WO2004095004A3 - Active remote sensing using a spectral lock-in technique - Google Patents

Active remote sensing using a spectral lock-in technique Download PDF

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Publication number
WO2004095004A3
WO2004095004A3 PCT/US2004/012379 US2004012379W WO2004095004A3 WO 2004095004 A3 WO2004095004 A3 WO 2004095004A3 US 2004012379 W US2004012379 W US 2004012379W WO 2004095004 A3 WO2004095004 A3 WO 2004095004A3
Authority
WO
WIPO (PCT)
Prior art keywords
technique
remote sensing
optical radiation
lock
active remote
Prior art date
Application number
PCT/US2004/012379
Other languages
French (fr)
Other versions
WO2004095004A2 (en
Inventor
Benjamin R Neff
Jeff D Pruitt
Matthew L Gypson
Michael E Dobbs
Original Assignee
Itt Mfg Enterprises Inc
Benjamin R Neff
Jeff D Pruitt
Matthew L Gypson
Michael E Dobbs
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Itt Mfg Enterprises Inc, Benjamin R Neff, Jeff D Pruitt, Matthew L Gypson, Michael E Dobbs filed Critical Itt Mfg Enterprises Inc
Priority to EP04760102A priority Critical patent/EP1618355B1/en
Priority to JP2006513206A priority patent/JP4634374B2/en
Publication of WO2004095004A2 publication Critical patent/WO2004095004A2/en
Publication of WO2004095004A3 publication Critical patent/WO2004095004A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N21/3151—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using two sources of radiation of different wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/396—Type of laser source
    • G01N2021/399—Diode laser

Abstract

A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the detected signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the detected signal that are present at the first and second frequencies.
PCT/US2004/012379 2003-04-22 2004-04-22 Active remote sensing using a spectral lock-in technique WO2004095004A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP04760102A EP1618355B1 (en) 2003-04-22 2004-04-22 Active remote sensing using a spectral lock-in technique
JP2006513206A JP4634374B2 (en) 2003-04-22 2004-04-22 Active remote sensing using spectrum lock-in technology

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/419,797 2003-04-22
US10/419,797 US6949734B2 (en) 2003-04-22 2003-04-22 Active remote sensing using a spectral lock-in technique

Publications (2)

Publication Number Publication Date
WO2004095004A2 WO2004095004A2 (en) 2004-11-04
WO2004095004A3 true WO2004095004A3 (en) 2005-01-27

Family

ID=33298426

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/012379 WO2004095004A2 (en) 2003-04-22 2004-04-22 Active remote sensing using a spectral lock-in technique

Country Status (4)

Country Link
US (1) US6949734B2 (en)
EP (1) EP1618355B1 (en)
JP (1) JP4634374B2 (en)
WO (1) WO2004095004A2 (en)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7009170B2 (en) * 2003-06-26 2006-03-07 Itt Manufacturing Enterprises, Inc. Active remote sensing using a simultaneous spectral sampling technique
US7616888B2 (en) * 2003-11-06 2009-11-10 Itt Manufacturing Enterprises, Inc. Method and system for measuring optical properties of a medium using digital communication processing techniques
US9801709B2 (en) 2004-11-02 2017-10-31 E-Vision Smart Optics, Inc. Electro-active intraocular lenses
US8778022B2 (en) 2004-11-02 2014-07-15 E-Vision Smart Optics Inc. Electro-active intraocular lenses
US20090264966A1 (en) * 2004-11-02 2009-10-22 Pixeloptics, Inc. Device for Inductive Charging of Implanted Electronic Devices
US7291856B2 (en) * 2005-04-28 2007-11-06 Honeywell International Inc. Sensor and methods for measuring select components in moving sheet products
US7859668B2 (en) 2005-12-15 2010-12-28 Honeywell International Inc. Apparatus and method for illuminator-independent color measurements
US8017927B2 (en) 2005-12-16 2011-09-13 Honeywell International Inc. Apparatus, system, and method for print quality measurements using multiple adjustable sensors
US7573575B2 (en) 2005-12-29 2009-08-11 Honeywell International Inc. System and method for color measurements or other spectral measurements of a material
US7688447B2 (en) 2005-12-29 2010-03-30 Honeywell International Inc. Color sensor
US7796251B2 (en) * 2006-03-22 2010-09-14 Itt Manufacturing Enterprises, Inc. Method, apparatus and system for rapid and sensitive standoff detection of surface contaminants
US7511809B2 (en) * 2006-07-07 2009-03-31 Itt Manufacturing Enterprises, Inc. Air sampler module for enhancing the detection capabilities of a chemical detection device or system
US7636154B1 (en) 2006-12-21 2009-12-22 Itt Manufacturing Enterprises, Inc. Modular optical detection system for point airborne and area surface substance detection
GB0717967D0 (en) * 2007-09-14 2007-10-24 Cascade Technologies Ltd Polarimetric hyperspectral imager
US7502693B1 (en) 2007-09-27 2009-03-10 Itt Manufacturing Enterprises, Inc. Spectral feature-based identification of substances
US8049892B2 (en) * 2008-01-22 2011-11-01 Honeywell International Inc. Apparatus and method for camera-based color measurements
US7592608B2 (en) * 2008-01-22 2009-09-22 Honeywell International Inc. Apparatus and method for measuring and/or controlling ultraviolet-activated materials in a paper-making process
US8396363B1 (en) 2009-09-14 2013-03-12 Exelis, Inc. Tone hopped lock-in system
JP2011169849A (en) * 2010-02-22 2011-09-01 Anritsu Corp Gas detection device
US8401809B2 (en) 2010-07-12 2013-03-19 Honeywell International Inc. System and method for adjusting an on-line appearance sensor system
US9030663B2 (en) 2011-10-31 2015-05-12 Exelis Inc. Remote absorption spectroscopy by coded transmission
CN104937395B (en) * 2013-01-17 2018-07-31 皇家飞利浦有限公司 Horizontal method and apparatus for monitoring interested gaseous species
US20220178821A1 (en) * 2019-04-05 2022-06-09 Seekops Inc. Analog signal processing for a lightweight and compact laser-based trace gas sensor
JP6953474B2 (en) * 2019-06-05 2021-10-27 野崎　眞次 Precision agriculture support system and precision agriculture support method
US11614430B2 (en) 2019-12-19 2023-03-28 Seekops Inc. Concurrent in-situ measurement of wind speed and trace gases on mobile platforms for localization and qualification of emissions
WO2021222201A1 (en) 2020-04-28 2021-11-04 Lake Shore Cryotronics, Inc. Hybrid digital and analog signal generation systems and methods
US11748866B2 (en) 2020-07-17 2023-09-05 Seekops Inc. Systems and methods of automated detection of gas plumes using optical imaging

