WO2005081313A3 - A microelectronic assembly having thermoelectric elements to cool a die and a method of making the same - Google Patents
A microelectronic assembly having thermoelectric elements to cool a die and a method of making the same Download PDFInfo
- Publication number
- WO2005081313A3 WO2005081313A3 PCT/US2005/003440 US2005003440W WO2005081313A3 WO 2005081313 A3 WO2005081313 A3 WO 2005081313A3 US 2005003440 W US2005003440 W US 2005003440W WO 2005081313 A3 WO2005081313 A3 WO 2005081313A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- die
- thermoelectric elements
- microelectronic assembly
- cool
- making
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/38—Cooling arrangements using the Peltier effect
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- H01—ELECTRIC ELEMENTS
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4871—Bases, plates or heatsinks
- H01L21/4882—Assembly of heatsink parts
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/0502—Disposition
- H01L2224/05022—Disposition the internal layer being at least partially embedded in the surface
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- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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- H01L2224/05075—Plural internal layers
- H01L2224/0508—Plural internal layers being stacked
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- H01L2224/0554—External layer
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
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- H01L2224/4809—Loop shape
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
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- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
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- H01L2924/14—Integrated circuits
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15312—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2005800039104A CN1914725B (en) | 2004-02-12 | 2005-02-02 | Microelectronic assembly having thermoelectric elements to cool a die and a method of making the same |
JP2006553163A JP4464974B2 (en) | 2004-02-12 | 2005-02-02 | Microelectronic assembly having a thermoelectric element for cooling a die and method of manufacturing the same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/778,514 US7589417B2 (en) | 2004-02-12 | 2004-02-12 | Microelectronic assembly having thermoelectric elements to cool a die and a method of making the same |
US10/778,514 | 2004-02-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005081313A2 WO2005081313A2 (en) | 2005-09-01 |
WO2005081313A3 true WO2005081313A3 (en) | 2005-11-24 |
Family
ID=34838194
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2005/003440 WO2005081313A2 (en) | 2004-02-12 | 2005-02-02 | A microelectronic assembly having thermoelectric elements to cool a die and a method of making the same |
Country Status (5)
Country | Link |
---|---|
US (1) | US7589417B2 (en) |
JP (1) | JP4464974B2 (en) |
CN (1) | CN1914725B (en) |
TW (1) | TWI324818B (en) |
WO (1) | WO2005081313A2 (en) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100257871A1 (en) * | 2003-12-11 | 2010-10-14 | Rama Venkatasubramanian | Thin film thermoelectric devices for power conversion and cooling |
US7638705B2 (en) * | 2003-12-11 | 2009-12-29 | Nextreme Thermal Solutions, Inc. | Thermoelectric generators for solar conversion and related systems and methods |
US7523617B2 (en) * | 2004-10-22 | 2009-04-28 | Nextreme Thermal Solutions, Inc. | Thin film thermoelectric devices for hot-spot thermal management in microprocessors and other electronics |
US8063298B2 (en) * | 2004-10-22 | 2011-11-22 | Nextreme Thermal Solutions, Inc. | Methods of forming embedded thermoelectric coolers with adjacent thermally conductive fields |
