustrates an embodiment of the invention in which the amount of additional charging current needed at the power input terminal 26 of DUT 34 is determined by a combination of prediction and adaption.
- Auxiliary power supply 38 supplies power VC to a current pulse generator 2104 which supplies a current pulse 13 to DUT power input terminal 26 when necessary to augment the normal supply current from main power supply 36.
- IC tester 58 supplies a signal CNT5 to current pulse generator 2102 indicating a predicted magnitude of the current pulse, and during each test cycle, IC tester 58 asserts a control signal CNT6 to tell current pulse generator 2102 when to generate the current pulse.
- IC tester 58 is programmed to test a particular type of DUT 34 and the predictions that it makes with respect to the size and duration of current pulse 13 needed during each test cycle may, as previously discussed, be based either on measurements of current drawn by a DUT of that type, or on a simulation of DUT behavior.
- the magnitude of additional charging current each DUT of that type may require during each test cycle can vary from the predicted charging current.
- a ratio of actual charging current drawn to predicted charging current tends to be relatively uniform on a cycle-by-cycle basis. For example one DUT might consistently draw 5% more charging current during each test cycle than the predicted charging current while another DUT of the same time might consistently draw 5% less than the predicted charging current during each test cycle.
- a feedback controller 2104 compensates for such variation in charging current requirements from predicted values by supplying an adaptive gain (or “adaption”) signal G to current pulse generator 2102 which appropriately increases or decreases the magnitude of current pulse 13 to adapt the current pulse to suit the requirements of the particular DUT 34 currently under test.
- the prediction signal CNT5 represents the predicted magnitude of the charging current demanded by DUTs of the type being tested whereas the gain (“adaption”) signal magnitude represents the prediction error for the particular instance of the DUT being tested.
- IC tester 58 Before testing DUT 34, IC tester 58 carries out a pretest procedure that may be similar to the test to be performed in that it sends test and CLOCK signal pulses to DUT 34 causing it to behave in generally the same way the DUT would during the test.
- feedback control circuit 2104 monitors the voltage VB at the DUT's power input terminal 26 and adjusts the magnitude of the gain signal G to minimize variations in VB that occur when the magnitude of 13 is too large or too small.
- the pretest procedure allows feedback controller 2104 time to adjust the magnitude of gain signal G to accommodate charging current demand of the particular DUT 34 to be tested. Thereafter, during the test, feedback controller 2104 continues to monitor VB and to adjust gain signal, but the adjustments it makes are small.
- the gain control feedback provided by controller 2104 finely adjusts the current pulse magnitude to accommodate any consistent propensity of the DUT's actual charging current demand to vary from the predicted demand.
- feedback controller 2104 of FIG. 21 may be of any of a variety of designs capable of producing an output gain control signal G that will minimize variations in VB.
- current pulse generator may be any of a variety of designs capable of producing a current pulse 13 wherein the timing of 13 is controlled by an input signal CNT6 and wherein the magnitude of 13 is a function of the current pulse magnitude represented by the control signal CNT5 and the magnitude of an adaptive gain signal G.
- FIG. 22 illustrates one non-limiting example of feedback controller 2104 which integrates the AC component of VB to produce gain control signal G.
- a DC blocking capacitor C10 passes the AC component of VB to an integrator 206 formed by an operational amplifier A1 connected in parallel with a capacitor C8 and a resistor R5 and having a resistor R4 in series with its input.
- FIG. 23 depicts one non-limiting example of current pulse generator 2106 of FIG. 21.
- the control signal CNT5 conveys data representing the predicted magnitude of the required current pulse 13.
- a digital-to-analog converter (DAC) 2112 converts the prediction data for the current test cycle into an analog signal P of magnitude proportional to the prediction data.
- DAC digital-to-analog converter
- a switch 2110 closes to apply signal P to an input of a variable gain amplifier 2112 powered by the VC output of auxiliary power supply 38 of FIG. 21.
- the gain control signal output of feedback controller 2104 of FIG. 21 controls the gain of amplifier 2112.
- Amplifier 2112 produces an output current pulse 13 of magnitude that is proportional to the product of P and G.
