WO2004066358A3 - Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same - Google Patents
Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same Download PDFInfo
- Publication number
- WO2004066358A3 WO2004066358A3 PCT/US2004/001752 US2004001752W WO2004066358A3 WO 2004066358 A3 WO2004066358 A3 WO 2004066358A3 US 2004001752 W US2004001752 W US 2004001752W WO 2004066358 A3 WO2004066358 A3 WO 2004066358A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- pixels
- bht
- microscopic
- photomask
- dimensional
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03C—PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES; PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR, STEREO-PHOTOGRAPHIC PROCESSES; AUXILIARY PROCESSES IN PHOTOGRAPHY
- G03C5/00—Photographic processes or agents therefor; Regeneration of such processing agents
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0005—Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04704433A EP1586008A4 (en) | 2003-01-23 | 2004-01-22 | Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same |
JP2006501104A JP2006516751A (en) | 2003-01-23 | 2004-01-22 | Binary halftone photomask and fine three-dimensional device and method for producing them |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/349,629 US6828068B2 (en) | 2003-01-23 | 2003-01-23 | Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same |
US10/349,629 | 2003-01-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004066358A2 WO2004066358A2 (en) | 2004-08-05 |
WO2004066358A3 true WO2004066358A3 (en) | 2004-11-11 |
Family
ID=32770256
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2004/001752 WO2004066358A2 (en) | 2003-01-23 | 2004-01-22 | Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same |
Country Status (7)
Country | Link |
---|---|
US (3) | US6828068B2 (en) |
EP (1) | EP1586008A4 (en) |
JP (1) | JP2006516751A (en) |
KR (1) | KR20050095857A (en) |
CN (1) | CN1705915A (en) |
TW (1) | TW200502706A (en) |
WO (1) | WO2004066358A2 (en) |
Families Citing this family (34)
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US6828068B2 (en) * | 2003-01-23 | 2004-12-07 | Photronics, Inc. | Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same |
US7043327B2 (en) * | 2003-08-12 | 2006-05-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | Lithography apparatus and method employing non-environmental variable correction |
US7003758B2 (en) | 2003-10-07 | 2006-02-21 | Brion Technologies, Inc. | System and method for lithography simulation |
KR100552266B1 (en) * | 2003-12-31 | 2006-02-20 | 동부아남반도체 주식회사 | Photo mask |
KR100644018B1 (en) * | 2004-06-18 | 2006-11-10 | 매그나칩 반도체 유한회사 | Forming method of microlens in image sensor |
JP4904034B2 (en) * | 2004-09-14 | 2012-03-28 | ケーエルエー−テンカー コーポレイション | Method, system and carrier medium for evaluating reticle layout data |
US7682981B2 (en) * | 2005-01-27 | 2010-03-23 | Contour Semiconductor, Inc. | Topography transfer method with aspect ratio scaling |
KR100674964B1 (en) * | 2005-03-14 | 2007-01-26 | 삼성전자주식회사 | Method and systematic apparatus for correcting photomask |
JP4817907B2 (en) * | 2006-03-22 | 2011-11-16 | Okiセミコンダクタ株式会社 | Photomask for forming resist pattern, method for manufacturing the same, and method for forming resist pattern using the photomask |
DE102006019963B4 (en) * | 2006-04-28 | 2023-12-07 | Envisiontec Gmbh | Device and method for producing a three-dimensional object by layer-by-layer solidifying a material that can be solidified under the influence of electromagnetic radiation using mask exposure |
DE102006019964C5 (en) | 2006-04-28 | 2021-08-26 | Envisiontec Gmbh | Device and method for producing a three-dimensional object by means of mask exposure |
JP4887958B2 (en) * | 2006-07-27 | 2012-02-29 | 凸版印刷株式会社 | Photo mask |