US20060243315A1 (en) * | 2005-04-29 | 2006-11-02 | Chrysler Gregory M | Gap-filling in electronic assemblies including a TEC structure |
SG139573A1 (en) * | 2006-07-17 | 2008-02-29 | Micron Technology Inc | Microelectronic packages with leadframes, including leadframes configured for stacked die packages, and associated systems and methods |
JP5522943B2 (en) * | 2008-01-29 | 2014-06-18 | 京セラ株式会社 | Thermoelectric module |
TWI405361B (en) * | 2008-12-31 | 2013-08-11 | Ind Tech Res Inst | Thermoelectric device and process thereof and stacked structure of chips and chip package structure |
US8035218B2 (en) * | 2009-11-03 | 2011-10-11 | Intel Corporation | Microelectronic package and method of manufacturing same |
US20110132000A1 (en) * | 2009-12-09 | 2011-06-09 | Deane Philip A | Thermoelectric Heating/Cooling Structures Including a Plurality of Spaced Apart Thermoelectric Components |
CN102194811B (en) * | 2010-03-05 | 2012-12-05 | 中芯国际集成电路制造(上海)有限公司 | Thermoelectric device |
FR2963165A1 (en) * | 2010-07-22 | 2012-01-27 | St Microelectronics Crolles 2 | METHOD FOR GENERATING ELECTRIC ENERGY IN A SEMICONDUCTOR DEVICE, AND CORRESPONDING DEVICE |
US8492788B2 (en) * | 2010-10-08 | 2013-07-23 | Guardian Industries Corp. | Insulating glass (IG) or vacuum insulating glass (VIG) unit including light source, and/or methods of making the same |
FR2966268B1 (en) | 2010-10-18 | 2013-08-16 | St Microelectronics Rousset | METHOD COMPRISING DETECTION OF INTEGRATED CIRCUIT BOX RETRIEVAL AFTER INITIAL SET-UP, AND CORRESPONDING INTEGRATED CIRCUIT. |
US8816494B2 (en) | 2012-07-12 | 2014-08-26 | Micron Technology, Inc. | Semiconductor device packages including thermally insulating materials and methods of making and using such semiconductor packages |
CN102800636B (en) * | 2012-08-28 | 2015-02-18 | 中国科学院微电子研究所 | Electronic component package and manufacturing method thereof |
DE102012110021A1 (en) * | 2012-10-19 | 2014-04-24 | Bpe E.K. | Multifunction microelectronic device and manufacturing method therefor |
WO2014159572A1 (en) * | 2013-03-14 | 2014-10-02 | Gmz Energy Inc. | Thermoelectric device fabrication using direct bonding |
US9559283B2 (en) | 2015-03-30 | 2017-01-31 | International Business Machines Corporation | Integrated circuit cooling using embedded peltier micro-vias in substrate |
US9941458B2 (en) * | 2015-03-30 | 2018-04-10 | International Business Machines Corporation | Integrated circuit cooling using embedded peltier micro-vias in substrate |
US10068875B2 (en) | 2015-10-22 | 2018-09-04 | Micron Technology, Inc. | Apparatuses and methods for heat transfer from packaged semiconductor die |
US11152279B2 (en) * | 2018-03-26 | 2021-10-19 | Raytheon Company | Monolithic microwave integrated circuit (MMIC) cooling structure |
US20230268244A1 (en) * | 2022-02-21 | 2023-08-24 | Taiwan Semiconductor Manufacturing Company, Ltd. | Thermal dissipation in power ic using pyroelectric materials |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020024154A1 (en) * | 2000-07-03 | 2002-02-28 | Reiko Hara | Thermoelectric module |
US6424533B1 (en) * | 2000-06-29 | 2002-07-23 | International Business Machines Corporation | Thermoelectric-enhanced heat spreader for heat generating component of an electronic device |
US20020113289A1 (en) * | 2000-02-04 | 2002-08-22 | Cordes Michael James | Method and apparatus for thermal management of integrated circuits |
US20030122245A1 (en) * | 2000-11-30 | 2003-07-03 | International Business Machines Corporation | Electronic module with integrated programmable thermoelectric cooling assembly and method of fabrication |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4483341A (en) * | 1982-12-09 | 1984-11-20 | Atlantic Richfield Company | Therapeutic hypothermia instrument |