- a capacitor C7 passes the 13 signal pulse to the signal path 2114 within probe card 50 of FIG. 21 that conveys power to DUT 34.
- FIG. 24 depicts another non-limiting example of current pulse generator 2106 of FIG. 21.
- the length of time IC tester 58 of FIG. 21 asserts the CNT5 control signal is proportional to the predicted magnitude of current pulse 13 needed during a next CLOCK signal cycle.
- IC tester 58 asserts the CNT5 signal to close a switch 2116 coupling the auxiliary supply output signal VC to a capacitor C8 via a resistor R5.
- IC tester 58 continues to assert the CNT5 signal for an amount of time that increases with the predicted magnitude of the next 13 signal pulse.
- auxiliary power supply 38 of FIG. 21 charges capacitor C8 to a voltage that is proportional to the predicted magnitude of the next 13 signal pulse.
- a switch 2117 connects capacitor C8 to the input of an amplifier 2118 having a gain controlled by the gain control signal output G of feedback controller 2104 of FIG. 21.
- a coupling capacitor C9 delivers the resulting 13 signal to the probe card conductor 2114 that delivers power to DUT 35 of FIG. 21.
- Control signal CNT6 opens switch 2117 after capacitor C8 has had time to substantially discharge. Since the magnitude of the 13 current pulse rises quickly and then declines as C8 discharges, the time-varying behavior of the 13 pulse tends to mimic the DUT's time- varying charging current demand.
- FIG. 25 depicts another non-limiting example of current pulse generator 2106 of FIG. 21 wherein data conveyed by the CNT5 signal represents the predicted magnitude of the 13 signal pulse.
- the gain control signal G acts as a reference voltage for a DAC 2120 converting the data conveyed by the CNT5 signal into an analog signal P.
- the voltage of gain control signal G scales defines the range of the DAC output signal P so that the P is proportional to a product of G and CNT5.
- a switch 2122 temporarily delivers the P signal to an amplifier 2124 in response to a pulse of the control signal CNT6, thereby causing amplifier 2125 to send an 13 signal pulse to power conductor 2114 via a coupling capacitor C10.
- the IC signal pulse magnitude is proportional to the product of the magnitudes of G and P.
- FIG. 26 illustrates another exemplary embodiment of a predictive/adaptive system in accordance with the invention wherein auxiliary power supply 38 supplies power to a variable gain amplifier 2126, and IC tester 58 supplies a control signal pulse CNT6 to amplifier 2126 whenever it predicts that additional charging current will be needed at the power input terminal 26 of DUT 34.
- a capacitor C11 delivers the 13 signal pulse to the power signal path 2114 within probe card 50 linking main power supply 36 to DUT power input terminal 26.
- Feedback control circuit 2104 monitors the voltage VB appearing at terminal 26 and adjusts the gain of amplifier 2126 to minimize the variation in VB.
- IC tester 58 supplies control signal CNT5 as input to auxiliary power supply 38 at the start of each CLOCK cycle for setting its output voltage VC in accordance with the magnitude of data conveyed by the CNT5 control signal.
- the magnitude of 13 is therefore a function of the product of magnitudes of gain control signal G and auxiliary supply voltage VC
- FIGs. 21-26 depict various exemplary embodiments of a predictive/adaptive control system in accordance with the invention for regulating the voltage of a power signal VB applied to DUT 34 by providing additional charging current to the DUT's power input terminal 26 after each edge of the CLOCK signal to meet a temporary increase in current demand due to switching initiated by the CLOCK signal edge.
- the control system is "predictive” in that it predicts the amount of additional current that the DUT will require during each cycle of the test.
- the control system is also "adaptive” in that it employs feedback to scale the current pulses it generates in response to the prediction to accommodate observed variations in the magnitude of current actually drawn by the individual DUTs to be tested.
- While the invention is illustrated herein as reducing noise in a system employing only a single main power supply, it will be appreciated that the invention can be employed in environments in which more than one main power supply provide power to DUTs. While the invention is illustrated as operating in connection with DUTs having a single power input, it will be appreciated that the apparatus can be adapted to operate in connection with DUTs having multiple power inputs.
