WO2005076281A8 - Nonvolatile memory - Google Patents

Nonvolatile memory

Info

Publication number
WO2005076281A8
WO2005076281A8 PCT/JP2005/002108 JP2005002108W WO2005076281A8 WO 2005076281 A8 WO2005076281 A8 WO 2005076281A8 JP 2005002108 W JP2005002108 W JP 2005002108W WO 2005076281 A8 WO2005076281 A8 WO 2005076281A8
Authority
WO
WIPO (PCT)
Prior art keywords
memory
state
nonvolatile memory
transit
states
Prior art date
Application number
PCT/JP2005/002108
Other languages
French (fr)
Other versions
WO2005076281A1 (en
Inventor
Kiyoshi Kato
Original Assignee
Semiconductor Energy Lab
Kiyoshi Kato
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Lab, Kiyoshi Kato filed Critical Semiconductor Energy Lab
Priority to KR1020127002364A priority Critical patent/KR101264761B1/en
Priority to KR1020067018186A priority patent/KR101157409B1/en
Priority to US10/588,064 priority patent/US7663915B2/en
Priority to EP05710153.7A priority patent/EP1714294B1/en
Publication of WO2005076281A1 publication Critical patent/WO2005076281A1/en
Publication of WO2005076281A8 publication Critical patent/WO2005076281A8/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/22Safety or protection circuits preventing unauthorised or accidental access to memory cells
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/30Power supply circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/702Masking faults in memories by using spares or by reconfiguring by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones

Abstract

A memory cell for storing 1-bit data is formed by using at least two memory elements in the OTP type nonvolatile memory using a memory element that have two states and can transit only in one direction. In the OTP type nonvolatile memory using a memory element that has two states of an H state (a first state) and an L ( a second state) state (hereinafter simply referred to as H and L) and can electrically transit only in one direction from L to H, a memory cell for storing 1-bit data is formed by using two or more memory elements.
PCT/JP2005/002108 2004-02-10 2005-02-04 Nonvolatile memory WO2005076281A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020127002364A KR101264761B1 (en) 2004-02-10 2005-02-04 Nonvolatile memory and IC card, ID card and ID tag incorporated with the same
KR1020067018186A KR101157409B1 (en) 2004-02-10 2005-02-04 Nonvolatile memory and IC card, ID card and ID tag incorporated with the same
US10/588,064 US7663915B2 (en) 2004-02-10 2005-02-04 Nonvolatile memory
EP05710153.7A EP1714294B1 (en) 2004-02-10 2005-02-04 Nonvolatile memory

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2004033075 2004-02-10
JP2004-033075 2004-02-10
JP2004-033081 2004-02-10
JP2004033081 2004-02-10

Publications (2)

Publication Number Publication Date
WO2005076281A1 WO2005076281A1 (en) 2005-08-18
WO2005076281A8 true WO2005076281A8 (en) 2006-10-19

Family

ID=34840175

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2005/002108 WO2005076281A1 (en) 2004-02-10 2005-02-04 Nonvolatile memory

Country Status (6)