US5284287A (en) * | 1992-08-31 | 1994-02-08 | Motorola, Inc. | Method for attaching conductive balls to a substrate |
US5291062A (en) * | 1993-03-01 | 1994-03-01 | Motorola, Inc. | Area array semiconductor device having a lid with functional contacts |
US5435482A (en) * | 1994-02-04 | 1995-07-25 | Lsi Logic Corporation | Integrated circuit having a coplanar solder ball contact array |
US5543661A (en) * | 1994-05-31 | 1996-08-06 | Sumitomo Metal Ceramics Inc. | Semiconductor ceramic package with terminal vias |
JP2937791B2 (en) * | 1995-03-14 | 1999-08-23 | 日本電気株式会社 | Peltier Eclair |
US5712448A (en) * | 1996-02-07 | 1998-01-27 | California Institute Of Technology | Cooling device featuring thermoelectric and diamond materials for temperature control of heat-dissipating devices |
JPH10200208A (en) * | 1997-01-09 | 1998-07-31 | Nec Corp | Semiconductor laser module |
US5821168A (en) * | 1997-07-16 | 1998-10-13 | Motorola, Inc. | Process for forming a semiconductor device |
SE515158C2 (en) | 1999-02-10 | 2001-06-18 | Ericsson Telefon Ab L M | Semiconductor device with ground connection via a non-through plug |
US6230497B1 (en) | 1999-12-06 | 2001-05-15 | Motorola, Inc. | Semiconductor circuit temperature monitoring and controlling apparatus and method |
US6455930B1 (en) * | 1999-12-13 | 2002-09-24 | Lamina Ceramics, Inc. | Integrated heat sinking packages using low temperature co-fired ceramic metal circuit board technology |
US6528907B2 (en) * | 2000-04-07 | 2003-03-04 | Mirae Corporation | Linear motor |
US6512291B2 (en) * | 2001-02-23 | 2003-01-28 | Agere Systems Inc. | Flexible semiconductor device support with integrated thermoelectric cooler and method for making same |
US6634770B2 (en) * | 2001-08-24 | 2003-10-21 | Densen Cao | Light source using semiconductor devices mounted on a heat sink |
DE10238843B8 (en) * | 2002-08-20 | 2008-01-03 | Infineon Technologies Ag | Semiconductor component |
US7034394B2 (en) * | 2003-10-08 | 2006-04-25 | Intel Corporation | Microelectronic assembly having thermoelectric elements to cool a die and a method of making the same |
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2004
- 2004-02-12 US US10/778,514 patent/US7589417B2/en not_active Expired - Fee Related
-
2005
- 2005-01-31 TW TW94102919A patent/TWI324818B/en not_active IP Right Cessation
- 2005-02-02 CN CN2005800039104A patent/CN1914725B/en not_active Expired - Fee Related
- 2005-02-02 WO PCT/US2005/003440 patent/WO2005081313A2/en active Application Filing
- 2005-02-02 JP JP2006553163A patent/JP4464974B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020113289A1 (en) * | 2000-02-04 | 2002-08-22 | Cordes Michael James | Method and apparatus for thermal management of integrated circuits |
US6424533B1 (en) * | 2000-06-29 | 2002-07-23 | International Business Machines Corporation | Thermoelectric-enhanced heat spreader for heat generating component of an electronic device |
US20020024154A1 (en) * | 2000-07-03 | 2002-02-28 | Reiko Hara | Thermoelectric module |
US20030122245A1 (en) * | 2000-11-30 | 2003-07-03 | International Business Machines Corporation | Electronic module with integrated programmable thermoelectric cooling assembly and method of fabrication |
Also Published As
Publication number | Publication date |
---|---|
TW200529398A (en) | 2005-09-01 |
US20050178423A1 (en) | 2005-08-18 |
JP2007523478A (en) | 2007-08-16 |
WO2005081313A2 (en) | 2005-09-01 |
JP4464974B2 (en) | 2010-05-19 |
CN1914725A (en) | 2007-02-14 |
TWI324818B (en) | 2010-05-11 |
US7589417B2 (en) | 2009-09-15 |
CN1914725B (en) | 2011-11-23 |
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