WO2005076281A8 - Nonvolatile memory - Google Patents
Nonvolatile memoryInfo
- Publication number
- WO2005076281A8 WO2005076281A8 PCT/JP2005/002108 JP2005002108W WO2005076281A8 WO 2005076281 A8 WO2005076281 A8 WO 2005076281A8 JP 2005002108 W JP2005002108 W JP 2005002108W WO 2005076281 A8 WO2005076281 A8 WO 2005076281A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- memory
- state
- nonvolatile memory
- transit
- states
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/702—Masking faults in memories by using spares or by reconfiguring by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020127002364A KR101264761B1 (en) | 2004-02-10 | 2005-02-04 | Nonvolatile memory and IC card, ID card and ID tag incorporated with the same |
KR1020067018186A KR101157409B1 (en) | 2004-02-10 | 2005-02-04 | Nonvolatile memory and IC card, ID card and ID tag incorporated with the same |
US10/588,064 US7663915B2 (en) | 2004-02-10 | 2005-02-04 | Nonvolatile memory |
EP05710153.7A EP1714294B1 (en) | 2004-02-10 | 2005-02-04 | Nonvolatile memory |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004033075 | 2004-02-10 | ||
JP2004-033075 | 2004-02-10 | ||
JP2004-033081 | 2004-02-10 | ||
JP2004033081 | 2004-02-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005076281A1 WO2005076281A1 (en) | 2005-08-18 |
WO2005076281A8 true WO2005076281A8 (en) | 2006-10-19 |
Family
ID=34840175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/002108 WO2005076281A1 (en) | 2004-02-10 | 2005-02-04 | Nonvolatile memory |
Country Status (6)
Country | Link |
---|---|
US (1) | US7663915B2 (en) |
EP (1) | EP1714294B1 (en) |
JP (1) | JP4860160B2 (en) |
KR (2) | KR101264761B1 (en) |
CN (1) | CN100485816C (en) |
WO (1) | WO2005076281A1 (en) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101264761B1 (en) * | 2004-02-10 | 2013-05-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Nonvolatile memory and IC card, ID card and ID tag incorporated with the same |
EP1886261B1 (en) | 2005-05-31 | 2011-11-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP4939804B2 (en) * | 2005-12-21 | 2012-05-30 | 三星電子株式会社 | Nonvolatile semiconductor memory device |
JP2007294082A (en) * | 2006-03-31 | 2007-11-08 | Semiconductor Energy Lab Co Ltd | Method for deleting data from nand type nonvolatile memory |
US7554854B2 (en) | 2006-03-31 | 2009-06-30 | Semiconductor Energy Laboratory Co., Ltd. | Method for deleting data from NAND type nonvolatile memory |
JP4852400B2 (en) * | 2006-11-27 | 2012-01-11 | シャープ株式会社 | Semiconductor memory device, semiconductor device, display device, liquid crystal display device, and receiver |
JP5311851B2 (en) * | 2007-03-23 | 2013-10-09 | 株式会社半導体エネルギー研究所 | Semiconductor device |
US7897482B2 (en) * | 2007-05-31 | 2011-03-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
CN101681885B (en) * | 2007-06-25 | 2013-09-25 | 株式会社半导体能源研究所 | Semiconductor device |
WO2009004919A1 (en) | 2007-06-29 | 2009-01-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP5408930B2 (en) | 2007-08-31 | 2014-02-05 | 株式会社半導体エネルギー研究所 | Method for manufacturing semiconductor device |
JP5371400B2 (en) * | 2007-12-14 | 2013-12-18 | 株式会社半導体エネルギー研究所 | Memory and semiconductor device |
US20110068332A1 (en) * | 2008-08-04 | 2011-03-24 | The Trustees Of Princeton University | Hybrid Dielectric Material for Thin Film Transistors |
WO2010026865A1 (en) * | 2008-09-05 | 2010-03-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor memory device and semiconductor device |
CN102160178B (en) | 2008-09-19 | 2013-06-19 | 株式会社半导体能源研究所 | Semiconductor device |
CN102150268B (en) * | 2008-09-30 | 2013-07-31 | 株式会社半导体能源研究所 | Semiconductor memory device |
US8780660B2 (en) * | 2010-06-08 | 2014-07-15 | Chengdu Kiloway Electronics Inc. | Spurious induced charge cleanup for one time programmable (OTP) memory |
JP5686698B2 (en) * | 2011-08-05 | 2015-03-18 | ルネサスエレクトロニクス株式会社 | Semiconductor device |
US9355026B1 (en) | 2012-04-17 | 2016-05-31 | Micron Technology, Inc. | Searching using multilevel cells and programming multilevel cells for searching |
CN103092315B (en) | 2013-01-09 | 2015-11-25 | 惠州Tcl移动通信有限公司 | The mobile terminal of rear recovery application program can be restarted |
KR102465966B1 (en) | 2016-01-27 | 2022-11-10 | 삼성전자주식회사 | Memory device and electronic apparatus comprising the same memory device |
TWI762894B (en) * | 2019-11-05 | 2022-05-01 | 友達光電股份有限公司 | Circuit device |
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-
2005
- 2005-02-04 KR KR1020127002364A patent/KR101264761B1/en not_active IP Right Cessation
- 2005-02-04 EP EP05710153.7A patent/EP1714294B1/en not_active Expired - Fee Related
- 2005-02-04 CN CNB2005800042200A patent/CN100485816C/en not_active Expired - Fee Related
- 2005-02-04 KR KR1020067018186A patent/KR101157409B1/en active IP Right Grant
- 2005-02-04 JP JP2005028511A patent/JP4860160B2/en not_active Expired - Fee Related
- 2005-02-04 US US10/588,064 patent/US7663915B2/en not_active Expired - Fee Related
- 2005-02-04 WO PCT/JP2005/002108 patent/WO2005076281A1/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR101264761B1 (en) | 2013-05-15 |
US20080144374A1 (en) | 2008-06-19 |
EP1714294A4 (en) | 2007-10-03 |
KR20120030572A (en) | 2012-03-28 |
JP4860160B2 (en) | 2012-01-25 |
CN1918663A (en) | 2007-02-21 |
KR20070022654A (en) | 2007-02-27 |
EP1714294A1 (en) | 2006-10-25 |
CN100485816C (en) | 2009-05-06 |
US7663915B2 (en) | 2010-02-16 |
EP1714294B1 (en) | 2016-04-20 |
JP2005259334A (en) | 2005-09-22 |
WO2005076281A1 (en) | 2005-08-18 |
KR101157409B1 (en) | 2012-06-21 |
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