WO2004019018A3 - Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses - Google Patents

Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses Download PDF

Info

Publication number
WO2004019018A3
WO2004019018A3 PCT/US2003/026311 US0326311W WO2004019018A3 WO 2004019018 A3 WO2004019018 A3 WO 2004019018A3 US 0326311 W US0326311 W US 0326311W WO 2004019018 A3 WO2004019018 A3 WO 2004019018A3
Authority
WO
WIPO (PCT)
Prior art keywords
profiles
function
fourier transform
samples
physical function
Prior art date
Application number
PCT/US2003/026311
Other languages
French (fr)
Other versions
WO2004019018A2 (en
Inventor
Aydogan Ozcan
Michel J F Digonnet
Gordon S Kino
Original Assignee
Univ Leland Stanford Junior
Aydogan Ozcan
Michel J F Digonnet
Gordon S Kino
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/357,275 external-priority patent/US7133134B2/en
Application filed by Univ Leland Stanford Junior, Aydogan Ozcan, Michel J F Digonnet, Gordon S Kino filed Critical Univ Leland Stanford Junior
Priority to EP03793270A priority Critical patent/EP1530712B1/en
Priority to DE60334911T priority patent/DE60334911D1/en
Priority to AT03793270T priority patent/ATE487934T1/en
Priority to AU2003265582A priority patent/AU2003265582A1/en
Priority to EP10010839.8A priority patent/EP2278302B1/en
Priority to CA002495062A priority patent/CA2495062A1/en
Publication of WO2004019018A2 publication Critical patent/WO2004019018A2/en
Publication of WO2004019018A3 publication Critical patent/WO2004019018A3/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4788Diffraction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4711Multiangle measurement
    • G01N2021/4723Scanning scatter angles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4735Solid samples, e.g. paper, glass

Abstract

A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.
PCT/US2003/026311 2002-08-21 2003-08-21 Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses WO2004019018A2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
EP03793270A EP1530712B1 (en) 2002-08-21 2003-08-21 Method of measuring optical nonlinearity spatial profiles of samples
DE60334911T DE60334911D1 (en) 2002-08-21 2003-08-21 Method for measuring optical nonlinearity space profiles of samples
AT03793270T ATE487934T1 (en) 2002-08-21 2003-08-21 METHOD FOR MEASURING OPTICAL NICHOLARITY SPACE PROFILES OF SAMPLES
AU2003265582A AU2003265582A1 (en) 2002-08-21 2003-08-21 Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses
EP10010839.8A EP2278302B1 (en) 2002-08-21 2003-08-21 Method of measuring temporal profiles of optical pulses
CA002495062A CA2495062A1 (en) 2002-08-21 2003-08-21 Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US40540502P 2002-08-21 2002-08-21
US60/405,405 2002-08-21
US10/357,275 2003-01-31
US10/357,275 US7133134B2 (en) 2002-08-21 2003-01-31 Method of measuring a physical function using a symmetric composite function
US10/378,591 2003-03-03
US10/378,591 US6856393B2 (en) 2002-08-21 2003-03-03 Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function

Publications (2)

Publication Number Publication Date
WO2004019018A2 WO2004019018A2 (en) 2004-03-04
WO2004019018A3 true WO2004019018A3 (en) 2004-07-29

Family

ID=31950529

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/026311 WO2004019018A2 (en) 2002-08-21 2003-08-21 Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses

Country Status (5)

