WO2004019018A3 - Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses - Google Patents
Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses Download PDFInfo
- Publication number
- WO2004019018A3 WO2004019018A3 PCT/US2003/026311 US0326311W WO2004019018A3 WO 2004019018 A3 WO2004019018 A3 WO 2004019018A3 US 0326311 W US0326311 W US 0326311W WO 2004019018 A3 WO2004019018 A3 WO 2004019018A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- profiles
- function
- fourier transform
- samples
- physical function
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 2
- 230000002123 temporal effect Effects 0.000 title abstract 2
- 239000002131 composite material Substances 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4788—Diffraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
- G01N2021/4723—Scanning scatter angles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4735—Solid samples, e.g. paper, glass
Abstract
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03793270A EP1530712B1 (en) | 2002-08-21 | 2003-08-21 | Method of measuring optical nonlinearity spatial profiles of samples |
DE60334911T DE60334911D1 (en) | 2002-08-21 | 2003-08-21 | Method for measuring optical nonlinearity space profiles of samples |
AT03793270T ATE487934T1 (en) | 2002-08-21 | 2003-08-21 | METHOD FOR MEASURING OPTICAL NICHOLARITY SPACE PROFILES OF SAMPLES |
AU2003265582A AU2003265582A1 (en) | 2002-08-21 | 2003-08-21 | Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses |
EP10010839.8A EP2278302B1 (en) | 2002-08-21 | 2003-08-21 | Method of measuring temporal profiles of optical pulses |
CA002495062A CA2495062A1 (en) | 2002-08-21 | 2003-08-21 | Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US40540502P | 2002-08-21 | 2002-08-21 | |
US60/405,405 | 2002-08-21 | ||
US10/357,275 | 2003-01-31 | ||
US10/357,275 US7133134B2 (en) | 2002-08-21 | 2003-01-31 | Method of measuring a physical function using a symmetric composite function |
US10/378,591 | 2003-03-03 | ||
US10/378,591 US6856393B2 (en) | 2002-08-21 | 2003-03-03 | Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004019018A2 WO2004019018A2 (en) | 2004-03-04 |
WO2004019018A3 true WO2004019018A3 (en) | 2004-07-29 |
Family
ID=31950529
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/026311 WO2004019018A2 (en) | 2002-08-21 | 2003-08-21 | Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses |
Country Status (5)
Country | Link |
---|---|
US (5) | US6856393B2 (en) |
EP (1) | EP1530712B1 (en) |
AU (1) | AU2003265582A1 (en) |
CA (1) | CA2495062A1 (en) |
WO (1) | WO2004019018A2 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6856393B2 (en) | 2002-08-21 | 2005-02-15 | The Board Of Trustees Of The Leland Stanford University | Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function |
US7133134B2 (en) * | 2002-08-21 | 2006-11-07 | The Board Of Trustees Of The Leland Stanford Junior University | Method of measuring a physical function using a symmetric composite function |
US7315636B2 (en) * | 2003-09-18 | 2008-01-01 | Accuray, Inc. | Generation of reconstructed images |
US7259868B2 (en) * | 2003-11-25 | 2007-08-21 | The Board Of Trustees Of The Leland Stanford Junior University | Method for determining the optical nonlinearity profile of a material |
US8194242B2 (en) * | 2005-07-29 | 2012-06-05 | Asml Netherlands B.V. | Substrate distortion measurement |
GB0717800D0 (en) * | 2007-09-12 | 2007-10-24 | Mitsubishi Electric Inf Tech | Pulse analyzer |
CN101910864B (en) * | 2007-11-12 | 2013-04-24 | 美国亚德诺半导体公司 | Methods and apparatus for generating and processing transmitter signals |
FR2984503B1 (en) * | 2011-12-16 | 2014-01-17 | Commissariat Energie Atomique | METHOD FOR RECONSTRUCTING OPTICAL PROPERTIES OF A DIFFUSING MEDIUM USING A COMBINATION OF A PLURALITY OF MELLIN-LAPLACE TRANSFORMS OF A SIZE INCLUDING A TIME DISTRIBUTION OF A RECEIVED SIGNAL, AND ASSOCIATED RECONSTRUCTION SYSTEM |
US9135682B2 (en) * | 2013-03-15 | 2015-09-15 | Indian Institute Of Technology Delhi | Image recovery from single shot digital hologram |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4792230A (en) * | 1986-09-08 | 1988-12-20 | Nippon Telegraph And Telephone Corporation | Method and apparatus for measuring ultrashort optical pulses |