Country Link
US (1) US7663915B2 (en)
EP (1) EP1714294B1 (en)
JP (1) JP4860160B2 (en)
KR (2) KR101264761B1 (en)
CN (1) CN100485816C (en)
WO (1) WO2005076281A1 (en)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101264761B1 (en) * 2004-02-10 2013-05-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Nonvolatile memory and IC card, ID card and ID tag incorporated with the same
EP1886261B1 (en) 2005-05-31 2011-11-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP4939804B2 (en) * 2005-12-21 2012-05-30 三星電子株式会社 Nonvolatile semiconductor memory device
JP2007294082A (en) * 2006-03-31 2007-11-08 Semiconductor Energy Lab Co Ltd Method for deleting data from nand type nonvolatile memory
US7554854B2 (en) 2006-03-31 2009-06-30 Semiconductor Energy Laboratory Co., Ltd. Method for deleting data from NAND type nonvolatile memory
JP4852400B2 (en) * 2006-11-27 2012-01-11 シャープ株式会社 Semiconductor memory device, semiconductor device, display device, liquid crystal display device, and receiver
JP5311851B2 (en) * 2007-03-23 2013-10-09 株式会社半導体エネルギー研究所 Semiconductor device
US7897482B2 (en) * 2007-05-31 2011-03-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
CN101681885B (en) * 2007-06-25 2013-09-25 株式会社半导体能源研究所 Semiconductor device
WO2009004919A1 (en) 2007-06-29 2009-01-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP5408930B2 (en) 2007-08-31 2014-02-05 株式会社半導体エネルギー研究所 Method for manufacturing semiconductor device
JP5371400B2 (en) * 2007-12-14 2013-12-18 株式会社半導体エネルギー研究所 Memory and semiconductor device
US20110068332A1 (en) * 2008-08-04 2011-03-24 The Trustees Of Princeton University Hybrid Dielectric Material for Thin Film Transistors
WO2010026865A1 (en) * 2008-09-05 2010-03-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device and semiconductor device
CN102160178B (en) 2008-09-19 2013-06-19 株式会社半导体能源研究所 Semiconductor device
CN102150268B (en) * 2008-09-30 2013-07-31 株式会社半导体能源研究所 Semiconductor memory device
US8780660B2 (en) * 2010-06-08 2014-07-15 Chengdu Kiloway Electronics Inc. Spurious induced charge cleanup for one time programmable (OTP) memory
JP5686698B2 (en) * 2011-08-05 2015-03-18 ルネサスエレクトロニクス株式会社 Semiconductor device
US9355026B1 (en) 2012-04-17 2016-05-31 Micron Technology, Inc. Searching using multilevel cells and programming multilevel cells for searching
CN103092315B (en) 2013-01-09 2015-11-25 惠州Tcl移动通信有限公司 The mobile terminal of rear recovery application program can be restarted
KR102465966B1 (en) 2016-01-27 2022-11-10 삼성전자주식회사 Memory device and electronic apparatus comprising the same memory device
TWI762894B (en) * 2019-11-05 2022-05-01 友達光電股份有限公司 Circuit device