Country Link
US (5) US6856393B2 (en)
EP (1) EP1530712B1 (en)
AU (1) AU2003265582A1 (en)
CA (1) CA2495062A1 (en)
WO (1) WO2004019018A2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6856393B2 (en) 2002-08-21 2005-02-15 The Board Of Trustees Of The Leland Stanford University Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function
US7133134B2 (en) * 2002-08-21 2006-11-07 The Board Of Trustees Of The Leland Stanford Junior University Method of measuring a physical function using a symmetric composite function
US7315636B2 (en) * 2003-09-18 2008-01-01 Accuray, Inc. Generation of reconstructed images
US7259868B2 (en) * 2003-11-25 2007-08-21 The Board Of Trustees Of The Leland Stanford Junior University Method for determining the optical nonlinearity profile of a material
US8194242B2 (en) * 2005-07-29 2012-06-05 Asml Netherlands B.V. Substrate distortion measurement
GB0717800D0 (en) * 2007-09-12 2007-10-24 Mitsubishi Electric Inf Tech Pulse analyzer
CN101910864B (en) * 2007-11-12 2013-04-24 美国亚德诺半导体公司 Methods and apparatus for generating and processing transmitter signals
FR2984503B1 (en) * 2011-12-16 2014-01-17 Commissariat Energie Atomique METHOD FOR RECONSTRUCTING OPTICAL PROPERTIES OF A DIFFUSING MEDIUM USING A COMBINATION OF A PLURALITY OF MELLIN-LAPLACE TRANSFORMS OF A SIZE INCLUDING A TIME DISTRIBUTION OF A RECEIVED SIGNAL, AND ASSOCIATED RECONSTRUCTION SYSTEM
US9135682B2 (en) * 2013-03-15 2015-09-15 Indian Institute Of Technology Delhi Image recovery from single shot digital hologram

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4792230A (en) * 1986-09-08 1988-12-20 Nippon Telegraph And Telephone Corporation Method and apparatus for measuring ultrashort optical pulses
US5530544A (en) * 1992-10-26 1996-06-25 Sandia Corporation Method and apparatus for measuring the intensity and phase of one or more ultrashort light pulses and for measuring optical properties of materials
JP2000329618A (en) * 1999-05-19 2000-11-30 Nippon Telegr & Teleph Corp <Ntt> Method and apparatus for measuring time waveform of light signal field
JP2001083015A (en) * 1999-09-14 2001-03-30 Nippon Telegr & Teleph Corp <Ntt> Method and device for measuring time wabeform of optical signal electric field
US6456380B1 (en) * 1999-05-19 2002-09-24 Nippon Telegraph And Telephone Corporation Method and apparatus for measuring waveform of optical signal

