WO2004030040A3 - Method and apparatus for shielding an integrated circuit from radiation - Google Patents

Method and apparatus for shielding an integrated circuit from radiation Download PDF

Info

Publication number
WO2004030040A3
WO2004030040A3 PCT/US2003/030245 US0330245W WO2004030040A3 WO 2004030040 A3 WO2004030040 A3 WO 2004030040A3 US 0330245 W US0330245 W US 0330245W WO 2004030040 A3 WO2004030040 A3 WO 2004030040A3
Authority
WO
WIPO (PCT)
Prior art keywords
circuit device
radiation
shielding
coupled
electronic circuit
Prior art date
Application number
PCT/US2003/030245
Other languages
French (fr)
Other versions
WO2004030040A2 (en
Inventor
Larry L Longden
Janet Patterson
Original Assignee
Maxwell Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maxwell Technologies Inc filed Critical Maxwell Technologies Inc
Priority to ES03798732.8T priority Critical patent/ES2674344T3/en
Priority to EP03798732.8A priority patent/EP1547128B1/en
Priority to AU2003276938A priority patent/AU2003276938A1/en
Publication of WO2004030040A2 publication Critical patent/WO2004030040A2/en
Publication of WO2004030040A3 publication Critical patent/WO2004030040A3/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/552Protection against radiation, e.g. light or electromagnetic waves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/05599Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8538Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/85399Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01077Iridium [Ir]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/15165Monolayer substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

Abstract

A radiation shielding integrated circuit device comprising an x-ray shielding layer for shielding an electronic circuit device from receiving an amount of x-rays greater than the total dose tole rance of the electronic circuit device; a base coupled to the x-ray shielding layer; a radiation shielding top coupled to the base; a radiation shielding bottom coupled to the base; and the elec tronic circuit device coupled to the x-ray shielding layer; wherein the electronic circuit device is shielded from receiving an amount of radiation greater than a total dose tolerance of the electronic circuit device.
PCT/US2003/030245 2002-09-25 2003-09-24 Method and apparatus for shielding an integrated circuit from radiation WO2004030040A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
ES03798732.8T ES2674344T3 (en) 2002-09-25 2003-09-24 Method and apparatus for shielding an integrated radiation circuit
EP03798732.8A EP1547128B1 (en) 2002-09-25 2003-09-24 Method and apparatus for shielding an integrated circuit from radiation
AU2003276938A AU2003276938A1 (en) 2002-09-25 2003-09-24 Method and apparatus for shielding an integrated circuit from radiation

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/065,209 US7382043B2 (en) 2002-09-25 2002-09-25 Method and apparatus for shielding an integrated circuit from radiation
US10/065,209 2002-09-25

Publications (2)

Publication Number Publication Date
WO2004030040A2 WO2004030040A2 (en) 2004-04-08
WO2004030040A3 true WO2004030040A3 (en) 2004-07-01

Family

ID=31990010

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/030245 WO2004030040A2 (en) 2002-09-25 2003-09-24 Method and apparatus for shielding an integrated circuit from radiation

Country Status (5)

Country Link
US (1) US7382043B2 (en)
EP (2) EP2270486B1 (en)
AU (1) AU2003276938A1 (en)
ES (2) ES2674344T3 (en)
WO (1) WO2004030040A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8018739B2 (en) 2003-07-16 2011-09-13 Maxwell Technologies, LLC Apparatus for shielding integrated circuit devices