- While the invention is described as providing additional charging current following a leading edge of a CLOCK signal pulse, it may be easily adapted to provide additional charging current following a trailing edge of the CLOCK signal pulse for use with DUTs that switch on trailing CLOCK signal edges.
- the invention in its broadest aspect is not intended to be limited to applications involving any particular type of IC tester, any particular type of tester-to-DUT interconnect system, or any particular type of IC DUT. It should also be understood by those of skill in the art that while the invention is described above as being employed in connection with the testing of integrated circuits, it may also be employed when testing any kind of electronic device including, for example, flip-chip assemblies, circuit boards and the like, whenever precise regulation of voltage at the power input terminals of the device during the test is desirable.
Abstract
Description
Claims
Priority Applications (4)
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KR1020047011685A KR101024872B1 (en) | 2002-01-30 | 2003-01-29 | Predictive, adaptive power supply for an integrated circuit under test |
JP2003564605A JP2005516226A (en) | 2002-01-30 | 2003-01-29 | Predictive adaptive power supply for integrated circuits under test. |
EP03707580A EP1470432B1 (en) | 2002-01-30 | 2003-01-29 | Predictive, adaptive power supply for an integrated circuit under test |
DE60317876T DE60317876T2 (en) | 2002-01-30 | 2003-01-29 | PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT IN THE TEST |
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US10/062,999 US7342405B2 (en) | 2000-01-18 | 2002-01-30 | Apparatus for reducing power supply noise in an integrated circuit |
US10/062,999 | 2002-01-30 | ||
US10/206,276 US6657455B2 (en) | 2000-01-18 | 2002-07-25 | Predictive, adaptive power supply for an integrated circuit under test |
US10/206,276 | 2002-07-25 |
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WO2003065064A2 true WO2003065064A2 (en) | 2003-08-07 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10355296B3 (en) * | 2003-11-27 | 2005-06-09 | Infineon Technologies Ag | Testing device for wafer testing of digital semiconductor circuits with signal amplifiers inserted in test signal channels for eliminating signal attentuation and noise |
US8933716B2 (en) | 2008-09-10 | 2015-01-13 | Advantest Corporation | Test apparatus and testing method |
Families Citing this family (88)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5914613A (en) | 1996-08-08 | 1999-06-22 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
US6256882B1 (en) | 1998-07-14 | 2001-07-10 | Cascade Microtech, Inc. | Membrane probing system |
US6657455B2 (en) | 2000-01-18 | 2003-12-02 | Formfactor, Inc. | Predictive, adaptive power supply for an integrated circuit under test |
JP4509437B2 (en) * | 2000-09-11 | 2010-07-21 | Hoya株式会社 | Manufacturing method of multilayer wiring board |
DE10143173A1 (en) | 2000-12-04 | 2002-06-06 | Cascade Microtech Inc | Wafer probe has contact finger array with impedance matching network suitable for wide band |
WO2003052435A1 (en) | 2001-08-21 | 2003-06-26 | Cascade Microtech, Inc. | Membrane probing system |
US6965244B2 (en) * | 2002-05-08 | 2005-11-15 | Formfactor, Inc. | High performance probe system |
US6724205B1 (en) * | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
KR100407284B1 (en) * | 2003-06-25 | 2003-12-03 | From 30 Co Ltd | Clamping force measuring apparatus of molding press for manufacturing semiconductor package |