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5339155A (en) * 1990-07-18 1994-08-16 Secretary Of State For Trade Industry Optical wavelength modulated long-path gas monitoring apparatus

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05196502A (en) * 1992-01-22 1993-08-06 Hitachi Ltd Polarization-demodulation spectroscope
JP3682793B2 (en) * 1995-11-30 2005-08-10 株式会社日立製作所 Light scattering device internal imaging device
JP3317853B2 (en) * 1996-08-09 2002-08-26 三菱電機株式会社 Laser radar light source
US6064488A (en) * 1997-06-06 2000-05-16 Monitor Labs, Inc. Method and apparatus for in situ gas concentration measurement
WO1999005488A1 (en) * 1997-07-28 1999-02-04 Hinds Instruments, Inc. Measurement of waveplate retardation using a photoelastic modulator
JP2000304655A (en) * 1999-04-22 2000-11-02 Kdd Corp Transmission characteristic measurement system
JP4678976B2 (en) * 2000-04-05 2011-04-27 株式会社日立メディコ Biological light measurement device
WO2003005002A1 (en) * 2001-07-02 2003-01-16 Advantest Corporation Propagation measurement apparatus and propagation measurement method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5339155A (en) * 1990-07-18 1994-08-16 Secretary Of State For Trade Industry Optical wavelength modulated long-path gas monitoring apparatus

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
BULLOCK A M ET AL: "MEASUREMENT OF ABSORPTION LINE WING STRUCTURE BY WAVELENGTH MODULATION SPECTROSCOPY", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 70, no. 10, 10 March 1997 (1997-03-10), pages 1195 - 1197, XP000685274, ISSN: 0003-6951 *
DOBBS M E ET AL: "Validation of design for space-based tunable diode laser absorption spectroscopy payload", PROC. SPIE - INT. SOC. OPT. ENG. (USA), PROCEEDINGS OF THE SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 2002, SPIE-INT. SOC. OPT. ENG, USA, vol. 4817, 10 July 2002 (2002-07-10), pages 123 - 128, XP002293888, ISSN: 0277-786X *
DUBINSKY I ET AL: "Frequency-modulation-enhanced remote sensing", APPL. PHYS. B, LASERS OPT. (GERMANY), APPLIED PHYSICS B (LASERS AND OPTICS), OCT. 1998, SPRINGER-VERLAG, GERMANY, vol. B67, no. 4, 1 October 1998 (1998-10-01), pages 481 - 492, XP002293889, ISSN: 0946-2171 *
LIANG-GUO WANG: "A H/sub 2/O(v) sensor system for combustion diagnostics using both direct absorption and frequency modulation spectroscopy", 1995, NEW YORK, NY, USA, IEEE, USA, 30 October 1995 (1995-10-30), pages 329 - 333 vol.2, XP002293890, ISBN: 0-7803-2450-1 *
OH D B ET AL: "Frequency modulation multiplexing for simultaneous detection of multiple gases by use of wavelength modulation spectroscopy with diode lasers", APPL. OPT. (USA), APPLIED OPTICS, 20 APRIL 1998, OPT. SOC. AMERICA, USA, vol. 37, no. 12, 20 April 1998 (1998-04-20), pages 2499 - 2501, XP002293891, ISSN: 0003-6935 *

Also Published As

Publication number Publication date
US6949734B2 (en) 2005-09-27
WO2004095004A2 (en) 2004-11-04
US20040212804A1 (en) 2004-10-28
JP4634374B2 (en) 2011-02-16
EP1618355B1 (en) 2011-06-15
JP2006524343A (en) 2006-10-26
EP1618355A2 (en) 2006-01-25

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