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6613978B2 (en) * 1993-06-18 2003-09-02 Maxwell Technologies, Inc. Radiation shielding of three dimensional multi-chip modules
US7327015B2 (en) * 2004-09-20 2008-02-05 Advanced Semiconductor Engineering, Inc. Semiconductor device package
JP2006237390A (en) * 2005-02-25 2006-09-07 Fuji Photo Film Co Ltd Ic and wireless ic tag
US9205182B2 (en) * 2005-03-31 2015-12-08 Medtronic, Inc. Methods and apparatus for reducing deleterious effects of x-ray radiation upon implantable medical device circuitry
DE102005025693B4 (en) 2005-06-04 2009-06-18 Forschungszentrum Karlsruhe Gmbh Process for producing an organometallic layer
KR100782774B1 (en) * 2006-05-25 2007-12-05 삼성전기주식회사 System in package module
US8154881B2 (en) * 2006-11-13 2012-04-10 Telecommunication Systems, Inc. Radiation-shielded semiconductor assembly
US7528790B2 (en) * 2007-06-12 2009-05-05 Ethertronics, Inc. System and method for preventing copying of electronic component designs
US8533853B2 (en) 2009-06-12 2013-09-10 Telecommunication Systems, Inc. Location sensitive solid state drive
EP2790132A3 (en) * 2009-09-24 2014-10-29 Terrara Code Research Institute, Inc. RFID tag
TWM409527U (en) * 2011-02-23 2011-08-11 Azurewave Technologies Inc Forming integrated circuit module
US9209138B2 (en) * 2013-12-09 2015-12-08 Aeroflex Colorado Springs, Inc. Integrated circuit shielding technique utilizing stacked die technology incorporating top and bottom nickel-iron alloy shields having a low coefficient of thermal expansion
CN105047648B (en) * 2015-06-23 2017-09-15 上海航天电子通讯设备研究所 A kind of system-in-package structure and method for packing
JP6829259B2 (en) * 2016-02-18 2021-02-10 ニンボー サニー オプテック カンパニー,リミテッド Integrated packaging process-based camera module, its integrated base parts, and how to manufacture them
WO2018236902A1 (en) 2017-06-20 2018-12-27 Viasat, Inc. Antenna array radiation shielding
KR102487841B1 (en) * 2018-03-14 2023-01-11 삼성전자주식회사 Semiconductor package
EP3891793A4 (en) 2018-12-06 2022-10-05 Analog Devices, Inc. Integrated device packages with passive device assemblies
US11664340B2 (en) 2020-07-13 2023-05-30 Analog Devices, Inc. Negative fillet for mounting an integrated device die to a carrier

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4922754A (en) * 1989-03-17 1990-05-08 Kennametal Inc. Acoustic emission transducer and mounting adapter for monitoring metalcutting tools
US5992237A (en) * 1997-07-22 1999-11-30 Skf Condition Monitoring, Inc. Digital vibration coupling stud