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5038342B2 (en) 1971-12-01 1975-12-09
US4778236A (en) 1984-09-14 1988-10-18 Canon Kabushiki Kaisha Thin film optical element
US5053696A (en) * 1985-03-08 1991-10-01 The University Of Rochester Electro-electron oscilloscope
US4674824A (en) * 1985-06-14 1987-06-23 Stanford University System for enhancement of optical features
US5368782A (en) 1987-07-29 1994-11-29 Toray Industries, Inc. Method of operating third-order nonlinear optical element
US5071249A (en) * 1988-10-05 1991-12-10 Hamamatsu Photonics K.K. Light waveform measuring apparatus
US4985178A (en) 1988-11-22 1991-01-15 E. I. Du Pont De Nemours And Company Nonlinear optical device from 3-methyl-4-methoxy-4'-nitrostilbene
DE68918866T2 (en) 1989-06-27 1995-02-16 Toray Industries SECOND-ORDER NON-LINEAR OPTICAL ELEMENT.
US5086239A (en) * 1990-02-22 1992-02-04 E. I. Du Pont De Nemours And Company Nonlinear optical elements containing j-aggregates of aromatic dyes
US5434699A (en) 1991-01-23 1995-07-18 Yeda Research And Development Co., Ltd. Method and system for producing second order nonlinear optical effects using in-plane poled polymer films
US5262890A (en) 1991-01-23 1993-11-16 Yeda Research And Development Co., Ltd. Method and system for producing second order nonlinear optical effects
US5333231A (en) 1991-05-02 1994-07-26 Ricoh Company, Ltd. Wavelength conversion element
US5194918A (en) * 1991-05-14 1993-03-16 The Board Of Trustees Of The Leland Stanford Junior University Method of providing images of surfaces with a correlation microscope by transforming interference signals
US5239407A (en) 1991-09-27 1993-08-24 University Of New Mexico Method and apparatus for creating large second-order nonlinearities in fused silica
US5247601A (en) 1991-09-27 1993-09-21 Myers Richard A Arrangement for producing large second-order optical nonlinearities in a waveguide structure including amorphous SiO2
US5309532A (en) 1991-12-02 1994-05-03 The Regents Of The University Of California Electro-optic intensity modulator with improved linearity
DE4202185A1 (en) * 1992-01-28 1993-07-29 Hilti Ag METHOD FOR FIBER OPTICAL FORCE MEASUREMENT
JPH05232384A (en) * 1992-02-18 1993-09-10 Olympus Optical Co Ltd Interference microscope
JPH074922A (en) 1993-06-21 1995-01-10 Jasco Corp Apparatus and method for measurement of film thickness of semiconductor multilayer thin film
US5519802A (en) 1994-05-09 1996-05-21 Deacon Research Method for making devices having a pattern poled structure and pattern poled structure devices
JPH08304430A (en) * 1995-05-12 1996-11-22 Canon Inc Frequency shifter and optical displacement measuring apparatus using it
US6150630A (en) 1996-01-11 2000-11-21 The Regents Of The University Of California Laser machining of explosives
IL125303A (en) 1996-01-12 2001-08-08 Cobolt Ab Method and arrangement for poling of optical crystals
US6043884A (en) * 1997-08-08 2000-03-28 Bio-Rad Laboratories, Inc. DSP technique for photoacoustic spectroscopy (PAS) sample pulse response for depth profiling
US6650466B1 (en) 1999-08-27 2003-11-18 Frank Wise High-energy pulse compression using phase shifts produced by the cascade quadriatic nonlinearity
US6479822B1 (en) 2000-07-07 2002-11-12 Massachusetts Institute Of Technology System and Method for terahertz frequency measurements
CN2520515Y (en) 2002-01-18 2002-11-13 玉晶光电(厦门)有限公司 Video lens
US7133134B2 (en) 2002-08-21 2006-11-07 The Board Of Trustees Of The Leland Stanford Junior University Method of measuring a physical function using a symmetric composite function
US6856393B2 (en) 2002-08-21 2005-02-15 The Board Of Trustees Of The Leland Stanford University Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function
US7259868B2 (en) 2003-11-25 2007-08-21 The Board Of Trustees Of The Leland Stanford Junior University Method for determining the optical nonlinearity profile of a material

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4792230A (en) * 1986-09-08 1988-12-20 Nippon Telegraph And Telephone Corporation Method and apparatus for measuring ultrashort optical pulses
US5530544A (en) * 1992-10-26 1996-06-25 Sandia Corporation Method and apparatus for measuring the intensity and phase of one or more ultrashort light pulses and for measuring optical properties of materials
JP2000329618A (en) * 1999-05-19 2000-11-30 Nippon Telegr & Teleph Corp <Ntt> Method and apparatus for measuring time waveform of light signal field
US6456380B1 (en) * 1999-05-19 2002-09-24 Nippon Telegraph And Telephone Corporation Method and apparatus for measuring waveform of optical signal
JP2001083015A (en) * 1999-09-14 2001-03-30 Nippon Telegr & Teleph Corp <Ntt> Method and device for measuring time wabeform of optical signal electric field

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
OZCAN A ET AL: "INVERSE FOURIER TRANSFORM TECHNIQUE TO DETERMINE SECOND-ORDER OPTICAL NONLINEARITY SPATIAL PROFILES", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 82, no. 9, 3 March 2003 (2003-03-03), pages 1362 - 1364, XP001163010, ISSN: 0003-6951 *
QIU M ET AL.: "Erratum", APPLIED PHYSICS LETTERS, vol. 77, no. 23, 4 December 2000 (2000-12-04), USA, pages 3863 *
QIU M, VILASECA R, BOTEY M, SELLARÈS J, PI F, AND ORRIOLS G: "Double fitting of Maker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica", APPLIED PHYSICS LETTERS, vol. 76, no. 23, 5 June 2000 (2000-06-05), USA, pages 3346 - 3348, XP002266762 *
RAMAN KASHYAP ET AL: "PHASE-MATCHED SECOND-HARMONIC GENERATION BY PERIODIC POLING OF FUSED SILICA", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 64, no. 11, 14 March 1994 (1994-03-14), pages 1332 - 1334, XP000434288, ISSN: 0003-6951 *