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4167786A (en) * 1978-01-24 1979-09-11 General Electric Company Load control processor
US4768169A (en) * 1983-10-28 1988-08-30 Seeq Technology, Inc. Fault-tolerant memory array
US4596014A (en) * 1984-02-21 1986-06-17 Foster Wheeler Energy Corporation I/O rack addressing error detection for process control
DE3546662C3 (en) * 1985-02-22 1997-04-03 Bosch Gmbh Robert Method for operating a data processing system
IT1214246B (en) * 1987-05-27 1990-01-10 Sgs Microelettronica Spa HIGH VOLATILE NON-VOLATILE MEMORY DEVICE FOR MODIFICATION CYCLES.
JP2537264B2 (en) * 1988-04-13 1996-09-25 株式会社東芝 Semiconductor memory device
US5029131A (en) * 1988-06-29 1991-07-02 Seeq Technology, Incorporated Fault tolerant differential memory cell and sensing
JPH0679440B2 (en) * 1990-03-22 1994-10-05 株式会社東芝 Nonvolatile semiconductor memory device
JP3011300B2 (en) * 1991-02-19 2000-02-21 三菱電機株式会社 Semiconductor storage device
JPH0683716A (en) * 1992-09-01 1994-03-25 Rohm Co Ltd Electrically rewritable non-volatile memory
US5379415A (en) * 1992-09-29 1995-01-03 Zitel Corporation Fault tolerant memory system
JPH06268180A (en) * 1993-03-17 1994-09-22 Kobe Steel Ltd Nonvolatile semiconductor memory device
US5469443A (en) * 1993-10-01 1995-11-21 Hal Computer Systems, Inc. Method and apparatus for testing random access memory
US5467396A (en) * 1993-10-27 1995-11-14 The Titan Corporation Tamper-proof data storage
US5789970A (en) * 1995-09-29 1998-08-04 Intel Corporation Static, low current, low voltage sensing circuit for sensing the state of a fuse device
JPH10116493A (en) * 1996-10-09 1998-05-06 Fujitsu Ltd Semiconductor memory device
JPH10154293A (en) * 1996-11-25 1998-06-09 Mitsubishi Heavy Ind Ltd Electronic vehicle position detection system
JP3916277B2 (en) * 1996-12-26 2007-05-16 シャープ株式会社 Read-only memory and arithmetic unit
JP3588529B2 (en) * 1997-01-28 2004-11-10 株式会社東芝 Semiconductor device and its application system device
JP3421526B2 (en) 1997-02-14 2003-06-30 モトローラ株式会社 Data processing device
TW397982B (en) * 1997-09-18 2000-07-11 Sanyo Electric Co Nonvolatile semiconductor memory device
FR2771839B1 (en) * 1997-11-28 2000-01-28 Sgs Thomson Microelectronics PROGRAMMABLE AND ELECTRICALLY ERASABLE NON-VOLATILE MEMORY
US6182239B1 (en) * 1998-02-06 2001-01-30 Stmicroelectronics, Inc. Fault-tolerant codes for multi-level memories
FR2778253B1 (en) * 1998-04-30 2000-06-02 Sgs Thomson Microelectronics DEVICE FOR CONFIGURING OPTIONS IN AN INTEGRATED CIRCUIT AND IMPLEMENTING METHOD
US6160734A (en) * 1998-06-04 2000-12-12 Texas Instruments Incorporated Method for ensuring security of program data in one-time programmable memory
JP2000207506A (en) * 1999-01-20 2000-07-28 Tokin Corp Non-contact type ic card system
JP2001057096A (en) * 1999-06-11 2001-02-27 Hitachi Ltd Multiplexed memory, and sensor and control system using the memory
US6757832B1 (en) * 2000-02-15 2004-06-29 Silverbrook Research Pty Ltd Unauthorized modification of values in flash memory
JP2001283594A (en) 2000-03-29 2001-10-12 Sharp Corp Non-volatile semiconductor memory
FR2810152A1 (en) * 2000-06-13 2001-12-14 St Microelectronics Sa EEPROM for securing electronic devices such as chip cards has elements for detection and correction of memory errors within the secure non-erasable memory area
US6388503B1 (en) * 2000-09-28 2002-05-14 Intel Corporation Output buffer with charge-pumped noise cancellation
JP2002203217A (en) * 2000-12-28 2002-07-19 Denso Corp Nonvolatile memory, electronic equipment and illegality monitoring system
JP3758079B2 (en) * 2001-02-26 2006-03-22 シャープ株式会社 Nonvolatile semiconductor memory device
JP2002279787A (en) * 2001-03-16 2002-09-27 Hitachi Ltd Non-volatile semiconductor memory
JP2002316724A (en) * 2001-04-25 2002-10-31 Dainippon Printing Co Ltd Illicit return prevention method
JP4064154B2 (en) 2001-05-31 2008-03-19 株式会社半導体エネルギー研究所 Nonvolatile memory and electronic device using the same
TW559814B (en) 2001-05-31 2003-11-01 Semiconductor Energy Lab Nonvolatile memory and method of driving the same
US6490197B1 (en) * 2001-08-02 2002-12-03 Stmicroelectronics, Inc. Sector protection circuit and method for flash memory devices
US20040004861A1 (en) * 2002-07-05 2004-01-08 Impinj, Inc. A Delware Corporation Differential EEPROM using pFET floating gate transistors
US7121639B2 (en) * 2002-12-02 2006-10-17 Silverbrook Research Pty Ltd Data rate equalisation to account for relatively different printhead widths
US6794997B2 (en) * 2003-02-18 2004-09-21 Sun Microsystems, Inc. Extending non-volatile memory endurance using data encoding
KR101264761B1 (en) * 2004-02-10 2013-05-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Nonvolatile memory and IC card, ID card and ID tag incorporated with the same
DE102004010840B4 (en) * 2004-03-05 2006-01-05 Infineon Technologies Ag A method of operating an electrically writable and erasable nonvolatile memory cell and a memory device for electrically nonvolatile memory
DE102004017863B4 (en) * 2004-04-13 2014-09-25 Qimonda Ag Circuit and method for determining a reference level for such a circuit
JP2005340356A (en) * 2004-05-25 2005-12-08 Hitachi Ltd Semiconductor storage device
US7142452B1 (en) * 2004-06-07 2006-11-28 Virage Logic Corporation Method and system for securing data in a multi-time programmable non-volatile memory device