US5530544A (en) * | 1992-10-26 | 1996-06-25 | Sandia Corporation | Method and apparatus for measuring the intensity and phase of one or more ultrashort light pulses and for measuring optical properties of materials |
JP2000329618A (en) * | 1999-05-19 | 2000-11-30 | Nippon Telegr & Teleph Corp <Ntt> | Method and apparatus for measuring time waveform of light signal field |
JP2001083015A (en) * | 1999-09-14 | 2001-03-30 | Nippon Telegr & Teleph Corp <Ntt> | Method and device for measuring time wabeform of optical signal electric field |
US6456380B1 (en) * | 1999-05-19 | 2002-09-24 | Nippon Telegraph And Telephone Corporation | Method and apparatus for measuring waveform of optical signal |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5038342B2 (en) | 1971-12-01 | 1975-12-09 | ||
US4778236A (en) | 1984-09-14 | 1988-10-18 | Canon Kabushiki Kaisha | Thin film optical element |
US5053696A (en) * | 1985-03-08 | 1991-10-01 | The University Of Rochester | Electro-electron oscilloscope |
US4674824A (en) * | 1985-06-14 | 1987-06-23 | Stanford University | System for enhancement of optical features |
US5368782A (en) | 1987-07-29 | 1994-11-29 | Toray Industries, Inc. | Method of operating third-order nonlinear optical element |
US5071249A (en) * | 1988-10-05 | 1991-12-10 | Hamamatsu Photonics K.K. | Light waveform measuring apparatus |
US4985178A (en) | 1988-11-22 | 1991-01-15 | E. I. Du Pont De Nemours And Company | Nonlinear optical device from 3-methyl-4-methoxy-4'-nitrostilbene |
DE68918866T2 (en) | 1989-06-27 | 1995-02-16 | Toray Industries | SECOND-ORDER NON-LINEAR OPTICAL ELEMENT. |
US5086239A (en) * | 1990-02-22 | 1992-02-04 | E. I. Du Pont De Nemours And Company | Nonlinear optical elements containing j-aggregates of aromatic dyes |
US5434699A (en) | 1991-01-23 | 1995-07-18 | Yeda Research And Development Co., Ltd. | Method and system for producing second order nonlinear optical effects using in-plane poled polymer films |
US5262890A (en) | 1991-01-23 | 1993-11-16 | Yeda Research And Development Co., Ltd. | Method and system for producing second order nonlinear optical effects |
US5333231A (en) | 1991-05-02 | 1994-07-26 | Ricoh Company, Ltd. | Wavelength conversion element |
US5194918A (en) * | 1991-05-14 | 1993-03-16 | The Board Of Trustees Of The Leland Stanford Junior University | Method of providing images of surfaces with a correlation microscope by transforming interference signals |
US5239407A (en) | 1991-09-27 | 1993-08-24 | University Of New Mexico | Method and apparatus for creating large second-order nonlinearities in fused silica |
US5247601A (en) | 1991-09-27 | 1993-09-21 | Myers Richard A | Arrangement for producing large second-order optical nonlinearities in a waveguide structure including amorphous SiO2 |
US5309532A (en) | 1991-12-02 | 1994-05-03 | The Regents Of The University Of California | Electro-optic intensity modulator with improved linearity |
DE4202185A1 (en) * | 1992-01-28 | 1993-07-29 | Hilti Ag | METHOD FOR FIBER OPTICAL FORCE MEASUREMENT |
JPH05232384A (en) * | 1992-02-18 | 1993-09-10 | Olympus Optical Co Ltd | Interference microscope |
JPH074922A (en) | 1993-06-21 | 1995-01-10 | Jasco Corp | Apparatus and method for measurement of film thickness of semiconductor multilayer thin film |
US5519802A (en) | 1994-05-09 | 1996-05-21 | Deacon Research | Method for making devices having a pattern poled structure and pattern poled structure devices |
JPH08304430A (en) * | 1995-05-12 | 1996-11-22 | Canon Inc | Frequency shifter and optical displacement measuring apparatus using it |
US6150630A (en) | 1996-01-11 | 2000-11-21 | The Regents Of The University Of California | Laser machining of explosives |
IL125303A (en) | 1996-01-12 | 2001-08-08 | Cobolt Ab | Method and arrangement for poling of optical crystals |
US6043884A (en) * | 1997-08-08 | 2000-03-28 | Bio-Rad Laboratories, Inc. | DSP technique for photoacoustic spectroscopy (PAS) sample pulse response for depth profiling |