Also Published As

Publication number Publication date
US20040044714A1 (en) 2004-03-04
US6856393B2 (en) 2005-02-15
EP1530712A2 (en) 2005-05-18
AU2003265582A1 (en) 2004-03-11
US20070211253A1 (en) 2007-09-13
US20060132783A1 (en) 2006-06-22
WO2004019018A2 (en) 2004-03-04
US7365851B2 (en) 2008-04-29
EP1530712B1 (en) 2010-11-10
US20040133614A1 (en) 2004-07-08
CA2495062A1 (en) 2004-03-04
US20060139645A1 (en) 2006-06-29
US7050169B2 (en) 2006-05-23
US7236246B2 (en) 2007-06-26
AU2003265582A8 (en) 2004-03-11
US7236247B2 (en) 2007-06-26

Similar Documents

Publication Publication Date Title
WO2005083445A3 (en) Methods for determining the effects of products on epithelial tissue
EP1566657A3 (en) Collision detection system and method of estimating target crossing location
ATE522832T1 (en) METHOD AND SYSTEMS FOR PROCESSING MICRO-EISMIC DATA
AU2003244342A1 (en) Biosensor, magnetic molecule measurement method, and measurement object measuring method
WO2006036847A3 (en) Measurement of the dynamic characteristics of interferometric modulators
BR0311823B1 (en) Method of determining at least one training parameter of interest.
MXPA05011970A (en) System and method for measurement report time stamping to ensure reference time correctness.
WO2008024948A3 (en) Apparatus and methods for enhancing optical coherence tomography imaging using volumetric filtering techniques
DE602004017170D1 (en) OPENING TEST PLATE USING OPENING METHOD
WO2004112576A3 (en) Systems and methods for prediction of objective visual acuity based on wavefront measurements
AU2003270334A1 (en) Method for producing steel with retained austenite
WO2006020341A3 (en) Characterization of materials with optically shaped acoustic waveforms
SG138497A1 (en) Method, device and system for determining direction of arrival of signal
WO2004019018A3 (en) Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses
WO2006102225A3 (en) Methods and apparatuses of measuring impulse noise parameters in multi-carrier communication systems
WO2007087560A3 (en) Stroke inducing and monitoring system and method for using the same
WO2005015332A3 (en) Virtual load monitoring system and method
WO2007059409A3 (en) Determining frequency components of jitter
AU2003286179A1 (en) Method and device for optical form measurement and/or estimation
DE602004028394D1 (en) SIGNAL INTERFERENCE MEASUREMENT
DE60231227D1 (en) RAIN ESTIMATION TECHNOLOGY BY RADAR WITH NEGLIGENT WEAKENING
DE50204287D1 (en) DEVICE FOR ATTACHING SEALING PROFILES TO VEHICLE DOORS
AU2003224336A1 (en) Methods for evaluating stroke or cardiac ischemia by nucleic acid detection
DE602006008902D1 (en) METHOD FOR DETERMINING THE PHASE AND STRENGTH OF A WEAK, ULTRA-SHORT OPTICAL IMPULSE BY MEANS OF A STRONGER, UNKNOWN IMPULSE
WO2004015420A8 (en) Method for diagnosing multiple sclerosis

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
ENP Entry into the national phase

Ref document number: 2495062

Country of ref document: CA

WWE Wipo information: entry into national phase

Ref document number: 2003793270

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 2003793270

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: JP

WWW Wipo information: withdrawn in national office

Country of ref document: JP