US7981257B2
(en)
|
2002-04-12 |
2011-07-19 |
Schneider Electric USA, Inc. |
Current-based method and apparatus for detecting and classifying arcs
|
US7988833B2
(en)
*
|
2002-04-12 |
2011-08-02 |
Schneider Electric USA, Inc. |
System and method for detecting non-cathode arcing in a plasma generation apparatus
|
US6736944B2
(en)
*
|
2002-04-12 |
2004-05-18 |
Schneider Automation Inc. |
Apparatus and method for arc detection
|
US20030209518A1
(en)
*
|
2002-05-08 |
2003-11-13 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Method of detecting abnormal chamber conditions in etcher
|
JP3959318B2
(en)
*
|
2002-08-22 |
2007-08-15 |
東京エレクトロン株式会社 |
Plasma leak monitoring method, plasma processing apparatus, plasma processing method, and computer program
|
DE60222570T2
(en)
*
|
2002-12-20 |
2008-05-21 |
Sony Deutschland Gmbh |
Method for extracting an RDS signal component and signal receiver
|
KR100536601B1
(en)
*
|
2003-06-27 |
2005-12-14 |
삼성전자주식회사 |
Plasma deposition facility
|
US7068045B2
(en)
*
|
2003-07-25 |
2006-06-27 |
Gaton Corporation |
Apparatus and method for real time determination of arc fault energy, location and type
|
US6967305B2
(en)
*
|
2003-08-18 |
2005-11-22 |
Mks Instruments, Inc. |
Control of plasma transitions in sputter processing systems
|
DE102004015090A1
(en)
|
2004-03-25 |
2005-11-03 |
Hüttinger Elektronik Gmbh + Co. Kg |
Arc discharge detection device
|
US7305311B2
(en)
*
|
2005-04-22 |
2007-12-04 |
Advanced Energy Industries, Inc. |
Arc detection and handling in radio frequency power applications
|
US7253637B2
(en)
*
|
2005-09-13 |
2007-08-07 |
Square D Company |
Arc fault circuit interrupter system
|
DE502005006550D1
(en)
*
|
2005-12-22 |
2009-03-12 |
Huettinger Elektronik Gmbh |
Method and device for arc detection in a plasma process
|
US7410593B2
(en)
*
|
2006-02-22 |
2008-08-12 |
Macronix International Co., Ltd. |
Plasma etching methods using nitrogen memory species for sustaining glow discharge
|
CN101473403B
(en)
|
2006-03-17 |
2012-02-08 |
施耐德自动化公司 |
Current-based method and apparatus for detecting and classifying arcs
|
JP5177958B2
(en)
*
|
2006-03-31 |
2013-04-10 |
Hoya株式会社 |
Processing data management system, processing system for magnetic disk manufacturing apparatus, and data management method for magnetic disk manufacturing apparatus
|
US7445695B2
(en)
*
|
2006-04-28 |
2008-11-04 |
Advanced Energy Industries Inc. |
Method and system for conditioning a vapor deposition target
|
US20080000768A1
(en)
*
|
2006-06-30 |
2008-01-03 |
Stimson Bradley O |
Electrically Coupled Target Panels
|
WO2008034092A2
(en)
*
|
2006-09-15 |
2008-03-20 |
Schneider Automation Inc. |
System and method for detecting non-cathode arcing in a plasma generation apparatus
|
US20080083611A1
(en)
*
|
2006-10-06 |
2008-04-10 |
Tegal Corporation |
High-adhesive backside metallization
|
DE102006053366A1
(en)
*
|
2006-11-10 |
2008-05-15 |
Schott Ag |
Method and apparatus for plasma enhanced chemical vapor deposition
|
EP1926122B1
(en)
*
|
2006-11-23 |
2009-11-11 |
HÜTTINGER Elektronik GmbH + Co. KG |
Method of detecting arcing in a plasma process and arc detection device
|
US7795817B2
(en)
*
|
2006-11-24 |
2010-09-14 |
Huettinger Elektronik Gmbh + Co. Kg |
Controlled plasma power supply
|
EP1928009B1
(en)
*
|
2006-11-28 |
2013-04-10 |
HÜTTINGER Elektronik GmbH + Co. KG |
Arc detection system, plasma power supply and arc detection method
|
US7589031B2
(en)
*
|
2006-12-01 |
2009-09-15 |
Applied Materials, Inc. |
Method of avoiding haze formation on surfaces of silicon-containing PECVD-deposited thin films
|
DE502006009308D1
(en)
*
|
2006-12-14 |
2011-05-26 |
Huettinger Elektronik Gmbh |
Arc discharge detector, plasma power supply and method of detecting arc discharges
|
US7463465B2
(en)
|