Also Published As

Publication number Publication date
KR101264761B1 (en) 2013-05-15
US20080144374A1 (en) 2008-06-19
EP1714294A4 (en) 2007-10-03
KR20120030572A (en) 2012-03-28
JP4860160B2 (en) 2012-01-25
CN1918663A (en) 2007-02-21
KR20070022654A (en) 2007-02-27
EP1714294A1 (en) 2006-10-25
CN100485816C (en) 2009-05-06
US7663915B2 (en) 2010-02-16
EP1714294B1 (en) 2016-04-20
JP2005259334A (en) 2005-09-22
WO2005076281A1 (en) 2005-08-18
KR101157409B1 (en) 2012-06-21

Similar Documents

Publication Publication Date Title
WO2005076281A8 (en) Nonvolatile memory
WO2005106886A3 (en) Refreshing data stored in a flash memory
WO2006072945A3 (en) Method of managing a multi-bit cell flash memory with improved reliability and performance
WO2007117790A3 (en) Programmable cell
WO2007014117A3 (en) Non-volatile memory
WO2006044203A3 (en) Flexible otp sector protection architecture for flash memories
WO2007142817A3 (en) Memory system with switch element
WO2007098044A8 (en) Multi-bit memory cell having electrically floating body transistor, and method of programming and reading same
EP2490224A3 (en) Non-volatile memory with single bit and multibit programming modes
WO2011100138A3 (en) Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, methods of writing to and reading from a memory cell, and computer systems
WO2009009076A3 (en) Error correction for memory
WO2007130615A3 (en) A method for reading a multilevel cell in a non-volatile memory device
TW200618190A (en) Method for fabricating a memory cell array, and memory cell array
ATE467180T1 (en) NETWORK ACCESSIBLE STORAGE ELEMENT, NETWORK ACCESSIBLE STORAGE MODULE, NETWORK STORAGE SYSTEM AND STORAGE AREA NETWORK
WO2007130921A3 (en) Memory module with reduced access granularity
WO2007116393A3 (en) Method for generating soft bits in flash memories
TW200635015A (en) Changing chip function based on fuse states
WO2009016824A1 (en) Nonvolatile storage device
ATE510287T1 (en) COUPLING COMPENSATION FOR NON-VOLATILE STORAGE
TW200702996A (en) Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperable
JP2005259334A5 (en)
TW200520209A (en) Nonvolatile semiconductor memory
WO2004031935A3 (en) Method and system for using a memory card protocol inside a bus protocol
WO2007078632A3 (en) Multiported memory with ports mapped to bank sets
TW200723507A (en) Gated diode nonvolatile memory cell array

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 10588064

Country of ref document: US

WWE Wipo information: entry into national phase

Ref document number: 200580004220.0

Country of ref document: CN

NENP Non-entry into the national phase

Ref country code: DE

WWW Wipo information: withdrawn in national office

Country of ref document: DE

WWE Wipo information: entry into national phase

Ref document number: 2005710153

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 1020067018186

Country of ref document: KR

WWP Wipo information: published in national office

Ref document number: 2005710153

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: JP

WWW Wipo information: withdrawn in national office

Country of ref document: JP

WWP Wipo information: published in national office

Ref document number: 1020067018186

Country of ref document: KR