KR100532447B1 (en) * | 2003-07-11 | 2005-11-30 | 삼성전자주식회사 | Parallel test apparatus and method of integrated circuit device able to provide high test current |
GB2425844B (en) | 2003-12-24 | 2007-07-11 | Cascade Microtech Inc | Active wafer probe |
KR100555544B1 (en) * | 2004-01-02 | 2006-03-03 | 삼성전자주식회사 | Apparatus for generating test stimulus signal having current source regardless of internal impedance value of a device under test |
JP2005321379A (en) * | 2004-04-07 | 2005-11-17 | Agilent Technol Inc | Integrated connecting means and cable assembly of measuring system for semiconductor characteristics |
US7173446B2 (en) * | 2004-06-24 | 2007-02-06 | Intel Corporation | Mechanism to stabilize power delivered to a device under test |
US7365556B2 (en) * | 2004-09-02 | 2008-04-29 | Texas Instruments Incorporated | Semiconductor device testing |
US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
US7247956B2 (en) * | 2004-11-30 | 2007-07-24 | Infineon Technologies Ag | Performance test board |
US7414418B2 (en) * | 2005-01-07 | 2008-08-19 | Formfactor, Inc. | Method and apparatus for increasing operating frequency of a system for testing electronic devices |
KR100688517B1 (en) * | 2005-01-11 | 2007-03-02 | 삼성전자주식회사 | Parallel test method for semiconductor device using a division of voltage supply unit |
US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
GB0502829D0 (en) * | 2005-02-11 | 2005-03-16 | Ibm | Connection error avoidance in apparatus connected to a power supply |
US7005879B1 (en) * | 2005-03-01 | 2006-02-28 | International Business Machines Corporation | Device for probe card power bus noise reduction |
US7609080B2 (en) * | 2005-03-22 | 2009-10-27 | Formfactor, Inc. | Voltage fault detection and protection |
US7425834B2 (en) | 2005-08-26 | 2008-09-16 | Power Integrations, Inc. | Method and apparatus to select a parameter/mode based on a time measurement |
US7621733B2 (en) * | 2005-09-30 | 2009-11-24 | 3D Systems, Inc. | Rapid prototyping and manufacturing system and method |
JP4598645B2 (en) * | 2005-10-13 | 2010-12-15 | 富士通セミコンダクター株式会社 | Test method and test apparatus |
KR100735749B1 (en) * | 2005-11-28 | 2007-07-06 | 삼성전자주식회사 | Semiconductor memory device, memory system, and data transmitting and receiving system |
JP4940643B2 (en) * | 2005-12-08 | 2012-05-30 | 日本電気株式会社 | Power supply noise tolerance inspection circuit and power supply noise tolerance inspection method |
US7859277B2 (en) * | 2006-04-24 | 2010-12-28 | Verigy (Singapore) Pte. Ltd. | Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array |
US7557592B2 (en) * | 2006-06-06 | 2009-07-07 | Formfactor, Inc. | Method of expanding tester drive and measurement capability |
TW200745572A (en) * | 2006-06-09 | 2007-12-16 | Visera Technologies Co Ltd | Manufacturing method of wafer-level testing circuit board, and the structure thereof |
US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
US7737715B2 (en) * | 2006-07-31 | 2010-06-15 | Marvell Israel (M.I.S.L) Ltd. | Compensation for voltage drop in automatic test equipment |
US7956628B2 (en) * | 2006-11-03 | 2011-06-07 | International Business Machines Corporation | Chip-based prober for high frequency measurements and methods of measuring |
US7852094B2 (en) * | 2006-12-06 | 2010-12-14 | Formfactor, Inc. | Sharing resources in a system for testing semiconductor devices |
US7812628B2 (en) * | 2006-12-13 | 2010-10-12 | Renesas Electronics Corporation | Method of on-chip current measurement and semiconductor IC |
US8362642B2 (en) * | 2007-03-01 | 2013-01-29 | Rambus Inc. | Optimized power supply for an electronic system |
