WO2004031743A8 - A waveguide structure - Google Patents

A waveguide structure

Info

Publication number
WO2004031743A8
WO2004031743A8 PCT/GB2002/004545 GB0204545W WO2004031743A8 WO 2004031743 A8 WO2004031743 A8 WO 2004031743A8 GB 0204545 W GB0204545 W GB 0204545W WO 2004031743 A8 WO2004031743 A8 WO 2004031743A8
Authority
WO
WIPO (PCT)
Prior art keywords
particles
waveguide structure
evanescent field
overlap
detection
Prior art date
Application number
PCT/GB2002/004545
Other languages
French (fr)
Other versions
WO2004031743A1 (en
Inventor
Mohammed Zourob
Stephen Mohr
Brown Bernard James Treves
Peter Robert Fielden
Nicholas John Goddard
Original Assignee
Secr Defence
Mohammed Zourob
Stephen Mohr
Brown Bernard James Treves
Peter Robert Fielden
Nicholas John Goddard
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Secr Defence, Mohammed Zourob, Stephen Mohr, Brown Bernard James Treves, Peter Robert Fielden, Nicholas John Goddard filed Critical Secr Defence
Priority to AU2002334118A priority Critical patent/AU2002334118B2/en
Priority to DE60238563T priority patent/DE60238563D1/en
Priority to EP02807883A priority patent/EP1549929B1/en
Priority to JP2004540911A priority patent/JP2006502382A/en
Priority to CNB028297229A priority patent/CN100554935C/en
Priority to PCT/GB2002/004545 priority patent/WO2004031743A1/en
Priority to AT02807883T priority patent/ATE491149T1/en
Priority to US10/529,970 priority patent/US7492978B2/en
Priority to CA002501267A priority patent/CA2501267A1/en
Publication of WO2004031743A1 publication Critical patent/WO2004031743A1/en
Publication of WO2004031743A8 publication Critical patent/WO2004031743A8/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122—Basic optical elements, e.g. light-guiding paths
    • G01N2015/019—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Electro-optical investigation, e.g. flow cytometers
    • G01N15/1434—Electro-optical investigation, e.g. flow cytometers using an analyser being characterised by its optical arrangement
    • G01N2015/1447—Spatial selection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N2021/7706—Reagent provision
    • G01N2021/7723—Swelling part, also for adsorption sensor, i.e. without chemical reaction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769—Measurement method of reaction-produced change in sensor
    • G01N2021/7776—Index
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B2006/12133—Functions
    • G02B2006/12138—Sensor

Abstract

A novel single point leaky waveguide structure and its use as an optical sensor for the detection of particles is disclosed. The waveguide structure is fabricated to increase the overlap of the evanescent field extension from the sensor surface with particles in the bulk solution of a flowing system so as to place most of the volume of the particles within the evanescent field. Increasing the overlap of the evanescent field with the particles and permitting mode propagation along the direction of flow for a few millimetres provides an effective interrogation approach for multiple particle detection in a single flow channel.
PCT/GB2002/004545 2002-10-07 2002-10-07 A waveguide structure WO2004031743A1 (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
AU2002334118A AU2002334118B2 (en) 2002-10-07 2002-10-07 A waveguide structure
DE60238563T DE60238563D1 (en) 2002-10-07 2002-10-07 WAVEGUIDE STRUCTURE
EP02807883A EP1549929B1 (en) 2002-10-07 2002-10-07 A waveguide structure
JP2004540911A JP2006502382A (en) 2002-10-07 2002-10-07 Waveguide structure
CNB028297229A CN100554935C (en) 2002-10-07 2002-10-07 Waveguiding structure
PCT/GB2002/004545 WO2004031743A1 (en) 2002-10-07 2002-10-07 A waveguide structure
AT02807883T ATE491149T1 (en) 2002-10-07 2002-10-07 WAVEGUIDE STRUCTURE
US10/529,970 US7492978B2 (en) 2002-10-07 2002-10-07 Waveguide structure
CA002501267A CA2501267A1 (en) 2002-10-07 2002-10-07 A waveguide structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/GB2002/004545 WO2004031743A1 (en) 2002-10-07 2002-10-07 A waveguide structure

Publications (2)

Publication Number Publication Date
WO2004031743A1 WO2004031743A1 (en) 2004-04-15
WO2004031743A8 true WO2004031743A8 (en) 2004-06-24

Family

ID=32050696

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB2002/004545 WO2004031743A1 (en) 2002-10-07 2002-10-07 A waveguide structure

Country Status (9)