JP2008089923A (en) * | 2006-09-29 | 2008-04-17 | Oki Electric Ind Co Ltd | Method of manufacturing optical element |
KR100873275B1 (en) * | 2007-03-19 | 2008-12-11 | 매그나칩 반도체 유한회사 | Method for fabricating image sensor |
JP4935452B2 (en) * | 2007-03-26 | 2012-05-23 | 凸版印刷株式会社 | Gray mask and pattern manufacturing method for gray mask |
US8191018B1 (en) * | 2007-07-17 | 2012-05-29 | Kovio, Inc. | Methods and software for printing materials onto a substrate |
WO2009057660A1 (en) * | 2007-11-01 | 2009-05-07 | Ulvac Coating Corporation | Half-tone mask, half-tone mask blank and method for manufacturing half-tone mask |
US9005848B2 (en) * | 2008-06-17 | 2015-04-14 | Photronics, Inc. | Photomask having a reduced field size and method of using the same |
US7897302B2 (en) * | 2008-08-18 | 2011-03-01 | Sharp Laboratories Of America, Inc. | Error diffusion-derived sub-resolutional grayscale reticle |
WO2010046410A2 (en) * | 2008-10-22 | 2010-04-29 | Micronic Laser Systems Ab | Method of compensation for bleaching of resist during three-dimensional exposure of resist |
JP4811520B2 (en) * | 2009-02-20 | 2011-11-09 | 住友金属鉱山株式会社 | Semiconductor device substrate manufacturing method, semiconductor device manufacturing method, semiconductor device substrate, and semiconductor device |
JP2010224125A (en) * | 2009-03-23 | 2010-10-07 | Canon Inc | Exposure mask, exposure method, and method of manufacturing optical element |
US9005849B2 (en) * | 2009-06-17 | 2015-04-14 | Photronics, Inc. | Photomask having a reduced field size and method of using the same |
JP5653745B2 (en) * | 2010-12-22 | 2015-01-14 | 日東電工株式会社 | Optical waveguide manufacturing method |
US8359562B2 (en) * | 2011-01-11 | 2013-01-22 | Infineon Technologies Ag | System and method for semiconductor device fabrication using modeling |
JP2012123409A (en) * | 2012-02-03 | 2012-06-28 | Hoya Corp | Test mask |
WO2013163300A1 (en) * | 2012-04-25 | 2013-10-31 | University Of Louisville Research Foundation, Inc. | Automated mask file generation from 3-d modeling |
US8975195B2 (en) * | 2013-02-01 | 2015-03-10 | GlobalFoundries, Inc. | Methods for optical proximity correction in the design and fabrication of integrated circuits |
US10185799B2 (en) * | 2014-04-22 | 2019-01-22 | Mentor Graphics Corporation | Verification of photonic integrated circuits |
EP3213148B1 (en) * | 2014-10-29 | 2021-01-13 | Hewlett-Packard Development Company, L.P. | Three-dimensional halftoning |
US11235532B2 (en) * | 2016-07-26 | 2022-02-01 | Hewlett-Packard Development Company, L.P. | Three-dimensional object substructures |
CN108242398A (en) * | 2016-12-23 | 2018-07-03 | 上海新微技术研发中心有限公司 | Method for Forming Complex Curved Surface on Wafer Surface |
CN106773524A (en) * | 2017-02-20 | 2017-05-31 | 京东方科技集团股份有限公司 | Mask plate |
US11301610B2 (en) | 2017-12-22 | 2022-04-12 | D2S, Inc. | Methods for modeling of a design in reticle enhancement technology |
Citations (2)
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US4908780A (en) * | 1988-10-14 | 1990-03-13 | Sun Microsystems, Inc. | Anti-aliasing raster operations utilizing sub-pixel crossing information to control pixel shading |
US6057855A (en) * | 1997-07-02 | 2000-05-02 | Hewlett-Packard Company | Method and apparatus for providing polygon pixel sub-sample information using incremental means |
Family Cites Families (18)
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US6749864B2 (en) * | 1986-02-13 | 2004-06-15 | Takeda Chemical Industries, Ltd. | Stabilized pharmaceutical composition |
JPH05224398A (en) * | 1992-02-12 | 1993-09-03 | Kuraray Co Ltd | Photomask having variable transmissivity and production of optical parts using the same |
US5310623A (en) | 1992-11-27 | 1994-05-10 | Lockheed Missiles & Space Company, Inc. | Method for fabricating microlenses |