Family Cites Families (129)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL157456B (en) * 1968-07-30 1978-07-17 Philips Nv SEMI-CONDUCTOR DEVICE IN AN INSULATING PLASTIC COVER.
US3771025A (en) * 1969-10-02 1973-11-06 Gen Electric Semiconductor device including low impedance connections
US3828425A (en) * 1970-10-16 1974-08-13 Texas Instruments Inc Method for making semiconductor packaged devices and assemblies
US3706840A (en) * 1971-05-10 1972-12-19 Intersil Inc Semiconductor device packaging
US3895143A (en) * 1973-03-16 1975-07-15 Nicolet Ind Inc Metal-fiber-latex-containing sheet materials
US3914858A (en) * 1974-08-23 1975-10-28 Nitto Electric Ind Co Method of making sealed cavity molded semiconductor devices
US4167647A (en) * 1974-10-02 1979-09-11 Santa Barbara Research Center Hybrid microelectronic circuit package
US3933530A (en) * 1975-01-28 1976-01-20 Rca Corporation Method of radiation hardening and gettering semiconductor devices
FR2305855A1 (en) * 1975-03-28 1976-10-22 Westinghouse Electric Corp TRANSISTOR MNOS A DRAIN-SOURCE PROTECTED AGAINST RADIATION
US4014772A (en) * 1975-04-24 1977-03-29 Rca Corporation Method of radiation hardening semiconductor devices
JPS52120768A (en) * 1976-04-05 1977-10-11 Nec Corp Semiconductor device
US4089575A (en) * 1976-09-27 1978-05-16 Amp Incorporated Connector for connecting a circuit element to the surface of a substrate
US4100675A (en) * 1976-11-01 1978-07-18 Mansol Ceramics Company Novel method and apparatus for hermetic encapsulation for integrated circuits and the like
US4091407A (en) * 1976-11-01 1978-05-23 Rca Corporation Combination glass/low temperature deposited Siw Nx Hy O.sub.z
NL189379C (en) * 1977-05-05 1993-03-16 Richardus Henricus Johannes Fi METHOD FOR ENCAPSULATION OF MICRO-ELECTRONIC ELEMENTS.
US4173683A (en) * 1977-06-13 1979-11-06 Rca Corporation Chemically treating the overcoat of a semiconductor device
US4402002A (en) * 1978-04-06 1983-08-30 Harris Corporation Radiation hardened-self aligned CMOS and method of fabrication
US4313768A (en) * 1978-04-06 1982-02-02 Harris Corporation Method of fabricating improved radiation hardened self-aligned CMOS having Si doped Al field gate
JPS5598846A (en) 1979-01-22 1980-07-28 Nippon Telegr & Teleph Corp <Ntt> Semiconductor device
JPS55128851A (en) * 1979-03-28 1980-10-06 Hitachi Ltd Semiconductor memory device
JPS6015152B2 (en) * 1980-01-09 1985-04-17 株式会社日立製作所 Resin-encapsulated semiconductor memory device
JPS56103452A (en) 1980-01-22 1981-08-18 Fujitsu Ltd Semiconductor device
JPS56165341A (en) * 1980-05-23 1981-12-18 Nec Corp Semiconductor device
JPS5795650A (en) 1980-12-05 1982-06-14 Nec Corp Semiconductor device
JPS57145345A (en) * 1981-03-04 1982-09-08 Nec Corp Semiconductor device
US4975762A (en) * 1981-06-11 1990-12-04 General Electric Ceramics, Inc. Alpha-particle-emitting ceramic composite cover
US4468411A (en) * 1982-04-05 1984-08-28 Motorola, Inc. Method for providing alpha particle protection for an integrated circuit die
JPS58207657A (en) * 1982-05-28 1983-12-03 Fujitsu Ltd Manufacture of semiconductor device
US4633573A (en) * 1982-10-12 1987-01-06 Aegis, Inc. Microcircuit package and sealing method
US4506108A (en) * 1983-04-01 1985-03-19 Sperry Corporation Copper body power hybrid package and method of manufacture
FR2547113B1 (en) * 1983-06-03 1986-11-07 Inf Milit Spatiale Aeronaut ELECTRONIC COMPONENT ENCAPSULATION BOX, RADIATION HARDENED
JPS60106150A (en) 1983-11-15 1985-06-11 Nippon Telegr & Teleph Corp <Ntt> Radiation proof package
JPS60124834A (en) 1983-12-09 1985-07-03 Nec Corp Inspecting process of semiconductor device
JPS60180150A (en) 1984-02-27 1985-09-13 Nippon Telegr & Teleph Corp <Ntt> Semiconductor device
JPS60143398U (en) 1984-03-05 1985-09-24 三菱電線工業株式会社 Shielding material