US7876114B2 (en) | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
US7962110B2 (en) * | 2008-02-14 | 2011-06-14 | Advantest Corporation | Driver circuit and test apparatus |
US7859318B2 (en) * | 2008-02-14 | 2010-12-28 | International Business Machines Corporation | Delay line regulation using high-frequency micro-regulators |
TWI362496B (en) * | 2008-03-05 | 2012-04-21 | Nanya Technology Corp | Apparatus for testing chip and circuit of probe card |
JP5446112B2 (en) * | 2008-03-31 | 2014-03-19 | 富士通セミコンダクター株式会社 | Semiconductor device and method for monitoring operation of semiconductor device |
US8154315B2 (en) * | 2008-04-08 | 2012-04-10 | Formfactor, Inc. | Self-referencing voltage regulator |
US7872481B1 (en) * | 2008-05-01 | 2011-01-18 | Keithley Instruments, Inc. | Low glitch multiple form C summing node switcher |
US8555098B2 (en) * | 2008-06-09 | 2013-10-08 | Advantest Corporation | Semiconductor circuit with load balance circuit |
WO2010007654A1 (en) * | 2008-07-14 | 2010-01-21 | 株式会社アドバンテスト | Signal output circuit, timing generation circuit, testing device, and receiving circuit |
US7924035B2 (en) * | 2008-07-15 | 2011-04-12 | Formfactor, Inc. | Probe card assembly for electronic device testing with DC test resource sharing |
US8344746B2 (en) * | 2008-09-29 | 2013-01-01 | Thermo Fisher Scientific Inc. | Probe interface for electrostatic discharge testing of an integrated circuit |
US7888957B2 (en) | 2008-10-06 | 2011-02-15 | Cascade Microtech, Inc. | Probing apparatus with impedance optimized interface |
US8410806B2 (en) | 2008-11-21 | 2013-04-02 | Cascade Microtech, Inc. | Replaceable coupon for a probing apparatus |
JP2011058803A (en) * | 2009-09-04 | 2011-03-24 | Advantest Corp | Test device and power source device |
KR101647302B1 (en) * | 2009-11-26 | 2016-08-10 | 삼성전자주식회사 | Probe card and test apparatus having the same |
US8564319B2 (en) * | 2010-06-17 | 2013-10-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Probe card for simultaneously testing multiple dies |
US8896336B2 (en) * | 2010-07-06 | 2014-11-25 | Formfactor, Inc. | Testing techniques for through-device vias |
JP2012019600A (en) * | 2010-07-07 | 2012-01-26 | Sony Corp | Charger and method for controlling charge |
JP2011059124A (en) * | 2010-10-14 | 2011-03-24 | Advantest Corp | Test device and power source device |
JP2012098220A (en) * | 2010-11-04 | 2012-05-24 | Advantest Corp | Testing device |
US20130120010A1 (en) * | 2011-11-10 | 2013-05-16 | Qualcomm Incorporated | Power Measurement System for Battery Powered Microelectronic Chipsets |
JP2013181831A (en) * | 2012-03-01 | 2013-09-12 | Advantest Corp | Test device |
JP6104578B2 (en) * | 2012-11-30 | 2017-03-29 | 日置電機株式会社 | Inspection apparatus and inspection method |
US9297846B2 (en) | 2012-12-01 | 2016-03-29 | Keysight Technologies, Inc. | Continuous broken sense lead detection system |
US9024678B2 (en) * | 2013-05-22 | 2015-05-05 | Infineon Technologies Ag | Current sensing circuit arrangement for output voltage regulation |
US9651596B2 (en) * | 2013-08-30 | 2017-05-16 | Keysight Technologies, Inc. | System and apparatus for measuring capacitance |
TWI531803B (en) * | 2013-12-17 | 2016-05-01 | 致伸科技股份有限公司 | Testing system of circuit board |
US20150247886A1 (en) | 2014-02-28 | 2015-09-03 | International Business Machines Corporation | Transformer Phase Permutation Causing More Uniform Transformer Phase Aging and general switching network suitable for same |
KR101553352B1 (en) | 2014-05-16 | 2015-09-15 | 주식회사 씨자인 | Semiconductor circuit with test function |