2006-12-28 |
2008-12-09 |
General Electric Company |
Series arc fault current interrupters and methods
|
US7728602B2
(en)
*
|
2007-02-16 |
2010-06-01 |
Mks Instruments, Inc. |
Harmonic derived arc detector
|
US8217299B2
(en)
*
|
2007-02-22 |
2012-07-10 |
Advanced Energy Industries, Inc. |
Arc recovery without over-voltage for plasma chamber power supplies using a shunt switch
|
DE502007006093D1
(en)
|
2007-03-08 |
2011-02-10 |
Huettinger Elektronik Gmbh |
A method and apparatus for suppressing arc discharges when operating a plasma process
|
US7737702B2
(en)
*
|
2007-08-15 |
2010-06-15 |
Applied Materials, Inc. |
Apparatus for wafer level arc detection at an electrostatic chuck electrode
|
US7768269B2
(en)
*
|
2007-08-15 |
2010-08-03 |
Applied Materials, Inc. |
Method of multi-location ARC sensing with adaptive threshold comparison
|
US7733095B2
(en)
*
|
2007-08-15 |
2010-06-08 |
Applied Materials, Inc. |
Apparatus for wafer level arc detection at an RF bias impedance match to the pedestal electrode
|
WO2009023133A1
(en)
*
|
2007-08-15 |
2009-02-19 |
Applied Materials, Inc. |
Method of wafer level transient sensing, threshold comparison and arc flag generation/deactivation
|
US7750644B2
(en)
*
|
2007-08-15 |
2010-07-06 |
Applied Materials, Inc. |
System with multi-location arc threshold comparators and communication channels for carrying arc detection flags and threshold updating
|
US7750645B2
(en)
*
|
2007-08-15 |
2010-07-06 |
Applied Materials, Inc. |
Method of wafer level transient sensing, threshold comparison and arc flag generation/deactivation
|
US20090171603A1
(en)
*
|
2007-12-28 |
2009-07-02 |
Sriram Changali |
Methods of detecting series arcs in electrical signals
|
US8289029B2
(en)
*
|
2008-02-14 |
2012-10-16 |
Mks Instruments, Inc. |
Application of wideband sampling for arc detection with a probabilistic model for quantitatively measuring arc events
|
US8334700B2
(en)
*
|
2008-02-14 |
2012-12-18 |
Mks Instruments, Inc. |
Arc detection
|
US8264237B2
(en)
*
|
2008-02-14 |
2012-09-11 |
Mks Instruments, Inc. |
Application of wideband sampling for arc detection with a probabilistic model for quantitatively measuring arc events
|
US8022718B2
(en)
*
|
2008-02-29 |
2011-09-20 |
Lam Research Corporation |
Method for inspecting electrostatic chucks with Kelvin probe analysis
|
US20090246385A1
(en)
*
|
2008-03-25 |
2009-10-01 |
Tegal Corporation |
Control of crystal orientation and stress in sputter deposited thin films
|
US8808513B2
(en)
*
|
2008-03-25 |
2014-08-19 |
Oem Group, Inc |
Stress adjustment in reactive sputtering
|
US8158017B2
(en)
*
|
2008-05-12 |
2012-04-17 |
Lam Research Corporation |
Detection of arcing events in wafer plasma processing through monitoring of trace gas concentrations
|
US20090308734A1
(en)
*
|
2008-06-17 |
2009-12-17 |
Schneider Automation Inc. |
Apparatus and Method for Wafer Level Arc Detection
|
US9613784B2
(en)
*
|
2008-07-17 |
2017-04-04 |
Mks Instruments, Inc. |
Sputtering system and method including an arc detection
|
US8054591B2
(en)
|
2008-07-24 |
2011-11-08 |
General Electric Company |
Arc detection using discrete wavelet transforms
|
US8044594B2
(en)
*
|
2008-07-31 |
2011-10-25 |
Advanced Energy Industries, Inc. |
Power supply ignition system and method
|
AR073128A1
(en)
*
|
2008-08-26 |
2010-10-13 |
Spx Corp |
DIGITAL OSCILLOSCOPE MODULE
|
AR073129A1
(en)
*
|
2008-08-26 |
2010-10-13 |
Spx Corp |
DIGITAL OSCILLOSCOPE MODULE WITH DETECTION OF FAILURES IN THE RECEPTION OF THE SENAL.
|
MX2011002463A
(en)
*
|
2008-09-19 |
2011-04-05 |
Schweitzer Engineering Lab Inc |
Validation of arc flash detection systems.
|
MX2011002459A
(en)
*
|
2008-09-19 |
2011-06-24 |
Schweitzer Engineering Lab Inc |
Electro-optical radiation collector for arc flash detection.