US4614836A (en) * 1984-03-19 1986-09-30 Axia Incorporated Ground connector for microelectronic circuit case
US4652465A (en) * 1984-05-14 1987-03-24 Nissan Chemical Industries Ltd. Process for the production of a silver coated copper powder and conductive coating composition
JPS60257546A (en) * 1984-06-04 1985-12-19 Mitsubishi Electric Corp Semiconductor device and manufacture thereof
JPS614249A (en) 1984-06-19 1986-01-10 Sumitomo Electric Ind Ltd Package for semiconductor device
JPS614250A (en) 1984-06-19 1986-01-10 Sumitomo Electric Ind Ltd Package for semiconductor device
US4663240A (en) * 1984-11-06 1987-05-05 Enthone, Incorporated RFI shielded plastic articles and process for making same
FR2584863B1 (en) 1985-07-12 1988-10-21 Inf Milit Spatiale Aeronaut ELECTRONIC COMPONENT HARDENED WITH RESPECT TO RADIATION
US4675978A (en) * 1985-09-09 1987-06-30 Rca Corporation Method for fabricating a radiation hardened oxide having two portions
US4825278A (en) * 1985-10-17 1989-04-25 American Telephone And Telegraph Company At&T Bell Laboratories Radiation hardened semiconductor devices
US4687622A (en) * 1985-10-29 1987-08-18 Irt Corporation Nuclear event detector
JPS62125651A (en) 1985-11-26 1987-06-06 Nippon Telegr & Teleph Corp <Ntt> Radiation resistant package
JPS62150776A (en) * 1985-12-24 1987-07-04 Fuji Electric Co Ltd Semiconductor device
US4935174A (en) * 1986-01-13 1990-06-19 Canon Kabushiki Kaisha Resin molded article bearing electric circuit patterns and process for producing the same
FR2597652B1 (en) * 1986-04-16 1988-07-29 Aerospatiale ELECTRONIC CIRCUIT PROTECTION BOX, HARDENED AGAINST X-RAYS
FR2597654B1 (en) * 1986-04-16 1989-06-30 Aerospatiale PROTECTIVE SHEATH OF ELECTRICAL OR OPTICAL CONDUCTORS, HARDENED AGAINST X-RAYS
US4823523A (en) * 1987-01-06 1989-04-25 Donald N. Coupard Electromagnetic radiation shielding enclosure and shielding components
US4891687A (en) * 1987-01-12 1990-01-02 Intel Corporation Multi-layer molded plastic IC package
US4835120A (en) * 1987-01-12 1989-05-30 Debendra Mallik Method of making a multilayer molded plastic IC package
US5180513A (en) 1987-02-06 1993-01-19 Key-Tech, Inc. Shielded plastic enclosure to house electronic equipment
US5047260A (en) 1987-02-06 1991-09-10 Key-Tech, Inc. Method for producing a shielded plastic enclosure to house electronic equipment
US4839716A (en) * 1987-06-01 1989-06-13 Olin Corporation Semiconductor packaging
US4888449A (en) * 1988-01-04 1989-12-19 Olin Corporation Semiconductor package
US4953002A (en) * 1988-03-31 1990-08-28 Honeywell Inc. Semiconductor device housing with magnetic field protection
US4979019A (en) * 1988-05-11 1990-12-18 Refractory Composites, Inc. Printed circuit board with inorganic insulating matrix
KR900019177A (en) 1988-05-19 1990-12-24 야마자키 순페이 Electrical apparatus and manufacturing method
DE3818114A1 (en) 1988-05-27 1989-11-30 Gruenzweig & Hartmann Montage ABSORBER FOR ELECTROMAGNETIC AND ACOUSTIC WAVES
US4903108A (en) * 1988-06-21 1990-02-20 Harris Corporation Radiation hardened complementary transistor integrated circuits
US4868716A (en) * 1988-07-15 1989-09-19 Hewlett-Packard Company RF interconnect and shielding system
US5001528A (en) 1989-01-31 1991-03-19 The United States Of America As Represented By The Secretary Of The Air Force Radiation hardened CMOS on SOI or SOS devices
JP2600366B2 (en) 1989-03-09 1997-04-16 富士通株式会社 Semiconductor chip mounting method
JPH02278740A (en) 1989-04-19 1990-11-15 Matsushita Electric Works Ltd Packaging of semiconductor device
JPH03165058A (en) 1989-11-24 1991-07-17 Mitsubishi Electric Corp Semiconductor device
US4967315A (en) * 1990-01-02 1990-10-30 General Electric Company Metallized ceramic circuit package