DE102014111675A1 (en) * | 2014-08-15 | 2016-02-18 | Dspace Digital Signal Processing And Control Engineering Gmbh | Simulation device and method for simulating a connectable to a control device peripheral circuitry |
CN105548864B (en) * | 2016-02-03 | 2018-06-08 | 中国电子科技集团公司第三十八研究所 | A kind of Digital Array Radar DAM receives digital circuit test system |
US9958487B2 (en) * | 2016-02-04 | 2018-05-01 | Dialog Semiconductor (Uk) Limited | Method and apparatus for powering an electronic device |
FR3047633B1 (en) * | 2016-02-08 | 2019-03-22 | Continental Automotive France | INTEGRATED CIRCUIT WITH AUXILIARY POWER SUPPLY PINS |
US10199995B2 (en) * | 2016-03-30 | 2019-02-05 | Mediatek Inc. | Programmable amplifier circuit capable of providing large or larger resistance for feedback path of its amplifier |
US10060968B2 (en) * | 2016-08-26 | 2018-08-28 | Teradyne, Inc. | Combining current sourced by channels of automatic test equipment |
KR102637795B1 (en) * | 2017-02-10 | 2024-02-19 | 에스케이하이닉스 주식회사 | Semiconductor device |
KR102293671B1 (en) | 2017-11-29 | 2021-08-24 | 삼성전자주식회사 | Apparatus for testing semiconductor device method tof testing semiconductor device |
US11049386B2 (en) * | 2018-06-14 | 2021-06-29 | Eaton Intelligent Power Limited | Switch with current and voltage collection |
CN113490902B (en) | 2019-02-04 | 2024-01-23 | 马克西姆综合产品公司 | Smart current limiter for computing devices |
CN113228483B (en) | 2019-03-13 | 2024-01-19 | 爱德万测试公司 | Power supply, automated test equipment, method for operating a power supply, method for operating an automated test equipment and computer program using a voltage variation compensation mechanism |
US11105844B2 (en) * | 2019-06-28 | 2021-08-31 | Microsoft Technology Licensing, Llc | Predictive voltage transient reduction in integrated circuits |
US11105843B2 (en) | 2019-10-10 | 2021-08-31 | Analog Devices International Unlimited Company | Robust architecture for mode switching of a force and measure apparatus |
KR20210143471A (en) * | 2020-05-20 | 2021-11-29 | 삼성전자주식회사 | Probe card test apparatus |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5731700A (en) * | 1994-03-14 | 1998-03-24 | Lsi Logic Corporation | Quiescent power supply current test method and apparatus for integrated circuits |
US5917331A (en) * | 1995-10-23 | 1999-06-29 | Megatest Corporation | Integrated circuit test method and structure |
JP2001004692A (en) * | 1999-01-01 | 2001-01-12 | Advantest Corp | Semiconductor test device |
WO2001073929A2 (en) * | 2000-01-18 | 2001-10-04 | Formfactor, Inc. | Apparatus for reducing power supply noise in an integrated circuit |
Family Cites Families (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4144536A (en) | 1977-11-21 | 1979-03-13 | Probe-Rite, Inc. | Inker network for probing machine |
DE3234004A1 (en) | 1982-09-14 | 1984-03-15 | Christoph Emmerich GmbH & Co KG, 6000 Frankfurt | Memory chip for microprocessors |
US4646299A (en) * | 1983-08-01 | 1987-02-24 | Fairchild Semiconductor Corporation | Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits |
US5652624A (en) * | 1985-09-23 | 1997-07-29 | Lippel; Bernard | Systems for dither-quantizing and reconstruction of digital television signals |
US5476211A (en) | 1993-11-16 | 1995-12-19 | Form Factor, Inc. | Method of manufacturing electrical contacts, using a sacrificial member |
CN1016820B (en) * | 1988-03-10 | 1992-05-27 | 天津大学 | Portable micro-computer controlled multifuncitonal tester of protective relay |
US5101149A (en) | 1989-07-18 | 1992-03-31 | National Semiconductor Corporation | Modifiable IC board |
US5070297A (en) * | 1990-06-04 | 1991-12-03 | Texas Instruments Incorporated | Full wafer integrated circuit testing device |