US6650466B1 (en) | 1999-08-27 | 2003-11-18 | Frank Wise | High-energy pulse compression using phase shifts produced by the cascade quadriatic nonlinearity |
US6479822B1 (en) | 2000-07-07 | 2002-11-12 | Massachusetts Institute Of Technology | System and Method for terahertz frequency measurements |
CN2520515Y (en) | 2002-01-18 | 2002-11-13 | 玉晶光电(厦门)有限公司 | Video lens |
US7133134B2 (en) | 2002-08-21 | 2006-11-07 | The Board Of Trustees Of The Leland Stanford Junior University | Method of measuring a physical function using a symmetric composite function |
US6856393B2 (en) | 2002-08-21 | 2005-02-15 | The Board Of Trustees Of The Leland Stanford University | Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function |
US7259868B2 (en) | 2003-11-25 | 2007-08-21 | The Board Of Trustees Of The Leland Stanford Junior University | Method for determining the optical nonlinearity profile of a material |
-
2003
- 2003-03-03 US US10/378,591 patent/US6856393B2/en not_active Expired - Lifetime
- 2003-08-21 AU AU2003265582A patent/AU2003265582A1/en not_active Abandoned
- 2003-08-21 EP EP03793270A patent/EP1530712B1/en not_active Expired - Lifetime
- 2003-08-21 US US10/645,331 patent/US7050169B2/en not_active Expired - Lifetime
- 2003-08-21 WO PCT/US2003/026311 patent/WO2004019018A2/en not_active Application Discontinuation
- 2003-08-21 CA CA002495062A patent/CA2495062A1/en not_active Abandoned
-
2006
- 2006-02-16 US US11/355,614 patent/US7236246B2/en not_active Expired - Lifetime
- 2006-02-16 US US11/356,275 patent/US7236247B2/en not_active Expired - Lifetime
-
2007
- 2007-05-10 US US11/747,177 patent/US7365851B2/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4792230A (en) * | 1986-09-08 | 1988-12-20 | Nippon Telegraph And Telephone Corporation | Method and apparatus for measuring ultrashort optical pulses |
US5530544A (en) * | 1992-10-26 | 1996-06-25 | Sandia Corporation | Method and apparatus for measuring the intensity and phase of one or more ultrashort light pulses and for measuring optical properties of materials |
JP2000329618A (en) * | 1999-05-19 | 2000-11-30 | Nippon Telegr & Teleph Corp <Ntt> | Method and apparatus for measuring time waveform of light signal field |
US6456380B1 (en) * | 1999-05-19 | 2002-09-24 | Nippon Telegraph And Telephone Corporation | Method and apparatus for measuring waveform of optical signal |
JP2001083015A (en) * | 1999-09-14 | 2001-03-30 | Nippon Telegr & Teleph Corp <Ntt> | Method and device for measuring time wabeform of optical signal electric field |
Non-Patent Citations (4)
Title |
---|
OZCAN A ET AL: "INVERSE FOURIER TRANSFORM TECHNIQUE TO DETERMINE SECOND-ORDER OPTICAL NONLINEARITY SPATIAL PROFILES", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 82, no. 9, 3 March 2003 (2003-03-03), pages 1362 - 1364, XP001163010, ISSN: 0003-6951 * |
QIU M ET AL.: "Erratum", APPLIED PHYSICS LETTERS, vol. 77, no. 23, 4 December 2000 (2000-12-04), USA, pages 3863 * |
QIU M, VILASECA R, BOTEY M, SELLARÈS J, PI F, AND ORRIOLS G: "Double fitting of Maker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica", APPLIED PHYSICS LETTERS, vol. 76, no. 23, 5 June 2000 (2000-06-05), USA, pages 3346 - 3348, XP002266762 * |
RAMAN KASHYAP ET AL: "PHASE-MATCHED SECOND-HARMONIC GENERATION BY PERIODIC POLING OF FUSED SILICA", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 64, no. 11, 14 March 1994 (1994-03-14), pages 1332 - 1334, XP000434288, ISSN: 0003-6951 * |
Also Published As
Publication number | Publication date |
---|---|
US20040044714A1 (en) | 2004-03-04 |
US6856393B2 (en) | 2005-02-15 |
EP1530712A2 (en) | 2005-05-18 |
AU2003265582A1 (en) | 2004-03-11 |
US20070211253A1 (en) | 2007-09-13 |
US20060132783A1 (en) | 2006-06-22 |
WO2004019018A2 (en) | 2004-03-04 |
US7365851B2 (en) | 2008-04-29 |
EP1530712B1 (en) | 2010-11-10 |
US20040133614A1 (en) | 2004-07-08 |
CA2495062A1 (en) | 2004-03-04 |
US20060139645A1 (en) | 2006-06-29 |
US7050169B2 (en) | 2006-05-23 |
US7236246B2 (en) | 2007-06-26 |
AU2003265582A8 (en) | 2004-03-11 |
US7236247B2 (en) | 2007-06-26 |
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