Country Link
US (1) US7492978B2 (en)
EP (1) EP1549929B1 (en)
JP (1) JP2006502382A (en)
CN (1) CN100554935C (en)
AT (1) ATE491149T1 (en)
AU (1) AU2002334118B2 (en)
CA (1) CA2501267A1 (en)
DE (1) DE60238563D1 (en)
WO (1) WO2004031743A1 (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7233711B1 (en) * 2005-05-11 2007-06-19 Hewlett Packard Development Company, L.P. Autonomous evanescent optical nanosensor
CN100360903C (en) * 2005-10-27 2008-01-09 上海交通大学 Method for measuring variation of gas liquid temperature, absorption, concentration, component and refraction rate
JP2007271596A (en) * 2006-03-08 2007-10-18 National Institute Of Advanced Industrial & Technology Optical waveguide mode sensor
EP2092310A1 (en) * 2006-11-10 2009-08-26 Koninklijke Philips Electronics N.V. Biosensor device and method for detecting molecules in an analyte
EP2208046B1 (en) * 2007-11-05 2019-12-11 Koninklijke Philips N.V. Method for detecting redispersion of beads
DE102008007823B3 (en) * 2008-02-07 2009-09-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Waveguide core and biosensor
JP5180703B2 (en) * 2008-06-27 2013-04-10 富士フイルム株式会社 Detection method, detection sample cell and detection kit
ES2381087B1 (en) * 2009-04-07 2013-01-30 Universidad Publica De Navarra OPTICAL FIBER SENSORS BASED ON THE RESONANCE EFFECT OF SURFACE PLASMONS USING TRANSPARENT CONDUCTING METAL OXIDES
GB0919742D0 (en) * 2009-11-11 2009-12-30 Millipore Corp Optical sensor
US8750652B2 (en) * 2010-10-12 2014-06-10 The Board Of Trustees Of The Leland Stanford Junior University Microfluidic waveguide detector
US8937721B2 (en) 2011-01-20 2015-01-20 National Institute Of Advanced Industrial Science And Technology Sensing device
WO2014116758A1 (en) * 2013-01-22 2014-07-31 The Regents Of The University Of California Ultra-sensitive force sensing based on evanescent light
FR3051921B1 (en) * 2016-05-31 2018-06-01 Centre National De La Recherche Scientifique LIGHTING DEVICE AND METHOD FOR EVANESCENT WAVE FLUORESCENCE MICROSCOPY
WO2018118934A1 (en) * 2016-12-19 2018-06-28 Massachusetts Institute Of Technology Systems and methods for monitoring air particulate matter
GB2565074A (en) * 2017-07-31 2019-02-06 Univ Bristol Method and apparatus for bacterial analysis
CN108051362B (en) * 2017-11-09 2021-10-08 中国科学院微电子研究所 Detection method for single nano-particle
US11307133B2 (en) * 2017-12-22 2022-04-19 Imec Vzw Device for illuminating a particle, and a system and a method for particle imaging
CN108332674B (en) * 2018-02-11 2020-01-21 中国科学院电子学研究所 Method for calculating thickness and porosity of porous film by single spectrum

Family Cites Families (16)

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Publication number Priority date Publication date Assignee Title
EP0184600B1 (en) 1984-12-10 1990-03-14 Prutec Limited Method for optically ascertaining parameters of species in a liquid analyte
US4649280A (en) * 1985-05-10 1987-03-10 The University Of Rochester Method and system for the enhancement of fluorescence
US5478755A (en) * 1988-07-25 1995-12-26 Ares Serono Research & Development Ltd. Long range surface plasma resonance immunoassay
GB8827853D0 (en) * 1988-11-29 1988-12-29 Ares Serono Res & Dev Ltd Sensor for optical assay
GB2256477B (en) * 1991-06-07 1995-03-08 Marconi Gec Ltd An optical sensor
US5327225A (en) * 1993-01-28 1994-07-05 The Center For Innovative Technology Surface plasmon resonance sensor
US5599668A (en) * 1994-09-22 1997-02-04 Abbott Laboratories Light scattering optical waveguide method for detecting specific binding events
GB9623820D0 (en) * 1996-11-16 1997-01-08 Secr Defence Surface plasma resonance sensor
US6222619B1 (en) * 1997-09-18 2001-04-24 University Of Utah Research Foundation Diagnostic device and method
GB9803704D0 (en) * 1998-02-24 1998-04-15 Univ Manchester Waveguide structure
US6188812B1 (en) 1998-09-01 2001-02-13 Hung Pin Kao Method and apparatus for enhanced evanescent fluorescence and color filtering using a high refractive index thin film coating
DE69909480T2 (en) * 1999-09-15 2004-04-15 Csem Centre Suisse D'electronique Et De Microtechnique S.A. Integrated optical sensor
GB9928849D0 (en) * 1999-12-07 2000-02-02 Secr Defence Brit Surface plasmon resonance
JP2002062255A (en) * 2000-08-22 2002-02-28 Nippon Laser & Electronics Lab Detector for detecting surface plasmon resonance angle and fluorescence concurrently
AU2001278937A1 (en) * 2000-11-29 2002-06-11 Salafsky, Joshua S. Method and apparatus using a surface-selective nonlinear optical technique for detection of probe-target interactions
JP2004521323A (en) * 2001-03-27 2004-07-15 サラフスカイ，ジョシュア，エス． Method and apparatus for detecting probe-target interactions using surface selective nonlinear optical techniques

Also Published As

Publication number Publication date
DE60238563D1 (en) 2011-01-20
EP1549929A1 (en) 2005-07-06
WO2004031743A1 (en) 2004-04-15
AU2002334118B2 (en) 2007-05-17
EP1549929B1 (en) 2010-12-08
CN100554935C (en) 2009-10-28
AU2002334118A1 (en) 2004-04-23
CA2501267A1 (en) 2004-04-15
US20060147147A1 (en) 2006-07-06
ATE491149T1 (en) 2010-12-15
CN1685213A (en) 2005-10-19
JP2006502382A (en) 2006-01-19
US7492978B2 (en) 2009-02-17

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Free format text: IN PCT GAZETTE 16/2004 UNDER (72, 75) REPLACE THE EXISTING ADDRESS OF "ZOUROB, MOHAMMED", "MOHR, STEPHEN", "TREVES BROWN, BERNARD, JAMES", "FIELDEN, PETER, ROBERT", "GODDARD, NICHOLAS, JOHN"" BY ""DEPARTMENT OF INSTRUMENTATION AND ANALYTICAL SCIENCE UNIVERSITY OF MANCHESTER INSTITUTE OF SCIENCE AND TECHNOLOGY (UMIST), PO BOX 88, MANCHESTER M60 1QD (GB)"

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