US5420720A (en) | 1992-06-25 | 1995-05-30 | Lockheed Missiles & Space Company, Inc. | Internally cooled large aperture microlens array with monolithically integrated microscanner |
US5497269A (en) | 1992-06-25 | 1996-03-05 | Lockheed Missiles And Space Company, Inc. | Dispersive microlens |
US5444572A (en) | 1992-11-27 | 1995-08-22 | Lockheed Missiles & Space Company, Inc. | Wavefront corrector for scanning microlens arrays |
KR0161389B1 (en) * | 1995-02-16 | 1999-01-15 | 윤종용 | A mask and the method of pattern forming using the same |
JP3889091B2 (en) * | 1996-09-03 | 2007-03-07 | 三菱電機株式会社 | Semiconductor development information integration system |
US6420073B1 (en) * | 1997-03-21 | 2002-07-16 | Digital Optics Corp. | Fabricating optical elements using a photoresist formed from proximity printing of a gray level mask |
US6406818B1 (en) | 1999-03-31 | 2002-06-18 | Photronics, Inc. | Method of manufacturing photomasks by plasma etching with resist stripped |
US6335151B1 (en) | 1999-06-18 | 2002-01-01 | International Business Machines Corporation | Micro-surface fabrication process |
JP2001272764A (en) * | 2000-03-24 | 2001-10-05 | Canon Inc | Photomask for projection exposure and for projection exposure method using the photomask |
JP3344418B2 (en) * | 2000-11-10 | 2002-11-11 | 松下電器産業株式会社 | Exposure device, semiconductor thin film, thin film transistor, liquid crystal display device, EL display device and method of manufacturing the same |
JPWO2002071738A1 (en) * | 2001-03-02 | 2004-07-02 | 大日本印刷株式会社 | Dither mask generation method and generation apparatus |
JP2002288487A (en) * | 2001-03-27 | 2002-10-04 | Mitsubishi Electric Corp | Ordering method and ordering system |
US6844119B2 (en) * | 2002-07-30 | 2005-01-18 | Hoya Corporation | Method for producing a halftone phase shift mask blank, a halftone phase shift mask blank and halftone phase shift mask |
US6828068B2 (en) * | 2003-01-23 | 2004-12-07 | Photronics, Inc. | Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same |
JP4296943B2 (en) * | 2003-01-28 | 2009-07-15 | ソニー株式会社 | Exposure mask manufacturing method, exposure method, and three-dimensional shape manufacturing method |
-
2003
- 2003-01-23 US US10/349,629 patent/US6828068B2/en not_active Expired - Lifetime
-
2004
- 2004-01-20 TW TW093101607A patent/TW200502706A/en unknown
- 2004-01-22 JP JP2006501104A patent/JP2006516751A/en active Pending
- 2004-01-22 KR KR1020057013446A patent/KR20050095857A/en not_active Application Discontinuation
- 2004-01-22 WO PCT/US2004/001752 patent/WO2004066358A2/en active Application Filing
- 2004-01-22 EP EP04704433A patent/EP1586008A4/en not_active Withdrawn
- 2004-01-22 CN CNA2004800012268A patent/CN1705915A/en active Pending
- 2004-10-28 US US10/975,293 patent/US7074530B2/en not_active Expired - Lifetime
-
2006
- 2006-05-24 US US11/439,757 patent/US7473500B2/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4908780A (en) * | 1988-10-14 | 1990-03-13 | Sun Microsystems, Inc. | Anti-aliasing raster operations utilizing sub-pixel crossing information to control pixel shading |
US6057855A (en) * | 1997-07-02 | 2000-05-02 | Hewlett-Packard Company | Method and apparatus for providing polygon pixel sub-sample information using incremental means |
Also Published As
Publication number | Publication date |
---|---|
US20060210891A1 (en) | 2006-09-21 |
US20050118515A1 (en) | 2005-06-02 |
TW200502706A (en) | 2005-01-16 |
KR20050095857A (en) | 2005-10-04 |
CN1705915A (en) | 2005-12-07 |
JP2006516751A (en) | 2006-07-06 |
US7473500B2 (en) | 2009-01-06 |
EP1586008A4 (en) | 2007-01-31 |
EP1586008A2 (en) | 2005-10-19 |
US6828068B2 (en) | 2004-12-07 |
WO2004066358A2 (en) | 2004-08-05 |
US7074530B2 (en) | 2006-07-11 |
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