JPH04218785A (en) * | 1990-12-19 | 1992-08-10 | Advantest Corp | Ic tester |
JP2641816B2 (en) | 1991-07-23 | 1997-08-20 | 三菱電機株式会社 | Measurement method for semiconductor integrated circuits |
US5254939A (en) * | 1992-03-20 | 1993-10-19 | Xandex, Inc. | Probe card system |
US5974662A (en) | 1993-11-16 | 1999-11-02 | Formfactor, Inc. | Method of planarizing tips of probe elements of a probe card assembly |
WO1996015458A1 (en) * | 1994-11-15 | 1996-05-23 | Formfactor, Inc. | Probe card assembly and kit, and methods of using same |
US5422562A (en) | 1994-01-19 | 1995-06-06 | Unitrode Corporation | Switching regulator with improved Dynamic response |
US6055661A (en) | 1994-06-13 | 2000-04-25 | Luk; Fong | System configuration and methods for on-the-fly testing of integrated circuits |
US5502671A (en) | 1994-08-31 | 1996-03-26 | Texas Instruments Incorporated | Apparatus and method for a semiconductor memory configuration-dependent output buffer supply circuit |
US5592077A (en) | 1995-02-13 | 1997-01-07 | Cirrus Logic, Inc. | Circuits, systems and methods for testing ASIC and RAM memory devices |
US6150186A (en) | 1995-05-26 | 2000-11-21 | Formfactor, Inc. | Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive |
JP3233559B2 (en) * | 1995-08-14 | 2001-11-26 | シャープ株式会社 | Method and apparatus for testing semiconductor integrated circuit |
US5652524A (en) | 1995-10-24 | 1997-07-29 | Unisys Corporation | Built-in load board design for performing high resolution quiescent current measurements of a device under test |
US5721495A (en) * | 1995-10-24 | 1998-02-24 | Unisys Corporation | Circuit for measuring quiescent current |
US5714888A (en) * | 1995-12-26 | 1998-02-03 | Motorola, Inc. | Method and apparatus for testing electronic circuitry in a manufacturing environment |
JP3743094B2 (en) * | 1996-04-11 | 2006-02-08 | ソニー株式会社 | Signal processing apparatus, integrated circuit and self-diagnosis method thereof |
US5931962A (en) * | 1996-09-23 | 1999-08-03 | Xilinx, Inc. | Method and apparatus for improving timing accuracy of a semiconductor test system |
US5822166A (en) | 1996-12-05 | 1998-10-13 | Intel Corporation | DC power bus voltage transient suppression circuit |
US5926384A (en) | 1997-06-26 | 1999-07-20 | Harris Corporation | DC-dC converter having dynamic regulator with current sourcing and sinking means |
US6087843A (en) * | 1997-07-14 | 2000-07-11 | Credence Systems Corporation | Integrated circuit tester with test head including regulating capacitor |
JPH11133068A (en) * | 1997-10-31 | 1999-05-21 | Hewlett Packard Japan Ltd | Voltage/current characteristic measuring device |
JP2000074997A (en) * | 1998-09-01 | 2000-03-14 | Advantest Corp | Ic test device and composite ic test device |
US6031361A (en) * | 1998-10-30 | 2000-02-29 | Volterra Semiconductor Corporation | Voltage regulation using an estimated current |
US6268015B1 (en) | 1998-12-02 | 2001-07-31 | Formfactor | Method of making and using lithographic contact springs |
JP2000171493A (en) * | 1998-12-02 | 2000-06-23 | Advantest Corp | Method and instrument for measuring current |
CN2403063Y (en) * | 1999-09-21 | 2000-10-25 | 阿姆斯戴尔公司 | Integrated protection power supply |
US6232759B1 (en) * | 1999-10-21 | 2001-05-15 | Credence Systems Corporation | Linear ramping digital-to-analog converter for integrated circuit tester |
JP2001153915A (en) * | 1999-11-29 | 2001-06-08 | Ando Electric Co Ltd | Ic tester, and testing method for ic |
US7342405B2 (en) | 2000-01-18 | 2008-03-11 | Formfactor, Inc. | Apparatus for reducing power supply noise in an integrated circuit |
