WO2005064280A3 - Measurement results data processing apparatus, system, method, and program - Google Patents

Measurement results data processing apparatus, system, method, and program Download PDF

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Publication number
WO2005064280A3
WO2005064280A3 PCT/EP2004/014701 EP2004014701W WO2005064280A3 WO 2005064280 A3 WO2005064280 A3 WO 2005064280A3 EP 2004014701 W EP2004014701 W EP 2004014701W WO 2005064280 A3 WO2005064280 A3 WO 2005064280A3
Authority
WO
WIPO (PCT)
Prior art keywords
error
program
uncompensated
calculation module
processing apparatus
Prior art date
Application number
PCT/EP2004/014701
Other languages
French (fr)
Other versions
WO2005064280A2 (en
Inventor
Alexander V Lopatin
Sergey Ermishin
Original Assignee
Madison Technologies Ltd
Alexander V Lopatin
Sergey Ermishin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from RU2003137663/28A external-priority patent/RU2003137663A/en
Priority claimed from RU2003137664/28A external-priority patent/RU2003137664A/en
Application filed by Madison Technologies Ltd, Alexander V Lopatin, Sergey Ermishin filed Critical Madison Technologies Ltd
Publication of WO2005064280A2 publication Critical patent/WO2005064280A2/en
Publication of WO2005064280A3 publication Critical patent/WO2005064280A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/032—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure affecting incoming signal, e.g. by averaging; gating undesired signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/02—Preprocessing

Abstract

A method, apparatus, and program for processing measurements. The apparatus comprises an electronic interface having an input to which are applied at least two uncompensated signals, each representing a measurement of a predetermined physical quantity, the electronic interface also having an output. A calculation module of the apparatus is coupled to the output. The calculation module determines an error in at least one of the uncompensated signals based upon those uncompensated signals. The determined error includes at least systematic and random error components Δsyst and Δrand. The calculation module also compensates for error in at least one uncompensated signal to provide a compensated signal, based on the determined error. The compensated signal represents substantially an actual value of the predetermined physical quantity originally subjected to measurement.
PCT/EP2004/014701 2003-12-29 2004-12-23 Measurement results data processing apparatus, system, method, and program WO2005064280A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
RU2003137663 2003-12-29
RU2003137663/28A RU2003137663A (en) 2003-12-29 2003-12-29 MEASUREMENT RESULTS DATA PROCESSING DEVICE
RU2003137664 2003-12-29
RU2003137664/28A RU2003137664A (en) 2003-12-29 2003-12-29 METHOD FOR INCREASING THE ACCURACY OF MEASUREMENTS

Publications (2)

Publication Number Publication Date
WO2005064280A2 WO2005064280A2 (en) 2005-07-14
WO2005064280A3 true WO2005064280A3 (en) 2005-11-03

Family

ID=34742253

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2004/014701 WO2005064280A2 (en) 2003-12-29 2004-12-23 Measurement results data processing apparatus, system, method, and program

Country Status (1)

Country Link
WO (1) WO2005064280A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105203148B (en) * 2015-09-30 2018-03-23 湖北工业大学 A kind of visible detection method of automobile combination meter
CN114137905B (en) * 2021-11-18 2023-10-03 合肥欣奕华智能机器股份有限公司 Error compensation method, device and storage medium

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2646927A1 (en) * 1976-10-18 1978-04-20 Bieler & Lang Ohg Compensation of gas measurement circuit - has temp. sensitive oscillating circuit whose frequency is converted into DC voltage to control balance of bridge
SU1649460A1 (en) * 1988-09-19 1991-05-15 Институт Автоматики Ан Киргсср Method of measuring electric and non-electric parameters
US5642301A (en) * 1994-01-25 1997-06-24 Rosemount Inc. Transmitter with improved compensation
US5777468A (en) * 1996-12-19 1998-07-07 Texas Instruments Incorporated Variable differential transformer system and method providing improved temperature stability and sensor fault detection apparatus
DE19715590A1 (en) * 1997-04-15 1998-11-05 Bosch Gmbh Robert Sensor module
DE19747510A1 (en) * 1997-10-28 1999-05-06 Sican F & E Gmbh Sibet Sensor measurement data processing system
EP1045226A1 (en) * 1999-04-15 2000-10-18 Matsushita Electric Industrial Co., Ltd. Signal correction apparatus and signal correction method
US6140824A (en) * 1996-01-17 2000-10-31 Patent-Treuhand-Gesellschaft Fuer Elektrishe Gluehlampen Circuit arrangement for the metrological determination of diameters of metal bodies
US6198275B1 (en) * 1995-06-07 2001-03-06 American Electronic Components Electronic circuit for automatic DC offset compensation for a linear displacement sensor
EP1108986A1 (en) * 1999-12-16 2001-06-20 Denso Corporation Method and system for temperature compensated throttle valve position control
US20010051857A1 (en) * 2000-06-13 2001-12-13 Mitutoyo Corporation Surface texture measuring machine and method of correcting a measured value for the machine
US20020066312A1 (en) * 2000-12-01 2002-06-06 Lebrun Ivan P. Self-compensating position sensor

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2646927A1 (en) * 1976-10-18 1978-04-20 Bieler & Lang Ohg Compensation of gas measurement circuit - has temp. sensitive oscillating circuit whose frequency is converted into DC voltage to control balance of bridge
SU1649460A1 (en) * 1988-09-19 1991-05-15 Институт Автоматики Ан Киргсср Method of measuring electric and non-electric parameters
US5642301A (en) * 1994-01-25 1997-06-24 Rosemount Inc. Transmitter with improved compensation
US6198275B1 (en) * 1995-06-07 2001-03-06 American Electronic Components Electronic circuit for automatic DC offset compensation for a linear displacement sensor
US6140824A (en) * 1996-01-17 2000-10-31 Patent-Treuhand-Gesellschaft Fuer Elektrishe Gluehlampen Circuit arrangement for the metrological determination of diameters of metal bodies
US5777468A (en) * 1996-12-19 1998-07-07 Texas Instruments Incorporated Variable differential transformer system and method providing improved temperature stability and sensor fault detection apparatus
DE19715590A1 (en) * 1997-04-15 1998-11-05 Bosch Gmbh Robert Sensor module
DE19747510A1 (en) * 1997-10-28 1999-05-06 Sican F & E Gmbh Sibet Sensor measurement data processing system
EP1045226A1 (en) * 1999-04-15 2000-10-18 Matsushita Electric Industrial Co., Ltd. Signal correction apparatus and signal correction method
EP1108986A1 (en) * 1999-12-16 2001-06-20 Denso Corporation Method and system for temperature compensated throttle valve position control
US20010051857A1 (en) * 2000-06-13 2001-12-13 Mitutoyo Corporation Surface texture measuring machine and method of correcting a measured value for the machine
US20020066312A1 (en) * 2000-12-01 2002-06-06 Lebrun Ivan P. Self-compensating position sensor

Also Published As

Publication number Publication date
WO2005064280A2 (en) 2005-07-14

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