JPH03212006A (en) 1990-01-17 1991-09-17 Sony Corp Package for high frequency circuit
US5140390A (en) 1990-02-16 1992-08-18 Hughes Aircraft Company High speed silicon-on-insulator device
US5024965A (en) 1990-02-16 1991-06-18 Chang Chen Chi P Manufacturing high speed low leakage radiation hardened CMOS/SOI devices
US5006479A (en) 1990-02-27 1991-04-09 Rockwell International Corporation Methods for improving radiation tolerance of silicon gate CMOS/silicon on sapphire devices
US5139969A (en) 1990-05-30 1992-08-18 Mitsubishi Denki Kabushiki Kaisha Method of making resin molded semiconductor device
US5086443A (en) * 1990-08-03 1992-02-04 The United States Of America As Represented By The United States Department Of Energy Background-reducing x-ray multilayer mirror
JPH0494560A (en) 1990-08-10 1992-03-26 Seiko Epson Corp Semiconductor device
US5250845A (en) 1990-11-30 1993-10-05 Hughes Aircraft Company Totally enclosed hermetic electronic module
US5166772A (en) 1991-02-22 1992-11-24 Motorola, Inc. Transfer molded semiconductor device package with integral shield
JPH04273200A (en) 1991-02-27 1992-09-29 Toshiba Corp Shield device
JPH04291948A (en) 1991-03-20 1992-10-16 Fujitsu Ltd Semiconductor device and its manufacture; radiating fin
US5149662A (en) 1991-03-27 1992-09-22 Integrated System Assemblies Corporation Methods for testing and burn-in of integrated circuit chips
US5138430A (en) 1991-06-06 1992-08-11 International Business Machines Corporation High performance versatile thermally enhanced IC chip mounting
JPH0715969B2 (en) 1991-09-30 1995-02-22 インターナショナル・ビジネス・マシーンズ・コーポレイション Multi-chip integrated circuit package and system thereof
US5206794A (en) 1991-12-20 1993-04-27 Vlsi Technology, Inc. Integrated circuit package with device and wire coat assembly
CA2080177C (en) 1992-01-02 1997-02-25 Edward Allan Highum Electro-magnetic shield and method for making the same
US5268331A (en) 1992-01-07 1993-12-07 Texas Instruments Incorporated Stabilizer/spacer for semiconductor device lead frames
US5202536A (en) 1992-02-03 1993-04-13 Schlegel Corporation EMI shielding seal with partial conductive sheath
US5578526A (en) 1992-03-06 1996-11-26 Micron Technology, Inc. Method for forming a multi chip module (MCM)
US5422435A (en) 1992-05-22 1995-06-06 National Semiconductor Corporation Stacked multi-chip modules and method of manufacturing
US5324952A (en) 1992-07-10 1994-06-28 Ball Corporation Radiation shielding for spacecraft components
US5220192A (en) 1992-07-10 1993-06-15 Lsi Logic Radiation hardened CMOS structure using an implanted P guard structure and method for the manufacture thereof
US5317107A (en) 1992-09-24 1994-05-31 Motorola, Inc. Shielded stripline configuration semiconductor device and method for making the same
US5656830A (en) 1992-12-10 1997-08-12 International Business Machines Corp. Integrated circuit chip composite having a parylene coating
US5589129A (en) 1993-02-19 1996-12-31 Kabushiki Kaisha Toshiba Method of manufacturing a molding using a filler or an additive concentrated on an arbitrary portion or distributed at a gradient concentration
US5384477A (en) 1993-03-09 1995-01-24 National Semiconductor Corporation CMOS latchup suppression by localized minority carrier lifetime reduction
CA2092371C (en) 1993-03-24 1999-06-29 Boris L. Livshits Integrated circuit packaging
US5294826A (en) 1993-04-16 1994-03-15 Northern Telecom Limited Integrated circuit package and assembly thereof for thermal and EMI management
US5880403A (en) * 1994-04-01 1999-03-09 Space Electronics, Inc. Radiation shielding of three dimensional multi-chip modules
US5635754A (en) * 1994-04-01 1997-06-03 Space Electronics, Inc. Radiation shielding of integrated circuits and multi-chip modules in ceramic and metal packages
