WO2003106978A3 - An inspection system and method - Google Patents

An inspection system and method Download PDF

Info

Publication number
WO2003106978A3
WO2003106978A3 PCT/US2003/019064 US0319064W WO03106978A3 WO 2003106978 A3 WO2003106978 A3 WO 2003106978A3 US 0319064 W US0319064 W US 0319064W WO 03106978 A3 WO03106978 A3 WO 03106978A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical path
collimated light
inspection system
light beam
source
Prior art date
Application number
PCT/US2003/019064
Other languages
French (fr)
Other versions
WO2003106978A2 (en
Inventor
Stanley P Johnson
Original Assignee
Stanley P Johnson
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Stanley P Johnson filed Critical Stanley P Johnson
Priority to AU2003243617A priority Critical patent/AU2003243617A1/en
Publication of WO2003106978A2 publication Critical patent/WO2003106978A2/en
Publication of WO2003106978A3 publication Critical patent/WO2003106978A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features

Abstract

An inspection system and a method for using the inspection system, wherein the inspection system includes a collimated light source defining a source optical path, the collimated light source being operable to cause a collimated light beam to propagate along the source optical path, a sensing device defining a sensor optical path, the sensor optical path being substantially perpendicular to the source optical path, a reflecting device disposed within the source optical path to receive the collimated light beam, the reflecting device causing a reflected collimated light beam to propagate along the sensor optical path to the sensing device and a retention mount, the retention mount being disposed within the sensor optical path such that when a component is retained within the retention mount, the component blocks at least a portion of the reflected collimated light beam.
PCT/US2003/019064 2002-06-17 2003-06-13 An inspection system and method WO2003106978A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2003243617A AU2003243617A1 (en) 2002-06-17 2003-06-13 An inspection system and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US38935702P 2002-06-17 2002-06-17
US60/389,357 2002-06-17

Publications (2)

Publication Number Publication Date
WO2003106978A2 WO2003106978A2 (en) 2003-12-24
WO2003106978A3 true WO2003106978A3 (en) 2004-07-22

Family

ID=29736630

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/019064 WO2003106978A2 (en) 2002-06-17 2003-06-13 An inspection system and method

Country Status (3)

Country Link
US (1) US7227163B2 (en)
AU (1) AU2003243617A1 (en)
WO (1) WO2003106978A2 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8035094B2 (en) * 2002-06-17 2011-10-11 Quest Metrology, LLC Methods for measuring at least one physical characteristic of a component
US7745805B2 (en) * 2002-06-17 2010-06-29 Johnson Thread-View Systems Product inspection system and a method for implementing same that incorporates a correction factor
US20100259764A1 (en) * 2003-06-13 2010-10-14 Johnson Stanley P Product inspection system and a method for implementing same
US7128298B1 (en) * 2004-05-12 2006-10-31 Johnson Stanley P Component positioning device
ITBO20050146A1 (en) * 2005-03-14 2006-09-15 Marposs Spa EQUIPMENT AND METHOD FOR THE CONTROL OF MECHANICAL PARTS
US20070193012A1 (en) * 2006-02-22 2007-08-23 Robert Bergman Metal forming process
WO2008002958A2 (en) * 2006-06-27 2008-01-03 Parlour, Barbara, E. Internal and external measuring device
US7633046B2 (en) * 2007-10-23 2009-12-15 Gii Acquisition Llc Method for estimating thread parameters of a part
DE102014106312A1 (en) * 2014-05-06 2015-11-12 Broetje-Automation Gmbh Method for testing a rivet
US11162770B2 (en) 2020-02-27 2021-11-02 Proto Labs, Inc. Methods and systems for an in-line automated inspection of a mechanical part

Citations (1)

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Publication number Priority date Publication date Assignee Title
US6404912B1 (en) * 1998-06-01 2002-06-11 Motorola, Inc. Method and apparatus for visually inspecting an object

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US3941484A (en) * 1974-10-31 1976-03-02 Bai Corporation Non-contact dimensional measurement technique
US4021119A (en) * 1975-06-24 1977-05-03 Honeywell Inc. Position gauge
US4062633A (en) * 1976-09-27 1977-12-13 General Motors Corporation O-ring inspection method and apparatus
US4634273A (en) * 1984-06-08 1987-01-06 Trw Inc. O-ring inspection method
GB2180337A (en) * 1985-09-13 1987-03-25 Tesa Metrology Ltd Optical measurement apparatus
US4644394A (en) * 1985-12-31 1987-02-17 Dale Reeves Apparatus for inspecting an externally threaded surface of an object
DE3607244A1 (en) * 1986-03-05 1987-09-10 Bat Cigarettenfab Gmbh DEVICE FOR DETECTING THE LENGTH EDGES OF A ROD-SHAPED OBJECT
US4872757A (en) * 1988-04-20 1989-10-10 Ball Corporation Optical convex surface profiling and gauging apparatus and method therefor
US5150623A (en) * 1990-07-17 1992-09-29 The Boeing Company Inspection device for flush head bolts and rivets
JPH04105006A (en) * 1990-08-24 1992-04-07 Tokyo Seimitsu Co Ltd Contactless measuring device
GB9107037D0 (en) * 1991-04-04 1991-05-22 Tesa Metrology Ltd Improvements in or relating to electro-optical measurement apparatus
US5521707A (en) * 1991-08-21 1996-05-28 Apeiron, Inc. Laser scanning method and apparatus for rapid precision measurement of thread form
DE4401238C2 (en) * 1994-01-18 1995-10-26 Bmt Gmbh Method and device for measuring eccentric parts of a measuring object
US6055329A (en) * 1994-06-09 2000-04-25 Sherikon, Inc. High speed opto-electronic gage and method for gaging
IT1281546B1 (en) * 1995-04-13 1998-02-18 Marposs Spa OPTOELECTRONIC MEASURING DEVICE FOR THE CONTROL OF LINEAR DIMENSIONS
US6111601A (en) * 1995-12-11 2000-08-29 Adachi; Yoshi Non-contacting laser gauge for qualifying screw fasteners and the like
US6064759A (en) * 1996-11-08 2000-05-16 Buckley; B. Shawn Computer aided inspection machine
DE19738977A1 (en) * 1997-09-05 1999-03-18 Blum Novotest Gmbh Measuring device for scanning dimensions, in particular diameters
US5914784A (en) * 1997-09-30 1999-06-22 International Business Machines Corporation Measurement method for linewidth metrology
US6172748B1 (en) * 1998-12-28 2001-01-09 Applied Vision Machine vision system and method for non-contact container inspection

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6404912B1 (en) * 1998-06-01 2002-06-11 Motorola, Inc. Method and apparatus for visually inspecting an object

Also Published As

Publication number Publication date
WO2003106978A2 (en) 2003-12-24
US20040036878A1 (en) 2004-02-26
AU2003243617A8 (en) 2003-12-31
US7227163B2 (en) 2007-06-05
AU2003243617A1 (en) 2003-12-31

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