|
US8451572B2
(en)
*
|
2008-09-19 |
2013-05-28 |
Schweitzer Engineering Laboratories Inc |
Protective device with metering and oscillography
|
EP2327129A4
(en)
*
|
2008-09-19 |
2013-09-04 |
Schweitzer Engineering Lab Inc |
Secure arc flash detection
|
BRPI0918899A2
(en)
|
2008-09-19 |
2017-08-01 |
Schweitzer Engineering Lab Inc |
method for self-testing an electric arc detection device, self-testing electrical arc detection device, and computer readable storage medium
|
US8395078B2
(en)
|
2008-12-05 |
2013-03-12 |
Advanced Energy Industries, Inc |
Arc recovery with over-voltage protection for plasma-chamber power supplies
|
US8815329B2
(en)
*
|
2008-12-05 |
2014-08-26 |
Advanced Energy Industries, Inc. |
Delivered energy compensation during plasma processing
|
US8159793B2
(en)
*
|
2008-12-22 |
2012-04-17 |
General Electric Company |
Arc detection using detailed and approximate coefficients from discrete wavelet transforms
|
US8170816B2
(en)
|
2008-12-29 |
2012-05-01 |
General Electric Company |
Parallel arc detection using discrete wavelet transforms
|
EP2219205B1
(en)
|
2009-02-17 |
2014-06-04 |
Solvix GmbH |
A power supply device for plasma processing
|
US8482375B2
(en)
*
|
2009-05-24 |
2013-07-09 |
Oem Group, Inc. |
Sputter deposition of cermet resistor films with low temperature coefficient of resistance
|
US8440061B2
(en)
*
|
2009-07-20 |
2013-05-14 |
Lam Research Corporation |
System and method for plasma arc detection, isolation and prevention
|
US8552665B2
(en)
|
2010-08-20 |
2013-10-08 |
Advanced Energy Industries, Inc. |
Proactive arc management of a plasma load
|
US8502689B2
(en)
|
2010-09-23 |
2013-08-06 |
Applied Materials, Inc. |
System and method for voltage-based plasma excursion detection
|
US8587321B2
(en)
*
|
2010-09-24 |
2013-11-19 |
Applied Materials, Inc. |
System and method for current-based plasma excursion detection
|
US9438028B2
(en)
|
2012-08-31 |
2016-09-06 |
Schweitzer Engineering Laboratories, Inc. |
Motor relay with integrated arc-flash detection
|
DE102012217497A1
(en)
*
|
2012-09-26 |
2014-03-27 |
Airbus Operations Gmbh |
A method of detecting a noise generating device in an electrical network, an electrical system, and an aircraft
|
DE202013012714U1
(en)
*
|
2012-12-18 |
2018-10-15 |
TRUMPF Hüttinger GmbH + Co. KG |
Power supply system with a power converter
|
DE102012223657B3
(en)
*
|
2012-12-18 |
2014-03-27 |
TRUMPF Hüttinger GmbH + Co. KG |
Power supply system for producing radio frequency signal of power converter, has amplitude data storage unit that stores amplitude data values, and multiplier that multiplies signal data values with amplitude data values
|
DE102012223659B4
(en)
*
|
2012-12-18 |
2016-03-10 |
TRUMPF Hüttinger GmbH + Co. KG |
Arclöschverfahren and power supply system with a power converter
|
WO2014094737A2
(en)
|
2012-12-18 |
2014-06-26 |
TRUMPF Hüttinger GmbH + Co. KG |
Method for producing high-frequency power and power supply system having a power converter for supplying a load with power
|
DE102012223660B4
(en)
*
|
2012-12-18 |
2016-03-03 |
TRUMPF Hüttinger GmbH + Co. KG |
Arclösch method for extinguishing arcs in a plasma chamber of a plasma system and power supply system
|
DE102013110883B3
(en)
|
2013-10-01 |
2015-01-15 |
TRUMPF Hüttinger GmbH + Co. KG |
Apparatus and method for monitoring a discharge in a plasma process
|
EP2905801B1
(en)
|
2014-02-07 |
2019-05-22 |
TRUMPF Huettinger Sp. Z o. o. |
Method of monitoring the discharge in a plasma process and monitoring device for monitoring the discharge in a plasma
|
EP3170011B1
(en)
*
|
2014-07-17 |
2022-08-24 |
Siemens Aktiengesellschaft |
Broken conductor detection method and apparatus
|
CN106093675A
(en)
*
|
2016-06-06 |
2016-11-09 |
国家电网公司 |
A kind of arc photosensor and arc light processing method
|
US10804689B2
(en)
|
2016-11-18 |
2020-10-13 |
Schweitzer Engineering Laboratories, Inc. |
Methods and systems for evaluating arc flash exposure hazard
|
WO2021061684A1
(en)
*
|
2019-09-23 |
2021-04-01 |
Operation Technology, Inc. |
Representation and utilization of constant arc energy or incident energy boundaries in time-current characteristics
|
CN111926308B
(en)
*
|
2020-08-24 |
2022-08-12 |
湖南红太阳光电科技有限公司 |
Method for processing plasma discharge abnormity
|
US11837862B2
(en)
|
2020-10-09 |
2023-12-05 |
Schweitzer Engineering Laboratories, Inc. |
Arc-flash sensor using optical fiber
|
US11425852B2
(en)
|
2020-10-16 |
2022-08-30 |
Verdant Robotics, Inc. |
Autonomous detection and control of vegetation
|
US11399531B1
(en)
|
2021-10-20 |
2022-08-02 |
Verdant Robotics, Inc. |
Precision detection and control of vegetation with real time pose estimation
|
US20230130106A1
(en)
*
|
2021-10-27 |
2023-04-27 |
Applied Materials, Inc. |
Methods and apparatus for processing a substrate
|