US5825042A (en) 1993-06-18 1998-10-20 Space Electronics, Inc. Radiation shielding of plastic integrated circuits
US5455745A (en) 1993-07-26 1995-10-03 National Semiconductor Corporation Coated bonding wires in high lead count packages
US5406117A (en) 1993-12-09 1995-04-11 Dlugokecki; Joseph J. Radiation shielding for integrated circuit devices using reconstructed plastic packages
US5436411A (en) 1993-12-20 1995-07-25 Lsi Logic Corporation Fabrication of substrates for multi-chip modules
US5498900A (en) 1993-12-22 1996-03-12 Honeywell Inc. Semiconductor package with weldable ceramic lid
FI117224B (en) 1994-01-20 2006-07-31 Nec Tokin Corp Electromagnetic interference suppression piece, applied by electronic device and hybrid integrated circuit element
US6261508B1 (en) 1994-04-01 2001-07-17 Maxwell Electronic Components Group, Inc. Method for making a shielding composition
US6720493B1 (en) * 1994-04-01 2004-04-13 Space Electronics, Inc. Radiation shielding of integrated circuits and multi-chip modules in ceramic and metal packages
US6455864B1 (en) 1994-04-01 2002-09-24 Maxwell Electronic Components Group, Inc. Methods and compositions for ionizing radiation shielding
US5770304A (en) 1994-07-11 1998-06-23 Nippon Paint Co., Ltd. Wide bandwidth electromagnetic wave absorbing material
US5672918A (en) 1994-08-18 1997-09-30 The United States Of America As Represented By The United States Department Of Energy System level latchup mitigation for single event and transient radiation effects on electronics
JP2875479B2 (en) 1994-09-08 1999-03-31 日本ペルノックス株式会社 Semiconductor sealing method
US5552338A (en) 1994-09-26 1996-09-03 Intel Corporation Method of using latchup current to blow a fuse in an integrated circuit
US5495394A (en) 1994-12-19 1996-02-27 At&T Global Information Solutions Company Three dimensional die packaging in multi-chip modules
US5706840A (en) 1995-03-03 1998-01-13 Sandia Corporation Precision cleaning apparatus and method
US5577319A (en) 1995-03-31 1996-11-26 Motorola, Inc. Method of encapsulating a crystal oscillator
KR0157570B1 (en) 1995-11-24 1999-02-18 김광호 Decoder for mpeg 2 bit
US5851852A (en) 1996-02-13 1998-12-22 Northrop Grumman Corporation Die attached process for SiC
US5998867A (en) 1996-02-23 1999-12-07 Honeywell Inc. Radiation enhanced chip encapsulant
WO1997040654A1 (en) 1996-04-24 1997-10-30 Okamura, Susumu Semiconductor device
US5780163A (en) 1996-06-05 1998-07-14 Dow Corning Corporation Multilayer coating for microelectronic devices
DE19645036B4 (en) 1996-10-31 2006-04-20 Siemens Ag Pyroelectric semiconductor infrared radiation detecting device and method of manufacture
US5935177A (en) 1997-02-06 1999-08-10 Accurate Automation Corporation Pilot-induced oscillation detection and compensation apparatus and method
US6064555A (en) 1997-02-25 2000-05-16 Czajkowski; David Radiation induced single event latchup protection and recovery of integrated circuits
JP3359846B2 (en) * 1997-07-18 2002-12-24 シャープ株式会社 Semiconductor device
US5888850A (en) 1997-09-29 1999-03-30 International Business Machines Corporation Method for providing a protective coating and electronic package utilizing same
US6121672A (en) 1998-11-03 2000-09-19 Utmc Microelectronic Systems Inc. Raised pedestal radiation shield for sensitive electronics
US6282071B1 (en) * 1999-11-08 2001-08-28 Thomson Licensing, S.A. Frequency dependent X-ray protection for a multimedia monitor
US6368899B1 (en) 2000-03-08 2002-04-09 Maxwell Electronic Components Group, Inc. Electronic device packaging
US6365960B1 (en) 2000-06-19 2002-04-02 Intel Corporation Integrated circuit package with EMI shield
US6778637B2 (en) * 2002-09-20 2004-08-17 Koninklijke Philips Electronics, N.V. Method and apparatus for alignment of anti-scatter grids for computed tomography detector arrays