US6657455B2 (en) * | 2000-01-18 | 2003-12-02 | Formfactor, Inc. | Predictive, adaptive power supply for an integrated circuit under test |
CN2447848Y (en) * | 2000-10-31 | 2001-09-12 | 深圳市Tcl电脑科技有限责任公司 | Wide AC input range switch power supply for computer |
EP1352657A4 (en) * | 2000-11-29 | 2004-06-16 | Morinaga Milk Industry Co Ltd | Interferon therapeutic effect-potentiating agents |
US6791344B2 (en) * | 2000-12-28 | 2004-09-14 | International Business Machines Corporation | System for and method of testing a microelectronic device using a dual probe technique |
JP4173726B2 (en) * | 2002-12-17 | 2008-10-29 | 株式会社ルネサステクノロジ | Interface circuit |
-
2002
- 2002-07-25 US US10/206,276 patent/US6657455B2/en not_active Expired - Lifetime
-
2003
- 2003-01-29 CN CNB038064588A patent/CN100454216C/en not_active Expired - Fee Related
- 2003-01-29 JP JP2003564605A patent/JP2005516226A/en active Pending
- 2003-01-29 EP EP03707580A patent/EP1470432B1/en not_active Expired - Fee Related
- 2003-01-29 WO PCT/US2003/002581 patent/WO2003065064A2/en active IP Right Grant
- 2003-01-29 KR KR1020047011685A patent/KR101024872B1/en not_active IP Right Cessation
- 2003-12-01 US US10/725,824 patent/US6949942B2/en not_active Expired - Fee Related
-
2005
- 2005-09-27 US US11/237,092 patent/US7245120B2/en not_active Expired - Fee Related
-
2007
- 2007-07-17 US US11/779,188 patent/US7714603B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5731700A (en) * | 1994-03-14 | 1998-03-24 | Lsi Logic Corporation | Quiescent power supply current test method and apparatus for integrated circuits |
US5917331A (en) * | 1995-10-23 | 1999-06-29 | Megatest Corporation | Integrated circuit test method and structure |
JP2001004692A (en) * | 1999-01-01 | 2001-01-12 | Advantest Corp | Semiconductor test device |
WO2001073929A2 (en) * | 2000-01-18 | 2001-10-04 | Formfactor, Inc. | Apparatus for reducing power supply noise in an integrated circuit |
Non-Patent Citations (2)
Title |
---|
"DEVICE TEST METHOD USING POWER SUPPLY CURRENT SIGNATURE COMPARISON" IBM TECHNICAL DISCLOSURE BULLETIN, IBM CORP. NEW YORK, US, vol. 34, no. 4A, 1 September 1991 (1991-09-01), pages 253-255, XP000210918 ISSN: 0018-8689 * |
PATENT ABSTRACTS OF JAPAN vol. 2000, no. 16, 8 May 2001 (2001-05-08) & JP 2001 004692 A (ADVANTEST CORP), 12 January 2001 (2001-01-12) * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10355296B3 (en) * | 2003-11-27 | 2005-06-09 | Infineon Technologies Ag | Testing device for wafer testing of digital semiconductor circuits with signal amplifiers inserted in test signal channels for eliminating signal attentuation and noise |
US7180313B2 (en) | 2003-11-27 | 2007-02-20 | Infineon Technologies Ag | Test device for wafer testing digital semiconductor circuits |
US8933716B2 (en) | 2008-09-10 | 2015-01-13 | Advantest Corporation | Test apparatus and testing method |
Also Published As
Publication number | Publication date |
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US20070257696A1 (en) | 2007-11-08 |
KR20040079960A (en) | 2004-09-16 |
US20060022699A1 (en) | 2006-02-02 |
US7714603B2 (en) | 2010-05-11 |
CN100454216C (en) | 2009-01-21 |
EP1470432A2 (en) | 2004-10-27 |
US7245120B2 (en) | 2007-07-17 |
US20020186037A1 (en) | 2002-12-12 |
JP2005516226A (en) | 2005-06-02 |
EP1470432B1 (en) | 2007-12-05 |
CN1643389A (en) | 2005-07-20 |
US20040075459A1 (en) | 2004-04-22 |
US6657455B2 (en) | 2003-12-02 |
US6949942B2 (en) | 2005-09-27 |
WO2003065064A3 (en) | 2003-10-16 |
KR101024872B1 (en) | 2011-03-31 |
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