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4922754A (en) * 1989-03-17 1990-05-08 Kennametal Inc. Acoustic emission transducer and mounting adapter for monitoring metalcutting tools
US5992237A (en) * 1997-07-22 1999-11-30 Skf Condition Monitoring, Inc. Digital vibration coupling stud

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8018739B2 (en) 2003-07-16 2011-09-13 Maxwell Technologies, LLC Apparatus for shielding integrated circuit devices

Also Published As

Publication number Publication date
AU2003276938A1 (en) 2004-04-19
ES2586036T3 (en) 2016-10-11
AU2003276938A8 (en) 2004-04-19
EP2270486B1 (en) 2016-05-04
US7382043B2 (en) 2008-06-03
EP2270486A3 (en) 2012-05-02
ES2674344T3 (en) 2018-06-29
EP1547128A2 (en) 2005-06-29
EP2270486A2 (en) 2011-01-05
EP1547128A4 (en) 2006-10-18
EP1547128B1 (en) 2018-03-28
WO2004030040A2 (en) 2004-04-08
US20040056334A1 (en) 2004-03-25

Similar Documents

Publication Publication Date Title
WO2004030040A3 (en) Method and apparatus for shielding an integrated circuit from radiation
WO2005010937A3 (en) Packaging of semiconductor devices for incrased reliability
US20020011572A1 (en) Radiation image pickup device and system
PL367099A1 (en) Emi shielding for electronic packages
IL124391A (en) Apparatus and method for shielding an electronic module from electromagnetic radiation
JPH09509016A (en) Radiation shielding of ICs and multi-chip modules in ceramic and metal packages
WO2003063952A3 (en) Method and apparatus for shielding against mri disturbances
WO2004093505A3 (en) Emi shielding for electronic component packaging
EP1351293A3 (en) Die-up ball grid array package with two substrates and method for making the same
SG103383A1 (en) A heat sink apparatus that provides electrical isolation for integrally shielded circuit
US6365960B1 (en) Integrated circuit package with EMI shield
EP1688996A3 (en) Semiconductor integrated device and method of providing shield interconnection therein
WO2013055700A1 (en) Wafer level applied rf shields
JP2003014862A (en) Radiation image detector and radiation shielding method
JPS55166943A (en) Semiconductor device
HK1040474A1 (en) Electronic device and shield
US7204701B1 (en) Method and apparatus for reducing capacitively coupled radio frequency energy between a semiconductor device and an adjacent metal structure
WO2004075254A3 (en) Electronic component and method of manufacturing same
DE60012008D1 (en) PROCESS FOR PROTECTIVE CIRCUIT DURING RADIATION STRILIZATION
JP6264723B2 (en) Radiation imaging equipment
JP2002250773A (en) Radiation image pickup device
AU2003250326A8 (en) Method for producing a copy protection for an electronic circuit and corresponding component
EP1220356A4 (en) Shielded electronic device and shield material
Poblenz et al. Analysis of total dose exposure to integrated circuits resulting from laminographic inspection of surface-mount-package solder joints
TWI266602B (en) EMI shielding package and method of making the same

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
WWE Wipo information: entry into national phase

Ref document number: 2003798732

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 2003798732

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: JP

WWW Wipo information: withdrawn in national office

Country of ref document: JP